ES2287309T3 - Dispositivos y circuitos nanoelectricos. - Google Patents
Dispositivos y circuitos nanoelectricos. Download PDFInfo
- Publication number
- ES2287309T3 ES2287309T3 ES02764075T ES02764075T ES2287309T3 ES 2287309 T3 ES2287309 T3 ES 2287309T3 ES 02764075 T ES02764075 T ES 02764075T ES 02764075 T ES02764075 T ES 02764075T ES 2287309 T3 ES2287309 T3 ES 2287309T3
- Authority
- ES
- Spain
- Prior art keywords
- substrate
- elongated
- zone
- channel
- barrier
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D10/00—Bipolar junction transistors [BJT]
- H10D10/01—Manufacture or treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D12/00—Bipolar devices controlled by the field effect, e.g. insulated-gate bipolar transistors [IGBT]
- H10D12/411—Insulated-gate bipolar transistors [IGBT]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/01—Manufacture or treatment
- H10D30/014—Manufacture or treatment of FETs having zero-dimensional [0D] or one-dimensional [1D] channels, e.g. quantum wire FETs, single-electron transistors [SET] or Coulomb blockade transistors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/40—FETs having zero-dimensional [0D], one-dimensional [1D] or two-dimensional [2D] charge carrier gas channels
- H10D30/43—FETs having zero-dimensional [0D], one-dimensional [1D] or two-dimensional [2D] charge carrier gas channels having one-dimensional [1D] charge carrier gas channels, e.g. quantum wire FETs or transistors having 1D quantum-confined channels
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D48/00—Individual devices not covered by groups H10D1/00 - H10D44/00
- H10D48/01—Manufacture or treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D8/00—Diodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D8/00—Diodes
- H10D8/01—Manufacture or treatment
- H10D8/043—Manufacture or treatment of planar diodes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
- H10D62/85—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group III-V materials, e.g. GaAs
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Mathematical Physics (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Junction Field-Effect Transistors (AREA)
- Element Separation (AREA)
- Semiconductor Integrated Circuits (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Networks Using Active Elements (AREA)
- Superconductors And Manufacturing Methods Therefor (AREA)
Abstract
Componente (130; 160) de circuito electrónico, que comprende un sustrato que soporta portadores de carga móviles, medios (8; 60; 70; 80; 114) de barrera aislantes alargados de división formados en la superficie del sustrato de manera que se definen zonas de sustrato primera (10; 50; 102; 154; 156) y segunda (12; 52; 54; 100; 104; 158) sobre cualquier lado de dichos medios de barrera, comprendiendo dichos medios de barrera una abertura, incluyendo además los medios de barrera barreras (16; 18; 66; 68; 82; 84; 120; 122; 174; 176) aislantes alargadas primera y segunda que se extienden desde los bordes de la abertura en la segunda zona (12; 52; 54; 100; 104; 158) de sustrato y que están situadas próximas entre sí pero separadas por una cantidad predeterminada para proporcionar un canal (20; 62; 64; 86; 88; 116; 118; 182; 184) alargado que se extiende entre las zonas de sustrato primera y segunda con un ancho predeterminado, que proporciona una trayectoria de flujo de portadores de carga en el sustrato desde la primera zona (10; 50; 102; 154; 156) de sustrato hacia la segunda zona (12; 52; 54; 100; 104; 158) de sustrato, y en el que dicho ancho predeterminado de dicho canal alargado es de tal manera que cuando se aplica una diferencia de voltaje entre dichas zonas de sustrato primera (10; 50; 102; 154; 156) y segunda (12; 52; 54; 100; 104; 158) tal como para provocar el flujo de dichos portadores de carga móviles a través de dicho canal (20; 62; 64; 86; 88; 116; 118; 182; 184) alargado, el voltaje existente en la segunda zona de sustrato influye, a través de dichas barreras (16; 18; 66; 68; 82; 84; 120; 122; 174; 176) aislantes primera y segunda, en el tamaño de las regiones de agotamiento existentes dentro de dicho canal alargado, por los que las características de conductividad del canal dependen de dicha diferencia de voltaje.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GBGB0109782.3A GB0109782D0 (en) | 2001-04-20 | 2001-04-20 | Nanoelectronic devices and circuits |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ES2287309T3 true ES2287309T3 (es) | 2007-12-16 |
Family
ID=9913182
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| ES02764075T Expired - Lifetime ES2287309T3 (es) | 2001-04-20 | 2002-04-18 | Dispositivos y circuitos nanoelectricos. |
Country Status (12)
| Country | Link |
|---|---|
| US (1) | US7224026B2 (es) |
| EP (1) | EP1380053B1 (es) |
| JP (1) | JP4902094B2 (es) |
| KR (1) | KR100884040B1 (es) |
| CN (1) | CN100377354C (es) |
| AT (1) | ATE363733T1 (es) |
| AU (1) | AU2002308010B2 (es) |
| CA (1) | CA2444681C (es) |
| DE (1) | DE60220394T2 (es) |
| ES (1) | ES2287309T3 (es) |
| GB (1) | GB0109782D0 (es) |
| WO (1) | WO2002086973A2 (es) |
Families Citing this family (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB0109782D0 (en) * | 2001-04-20 | 2001-06-13 | Btg Int Ltd | Nanoelectronic devices and circuits |
| JP3908503B2 (ja) * | 2001-10-30 | 2007-04-25 | 富士通株式会社 | 光スイッチ |
| US7838875B1 (en) * | 2003-01-22 | 2010-11-23 | Tsang Dean Z | Metal transistor device |
| GB0415995D0 (en) * | 2004-07-16 | 2004-08-18 | Song Aimin | Memory array |
| US7874250B2 (en) * | 2005-02-09 | 2011-01-25 | Schlumberger Technology Corporation | Nano-based devices for use in a wellbore |
| KR101317695B1 (ko) * | 2005-05-09 | 2013-10-15 | 나노 이프린트 리미티드 | 전자 소자 |
| US20080253167A1 (en) * | 2007-04-16 | 2008-10-16 | Ralf Symanczyk | Integrated Circuit, Method of Operating an Integrated Circuit, Method of Manufacturing an Integrated Circuit, Active Element, Memory Module, and Computing System |
| GB2462693B (en) * | 2008-07-31 | 2013-06-19 | Pragmatic Printing Ltd | Forming electrically insulative regions |
| GB2467316B (en) | 2009-01-28 | 2014-04-09 | Pragmatic Printing Ltd | Electronic devices, circuits and their manufacture |
| CN101431106B (zh) * | 2008-12-05 | 2012-06-06 | 中山大学 | 基于负微分迁移率的平面纳米电磁辐射器结构 |
| GB2473200B (en) * | 2009-09-02 | 2014-03-05 | Pragmatic Printing Ltd | Structures comprising planar electronic devices |
| GB2475561A (en) | 2009-11-24 | 2011-05-25 | Nano Eprint Ltd | Planar electronic devices |
| US20120305892A1 (en) * | 2010-12-08 | 2012-12-06 | Martin Thornton | Electronic device, method of manufacturing a device and apparatus for manufacturing a device |
| JP5594780B2 (ja) * | 2011-02-28 | 2014-09-24 | 日本電信電話株式会社 | 半導体回路 |
| GB2499606B (en) | 2012-02-21 | 2016-06-22 | Pragmatic Printing Ltd | Substantially planar electronic devices and circuits |
| JP5814194B2 (ja) * | 2012-07-27 | 2015-11-17 | 日本電信電話株式会社 | 半導体論理回路 |
| EP2731263A1 (en) | 2012-11-08 | 2014-05-14 | Université Montpellier 2 Sciences et Techniques | Device and method for mixing electromagnetic waves with frequencies up to the THz range |
| EP2731264A1 (en) | 2012-11-08 | 2014-05-14 | Université Montpellier 2 Sciences et Techniques | Device and method for direct demodulation of signals with carrier frequencies up to the THz range |
| CN103219944B (zh) * | 2013-04-23 | 2015-09-16 | 华南师范大学 | 一种基于低维半导体结构的倍频器 |
| CN103489937B (zh) * | 2013-10-11 | 2017-01-25 | 中国科学院半导体研究所 | 一种非对称沟道量子点场效应光子探测器 |
| CN104112752B (zh) | 2014-05-16 | 2017-03-08 | 华南师范大学 | 具有相位锁定功能的平面纳米振荡器阵列 |
| FR3030886B1 (fr) * | 2014-12-22 | 2017-03-10 | Centre Nat Rech Scient | Dispositif de modulation comportant une nano-diode |
| CN108598258B (zh) * | 2018-04-27 | 2021-11-09 | 华南师范大学 | 一种具有静态负微分电阻特性的太赫兹器件 |
| JP2020009883A (ja) * | 2018-07-06 | 2020-01-16 | ソニーセミコンダクタソリューションズ株式会社 | 受光素子、測距モジュール、および、電子機器 |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3829356A (en) * | 1971-04-16 | 1974-08-13 | Nl Industries Inc | Sintered ceramic bodies with porous portions |
| US3679950A (en) * | 1971-04-16 | 1972-07-25 | Nl Industries Inc | Ceramic capacitors |
| DE59010851D1 (de) * | 1989-04-27 | 1998-11-12 | Max Planck Gesellschaft | Halbleiterstruktur mit einer 2D-Ladungsträgerschicht und Herstellungsverfahren |
| EP0394757B1 (de) * | 1989-04-27 | 1998-10-07 | Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. | Halbleiterstruktur mit einer 2D-Ladungsträgerschicht und Herstellungsverfahren |
| US5385865A (en) * | 1990-04-26 | 1995-01-31 | Max-Planck-Gesellschaft Zur Forderung Der Wissenschaften | Method of generating active semiconductor structures by means of starting structures which have a 2D charge carrier layer parallel to the surface |
| JPH0411784A (ja) * | 1990-04-28 | 1992-01-16 | Fujitsu Ltd | 量子ポイントコンタクト装置およびその製造方法 |
| JPH04229656A (ja) * | 1990-06-13 | 1992-08-19 | Fujitsu Ltd | 量子波屈折デバイス |
| JPH05315598A (ja) * | 1992-05-08 | 1993-11-26 | Fujitsu Ltd | 半導体装置 |
| JP3182892B2 (ja) * | 1992-07-03 | 2001-07-03 | 松下電器産業株式会社 | 量子素子の製造方法 |
| JPH06140636A (ja) * | 1992-10-28 | 1994-05-20 | Sony Corp | 量子細線トランジスタとその製法 |
| GB9226847D0 (en) * | 1992-12-23 | 1993-02-17 | Hitachi Europ Ltd | Complementary conductive device |
| GB9311111D0 (en) * | 1993-05-28 | 1993-07-14 | Hitachi Europ Ltd | Quantum structure devices |
| US5772905A (en) | 1995-11-15 | 1998-06-30 | Regents Of The University Of Minnesota | Nanoimprint lithography |
| JP3414992B2 (ja) * | 1997-08-13 | 2003-06-09 | 日本電信電話株式会社 | 半導体光素子とその製造方法 |
| JP3776266B2 (ja) * | 1998-09-14 | 2006-05-17 | 富士通株式会社 | 赤外線検知器とその製造方法 |
| TW514968B (en) * | 2000-09-01 | 2002-12-21 | Btg Int Ltd | Nanoelectronic devices, circuits including such devices and methods for achieving transistor action and rectifying an alternating voltage in such device |
| EP1251562A1 (en) * | 2001-04-20 | 2002-10-23 | Btg International Limited | Nanoelectronic devices and circuits |
| GB0109782D0 (en) * | 2001-04-20 | 2001-06-13 | Btg Int Ltd | Nanoelectronic devices and circuits |
-
2001
- 2001-04-20 GB GBGB0109782.3A patent/GB0109782D0/en not_active Ceased
-
2002
- 2002-04-18 CA CA2444681A patent/CA2444681C/en not_active Expired - Fee Related
- 2002-04-18 US US10/475,347 patent/US7224026B2/en not_active Expired - Lifetime
- 2002-04-18 CN CNB028085086A patent/CN100377354C/zh not_active Expired - Lifetime
- 2002-04-18 AU AU2002308010A patent/AU2002308010B2/en not_active Ceased
- 2002-04-18 ES ES02764075T patent/ES2287309T3/es not_active Expired - Lifetime
- 2002-04-18 WO PCT/GB2002/001807 patent/WO2002086973A2/en not_active Ceased
- 2002-04-18 JP JP2002584390A patent/JP4902094B2/ja not_active Expired - Lifetime
- 2002-04-18 KR KR1020037013565A patent/KR100884040B1/ko not_active Expired - Lifetime
- 2002-04-18 EP EP02764075A patent/EP1380053B1/en not_active Expired - Lifetime
- 2002-04-18 DE DE60220394T patent/DE60220394T2/de not_active Expired - Lifetime
- 2002-04-18 AT AT02764075T patent/ATE363733T1/de active
Also Published As
| Publication number | Publication date |
|---|---|
| DE60220394T2 (de) | 2008-01-31 |
| US7224026B2 (en) | 2007-05-29 |
| US20040149679A1 (en) | 2004-08-05 |
| CA2444681C (en) | 2013-12-17 |
| EP1380053B1 (en) | 2007-05-30 |
| GB0109782D0 (en) | 2001-06-13 |
| WO2002086973A3 (en) | 2003-10-16 |
| DE60220394D1 (de) | 2007-07-12 |
| JP4902094B2 (ja) | 2012-03-21 |
| CN1669144A (zh) | 2005-09-14 |
| KR20040012755A (ko) | 2004-02-11 |
| AU2002308010B2 (en) | 2007-08-09 |
| JP2004534388A (ja) | 2004-11-11 |
| KR100884040B1 (ko) | 2009-02-19 |
| CA2444681A1 (en) | 2002-10-31 |
| WO2002086973A2 (en) | 2002-10-31 |
| CN100377354C (zh) | 2008-03-26 |
| ATE363733T1 (de) | 2007-06-15 |
| EP1380053A2 (en) | 2004-01-14 |
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