JPH02120085U - - Google Patents
Info
- Publication number
- JPH02120085U JPH02120085U JP2957389U JP2957389U JPH02120085U JP H02120085 U JPH02120085 U JP H02120085U JP 2957389 U JP2957389 U JP 2957389U JP 2957389 U JP2957389 U JP 2957389U JP H02120085 U JPH02120085 U JP H02120085U
- Authority
- JP
- Japan
- Prior art keywords
- body portion
- main body
- guide hole
- guide
- tab
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 2
- 210000000078 claw Anatomy 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Description
第１図ａとｂは本考案の一実施例を示す斜視図
と主要構成部材の一構造例を示す要部側断面図、
第２図はＴＡＢの一構成例を示す模式的要部平面
図である。
図において、１はコンタクトピン、１ａはピン
本体部、１ｂはパターン接触部、１ｃはリード線
接続部、１ｄは付勢バネ、５はＬＳＩ（半導体装
置）、８は実装部、１０はリードパターン、１１
はＬＳＩ係入孔、１２は凹部、１３は蝶番、１４
はガイド用突起、１５は本体部、１５ａは係止面
、１５ｂはピン突出面、１６は蓋部、１６ａはＴ
ＡＢ押圧面、１７は蓋固定用ラツチ、１７ａは爪
部、１７ｂは軸部、１８はガイド孔、２０はＴＡ
Ｂ、をそれぞれ示す。
Figures 1a and 1b are a perspective view showing an embodiment of the present invention and a side sectional view showing an example of the structure of the main components;
FIG. 2 is a schematic plan view of essential parts showing an example of the configuration of TAB. In the figure, 1 is a contact pin, 1a is a pin body part, 1b is a pattern contact part, 1c is a lead wire connection part, 1d is a biasing spring, 5 is an LSI (semiconductor device), 8 is a mounting part, and 10 is a lead pattern. , 11
is the LSI insertion hole, 12 is the recess, 13 is the hinge, 14
15 is a guide projection, 15 is a main body part, 15a is a locking surface, 15b is a pin protruding surface, 16 is a lid part, 16a is a T
AB pressing surface, 17 is the lid fixing latch, 17a is the claw part, 17b is the shaft part, 18 is the guide hole, 20 is TA
B, respectively.
Claims (1)
パターン１０がそれぞれ独立的、かつ連続的に形
成されると共に、これら各リードパターン１０対
応にガイド孔１８を有してなるＴＡＢ２０の試験
用治具であつて、 前記リードパターン１０対応に設けられたコン
タクトピン１および前記ガイド孔１８内に嵌合状
態で係入可能に設けられた複数個のガイド用突起
１４を装備してなる本体部１５と、 前記ガイド用突起１４をガイド孔１８内に係入
させる形で前記本体部１５上に位置決めされた前
記ＴＡＢ２０に対して当接或いは離脱が可能なよ
うに配置されてなる蓋部１６と、 によつて構成されてなることを特徴とするＴＡＢ
試験用治具。[Claims for Utility Model Registration] Lead patterns 10 connected to input/output terminals of the semiconductor device 5 are formed independently and continuously, and a guide hole 18 is provided corresponding to each of the lead patterns 10. This is a test jig for the TAB20, which is equipped with a contact pin 1 provided corresponding to the lead pattern 10 and a plurality of guide protrusions 14 provided so as to be able to fit into the guide hole 18 in a fitted state. a main body portion 15 formed of the above-mentioned body portion 15; and a main body portion 15 arranged so as to be able to come into contact with or separate from the TAB 20 positioned on the main body portion 15 in such a manner that the guide protrusion 14 is inserted into the guide hole 18. A TAB characterized by comprising: a lid portion 16;
Test jig.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2957389U JPH02120085U (en) | 1989-03-14 | 1989-03-14 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2957389U JPH02120085U (en) | 1989-03-14 | 1989-03-14 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH02120085U true JPH02120085U (en) | 1990-09-27 |
Family
ID=31253906
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2957389U Pending JPH02120085U (en) | 1989-03-14 | 1989-03-14 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH02120085U (en) |
-
1989
- 1989-03-14 JP JP2957389U patent/JPH02120085U/ja active Pending