DE3472007D1 - Probe head assembly - Google Patents

Probe head assembly

Info

Publication number
DE3472007D1
DE3472007D1 DE8484305937T DE3472007T DE3472007D1 DE 3472007 D1 DE3472007 D1 DE 3472007D1 DE 8484305937 T DE8484305937 T DE 8484305937T DE 3472007 T DE3472007 T DE 3472007T DE 3472007 D1 DE3472007 D1 DE 3472007D1
Authority
DE
Germany
Prior art keywords
centre
array
head assembly
probe head
held
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8484305937T
Other languages
English (en)
Inventor
Frank Harry Jenner
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Marconi Instruments Ltd
Original Assignee
Marconi Instruments Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Marconi Instruments Ltd filed Critical Marconi Instruments Ltd
Application granted granted Critical
Publication of DE3472007D1 publication Critical patent/DE3472007D1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
DE8484305937T 1983-09-17 1984-08-30 Probe head assembly Expired DE3472007D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB08324956A GB2146849B (en) 1983-09-17 1983-09-17 Electrical test probe head assembly

Publications (1)

Publication Number Publication Date
DE3472007D1 true DE3472007D1 (en) 1988-07-14

Family

ID=10548954

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8484305937T Expired DE3472007D1 (en) 1983-09-17 1984-08-30 Probe head assembly

Country Status (4)

Country Link
EP (1) EP0135384B1 (de)
AT (1) ATE35058T1 (de)
DE (1) DE3472007D1 (de)
GB (1) GB2146849B (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4788496A (en) * 1982-11-05 1988-11-29 Martin Maelzer Adapter for a printed circuit board testing device
GB8518861D0 (en) * 1985-07-25 1985-08-29 Int Computers Ltd Testing printed circuit board
DE3678825D1 (de) * 1985-11-01 1991-05-23 Hewlett Packard Co Halterung fuer leiterplattentest.
DE3539720A1 (de) * 1985-11-08 1987-05-14 Martin Maelzer Adapter fuer ein leiterplattenpruefgeraet
US4783624A (en) * 1986-04-14 1988-11-08 Interconnect Devices, Inc. Contact probe devices and method
DE3638372A1 (de) * 1986-11-11 1988-05-26 Lang Dahlke Helmut Vorrichtung zum pruefen von elektrischen leiterplatten
DE3736689A1 (de) * 1986-11-18 1988-05-26 Luther Erich Adapter fuer ein leiterplattenpruefgeraet
DE3906691A1 (de) * 1988-03-04 1989-09-14 Manfred Prokopp Kontaktiervorrichtung fuer pruefvorrichtungen zum pruefen von leiterplatten oder dgl.
DE3925505A1 (de) * 1989-04-05 1990-10-11 Siemens Ag Vorrichtung zum pruefen von leiterplatten
DE4226069C2 (de) * 1992-08-06 1994-08-04 Test Plus Electronic Gmbh Adaptereinrichtung für eine Prüfeinrichtung für Schaltungsplatinen
US5945836A (en) 1996-10-29 1999-08-31 Hewlett-Packard Company Loaded-board, guided-probe test fixture
US6407565B1 (en) 1996-10-29 2002-06-18 Agilent Technologies, Inc. Loaded-board, guided-probe test fixture
EP0943924A3 (de) * 1998-03-19 1999-12-01 Hewlett-Packard Company Prüfadapter mit Nadelführung für bestückte Leiterplatten
GB2384373A (en) * 2002-01-19 2003-07-23 Robert James Hancox Torch or cycle lamp with display means
US6784675B2 (en) 2002-06-25 2004-08-31 Agilent Technologies, Inc. Wireless test fixture adapter for printed circuit assembly tester
BE1028241B1 (nl) * 2020-04-27 2021-11-29 Ipte Factory Automation N V Inrichting voor het testen van een printplaat

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3564408A (en) * 1968-08-12 1971-02-16 Bendix Corp Test device for an electrical circuit card
US3731191A (en) * 1969-12-22 1973-05-01 Ibm Micro-miniature probe assembly
US4027935A (en) * 1976-06-21 1977-06-07 International Business Machines Corporation Contact for an electrical contactor assembly
US4132948A (en) * 1977-03-17 1979-01-02 Teradyne, Inc. Test fixture using stock printed circuit board having test pins mounted thereon
US4112364A (en) * 1977-04-04 1978-09-05 Teradyne, Inc. Circuit board testing apparatus
GB2038567B (en) * 1978-12-28 1982-12-01 Philips Electronic Associated Device for making temporary electrical connections to an electrical assembly
DE2933862A1 (de) * 1979-08-21 1981-03-12 Paul Mang Vorrichtung zur elektronischen pruefung von leiterplatten.
GB2061630A (en) * 1979-10-17 1981-05-13 Standard Telephones Cables Ltd Apparatus for testing printed circuit boards
DE3038665C2 (de) * 1980-10-13 1990-03-29 Riba-Prüftechnik GmbH, 7801 Schallstadt Prüfeinrichtung zum Überprüfen von mit Leiterbahnen versehenen Leiterplatten
FR2493671A1 (fr) * 1980-10-30 1982-05-07 Everett Charles Inc Decaleur de contacts, appareil d'essai muni d'un decaleur de contacts et procede de fabrication d'un decaleur de contacts
DE3273554D1 (en) * 1981-06-30 1986-11-06 Ibm Contact probe assembly for integrated circuits
GB2108774B (en) * 1981-10-21 1985-01-09 Marconi Instruments Ltd Electrical interface arrangements
GB2108775B (en) * 1981-10-21 1985-01-03 Marconi Instruments Ltd Electrical interface arrangements
DE3240916C2 (de) * 1982-11-05 1985-10-31 Luther, Erich, Ing.(Grad.), 3003 Ronnenberg Vorrichtung zum Prüfen von elektrischen Leiterplatten

Also Published As

Publication number Publication date
EP0135384A1 (de) 1985-03-27
GB2146849B (en) 1987-08-05
EP0135384B1 (de) 1988-06-08
GB8324956D0 (en) 1983-10-19
ATE35058T1 (de) 1988-06-15
GB2146849A (en) 1985-04-24

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee