BR9609697A - Sistema de interfometria para ondeado e método com profundidade de imagem ampliada. - Google Patents

Sistema de interfometria para ondeado e método com profundidade de imagem ampliada.

Info

Publication number
BR9609697A
BR9609697A BR9609697-7A BR9609697A BR9609697A BR 9609697 A BR9609697 A BR 9609697A BR 9609697 A BR9609697 A BR 9609697A BR 9609697 A BR9609697 A BR 9609697A
Authority
BR
Brazil
Prior art keywords
grid
image
interferometry system
enlarged image
depth
Prior art date
Application number
BR9609697-7A
Other languages
English (en)
Inventor
Kevin G Harding
Original Assignee
Budd Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Budd Co filed Critical Budd Co
Publication of BR9609697A publication Critical patent/BR9609697A/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2441—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using interferometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/254—Projection of a pattern, viewing through a pattern, e.g. moiré

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)

Abstract

Patente de Invenção:<B>"SISTEMA DE INTERFEROMETRIA PARA ONDEADO E MéTODO COM PROFUNDIDADE DE IMAGEM AMPLIADA"<D>. Um sistema e método de interferometria para ondeado são produzidos para obter contorno de superfície de campo completo com uma profundidade ampliada de visão de imagem. O sistema de interferometria para ondeado inclui um sistema de projeção geralmente composto de uma fonte de luz, lente de imagem e um modelo de grade de onda quadrada. A lente de imagem é configurada para filtrar raios de luz de ordem superior passando através do modelo de grade de onda quadrada, de forma a projetar um modelo semelhante à onda senoidal sobre a superfície desejada. O sistema de interferometria para ondeado também inclui um sistema de visualização geralmente composto de uma lente de imagem, uma grade submestre e uma câmera. A grade submeste é preferivelmente uma grade feita sob encomenda que pode ser produzida gravando-se um modelo de grade em relação a uma superfície de referência. A câmera é capaz de visualizar uma imagem em qualquer lugar dentro de uma profundidade ampliada de imagem e analisar as margens ondeadas. Uma determinação do desvio entre uma peça de teste e uma superfície de referência produz um sistema de inspeção de peça.
BR9609697-7A 1995-07-18 1996-07-17 Sistema de interfometria para ondeado e método com profundidade de imagem ampliada. BR9609697A (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US50370795A 1995-07-18 1995-07-18
PCT/US1996/011851 WO1997004285A1 (en) 1995-07-18 1996-07-17 Moire interferometry system and method with extended imaging depth

Publications (1)

Publication Number Publication Date
BR9609697A true BR9609697A (pt) 1999-12-21

Family

ID=24003185

Family Applications (1)

Application Number Title Priority Date Filing Date
BR9609697-7A BR9609697A (pt) 1995-07-18 1996-07-17 Sistema de interfometria para ondeado e método com profundidade de imagem ampliada.

Country Status (10)

Country Link
US (1) US5835218A (pt)
EP (1) EP0839314A1 (pt)
JP (1) JPH11510248A (pt)
KR (1) KR19990029064A (pt)
CN (1) CN1196791A (pt)
AU (1) AU728407B2 (pt)
BR (1) BR9609697A (pt)
CA (1) CA2227183A1 (pt)
MX (1) MX9800527A (pt)
WO (1) WO1997004285A1 (pt)

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US9330324B2 (en) 2005-10-11 2016-05-03 Apple Inc. Error compensation in three-dimensional mapping
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RU2583852C2 (ru) * 2014-07-11 2016-05-10 Федеральное государственное бюджетное образовательное учреждение высшего образования "Тюменский государственный нефтегазовый университет" (ТюмГНГУ) Графо-проекционный муаровый способ измерения
CN106657970A (zh) * 2016-10-25 2017-05-10 乐视控股（北京）有限公司 一种深度图成像装置
CN108562240B (zh) * 2018-01-24 2019-08-23 北京理工大学 基于两步载波拼接法的数字莫尔移相干涉测量方法
RU2732343C1 (ru) * 2019-11-18 2020-09-15 федеральное государственное бюджетное образовательное учреждение высшего образования "Самарский государственный технический университет" Цифровая автоматизированная установка для исследования деформации тонкостенных элементов методом муаровых полос
FR3107117B1 (fr) * 2020-02-10 2022-04-01 Saint Gobain Méthode de mesure de la géométrie d’un vitrage
CN113551618B (zh) * 2021-07-14 2023-01-31 苏州大学 一种基于衍射编码相位板的条纹投影三维形貌测量方法及装置
CN116243451B (zh) * 2022-12-27 2026-03-27 武汉精立电子技术有限公司 对焦调节方法及装置

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Also Published As

Publication number Publication date
AU6499296A (en) 1997-02-18
CN1196791A (zh) 1998-10-21
EP0839314A1 (en) 1998-05-06
KR19990029064A (ko) 1999-04-15
WO1997004285A1 (en) 1997-02-06
AU728407B2 (en) 2001-01-11
JPH11510248A (ja) 1999-09-07
MX9800527A (es) 1998-11-29
US5835218A (en) 1998-11-10
CA2227183A1 (en) 1997-02-06

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Legal Events

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B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]