EP0791227A4 - FORMATION OF A FLAT SURFACE ON A SUBSTRATE BY MODIFICATION OF ITS TOPOGRAPHY - Google Patents

FORMATION OF A FLAT SURFACE ON A SUBSTRATE BY MODIFICATION OF ITS TOPOGRAPHY

Info

Publication number
EP0791227A4
EP0791227A4 EP95940684A EP95940684A EP0791227A4 EP 0791227 A4 EP0791227 A4 EP 0791227A4 EP 95940684 A EP95940684 A EP 95940684A EP 95940684 A EP95940684 A EP 95940684A EP 0791227 A4 EP0791227 A4 EP 0791227A4
Authority
EP
European Patent Office
Prior art keywords
topography
modification
formation
substrate
flat surface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP95940684A
Other languages
German (de)
French (fr)
Other versions
EP0791227A1 (en
Inventor
Peter K Moon
Ananda G Sarangi
Timothy L Deeter
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Intel Corp
Original Assignee
Intel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intel Corp filed Critical Intel Corp
Publication of EP0791227A1 publication Critical patent/EP0791227A1/en
Publication of EP0791227A4 publication Critical patent/EP0791227A4/en
Withdrawn legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B26HAND CUTTING TOOLS; CUTTING; SEVERING
    • B26DCUTTING; DETAILS COMMON TO MACHINES FOR PERFORATING, PUNCHING, CUTTING-OUT, STAMPING-OUT OR SEVERING
    • B26D7/00Details of apparatus for cutting, cutting-out, stamping-out, punching, perforating, or severing by means other than cutting
    • B26D7/08Means for treating work or cutting member to facilitate cutting
    • B26D7/088Means for treating work or cutting member to facilitate cutting by cleaning or lubricating
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B26HAND CUTTING TOOLS; CUTTING; SEVERING
    • B26FPERFORATING; PUNCHING; CUTTING-OUT; STAMPING-OUT; SEVERING BY MEANS OTHER THAN CUTTING
    • B26F3/00Severing by means other than cutting; Apparatus therefor
    • B26F3/002Precutting and tensioning or breaking
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65CLABELLING OR TAGGING MACHINES, APPARATUS, OR PROCESSES
    • B65C9/00Details of labelling machines or apparatus
    • B65C9/08Label feeding
    • B65C9/18Label feeding from strips, e.g. from rolls
    • B65C9/1896Label feeding from strips, e.g. from rolls the labels being torn or burst from a strip
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65HHANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H35/00Delivering articles from cutting or line-perforating machines; Article or web delivery apparatus incorporating cutting or line-perforating devices, e.g. adhesive tape dispensers
    • B65H35/10Delivering articles from cutting or line-perforating machines; Article or web delivery apparatus incorporating cutting or line-perforating devices, e.g. adhesive tape dispensers from or with devices for breaking partially-cut or perforated webs, e.g. bursters
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/60Formation of materials, e.g. in the shape of layers or pillars of insulating materials
    • H10P14/69Inorganic materials
    • H10P14/692Inorganic materials composed of oxides, glassy oxides or oxide-based glasses
    • H10P14/6921Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon
    • H10P14/6922Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon the material containing Si, O and at least one of H, N, C, F or other non-metal elements, e.g. SiOC, SiOC:H or SiONC
    • H10P14/6923Inorganic materials composed of oxides, glassy oxides or oxide-based glasses containing silicon the material containing Si, O and at least one of H, N, C, F or other non-metal elements, e.g. SiOC, SiOC:H or SiONC the material being boron or phosphorus doped silicon oxides, e.g. BPSG, BSG or PSG
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W10/00Isolation regions in semiconductor bodies between components of integrated devices
    • H10W10/01Manufacture or treatment
    • H10W10/011Manufacture or treatment of isolation regions comprising dielectric materials
    • H10W10/014Manufacture or treatment of isolation regions comprising dielectric materials using trench refilling with dielectric materials, e.g. shallow trench isolations
    • H10W10/0143Manufacture or treatment of isolation regions comprising dielectric materials using trench refilling with dielectric materials, e.g. shallow trench isolations comprising concurrently refilling multiple trenches having different shapes or dimensions
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W10/00Isolation regions in semiconductor bodies between components of integrated devices
    • H10W10/10Isolation regions comprising dielectric materials
    • H10W10/17Isolation regions comprising dielectric materials formed using trench refilling with dielectric materials, e.g. shallow trench isolations

Landscapes

  • Life Sciences & Earth Sciences (AREA)
  • Forests & Forestry (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Element Separation (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
EP95940684A 1994-11-10 1995-11-13 FORMATION OF A FLAT SURFACE ON A SUBSTRATE BY MODIFICATION OF ITS TOPOGRAPHY Withdrawn EP0791227A4 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US337000 1989-04-12
US33700094A 1994-11-10 1994-11-10
PCT/US1995/014681 WO1996015552A1 (en) 1994-11-10 1995-11-13 Forming a planar surface over a substrate by modifying the topography of the substrate

Publications (2)

Publication Number Publication Date
EP0791227A1 EP0791227A1 (en) 1997-08-27
EP0791227A4 true EP0791227A4 (en) 1998-04-01

Family

ID=23318670

Family Applications (1)

Application Number Title Priority Date Filing Date
EP95940684A Withdrawn EP0791227A4 (en) 1994-11-10 1995-11-13 FORMATION OF A FLAT SURFACE ON A SUBSTRATE BY MODIFICATION OF ITS TOPOGRAPHY

Country Status (7)

Country Link
EP (1) EP0791227A4 (en)
JP (1) JPH10512098A (en)
KR (1) KR970707582A (en)
CN (1) CN1171166A (en)
AU (1) AU4235196A (en)
TW (1) TW299458B (en)
WO (1) WO1996015552A1 (en)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5665633A (en) 1995-04-06 1997-09-09 Motorola, Inc. Process for forming a semiconductor device having field isolation
US5885856A (en) * 1996-08-21 1999-03-23 Motorola, Inc. Integrated circuit having a dummy structure and method of making
DE19703611A1 (en) * 1997-01-31 1998-08-06 Siemens Ag Application-specific integrated semiconductor product with dummy elements
JP3638778B2 (en) 1997-03-31 2005-04-13 株式会社ルネサステクノロジ Semiconductor integrated circuit device and manufacturing method thereof
JP2006128709A (en) * 1997-03-31 2006-05-18 Renesas Technology Corp Semiconductor integrated circuit device and manufacturing method therefor
JP5600280B2 (en) * 1997-03-31 2014-10-01 ルネサスエレクトロニクス株式会社 Semiconductor integrated circuit device
EP0939432A1 (en) * 1998-02-17 1999-09-01 Siemens Aktiengesellschaft Mask design method for manufacturing a dummy region in a trench isolation region between electrically active regions of a microelectronic device
JP2000124305A (en) 1998-10-15 2000-04-28 Mitsubishi Electric Corp Semiconductor device
JP2000340529A (en) * 1999-05-31 2000-12-08 Mitsubishi Electric Corp Semiconductor device
US6396158B1 (en) 1999-06-29 2002-05-28 Motorola Inc. Semiconductor device and a process for designing a mask
JP4307664B2 (en) 1999-12-03 2009-08-05 株式会社ルネサステクノロジ Semiconductor device
US6459156B1 (en) 1999-12-22 2002-10-01 Motorola, Inc. Semiconductor device, a process for a semiconductor device, and a process for making a masking database
JP4767390B2 (en) * 2000-05-19 2011-09-07 エルピーダメモリ株式会社 DRAM
US6614062B2 (en) * 2001-01-17 2003-09-02 Motorola, Inc. Semiconductor tiling structure and method of formation
US6611045B2 (en) 2001-06-04 2003-08-26 Motorola, Inc. Method of forming an integrated circuit device using dummy features and structure thereof
US6989229B2 (en) 2003-03-27 2006-01-24 Freescale Semiconductor, Inc. Non-resolving mask tiling method for flare reduction
JP4987254B2 (en) 2005-06-22 2012-07-25 株式会社東芝 Manufacturing method of semiconductor device
FR2923914B1 (en) 2007-11-21 2010-01-08 Commissariat Energie Atomique DEVICE FOR THICKNESS AND SQUARE RESISTIVITY MEASUREMENTS OF INTERCONNECTION LINES

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6392042A (en) * 1986-10-06 1988-04-22 Nec Corp Manufacture of semiconductor device
JPH0382053A (en) * 1989-08-24 1991-04-08 Nec Corp Semiconductor device
EP0545263A2 (en) * 1991-11-29 1993-06-09 Sony Corporation Method of forming trench isolation having polishing step and method of manufacturing semiconductor device
JPH05258017A (en) * 1992-03-11 1993-10-08 Fujitsu Ltd Semiconductor integrated circuit device and wiring layout method for the same
US5278105A (en) * 1992-08-19 1994-01-11 Intel Corporation Semiconductor device with dummy features in active layers

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59186342A (en) * 1983-04-06 1984-10-23 Matsushita Electric Ind Co Ltd Manufacture of semiconductor device
JPS6015944A (en) * 1983-07-08 1985-01-26 Hitachi Ltd Semiconductor device
JPS63240045A (en) * 1987-03-27 1988-10-05 Matsushita Electric Ind Co Ltd Semiconductor device
US5225358A (en) * 1991-06-06 1993-07-06 Lsi Logic Corporation Method of forming late isolation with polishing
US5229316A (en) * 1992-04-16 1993-07-20 Micron Technology, Inc. Semiconductor processing method for forming substrate isolation trenches
US5265378A (en) * 1992-07-10 1993-11-30 Lsi Logic Corporation Detecting the endpoint of chem-mech polishing and resulting semiconductor device

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6392042A (en) * 1986-10-06 1988-04-22 Nec Corp Manufacture of semiconductor device
JPH0382053A (en) * 1989-08-24 1991-04-08 Nec Corp Semiconductor device
EP0545263A2 (en) * 1991-11-29 1993-06-09 Sony Corporation Method of forming trench isolation having polishing step and method of manufacturing semiconductor device
JPH05258017A (en) * 1992-03-11 1993-10-08 Fujitsu Ltd Semiconductor integrated circuit device and wiring layout method for the same
US5278105A (en) * 1992-08-19 1994-01-11 Intel Corporation Semiconductor device with dummy features in active layers

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
PATENT ABSTRACTS OF JAPAN vol. 012, no. 328 (E - 654) 6 September 1988 (1988-09-06) *
PATENT ABSTRACTS OF JAPAN vol. 015, no. 254 (E - 1083) 27 June 1991 (1991-06-27) *
PATENT ABSTRACTS OF JAPAN vol. 018, no. 024 (P - 1675) 14 January 1994 (1994-01-14) *
See also references of WO9615552A1 *

Also Published As

Publication number Publication date
CN1171166A (en) 1998-01-21
EP0791227A1 (en) 1997-08-27
KR970707582A (en) 1997-12-01
JPH10512098A (en) 1998-11-17
TW299458B (en) 1997-03-01
AU4235196A (en) 1996-06-06
WO1996015552A1 (en) 1996-05-23

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