BR0106645A - Sonda, e, conjunto de sonda e conector - Google Patents

Sonda, e, conjunto de sonda e conector

Info

Publication number
BR0106645A
BR0106645A BR0106645-5A BR0106645A BR0106645A BR 0106645 A BR0106645 A BR 0106645A BR 0106645 A BR0106645 A BR 0106645A BR 0106645 A BR0106645 A BR 0106645A
Authority
BR
Brazil
Prior art keywords
probe
connector
housing
terminal
fixture
Prior art date
Application number
BR0106645-5A
Other languages
English (en)
Inventor
Arra D Yeguiayan
Matthew R Parker
Marco Deblois
Rene Melacon
Original Assignee
Qa Technology Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=26900045&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=BR0106645(A) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Qa Technology Co Inc filed Critical Qa Technology Co Inc
Publication of BR0106645A publication Critical patent/BR0106645A/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Measurement And Recording Of Electrical Phenomena And Electrical Characteristics Of The Living Body (AREA)

Abstract

"SONDA, E, CONJUNTO DE SONDA E CONECTOR". Sonda aperfeiçoada (78) inclui um alojamento tubular condutivo (80) ou corpo contendo uma mola em espiral (84) e um êmbolo condutivo (82) móvel no alojamento (80) e tendo uma ponta de contato (85) que se estende para fora de uma extremidade do alojamento (80). O êmbolo (82) e a ponta (85) são impelidos para uma posição normalmente para fora pela força de solicitação da mola (84). A extremidade oposta do alojamento tem uma abertura para correspondência com um pino condutivo de um conector. O conector (96,97) é retido em uma placa de montagem (52) de uma fixação associada (40) e tem extremidades terminais de configuração desejada. A extremidade terminal pode incluir um pino enrolado por fio, um terminal do tipo ligação (113) para fixação a um fio (110) ou o terminal pode incluir um pino carregado por mola (84) para encaixe com um contato elétrico associado. Uma vedação hermética (170) pode ser proporcionada entre a sonda e o conector e o conector pode ser montado em uma montagem de modo que, quando vácuo é aplicado a uma fixação de teste associada (40), ar não pode ser retirado através da fixação ou através do corpo da sonda.
BR0106645-5A 2000-05-18 2001-05-14 Sonda, e, conjunto de sonda e conector BR0106645A (pt)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US20504500P 2000-05-18 2000-05-18
US09/759,980 US6570399B2 (en) 2000-05-18 2001-01-12 Test probe and separable mating connector assembly
PCT/US2001/015479 WO2001088557A1 (en) 2000-05-18 2001-05-14 Test probe and connector

Publications (1)

Publication Number Publication Date
BR0106645A true BR0106645A (pt) 2002-04-23

Family

ID=26900045

Family Applications (1)

Application Number Title Priority Date Filing Date
BR0106645-5A BR0106645A (pt) 2000-05-18 2001-05-14 Sonda, e, conjunto de sonda e conector

Country Status (10)

Country Link
US (1) US6570399B2 (pt)
EP (1) EP1285281B1 (pt)
JP (1) JP4452428B2 (pt)
AT (1) ATE345508T1 (pt)
AU (1) AU2001264590A1 (pt)
BR (1) BR0106645A (pt)
CA (1) CA2375326C (pt)
DE (1) DE60124536T2 (pt)
NO (1) NO20020049L (pt)
WO (1) WO2001088557A1 (pt)

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US6331836B1 (en) * 2000-08-24 2001-12-18 Fast Location.Net, Llc Method and apparatus for rapidly estimating the doppler-error and other receiver frequency errors of global positioning system satellite signals weakened by obstructions in the signal path
US6876530B2 (en) * 2001-01-12 2005-04-05 Qa Technology Company, Inc. Test probe and connector
KR20040087341A (ko) * 2002-03-05 2004-10-13 리카 일렉트로닉스 인터내셔널, 인크. 전자 패키지와 테스트 장비를 인터페이싱시키기 위한 장치
DE10225028B3 (de) * 2002-06-06 2004-01-15 Ratzky, Bruno Kugelgelenk-Führungsstifte mit Einrastung-Modularer, haubenloser, höhenselbsteinstellender, von oben genau kontaktierbarer Vakuum-Prüfadapter
US6967492B2 (en) * 2003-11-26 2005-11-22 Asm Assembly Automation Ltd. Spring contact probe device for electrical testing
US20050253602A1 (en) * 2004-04-28 2005-11-17 Cram Daniel P Resilient contact probe apparatus, methods of using and making, and resilient contact probes
US7183781B2 (en) * 2004-08-13 2007-02-27 Agilent Technologies, Inc. Incorporation of isolation resistor(s) into probes using probe tip spring pins
US7081869B2 (en) * 2004-10-13 2006-07-25 Research In Motion Limited Test fixture for assembled wireless devices
US7161369B2 (en) * 2004-10-29 2007-01-09 Agilent Technologies, Inc. Method and apparatus for a wobble fixture probe for probing test access point structures
US7298153B2 (en) * 2005-05-25 2007-11-20 Interconnect Devices, Inc. Eccentric offset Kelvin probe
US7154286B1 (en) * 2005-06-30 2006-12-26 Interconnect Devices, Inc. Dual tapered spring probe
US7492173B2 (en) 2006-01-12 2009-02-17 Agilent Technologies, Inc. Probe accessories, and methods for probing test points using same
US7331795B2 (en) * 2006-01-13 2008-02-19 Raytheon Company Spring probe-compliant pin connector
US7616019B2 (en) * 2006-05-08 2009-11-10 Aspen Test Engineering, Inc. Low profile electronic assembly test fixtures
JP2007304008A (ja) * 2006-05-12 2007-11-22 Nidec-Read Corp 基板検査用接触子、基板検査用治具及び基板検査装置
US7498826B2 (en) * 2006-08-25 2009-03-03 Interconnect Devices, Inc. Probe array wafer
US20100015833A1 (en) * 2008-07-16 2010-01-21 Cooper Technologies Company High density spring contact connector
US20100194419A1 (en) * 2009-02-05 2010-08-05 Chan Edward K Multi-contact probe assembly
JP2011247838A (ja) * 2010-05-31 2011-12-08 Ricoh Co Ltd スイッチプローブ、基板検査装置及び基板検査システム
JPWO2013051674A1 (ja) * 2011-10-07 2015-03-30 日本発條株式会社 プローブユニット
KR101328581B1 (ko) * 2012-06-13 2013-11-13 리노공업주식회사 검사용 프로브 및 그 제조방법
US9022790B1 (en) * 2012-09-11 2015-05-05 Western Digital Technologies, Inc. Fixture for a disk drive printed circuit board
JP6266209B2 (ja) * 2012-12-25 2018-01-24 株式会社エンプラス 電気接触子及び電気部品用ソケット
JP2014178175A (ja) * 2013-03-14 2014-09-25 Micronics Japan Co Ltd 相互接続装置及び相互接続装置の組立方法
WO2014145925A1 (en) * 2013-03-15 2014-09-18 Moontunes, Inc. Systems and methods for controlling cameras at live events
CN203337694U (zh) * 2013-05-27 2013-12-11 深圳市策维科技有限公司 一种测试探针
KR101473170B1 (ko) 2013-08-12 2014-12-17 리노공업주식회사 컨택트 프로브
US9933455B2 (en) 2015-05-04 2018-04-03 Qualcomm Incorporated Known good die testing for high frequency applications
US9851569B2 (en) 2015-11-06 2017-12-26 Microsoft Technology Licensing, Llc Mounting apparatus for head-mounted display device
US10894419B2 (en) 2017-03-14 2021-01-19 Illinois Tool Works Inc. Quick connect assembly for fluid and electrical connections
EP3918349A1 (en) * 2018-09-11 2021-12-08 Magicmotorsport Srl Probe for tools for carrying out tests on electrical and/or electronic circuits and assembly comprising the probe
US11906550B2 (en) * 2021-04-30 2024-02-20 Essai, Inc. Probe system for QFP integrated circuit device test tooling
US12241912B2 (en) 2021-10-22 2025-03-04 Raytheon Company Socketless or flush mount QFN (quad flat no lead) test board, fixture, and method

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Publication number Priority date Publication date Assignee Title
US2885648A (en) 1956-12-06 1959-05-05 Herbert H King Test probe with retractible shield
DE7633778U1 (de) 1976-10-27 1977-05-12 Heilmann, Werner, 7750 Konstanz 3000 Hannover Kontaktstift Heilmann, Werner, 7750 Konstanz
US4164704A (en) 1976-11-01 1979-08-14 Metropolitan Circuits, Inc. Plural probe circuit card fixture using a vacuum collapsed membrane to hold the card against the probes
US4321532A (en) * 1978-03-16 1982-03-23 Luna L Jack Repairable spring probe assembly
US4289367A (en) * 1979-12-10 1981-09-15 John Fluke Mfg. Co., Inc. Spring loaded connector pin
US4461993A (en) 1981-09-21 1984-07-24 Everett/Charles, Inc. Low resistance electrical spring probe
US4504780A (en) 1982-08-25 1985-03-12 Marsella John R Test probe
AT395485B (de) 1985-01-22 1993-01-25 Feinmetall Gmbh Pruefadapter
US4659987A (en) 1985-03-25 1987-04-21 Qa Technology Company Electrical circuit test probe and connector
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DE8709234U1 (de) * 1987-07-03 1987-10-08 Nixdorf Computer Ag, 4790 Paderborn Kontaktstiftgerät
US4885533B1 (en) 1988-09-09 1998-11-03 Qa Technology Co Inc Electrical circuit test probe having an elongate cylindrical retaining and sliding bearing region
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US5850147A (en) 1992-03-10 1998-12-15 Virginia Panel Corporation Coaxial double-headed spring contact probe assembly and coaxial surface contact for engagement therewith
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US5576631A (en) 1992-03-10 1996-11-19 Virginia Panel Corporation Coaxial double-headed spring contact probe assembly
JP2558254Y2 (ja) 1993-03-31 1997-12-24 弘洋電子機器 株式会社 検査用プローブピンおよびその差込ソケット
US6034532A (en) 1993-07-01 2000-03-07 Alphatest Corporation Resilient connector having a tubular spring
US5485096A (en) 1994-04-05 1996-01-16 Aksu; Allen Printed circuit board tester having a test bed with spring probes and easily replaceable switch cards
DE4416151C1 (de) 1994-05-09 1995-07-27 Ingun Pruefmittelbau Vorrichtung zum Kontaktieren von Prüfpunkten einer elektronischen Leiterplatte o. dgl. Prüfling
US5801544A (en) 1997-01-16 1998-09-01 Delaware Capital Formation, Inc. Spring probe and method for biasing
US5781023A (en) * 1997-01-31 1998-07-14 Delware Capital Formation, Inc. Hollow plunger test probe
US6066957A (en) 1997-09-11 2000-05-23 Delaware Capital Formation, Inc. Floating spring probe wireless test fixture
US6025729A (en) 1997-09-11 2000-02-15 Delaware Capital Formation, Inc. Floating spring probe wireless test fixture
US6104205A (en) 1998-02-26 2000-08-15 Interconnect Devices, Inc. Probe with tab retainer
DE19907727A1 (de) 1999-02-23 2000-08-24 Test Plus Electronic Gmbh Testadapter zur Kontaktierung von bestückten Leiterplatinen
US6170887B1 (en) 1999-07-26 2001-01-09 Armaturenfabrik Hermann Voss Gmbh + Co. Plug connector for rapid and releaseable connection of pressurized lines

Also Published As

Publication number Publication date
CA2375326A1 (en) 2001-11-22
EP1285281B1 (en) 2006-11-15
NO20020049D0 (no) 2002-01-07
EP1285281A4 (en) 2005-07-13
NO20020049L (no) 2002-02-28
AU2001264590A1 (en) 2001-11-26
EP1285281A1 (en) 2003-02-26
JP4452428B2 (ja) 2010-04-21
US6570399B2 (en) 2003-05-27
JP2003533703A (ja) 2003-11-11
ATE345508T1 (de) 2006-12-15
DE60124536D1 (de) 2006-12-28
WO2001088557A1 (en) 2001-11-22
CA2375326C (en) 2010-07-06
US20020000820A1 (en) 2002-01-03
DE60124536T2 (de) 2007-09-20

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Legal Events

Date Code Title Description
B11A Dismissal acc. art.33 of ipl - examination not requested within 36 months of filing
B11Y Definitive dismissal - extension of time limit for request of examination expired [chapter 11.1.1 patent gazette]