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Individual
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Priority to ES0252908ApriorityCriticalpatent/ES252908A1/es
Publication of ES252908A1publicationCriticalpatent/ES252908A1/es
Testing Of Individual Semiconductor Devices
(AREA)
Abstract
Un aparato par ensayo de transistores, caracterizado por comprender un único instrumento y un grupo de conmutadores,sincronizados bajo un mando único, que pueden adoptar tres distintas posiciones, en la primera de las cuales queda sin corriente la base del transistor, quedando conectado el instrumento de medida al circuito del colector, de manera que el mismo indica directamente sobre una correspondiente escala el valor de la corriente de fuga entre colector y emisor.
ES0252908A1959-10-131959-10-13Un aparato para ensayo de transistores
ExpiredES252908A1
(es)