EP3028311A1 - Procédé de réalisation d'une jonction pn dans une cellule photovoltaïque à base de czts et cellule photovoltaïque en configuration superstrat et à base de czts - Google Patents
Procédé de réalisation d'une jonction pn dans une cellule photovoltaïque à base de czts et cellule photovoltaïque en configuration superstrat et à base de cztsInfo
- Publication number
- EP3028311A1 EP3028311A1 EP14767116.8A EP14767116A EP3028311A1 EP 3028311 A1 EP3028311 A1 EP 3028311A1 EP 14767116 A EP14767116 A EP 14767116A EP 3028311 A1 EP3028311 A1 EP 3028311A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- layer
- czts
- electrode
- zinc
- photovoltaic cell
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/12—Active materials
- H10F77/128—Active materials comprising only Group I-II-IV-VI kesterite materials, e.g. Cu2ZnSnSe4 or Cu2ZnSnS4
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F10/00—Individual photovoltaic cells, e.g. solar cells
- H10F10/10—Individual photovoltaic cells, e.g. solar cells having potential barriers
- H10F10/16—Photovoltaic cells having only PN heterojunction potential barriers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F19/00—Integrated devices, or assemblies of multiple devices, comprising at least one photovoltaic cell covered by group H10F10/00, e.g. photovoltaic modules
- H10F19/30—Integrated devices, or assemblies of multiple devices, comprising at least one photovoltaic cell covered by group H10F10/00, e.g. photovoltaic modules comprising thin-film photovoltaic cells
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F71/00—Manufacture or treatment of devices covered by this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/20—Electrodes
- H10F77/244—Electrodes made of transparent conductive layers, e.g. transparent conductive oxide [TCO] layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/203—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using transformation of metal, e.g. oxidation or nitridation
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/29—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by the substrates
- H10P14/2901—Materials
- H10P14/2922—Materials being non-crystalline insulating materials, e.g. glass or polymers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/32—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by intermediate layers between substrates and deposited layers
- H10P14/3202—Materials thereof
- H10P14/3224—Materials thereof being Group IIB-VIA semiconductors
- H10P14/3228—Sulfides
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/32—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by intermediate layers between substrates and deposited layers
- H10P14/3202—Materials thereof
- H10P14/3224—Materials thereof being Group IIB-VIA semiconductors
- H10P14/3231—Selenides
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/32—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by intermediate layers between substrates and deposited layers
- H10P14/3202—Materials thereof
- H10P14/3241—Materials thereof being conductive materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/32—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by intermediate layers between substrates and deposited layers
- H10P14/3242—Structure
- H10P14/3244—Layer structure
- H10P14/3248—Layer structure consisting of two layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/34—Deposited materials, e.g. layers
- H10P14/3402—Deposited materials, e.g. layers characterised by the chemical composition
- H10P14/3424—Deposited materials, e.g. layers characterised by the chemical composition being Group IIB-VIA materials
- H10P14/3428—Sulfides
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/34—Deposited materials, e.g. layers
- H10P14/3402—Deposited materials, e.g. layers characterised by the chemical composition
- H10P14/3424—Deposited materials, e.g. layers characterised by the chemical composition being Group IIB-VIA materials
- H10P14/3431—Selenides
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
- H10P14/34—Deposited materials, e.g. layers
- H10P14/3402—Deposited materials, e.g. layers characterised by the chemical composition
- H10P14/3436—Deposited materials, e.g. layers characterised by the chemical composition being chalcogenide semiconductor materials not being oxides, e.g. ternary compounds
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/547—Monocrystalline silicon PV cells
Definitions
- the invention relates to the field of photovoltaic solar energy and more particularly to thin-film photovoltaic cells that make it possible to directly convert sunlight into electricity, by using the electronic properties of suitable materials.
- Thin layer a layer having a thickness of less than 5 pm, or even 3 pm.
- the manufacture of a photovoltaic cell requires the formation of a p-n junction between a p-type or n-type semiconductor, in which the light is absorbed, and an n-type or p-type semiconductor.
- a solar cell may have a substrate or superstrate type structure.
- the manufacture of the solar cell begins with the formation, on a substrate for example of glass or polyamide, of a metal layer, for example molybdenum, forming the lower electrode.
- a metal layer for example molybdenum
- This absorbent layer for example of the p type, is then produced.
- This absorbent layer may in particular be made of CZTS, corresponding to the general formula Cu 2 ZnSn (S 1-x Se x ) 4 with 0 x x 1 1, or in CIGS.
- a buffer layer is then deposited on the absorbent layer.
- This buffer layer is made of an n-type semiconductor material, for example CdS. ZnS 1-x Se x with 0 x x 1 1 (hereinafter referred to as ZnS) or ln 2 Se 3 . This deposit is generally carried out by chemical bath.
- the cell is terminated by the formation of a conductive transparent electrode.
- This electrode is obtained by depositing a layer of a conductive and transparent oxide, such as AZO, ITO or SnO 2 : F, in particular deposited by sputtering.
- the same stack of layers can also be obtained by depositing the layers in the opposite direction, so as to obtain a superstrate type structure. With such a structure, the incident light passes through the transparent substrate before reaching the absorbent layer.
- the manufacture of a superstrate solar cell begins with the deposition of a conductive transparent electrode on a transparent substrate.
- a n-type or p-type buffer layer is then deposited on this conductive transparent electrode, with a p-type or n-type absorber layer being formed on the buffer layer.
- the manufacture of the solar cell ends with the production of a conductive (for example metallic) layer forming a rear electrode.
- the cells in the superstrate configuration are typically made with an absorbent CdTe layer.
- the conventional methods do not make it possible to obtain a solar cell in a superstrate configuration comprising an absorbent layer made of CZTS.
- the buffer layer is made of CdS or In 2 Se 3
- CZTS CZTS precursors
- cadmium or indium diffuses into the absorbent layer. This is due to the fact that the annealing is carried out at high temperature, that is to say at a temperature between 500 and 600 ° C.
- the diffusion of cadmium or indium occurs as soon as the temperature reaches 350 ° C.
- the buffer layer is made of ZnS
- diffusion of zinc, sulfur and / or selenium in the photovoltaic material is not observed.
- the ZnS layer is deposited by chemical bath, it contains numerous defects due to the inclusion of oxygen or hydrogen atoms, for example. These atoms are, on the other hand, capable of diffusing into the CZTS layer during the annealing step.
- the object of the invention is to overcome these drawbacks by proposing a method for producing solar cells based on CZTS and in a superstrate configuration, this method being moreover simplified compared to that conventionally used to obtain a solar cell based on CZTS. in substrate configuration.
- the invention firstly relates to a method for producing a pn junction in a thin-film photovoltaic cell based on CZTS, comprising:
- x Se x with x between 0 and 1.
- step a) selenium and / or sulfur are deposited in elemental form or in compounds.
- magnesium and / or oxygen are also deposited, the buffer layer obtained being then in Zn1.x gxOyS 2 Se1.y 2 with x and (y + 2) between 0 and 1.
- the first step is the deposition of a layer of zinc and then the deposition of a layer containing zinc, tin and copper, in the amounts necessary for ( a) formation of CZTS.
- magnesium and / or oxygen is also deposited magnesium and / or oxygen.
- the invention also relates to a method for producing a solar cell based on CZTS and in a superstrate configuration, comprising the following steps:
- a transparent substrate comprising a conductive and transparent electrode
- the buffer layer in ZnSi. x Se x with x between 0 and 1 being obtained between the transparent electrode and the absorbent layer in CZTS and
- the invention also relates to a photovoltaic cell in thin layers and in a superstrate configuration comprising successively:
- the invention also relates to a photovoltaic cell in thin layers and in a superstrate configuration comprising successively:
- the backside electrode is a molybdenum layer.
- FIG. 1 is a sectional view illustrating a substrate with a transparent and conductive electrode
- FIG. 2 is a sectional view of a stack of layers obtained after the precursor deposition step of the process according to the invention
- FIG. 3 is a sectional view of the stack illustrated in FIG. after the annealing step
- FIG. 4 illustrates a solar cell obtained with the process according to the invention.
- the method of producing a photovoltaic cell according to the invention consists first of all in obtaining a transparent substrate 1 on which a transparent and conductive electrode 10 has been formed. It will be referred to as the electrode on the front face, the incident light being intended to pass through the substrate 1.
- This substrate may in particular be made of glass, or of another transparent material in the range 300 nm - 1500 nm.
- substrates provided by the glass industry and on which a transparent electrode is already present, are used.
- FIG. 2 illustrates another stage in which a layer 20 of zinc is deposited on the electrode 10 and then a layer 21 of precursors containing zinc, tin and copper in the quantities necessary for the formation. of CZTS.
- the ratios of elements Cu, Zn and Sn are conventionally chosen such that: 0.75 ⁇ Cu (Zn + Sn) ⁇ 0.95 and 1.05 ⁇ ; Zn / Sn ⁇ 1.35 to obtain a layer of CZTS.
- This deposition step may also be carried out by depositing a single layer of precursors containing zinc, tin and copper, the amount of zinc then being greater than that necessary to transform the precursors into a photovoltaic material of the CZTS type.
- the ratios of elements Cu, Zn and Sn are chosen so that 0.6 Cu Cu / (Zn + Sn) s 0.9 and 1.3 s Zn / Sn 1.9 1.9.
- the amount of zinc will be expected in excess of about 5 to 35% over the amount of tin given by the nominal stoichiometry of the CZTS and the amount of copper will be expected to be about 5 to 25% less than the quantity given by the nominal stoichiometry.
- the precursors may be deposited under vacuum, in particular by cathodic sputtering or by evaporation, or else by a liquid route, in particular by electro-deposition.
- these deposits can be made at room temperature or at high temperature up to 600 ° C.
- the stack is subjected to an annealing step under an atmosphere of sulfur and / or selenium.
- This annealing step is performed at temperatures between 300 and 700 e C and typically of the order of 500 e C.
- This step lasts between 1 and 90 minutes. This duration is typically of the order of ten minutes.
- the stack is placed in an inert gas (argon or nitrogen), at a pressure close to atmospheric pressure, typically between 1 mbar and 10 bar.
- the chalcogen (S and / or Se) can be provided in the form of elemental gas or in the form of H 2 S or H 2 Se type gas.
- Figure 3 illustrates a stack that is obtained at the end of the annealing step.
- a buffer layer 3 On the transparent electrode 10, is formed a buffer layer 3 and, on this layer 3, an absorbent layer 4.
- Layer 3 is formed of a material of general formula
- this material is designated by ZnS.
- the layer 4 is formed in CZTS.
- the annealing step leads to pushing zinc towards the transparent electrode 10 to form the ZnS material.
- the precursors may be deposited as compounds with a chalcogen (S and / or Se), for example Cu (S and / or Se) or Zn (S and / or Se).
- a chalcogen S and / or Se
- the chalcogen (s) may also be deposited in elemental form.
- magnesium and / or oxygen can also be deposited with the precursors.
- Magnesium and / or oxygen may be deposited by elemental deposition or by reactive deposition in an oxygen atmosphere of certain precursors.
- the buffer layer obtained is of a material represented by the general formula (Mg) Zn (O) S.
- This formula corresponds to materials of the type Zn V) ⁇ Mg x 0yS z Se fy . .With 2 x between 0 and 1 and (y + z). y and z being especially such that 0 y y + z ⁇ 1.
- This magnesium and / or oxygen supply can be realized whether the precursors are deposited simultaneously or sequentially, as illustrated in FIG. 2.
- the substrate 1 is made from soda-lime glass including a transparent electrode Sn0 2 : F.
- the layer 20 has a thickness of between 10 and 100 nm when it comprises only zinc and it typically has a thickness of 30 nm.
- the layer comprises zinc and a chalcogen, it has a thickness of between 20 and 200 nm and which is typically equal to 50 nm.
- the layer 21 comprises for example a ZnS layer5 whose thickness is 340 nm, a copper layer whose thickness is 110 nm. and a tin layer whose thickness is 160 nm.
- the values indicated correspond to a layer thickness of 30 nm (Zn) or 50 nm (ZnS).
- a ZnS buffer layer having a thickness of approximately 50 nm and a CZTS layer 4 whose thickness is about 1000 nm. It is also possible to deposit on the electrode 10, a ZnS layer whose thickness is about 400 nm. This deposit is typically made by sputtering.
- the stack obtained is then subjected to a selenization annealing step. It is performed at a temperature between 450 and 700X and typically equal to 570 e C for a time between 1 and 120 min IO and typically equal to 30 min, under a nitrogen pressure of 10 mBar and 3 atm and in particular under atmospheric pressure and under a partial pressure of selenium of between 0.01 mbar and 100 mbar and especially 1 mbar.
- the partial pressure of Se can come from the evaporation of elemental Se or H 2 Se.
- the amount of zinc required for forming the photovoltaic material CZTS is present in the ZnS layer, which therefore has a greater thickness than in the preceding example (340 nm).
- the deposition and annealing steps make it possible to produce a buffer layer 3 and an absorbent layer 4, with a pn junction at the interface between these two layers.
- the typical thicknesses are 50 nm for the buffer layer and 1000 nm for the absorbent layer.
- FIG. 4 illustrates the last step of the method, in which a back-face electrode 5 is made.
- This step consists of producing a metal layer.
- This layer can be obtained by a simple deposition of conductive metal, in particular Au, Cu, Mo or Ti.
- This metal deposition may be preceded by a chemical cleaning of the surface of the layer 4 or a doping step near the surface of the layer 4. In both cases, these preliminary steps are intended to improve the electrical contact between layers 4 and 5.
Landscapes
- Photovoltaic Devices (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Life Sciences & Earth Sciences (AREA)
- Sustainable Development (AREA)
- Sustainable Energy (AREA)
Abstract
Description
Claims
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR1357660A FR3009434B1 (fr) | 2013-08-01 | 2013-08-01 | Procede de realisation d'une jonction pn dans une cellule photovoltaique a base de czts et cellule photovoltaique en configuration superstrat et a base de czts |
| PCT/IB2014/063305 WO2015015367A1 (fr) | 2013-08-01 | 2014-07-22 | Procédé de réalisation d'une jonction pn dans une cellule photovoltaïque à base de czts et cellule photovoltaïque en configuration superstrat et à base de czts |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| EP3028311A1 true EP3028311A1 (fr) | 2016-06-08 |
Family
ID=49212958
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP14767116.8A Withdrawn EP3028311A1 (fr) | 2013-08-01 | 2014-07-22 | Procédé de réalisation d'une jonction pn dans une cellule photovoltaïque à base de czts et cellule photovoltaïque en configuration superstrat et à base de czts |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US20160163896A1 (fr) |
| EP (1) | EP3028311A1 (fr) |
| FR (1) | FR3009434B1 (fr) |
| WO (1) | WO2015015367A1 (fr) |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8426241B2 (en) * | 2010-09-09 | 2013-04-23 | International Business Machines Corporation | Structure and method of fabricating a CZTS photovoltaic device by electrodeposition |
| US20130056054A1 (en) * | 2011-09-06 | 2013-03-07 | Intermolecular, Inc. | High work function low resistivity back contact for thin film solar cells |
| US20130164885A1 (en) * | 2011-12-21 | 2013-06-27 | Intermolecular, Inc. | Absorbers For High-Efficiency Thin-Film PV |
-
2013
- 2013-08-01 FR FR1357660A patent/FR3009434B1/fr not_active Expired - Fee Related
-
2014
- 2014-07-22 US US14/908,932 patent/US20160163896A1/en not_active Abandoned
- 2014-07-22 EP EP14767116.8A patent/EP3028311A1/fr not_active Withdrawn
- 2014-07-22 WO PCT/IB2014/063305 patent/WO2015015367A1/fr not_active Ceased
Non-Patent Citations (2)
| Title |
|---|
| None * |
| See also references of WO2015015367A1 * |
Also Published As
| Publication number | Publication date |
|---|---|
| US20160163896A1 (en) | 2016-06-09 |
| FR3009434A1 (fr) | 2015-02-06 |
| FR3009434B1 (fr) | 2016-12-23 |
| WO2015015367A1 (fr) | 2015-02-05 |
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