IT201600129994A1 - Spettometro a fluorescenza x - Google Patents
Spettometro a fluorescenza xInfo
- Publication number
- IT201600129994A1 IT201600129994A1 IT102016000129994A IT201600129994A IT201600129994A1 IT 201600129994 A1 IT201600129994 A1 IT 201600129994A1 IT 102016000129994 A IT102016000129994 A IT 102016000129994A IT 201600129994 A IT201600129994 A IT 201600129994A IT 201600129994 A1 IT201600129994 A1 IT 201600129994A1
- Authority
- IT
- Italy
- Prior art keywords
- spectometer
- fluorescent
- fluorescent spectometer
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/10—Scattering devices; Absorbing devices; Ionising radiation filters
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
- H01J35/08—Anodes; Anti cathodes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/301—Accessories, mechanical or electrical features portable apparatus
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| IT102016000129994A IT201600129994A1 (it) | 2016-12-22 | 2016-12-22 | Spettometro a fluorescenza x |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| IT102016000129994A IT201600129994A1 (it) | 2016-12-22 | 2016-12-22 | Spettometro a fluorescenza x |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| IT201600129994A1 true IT201600129994A1 (it) | 2018-06-22 |
Family
ID=58701698
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IT102016000129994A IT201600129994A1 (it) | 2016-12-22 | 2016-12-22 | Spettometro a fluorescenza x |
Country Status (1)
| Country | Link |
|---|---|
| IT (1) | IT201600129994A1 (it) |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3919548A (en) * | 1974-07-24 | 1975-11-11 | David E Porter | X-Ray energy spectrometer system |
| US20080084966A1 (en) * | 2006-02-01 | 2008-04-10 | Toshiba Electron Tubes & Devices Co., Ltd. | X-ray source and fluorescent X-ray analyzing apparatus |
| US20090028297A1 (en) * | 2007-07-28 | 2009-01-29 | Yoshiki Matoba | X-ray tube and x-ray analysis apparatus |
| CN201666885U (zh) * | 2010-01-08 | 2010-12-08 | 纳优科技(北京)有限公司 | 用于偏振二次靶x射线荧光光谱仪的多靶材靶盘装置 |
-
2016
- 2016-12-22 IT IT102016000129994A patent/IT201600129994A1/it unknown
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3919548A (en) * | 1974-07-24 | 1975-11-11 | David E Porter | X-Ray energy spectrometer system |
| US20080084966A1 (en) * | 2006-02-01 | 2008-04-10 | Toshiba Electron Tubes & Devices Co., Ltd. | X-ray source and fluorescent X-ray analyzing apparatus |
| US20090028297A1 (en) * | 2007-07-28 | 2009-01-29 | Yoshiki Matoba | X-ray tube and x-ray analysis apparatus |
| CN201666885U (zh) * | 2010-01-08 | 2010-12-08 | 纳优科技(北京)有限公司 | 用于偏振二次靶x射线荧光光谱仪的多靶材靶盘装置 |
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