IT1153156B - Analizzatore di gadolinio e metodo relativo - Google Patents
Analizzatore di gadolinio e metodo relativoInfo
- Publication number
- IT1153156B IT1153156B IT22690/82A IT2269082A IT1153156B IT 1153156 B IT1153156 B IT 1153156B IT 22690/82 A IT22690/82 A IT 22690/82A IT 2269082 A IT2269082 A IT 2269082A IT 1153156 B IT1153156 B IT 1153156B
- Authority
- IT
- Italy
- Prior art keywords
- gadolinio
- analyzer
- related method
- gadolinio analyzer
- Prior art date
Links
- UIWYJDYFSGRHKR-UHFFFAOYSA-N gadolinium atom Chemical compound [Gd] UIWYJDYFSGRHKR-UHFFFAOYSA-N 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Monitoring And Testing Of Nuclear Reactors (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US06/294,542 US4459258A (en) | 1981-08-20 | 1981-08-20 | Elemental analyzer and method |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| IT8222690A0 IT8222690A0 (it) | 1982-07-30 |
| IT8222690A1 IT8222690A1 (it) | 1984-01-30 |
| IT1153156B true IT1153156B (it) | 1987-01-14 |
Family
ID=23133889
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IT22690/82A IT1153156B (it) | 1981-08-20 | 1982-07-30 | Analizzatore di gadolinio e metodo relativo |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US4459258A (it) |
| JP (1) | JPS5866042A (it) |
| DE (1) | DE3230005C2 (it) |
| ES (1) | ES8500499A1 (it) |
| IT (1) | IT1153156B (it) |
| SE (1) | SE460801B (it) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USH75H (en) | 1983-11-23 | 1986-06-03 | The United States Of America As Respresented By The United States Department Of Energy | Nuclear diagnostic for fast alpha particles |
| US5053185A (en) * | 1990-05-23 | 1991-10-01 | Gamma-Metrics | Material analyzer with carousel |
| JP1784615S (ja) * | 2024-06-25 | 2024-11-14 | エックス線分析機 | |
| USD1120783S1 (en) * | 2024-06-25 | 2026-03-31 | Rigaku Corporation | Measuring device for x-ray emission spectrochemical analysis |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2707555A (en) * | 1950-06-08 | 1955-05-03 | Antoine M Gaudin | Beryl ore selector |
| US3102952A (en) * | 1954-05-27 | 1963-09-03 | Philips Corp | X-ray fluorescence analysis of multi-component systems |
| GB940056A (en) * | 1961-06-06 | 1963-10-23 | Saadia Amiel | Determination of o |
| GB1017595A (en) * | 1962-06-20 | 1966-01-19 | Atomic Energy Authority Uk | Improvements in or relating to radiometric analysis techniques |
| US3445651A (en) * | 1964-07-06 | 1969-05-20 | Hilger & Watts Ltd | Radiometric analysis of powdered sample material |
| US3562525A (en) * | 1967-06-29 | 1971-02-09 | Minnesota Mining & Mfg | X-ray fludrescence gauging employing a single x-ray source and a reference sample for comparative measurements |
| US3671744A (en) * | 1970-10-05 | 1972-06-20 | Minnesota Mining & Mfg | Digital differential emission x-ray gauge |
| JPS6010257B2 (ja) * | 1973-09-08 | 1985-03-15 | 正人 森田 | 同位元素の定量法 |
| ZA741707B (en) * | 1974-03-15 | 1975-07-30 | Chamber Of Mines Services Ltd | Determining heavy element concentration in ores |
| DE2727989C3 (de) * | 1977-06-22 | 1980-05-08 | Kernforschungszentrum Karlsruhe Gmbh, 7500 Karlsruhe | Einrichtung zur Bestimmung von Uran und/oder Thorium in Erzproben |
| US4229654A (en) * | 1978-08-07 | 1980-10-21 | General Electric Company | Determining fissile content of nuclear fuel elements |
-
1981
- 1981-08-20 US US06/294,542 patent/US4459258A/en not_active Expired - Lifetime
-
1982
- 1982-07-30 IT IT22690/82A patent/IT1153156B/it active
- 1982-08-12 DE DE3230005A patent/DE3230005C2/de not_active Expired
- 1982-08-18 SE SE8204751A patent/SE460801B/sv not_active IP Right Cessation
- 1982-08-19 ES ES515129A patent/ES8500499A1/es not_active Expired
- 1982-08-20 JP JP57143502A patent/JPS5866042A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| DE3230005C2 (de) | 1986-11-27 |
| JPH0313544B2 (it) | 1991-02-22 |
| IT8222690A1 (it) | 1984-01-30 |
| JPS5866042A (ja) | 1983-04-20 |
| DE3230005A1 (de) | 1983-03-24 |
| ES515129A0 (es) | 1984-10-16 |
| SE8204751L (sv) | 1983-02-21 |
| ES8500499A1 (es) | 1984-10-16 |
| IT8222690A0 (it) | 1982-07-30 |
| SE8204751D0 (sv) | 1982-08-18 |
| US4459258A (en) | 1984-07-10 |
| SE460801B (sv) | 1989-11-20 |
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