BR0314774A - Dispositivo de medição interferométrico - Google Patents

Dispositivo de medição interferométrico

Info

Publication number
BR0314774A
BR0314774A BR0314774-6A BR0314774A BR0314774A BR 0314774 A BR0314774 A BR 0314774A BR 0314774 A BR0314774 A BR 0314774A BR 0314774 A BR0314774 A BR 0314774A
Authority
BR
Brazil
Prior art keywords
radius
conducted
probe
measuring
modulating
Prior art date
Application number
BR0314774-6A
Other languages
English (en)
Inventor
Dominique Marchal
Marc-Henri Duvoisin
Dominique Breider
Pawel Drabarek
Original Assignee
Bosch Gmbh Robert
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bosch Gmbh Robert filed Critical Bosch Gmbh Robert
Publication of BR0314774A publication Critical patent/BR0314774A/pt

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/02055Reduction or prevention of errors; Testing; Calibration
    • G01B9/02062Active error reduction, i.e. varying with time
    • G01B9/02064Active error reduction, i.e. varying with time by particular adjustment of coherence gate, i.e. adjusting position of zero path difference in low coherence interferometry
    • G01B9/02065Active error reduction, i.e. varying with time by particular adjustment of coherence gate, i.e. adjusting position of zero path difference in low coherence interferometry using a second interferometer before or after measuring interferometer
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/02049Interferometers characterised by particular mechanical design details
    • G01B9/0205Interferometers characterised by particular mechanical design details of probe head
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/02055Reduction or prevention of errors; Testing; Calibration
    • G01B9/02056Passive reduction of errors
    • G01B9/02057Passive reduction of errors by using common path configuration, i.e. reference and object path almost entirely overlapping
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/0209Low-coherence interferometers

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

"DISPOSITIVO DE MEDIçãO INTERFEROMéTRICO". A presente invenção refere-se a um dispositivo de medição interferométrico para o registro da forma, da rugosidade ou da distância da superfície de um objeto de medição (8), com um interferómetro de modulação (2), ao qual é conduzida, de uma fonte de radiação (1), uma irradiação de coerência curta, e que apresenta um primeiro divisor de radiação (2.3) para a divisão da irradiação fornecida em um primeiro raio parcial (2.1), conduzido através de um primeiro braço, e em um segundo raio parcial (2.1<39>), conduzido através de um segundo braço, dos quais um é deslocado em relação ao outro, por meio de um dispositivo de modulação (2.2, 2.2<39>), em sua fase de luz ou freq³ência de luz, e percorre um trajeto de retardamento (2.9<39>), e os quais, logo em seguida, são reunidos em um outro divisor de radiação (2.10) do interferómetro de modulação (2), com uma sonda de medição (3) espacialmente separada do interferómetro de modulação (2) e acoplada ou podendo ser acoplada com este, através de uma disposição de fibra ótica (6), em cuja sonda os raios parciais reunidos são distribuídos, através de uma unidade de fibra ótica da sonda (3.1, 3.2) com uma superfície de saída (3.4) inclinada do lado do objeto, em um raio de medição conduzido à superfície e um raio de referência, e em cuja sonda o raio de medição (r~ 1~, (t)) refletido na superfície e o raio de referência (r~ 2~ (t)) refletido em um plano de referência são sobrepostos, e com um dispositivo de recepção (4) e uma unidade de avaliação (5) para a transformação da irradiação conduzida a ele em sinais elétricos, e para a avaliação dos sinais com base em uma diferença de fases. Uma medição exata da superfície é favorecida pelo fato de que, o ângulo de inclinação (<sym>) da superfície de saída (3.4) em relação à normal do eixo da sonda óptica (3.5) é de, pelo menos, 46<198> (Figura 4).
BR0314774-6A 2002-09-25 2003-03-28 Dispositivo de medição interferométrico BR0314774A (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10244553A DE10244553B3 (de) 2002-09-25 2002-09-25 Interferometrische Messeinrichtung
PCT/DE2003/001032 WO2004029544A1 (de) 2002-09-25 2003-03-28 Interferometrische messeinrichtung

Publications (1)

Publication Number Publication Date
BR0314774A true BR0314774A (pt) 2005-07-26

Family

ID=30010633

Family Applications (1)

Application Number Title Priority Date Filing Date
BR0314774-6A BR0314774A (pt) 2002-09-25 2003-03-28 Dispositivo de medição interferométrico

Country Status (7)

Country Link
US (1) US7400408B2 (pt)
EP (1) EP1546646A1 (pt)
JP (1) JP2006500571A (pt)
CN (1) CN1294401C (pt)
BR (1) BR0314774A (pt)
DE (1) DE10244553B3 (pt)
WO (1) WO2004029544A1 (pt)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005046605A1 (de) * 2005-09-29 2007-04-05 Robert Bosch Gmbh Interferometrische Messeinrichtung
US7295293B2 (en) * 2005-10-21 2007-11-13 Hewlett-Packard Development Company, L.P. Apparatus and method for testing a reflector coating
DE102006001732A1 (de) 2006-01-13 2007-07-19 Robert Bosch Gmbh Interferometrische Messvorrichtung
DE102006014766A1 (de) * 2006-03-30 2007-10-04 Robert Bosch Gmbh Interferometrische Messvorrichtung
DE102006048316A1 (de) 2006-10-12 2008-04-17 Robert Bosch Gmbh Optische Fasersonde und Verfahren zur Herstellung einer optischen Fasersonde
DE102006048317A1 (de) * 2006-10-12 2008-04-17 Robert Bosch Gmbh Optische Fasersonde
DE102007018817A1 (de) 2007-04-20 2008-10-23 Robert Bosch Gmbh Verfahren und Vorrichtung zur Druckmessung
DE102009029372A1 (de) * 2009-09-11 2011-03-24 Robert Bosch Gmbh Messvorrichtung zur Messung einer Entfernung zwischen der Messvorrichtung und einem Zielobjekt mit Hilfe optischer Messstrahlung
DE102010022641B4 (de) * 2010-06-04 2013-07-04 Deutsches Zentrum für Luft- und Raumfahrt e.V. Messeinrichtung und Verfahren zur Vermessung optischer Weglängenänderungen
EP2643904B1 (en) * 2010-11-24 2020-08-12 Fianium Limited Optical systems
FR2979143B1 (fr) * 2011-08-16 2016-03-25 Univ Joseph Fourier Dispositif optique d'analyse interferometrique de l'etat de surface interne d'un tube
EP2847651A1 (en) * 2012-05-10 2015-03-18 Koninklijke Philips N.V. Gesture control
US9869795B2 (en) * 2013-08-30 2018-01-16 Halliburton Energy Services, Inc. Distributed acoustic sensing system with variable spatial resolution
US10337316B2 (en) 2013-08-30 2019-07-02 Halliburton Energy Services, Inc. Distributed acoustic sensing system with variable spatial resolution
US10667692B2 (en) * 2015-11-12 2020-06-02 The Johns Hopkins University Coherent optical imaging for detecting neural signatures and medical imaging applications using common-path coherent optical techniques
US10107615B2 (en) 2016-04-20 2018-10-23 Quality Vision International, Inc. Remote probe for optical measuring machine
US10107614B1 (en) 2017-04-18 2018-10-23 Quality Vision International, Inc. Optical pen for interferometric measuring machine
DE102017218086A1 (de) 2017-10-11 2019-04-11 Carl Zeiss Industrielle Messtechnik Gmbh Antastelement und Koordinatenmessgerät zur Vermessung mindestens eines Messobjekts
EP3789727B1 (en) * 2019-09-04 2024-04-10 Taylor Hobson Limited Interferometric measuring device
CN112129243B (zh) * 2020-09-04 2022-02-15 电子科技大学 基于光电振荡器的准分布式光纤扭转角度测量装置和方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6134003A (en) * 1991-04-29 2000-10-17 Massachusetts Institute Of Technology Method and apparatus for performing optical measurements using a fiber optic imaging guidewire, catheter or endoscope
DE4244605A1 (de) * 1992-05-27 1993-12-02 Hewlett Packard Co Optisches Niederkohärenzreflektometer von verbesserter Empfindlichkeit mit optischer Dämpfung
DE19520305C2 (de) * 1995-06-02 1997-04-17 Fraunhofer Ges Forschung Verfahren und Meßvorrichtung zur interferometrischen Abstandsmessung
US5781297A (en) 1996-08-23 1998-07-14 M&M Precision Systems Corporation Mixed frequency and amplitude modulated fiber optic heterodyne interferometer for distance measurement
DE19721883C2 (de) * 1997-05-26 1999-04-15 Bosch Gmbh Robert Interferometrische Meßvorrichtung
DE19738900B4 (de) * 1997-09-05 2005-07-14 Robert Bosch Gmbh Interferometrische Meßvorrichtung zur Formvermessung an rauhen Oberflächen
DE19808273A1 (de) * 1998-02-27 1999-09-09 Bosch Gmbh Robert Interferometrische Meßeinrichtung zum Erfassen der Form oder des Abstandes insbesondere rauher Oberflächen
DE19819762A1 (de) * 1998-05-04 1999-11-25 Bosch Gmbh Robert Interferometrische Meßeinrichtung
DE10057540A1 (de) * 2000-11-20 2002-06-06 Bosch Gmbh Robert Interferometrische Messvorrichtung
DE10057539B4 (de) * 2000-11-20 2008-06-12 Robert Bosch Gmbh Interferometrische Messvorrichtung
US7283247B2 (en) * 2002-09-25 2007-10-16 Olympus Corporation Optical probe system

Also Published As

Publication number Publication date
CN1685196A (zh) 2005-10-19
DE10244553B3 (de) 2004-02-05
JP2006500571A (ja) 2006-01-05
US20060238771A1 (en) 2006-10-26
CN1294401C (zh) 2007-01-10
EP1546646A1 (de) 2005-06-29
WO2004029544A1 (de) 2004-04-08
US7400408B2 (en) 2008-07-15

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Legal Events

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B08F Application fees: application dismissed [chapter 8.6 patent gazette]

Free format text: REFERENTE A 3A ANUIDA DE.

B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: REFERENTE AO DESPACHO 8.6 PUBLICADO NA RPI 2077 DE 26/10/2010.