EP4632317A4 - Displacement measuring device and manufacturing method therefor - Google Patents

Displacement measuring device and manufacturing method therefor

Info

Publication number
EP4632317A4
EP4632317A4 EP23899274.7A EP23899274A EP4632317A4 EP 4632317 A4 EP4632317 A4 EP 4632317A4 EP 23899274 A EP23899274 A EP 23899274A EP 4632317 A4 EP4632317 A4 EP 4632317A4
Authority
EP
European Patent Office
Prior art keywords
manufacturing
measuring device
method therefor
displacement measuring
displacement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
EP23899274.7A
Other languages
German (de)
French (fr)
Other versions
EP4632317A1 (en
Inventor
Shaolong Zhong
Changxia Liu
Liang Long
Jingfang Ling
Zhihui Guo
Zuoxing Zhou
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shanghai Baiantek Sensing Technology Co Ltd
Shanghai Baiantek Sensing Tech Co Ltd
Original Assignee
Shanghai Baiantek Sensing Technology Co Ltd
Shanghai Baiantek Sensing Tech Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shanghai Baiantek Sensing Technology Co Ltd, Shanghai Baiantek Sensing Tech Co Ltd filed Critical Shanghai Baiantek Sensing Technology Co Ltd
Publication of EP4632317A1 publication Critical patent/EP4632317A1/en
Publication of EP4632317A4 publication Critical patent/EP4632317A4/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Optical Transform (AREA)
EP23899274.7A 2022-12-05 2023-04-03 Displacement measuring device and manufacturing method therefor Pending EP4632317A4 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN202211545084.8A CN115560682B (en) 2022-12-05 2022-12-05 Displacement measuring device and manufacturing method thereof
PCT/CN2023/086034 WO2024119680A1 (en) 2022-12-05 2023-04-03 Displacement measurement device and manufacturing method therefor

Publications (2)

Publication Number Publication Date
EP4632317A1 EP4632317A1 (en) 2025-10-15
EP4632317A4 true EP4632317A4 (en) 2026-02-11

Family

ID=84770650

Family Applications (1)

Application Number Title Priority Date Filing Date
EP23899274.7A Pending EP4632317A4 (en) 2022-12-05 2023-04-03 Displacement measuring device and manufacturing method therefor

Country Status (3)

Country Link
EP (1) EP4632317A4 (en)
CN (1) CN115560682B (en)
WO (1) WO2024119680A1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115560682B (en) * 2022-12-05 2023-02-03 上海拜安传感技术有限公司 Displacement measuring device and manufacturing method thereof
CN115854889B (en) * 2023-03-08 2023-06-06 上海拜安传感技术有限公司 Contact type displacement measuring device
CN117928416B (en) * 2024-03-22 2024-06-07 上海拜安传感技术有限公司 MEMS optical fiber surface type strain gauge

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3101385A1 (en) * 2015-06-05 2016-12-07 Carl Zeiss Microscopy GmbH Device and method for detecting surface topographies
EP3696494B1 (en) * 2014-12-31 2022-07-06 Rememdia LC Position sensor and corresponding sensing method

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0179935B1 (en) * 1984-10-31 1988-05-18 Ibm Deutschland Gmbh Interferometric thickness analyzer and measuring method
JPH06294608A (en) * 1993-04-07 1994-10-21 Res Dev Corp Of Japan Fine linear reflection type micro displacement detector
JPH0973020A (en) * 1995-09-05 1997-03-18 Toshiba Corp Optical multiplexer / demultiplexer
US6943950B2 (en) * 2000-08-07 2005-09-13 Texas Instruments Incorporated Two-dimensional blazed MEMS grating
US7116430B2 (en) * 2002-03-29 2006-10-03 Georgia Technology Research Corporation Highly-sensitive displacement-measuring optical device
JP5049108B2 (en) * 2007-11-29 2012-10-17 アンリツ株式会社 Optical fiber sensor
CN101825434B (en) * 2010-04-28 2011-09-14 东北大学 Blazed fiber bragg grating demodulation-based micro-displacement sensor and detection method
CN201903327U (en) * 2010-12-17 2011-07-20 刘晓旻 Free space micro optics optical lever system for nanoscale micro-displacement measurement
CN102901840A (en) * 2012-10-22 2013-01-30 浙江建设职业技术学院 High-sensitivity FBG (Fiber Bragg Grating) acceleration sensor
CN204007519U (en) * 2014-08-20 2014-12-10 武汉光驰科技有限公司 Optical fiber optical grating sensing experiment instrument
CN104406525B (en) * 2014-11-13 2017-02-15 浙江大学 Grating group micro-displacement sensor and displacement measuring method using same
EP3173752A1 (en) * 2015-11-27 2017-05-31 Universite Libre De Bruxelles Transducer with stiffness adjustment
CN107388982B (en) * 2017-06-20 2019-11-08 西安交通大学 Portable nano-machining on-line measuring device and measuring method
CN107917680B (en) * 2017-11-07 2019-10-25 南京航空航天大学 A fast recognition method for small angles based on blazed gratings
CN109506766A (en) * 2018-12-21 2019-03-22 宁波中车时代传感技术有限公司 It is a kind of to be shaken integrative sensor in parallel based on the optical fiber temperature of balzed grating, and fiber grating
CN113155332A (en) * 2021-04-20 2021-07-23 云南省建设投资控股集团有限公司 Stress measurement sensitivity enhancing device of fiber grating sensor and manufacturing method thereof
CN115560682B (en) * 2022-12-05 2023-02-03 上海拜安传感技术有限公司 Displacement measuring device and manufacturing method thereof

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3696494B1 (en) * 2014-12-31 2022-07-06 Rememdia LC Position sensor and corresponding sensing method
EP3101385A1 (en) * 2015-06-05 2016-12-07 Carl Zeiss Microscopy GmbH Device and method for detecting surface topographies

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
PIERCE D S ET AL: "A NOVEL LASER TRIANGULATION TECHNIQUE FOR HIGH PRECISION DISTANCE MEASUREMENT", PROCEEDINGS OF THE INDUSTRY APPLICATIONS SOCIETY ANNUAL MEETING. HOUSTON, OCT. 4 - 9, 1992; [PROCEEDINGS OF THE INDUSTRY APPLICATIONS SOCIETY ANNUAL MEETING], NEW YORK, IEEE, US, vol. 2, 1 January 1992 (1992-01-01), pages 1762 - 1769, XP000334204, ISBN: 978-0-7803-0635-6, DOI: 10.1109/IAS.1992.244524 *
See also references of WO2024119680A1 *

Also Published As

Publication number Publication date
CN115560682A (en) 2023-01-03
EP4632317A1 (en) 2025-10-15
WO2024119680A1 (en) 2024-06-13
CN115560682B (en) 2023-02-03

Similar Documents

Publication Publication Date Title
EP4096280A4 (en) MEASUREMENT METHOD AND DEVICE
EP4435409A4 (en) MEASURING DEVICE AND MEASURING METHOD
EP4529107A4 (en) DISTANCE MEASURING METHOD AND DEVICE
EP4308921A4 (en) MEASURING DEVICE AND METHOD
EP4481836A4 (en) PHOTODETECTION DEVICE AND MANUFACTURING METHOD THEREOF
EP4575579A4 (en) DISTANCE MEASURING METHOD AND DEVICE
EP4382944A4 (en) MEASURING DEVICE AND MEASURING METHOD
EP4489463A4 (en) MEASURING METHOD AND DEVICE
EP4354079A4 (en) POSITION MEASURING DEVICE AND POSITION MEASURING METHOD
EP4283283A4 (en) MEASURING DEVICE AND MEASURING METHODS
EP4657947A4 (en) MEASURING METHOD AND COMMUNICATION DEVICE
EP4650826A4 (en) MEASURING METHOD AND DEVICE
EP4495543A4 (en) Mud thickness measuring method and mud thickness measuring device
EP4524544A4 (en) TRANSFER MEASURING METHOD AND TRANSFER MEASURING DEVICE
EP4468789A4 (en) MEASURING METHODS AND DEVICES
EP4431953A4 (en) MEASURING DEVICE AND MEASURING METHOD
EP4365614C0 (en) MAGNETIC MEASURING DEVICE AND MAGNETIC MEASURING METHOD
EP4542187A4 (en) TEMPERATURE MEASURING DEVICE AND TEMPERATURE MEASURING METHOD
EP4589328A4 (en) DISTANCE MEASURING METHOD AND DEVICE
EP4586124A4 (en) INTEGRITY MEASUREMENT METHOD AND DEVICE
EP4611442A4 (en) MEASURING METHODS AND DEVICES
EP4535041A4 (en) POSITION MEASURING DEVICE, POSITION MEASURING METHOD AND POSITION MEASURING PROGRAM
EP4207540A4 (en) MEASURING DEVICE AND METHOD
EP4207325A4 (en) DISPLAY DEVICE AND MANUFACTURING METHOD THEREFOR
EP4116690C0 (en) MEASURING METHOD AND MEASURING ARRANGEMENT

Legal Events

Date Code Title Description
STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: THE INTERNATIONAL PUBLICATION HAS BEEN MADE

PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: REQUEST FOR EXAMINATION WAS MADE

17P Request for examination filed

Effective date: 20250619

AK Designated contracting states

Kind code of ref document: A1

Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC ME MK MT NL NO PL PT RO RS SE SI SK SM TR

A4 Supplementary search report drawn up and despatched

Effective date: 20260114

RIC1 Information provided on ipc code assigned before grant

Ipc: G01B 11/02 20060101AFI20260108BHEP

DAV Request for validation of the european patent (deleted)
DAX Request for extension of the european patent (deleted)