HU0700635D0 - Differential-polarizing accessory measuring block for laser slanning micrescopes - Google Patents

Differential-polarizing accessory measuring block for laser slanning micrescopes

Info

Publication number
HU0700635D0
HU0700635D0 HU0700635A HUP0700635A HU0700635D0 HU 0700635 D0 HU0700635 D0 HU 0700635D0 HU 0700635 A HU0700635 A HU 0700635A HU P0700635 A HUP0700635 A HU P0700635A HU 0700635 D0 HU0700635 D0 HU 0700635D0
Authority
HU
Hungary
Prior art keywords
slanning
micrescopes
polarizing
differential
laser
Prior art date
Application number
HU0700635A
Other languages
English (en)
Original Assignee
Magyar Tudomanyos Akadumia Sze
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Magyar Tudomanyos Akadumia Sze filed Critical Magyar Tudomanyos Akadumia Sze
Priority to HU0700635A priority Critical patent/HUP0700635A2/hu
Publication of HU0700635D0 publication Critical patent/HU0700635D0/hu
Priority to PCT/HU2008/000106 priority patent/WO2009040591A1/en
Priority to US12/679,888 priority patent/US8451446B2/en
Priority to EP08806829.1A priority patent/EP2201351B1/en
Publication of HUP0700635A2 publication Critical patent/HUP0700635A2/hu

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/19—Dichroism
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N21/23—Bi-refringence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0068—Optical details of the image generation arrangements using polarisation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6445—Measuring fluorescence polarisation
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Microscoopes, Condenser (AREA)
HU0700635A 2007-09-28 2007-09-28 Differential-polarizing accessory measuring block for laser scanning microscopes HUP0700635A2 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
HU0700635A HUP0700635A2 (en) 2007-09-28 2007-09-28 Differential-polarizing accessory measuring block for laser scanning microscopes
PCT/HU2008/000106 WO2009040591A1 (en) 2007-09-28 2008-09-26 Differential polarization measuring extension unit for a laser-scanning microscope
US12/679,888 US8451446B2 (en) 2007-09-28 2008-09-26 Differential polarization measuring extension unit for a laser-scanning microscope
EP08806829.1A EP2201351B1 (en) 2007-09-28 2008-09-26 Laser-scanning microscope with a differential polarization measuring extension unit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
HU0700635A HUP0700635A2 (en) 2007-09-28 2007-09-28 Differential-polarizing accessory measuring block for laser scanning microscopes

Publications (2)

Publication Number Publication Date
HU0700635D0 true HU0700635D0 (en) 2007-11-28
HUP0700635A2 HUP0700635A2 (en) 2009-05-28

Family

ID=89987782

Family Applications (1)

Application Number Title Priority Date Filing Date
HU0700635A HUP0700635A2 (en) 2007-09-28 2007-09-28 Differential-polarizing accessory measuring block for laser scanning microscopes

Country Status (4)

Country Link
US (1) US8451446B2 (hu)
EP (1) EP2201351B1 (hu)
HU (1) HUP0700635A2 (hu)
WO (1) WO2009040591A1 (hu)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114001644A (zh) * 2021-10-28 2022-02-01 山西大学 三波长光纤线阵列差分共焦显微探测方法与装置

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8773662B2 (en) 2010-07-22 2014-07-08 Vuv Analytics, Inc. Methods and apparatus for vacuum ultraviolet (VUV) or shorter wavelength circular dichroism spectroscopy
US8427645B2 (en) * 2011-01-10 2013-04-23 Nanometrics Incorporated Mueller matrix spectroscopy using chiroptic
TWI477757B (zh) * 2011-02-18 2015-03-21 Univ Nat Cheng Kung 光學參數測量裝置與光學參數測量方法
JP2013036792A (ja) * 2011-08-05 2013-02-21 Seiko Epson Corp 偏光状態測定装置及び偏光状態測定方法
JP5890719B2 (ja) * 2012-03-29 2016-03-22 日本分光株式会社 アライメント機構を備えた円偏光二色性分光光度計
US10441465B2 (en) 2014-03-26 2019-10-15 Optimedica Corporation Registration of LOI fiducials with camera
US10441463B2 (en) 2014-03-26 2019-10-15 Optimedica Corporation Confocal laser eye surgery system and improved confocal bypass assembly
EP3122297B8 (en) * 2014-03-26 2024-02-14 AMO Development, LLC Confocal laser eye system
JP2019518242A (ja) 2016-05-30 2019-06-27 ザ トラスティース オブ コロンビア ユニバーシティ イン ザ シティ オブ ニューヨーク 位相変調素子および像再構成部を用いるｓｃａｐｅ顕微鏡法
JP6351893B1 (ja) * 2018-02-26 2018-07-04 日本分光株式会社 位相差制御装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5748318A (en) * 1996-01-23 1998-05-05 Brown University Research Foundation Optical stress generator and detector
US6167173A (en) * 1997-01-27 2000-12-26 Carl Zeiss Jena Gmbh Laser scanning microscope
HU226937B1 (en) 2000-11-17 2010-03-29 Mta Szegedi Biolog Koezpont Method and apparatus for determining polarization amount of material by a laser scanning microscope
JP2005509153A (ja) * 2001-10-16 2005-04-07 ハインズ インスツルメンツ インコーポレイテッド 複屈折測定システムの正確な校正
WO2008081374A2 (en) * 2006-12-28 2008-07-10 Koninklijke Philips Electronics N.V. Reflection or single scattering spectroscopy and imaging

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114001644A (zh) * 2021-10-28 2022-02-01 山西大学 三波长光纤线阵列差分共焦显微探测方法与装置
CN114001644B (zh) * 2021-10-28 2024-05-24 山西大学 三波长光纤线阵列差分共焦显微探测方法与装置

Also Published As

Publication number Publication date
HUP0700635A2 (en) 2009-05-28
WO2009040591A1 (en) 2009-04-02
US20100245822A1 (en) 2010-09-30
EP2201351A1 (en) 2010-06-30
EP2201351B1 (en) 2013-11-06
US8451446B2 (en) 2013-05-28

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Legal Events

Date Code Title Description
HC9A Change of name, address

Owner name: MAGYAR TUDOMANYOS AKADEMIA SZEGEDI BIOLOGIAI K, HU

Free format text: FORMER OWNER(S): MAGYAR TUDOMANYOS AKADEMIA SZEGEDI BIOLOGIAI KOEZPONT, HU

FA9A Lapse of provisional patent protection due to relinquishment or protection considered relinquished