EP0048557A1 - Elektronischer Münzprüfer - Google Patents

Elektronischer Münzprüfer Download PDF

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Publication number
EP0048557A1
EP0048557A1 EP81304000A EP81304000A EP0048557A1 EP 0048557 A1 EP0048557 A1 EP 0048557A1 EP 81304000 A EP81304000 A EP 81304000A EP 81304000 A EP81304000 A EP 81304000A EP 0048557 A1 EP0048557 A1 EP 0048557A1
Authority
EP
European Patent Office
Prior art keywords
coin
validator
coil
signal
electronic coin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP81304000A
Other languages
English (en)
French (fr)
Other versions
EP0048557B1 (de
Inventor
John Arnold Stockdale
John Hewinson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Cessione gec Plessey Telecomunications Ltd
Original Assignee
Plessey Overseas Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Plessey Overseas Ltd filed Critical Plessey Overseas Ltd
Priority to AT81304000T priority Critical patent/ATE12710T1/de
Publication of EP0048557A1 publication Critical patent/EP0048557A1/de
Application granted granted Critical
Publication of EP0048557B1 publication Critical patent/EP0048557B1/de
Expired legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G07—CHECKING-DEVICES
    • G07D—HANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
    • G07D5/00—Testing specially adapted to determine the identity or genuineness of coins, e.g. for segregating coins which are unacceptable or alien to a currency
    • G07D5/08—Testing the magnetic or electric properties

Definitions

  • the present invention relates to electronic coin validators.
  • a step change of magnetic flux is applied axially to a coin an eddy current is induced which flows in the periphery of the coin, the coin acts like a coil comprising a single shorted turn.
  • the coin has an inductance Lc and an equivalent series resistance Rc, related to the resistivity of the coin and its resistance.
  • the eddy current induced in the coin is also related to the current step I in the transmit coil that produces the step change of magnetic flux and the mutual coupling Me between the coil and coin.
  • the current can be used to give an electronic signature that defines the coin type.
  • an electronic coin validator including a transmit coil for creating a magnetic field, a receive coil for detecting changes in the magnetic field due to the presence of a coin adjacent to the coils, and means whereby tne validator operates to perform a test on the coin, to give a first parameter which is a measure of the coin face area, and a second parameter which is a measure of the coin resistance, said first and second parameters being used to establish the validity of tne coin.
  • an electronic coin validator including a transmit coil for creating a magnetic field and a receive coil for detecting the transmitted magnetic field, said receive coil being used to detect a compensation signal when the transmit coil is activated, which signal is unaffected by the coin to be validated.
  • the magnetic field is larger than the largest coin to be tested and two parameters are measured, coin face area and coin resistance.
  • the receive coil current waveform is shown in Figure 2. If the open circuit voltage in the coin, is detected, the peak voltage is a measure of a coin face area and the integrated voltage waveform has a time constant related to the coin resistance.
  • the circuit of Figure 1 produces the waveforms of Figure 2. It consists of a current switch CS which has a defined turn on time, and drives the transmit coil TC.
  • the receive coil RC drives an amplifier which is connected to an integrator I and a peak detector PD.
  • a comparator set at 90% of the integrator maximum output voltage gives a signal that allows t.coin to be measured, where t coin is the time taken for the integrator output voltage to rise to the 90% level.
  • a start pulse gates a 10 MHz clock into a counter chain CC via flip flop FF1 when the transmit current step is applied, and, the integrator output stops the count.
  • the number in the counter is now a measure of t coin which relates to coin resistance, and may be applied to a microprocessor ⁇ P for evaluation.
  • the peak detector holds the peak impulse shown in Figure 2 and can produce the set of output voltages shown in Figure 3 for the different coins.
  • the peak detector drives four window gates WG, one of which is shown, whose thresholds are adjusted to each coin face area distribution.
  • the window comparator outputs are gated into a 'D' type flip-flop FF2 that are clocked 5 u S after the start of the coin test, this effectively produces a peak detector output sample at 5 ⁇ S, as shown in Figure 3.
  • the output of each flip-flop FF2 may be applied to the microprocessorup for evaluation.
  • the peak detector voltage may be entered into an analog-to-digital converter and the output applied to a microprocessor for evaluation.
  • step T If the step is of rise time T, this is modified to:
  • the voltage in the receive coil due to the presence of the coin is modified to: and this has to be added to the voltage due to the direct flux in order to give the complete receive waveform. It can be seen from the equations that if a test impulse is applied when no coin is present then this can be used to provide a reference level providing compensation for the effects of drift etc.
  • the coin validator verifies two parameters of a coin before it is passed as genuine.
  • Any disc of the correct size will meet the size parameter, but then has to have a time t coin inside the correct time distribution to meet the second parameter and be recognised as genuine.
  • the validator uses identical transmit and receive coils wound on the outside of a ferrite vinkor..
  • the area of the coil is quite critical and has to be such as to allow sufficient flux to pass around each coin and also produce an easily measurable t-coin period in excess of 10 uS.
  • the multi-frequency validator carries out a test to verify two parameters of the coin.
  • the first parameter is of face area of the coin, and the second parameter is of the coin resistance.
  • a magnetic field larger than the largest coin face area is produced across the coin runway between the transmit and receive coils.
  • the field can be either produced by an alternating current or a step change of current in the transmit coil.
  • the multi-frequency validator has a transmit coil TC which is driven by a coil drive circuit CD.
  • the coil drive circuit CD is fed with a multi-frequency signal generated from oscillator OSC and divider circuit DV via a signal amplitude control circuit AC, filter circuits F1-F4 and summing and amplitude weighting circuit SW.
  • the receive coil RC drives a differential amplifier DA and filters F5-F8.
  • the output of the filters is fed via respective rectifier circuits R1-R3 to detector circuits D1-D3 the outputs of which are selectively switched by switch S to analog-to-digital converter ADO to a microprocessor pP for evaluation.
  • Rectifier R4 feeds an automatic gain control circuit AGO which also receives a voltage reference signal from circuit VR.
  • the output of the automatic gain control circuit AGO is used to modify the operation of signal amplitude control circuit AC to compensate for temperature changes in inductance, drift etc.
  • the graph shown in Figure 5 shows the normalized receive coil voltage NCV against transmit current frequency f. At frequencies below 1KHz the received signal amplitude is unaffected by the presence of the coin set of interest and so can be used for a continuous reference tone that compensates for variations in mutual inductance, temperature effects and component drift.
  • the coin is opaque to the applied magnetic field and so the majority of the received signal is due to the field that gets round the edge of the coin, therefore the ratio of the amplitude of the received signal with and without the coin present gives a measure of the coin face area. If amplitude measurements are taken in the receive coil at two frequencies between 1KHz and 100KHz we can get a measure of the coin resistance.
  • the open circuit receive coil voltage is:-
  • a w cos wt gives a measure of coin face area at high frequency and the other terms at lower frequencies give a measure of coin resistance.
  • Voc varies in amplitude with w and M.
  • An accurately controlled frequency using a crystal master clock will prevent variations in w effecting Voc.
  • coin face area is the ratio of the magnetic field passing round the coin to that when no coin is present and is directly proportional to the mechanical dimensions of the receive coil, which vary from coil to coil.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Coins (AREA)
  • Electrochromic Elements, Electrophoresis, Or Variable Reflection Or Absorption Elements (AREA)
  • Medicines Containing Plant Substances (AREA)
  • Acyclic And Carbocyclic Compounds In Medicinal Compositions (AREA)
  • Seasonings (AREA)
  • Noodles (AREA)
  • Confectionery (AREA)
EP81304000A 1980-09-19 1981-09-02 Elektronischer Münzprüfer Expired EP0048557B1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AT81304000T ATE12710T1 (de) 1980-09-19 1981-09-02 Elektronischer muenzpruefer.

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB8030389 1980-09-19
GB8030389 1980-09-19

Publications (2)

Publication Number Publication Date
EP0048557A1 true EP0048557A1 (de) 1982-03-31
EP0048557B1 EP0048557B1 (de) 1985-04-10

Family

ID=10516179

Family Applications (1)

Application Number Title Priority Date Filing Date
EP81304000A Expired EP0048557B1 (de) 1980-09-19 1981-09-02 Elektronischer Münzprüfer

Country Status (7)

Country Link
EP (1) EP0048557B1 (de)
AT (1) ATE12710T1 (de)
AU (1) AU541536B2 (de)
DE (1) DE3169841D1 (de)
IE (1) IE52100B1 (de)
ZA (1) ZA816172B (de)
ZW (1) ZW22881A1 (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0119000A1 (de) * 1983-02-09 1984-09-19 Cash & Security Equipment Limited Münzenerkennungsvorrichtung

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1925042A1 (de) * 1969-05-16 1970-11-26 Johann Stegmueller Verfahren zur Erkennung bzw. zur Ermittlung von Abmessungen und Material von Muenzenund Werkstuecken mittels kapazitiver oder/und induktiver Tastsonden
DE1930345A1 (de) * 1969-06-14 1970-12-23 Nat Rejectors Gmbh Anordnung zur Sortierung von metallischen Blechen oder Scheiben
FR2212589A1 (de) * 1972-12-29 1974-07-26 Satmam
US3962627A (en) * 1974-12-20 1976-06-08 The Vendo Company Electronic apparatus for testing moving coins employing successive time significant sensings of the effects of proximity of a coin under test to inductive impedance elements upon the effective impedances thereof
DE2551321A1 (de) * 1975-11-13 1977-05-26 Berliner Maschinenbau Ag Automatisch programmierbare schaltung zur pruefung von muenzen
US4086527A (en) * 1975-03-25 1978-04-25 Crouzet Method and apparatus for monetary articles authentification
US4091908A (en) * 1976-02-10 1978-05-30 Nippon Coinco Co., Ltd. Coin checking device for a vending machine
US4108296A (en) * 1976-04-08 1978-08-22 Nippon Coinco Co., Ltd. Coin receiving apparatus for a vending machine
US4124111A (en) * 1975-12-02 1978-11-07 Nippon Coinco Co. Ltd. Coin inspecting apparatus

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1925042A1 (de) * 1969-05-16 1970-11-26 Johann Stegmueller Verfahren zur Erkennung bzw. zur Ermittlung von Abmessungen und Material von Muenzenund Werkstuecken mittels kapazitiver oder/und induktiver Tastsonden
DE1930345A1 (de) * 1969-06-14 1970-12-23 Nat Rejectors Gmbh Anordnung zur Sortierung von metallischen Blechen oder Scheiben
FR2212589A1 (de) * 1972-12-29 1974-07-26 Satmam
US3962627A (en) * 1974-12-20 1976-06-08 The Vendo Company Electronic apparatus for testing moving coins employing successive time significant sensings of the effects of proximity of a coin under test to inductive impedance elements upon the effective impedances thereof
US4086527A (en) * 1975-03-25 1978-04-25 Crouzet Method and apparatus for monetary articles authentification
DE2551321A1 (de) * 1975-11-13 1977-05-26 Berliner Maschinenbau Ag Automatisch programmierbare schaltung zur pruefung von muenzen
US4124111A (en) * 1975-12-02 1978-11-07 Nippon Coinco Co. Ltd. Coin inspecting apparatus
US4091908A (en) * 1976-02-10 1978-05-30 Nippon Coinco Co., Ltd. Coin checking device for a vending machine
US4108296A (en) * 1976-04-08 1978-08-22 Nippon Coinco Co., Ltd. Coin receiving apparatus for a vending machine

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0119000A1 (de) * 1983-02-09 1984-09-19 Cash & Security Equipment Limited Münzenerkennungsvorrichtung

Also Published As

Publication number Publication date
ZA816172B (en) 1982-09-29
EP0048557B1 (de) 1985-04-10
DE3169841D1 (en) 1985-05-15
ATE12710T1 (de) 1985-04-15
IE812174L (en) 1982-03-19
AU541536B2 (en) 1985-01-10
ZW22881A1 (en) 1981-12-09
AU7516781A (en) 1982-03-25
IE52100B1 (en) 1987-06-10

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