JPH038791A - Silicon single crystal manufacturing method and manufacturing device - Google Patents

Silicon single crystal manufacturing method and manufacturing device

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Publication number
JPH038791A
JPH038791A JP14192389A JP14192389A JPH038791A JP H038791 A JPH038791 A JP H038791A JP 14192389 A JP14192389 A JP 14192389A JP 14192389 A JP14192389 A JP 14192389A JP H038791 A JPH038791 A JP H038791A
Authority
JP
Japan
Prior art keywords
raw material
silicon
material supply
single crystal
tube
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14192389A
Other languages
Japanese (ja)
Inventor
Hiroshi Kamio
神尾 寛
Kenji Araki
健治 荒木
Shuzo Fukuda
福田 脩三
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Engineering Corp
Original Assignee
NKK Corp
Nippon Kokan Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NKK Corp, Nippon Kokan Ltd filed Critical NKK Corp
Priority to JP14192389A priority Critical patent/JPH038791A/en
Publication of JPH038791A publication Critical patent/JPH038791A/en
Pending legal-status Critical Current

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Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 [産業上の利用分野コ 本発明はチョクラルスキー法(以下CZ法という)によ
るシリコン単結晶の引き上げ方法及び装置に関するもの
である。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to a method and apparatus for pulling silicon single crystals by the Czochralski method (hereinafter referred to as the CZ method).

[従来の技術] シリコン原料を連続的に供給しながらチョクラルスキー
法によるシリコン単結晶の引き上げ方法は古く良く知ら
れている。第4図は従来のシリコン単結晶の引き上げ装
置を示す図である。この装置の優れた点は、シリコン単
結晶引き上げ部Aから引き上げられたシリコン単結晶1
1に見合った量の粒状のシリコン原料12を連続的に原
料供給部Bに供給するため、石英るつぼ13のシ・リコ
ン融液14の量を常に一定になるように保つことができ
る点である。
[Prior Art] A method of pulling a silicon single crystal using the Czochralski method while continuously supplying a silicon raw material is old and well known. FIG. 4 is a diagram showing a conventional silicon single crystal pulling apparatus. The advantage of this equipment is that the silicon single crystal 1 pulled from the silicon single crystal pulling section A
Since the amount of granular silicon raw material 12 commensurate with 1 is continuously supplied to the raw material supply section B, the amount of silicon melt 14 in the quartz crucible 13 can always be kept constant. .

その結果引き上げられたシリコン単結晶11の長手方向
の酸素濃度はどの位置においても同じように保つことが
できる。また、シリコン単結晶11中のドープ材濃度に
おいても、引き上げられたシリコン単結晶11中に取り
込まれたドープ材の量に見合った量をシリコン融液14
中に連続的に添加すれば、シリコン単結晶11の長手方
向のドープ材濃度を一定に保つことができ、高品質、高
歩留のシリコン単結晶を製造することができる。
As a result, the oxygen concentration in the longitudinal direction of the pulled silicon single crystal 11 can be kept the same at any position. Also, regarding the concentration of the dopant in the silicon single crystal 11, an amount corresponding to the amount of dopant taken into the silicon single crystal 11 that has been pulled is set in the silicon melt 14.
By continuously adding dopant to the silicon single crystal 11, the concentration of the dopant in the longitudinal direction of the silicon single crystal 11 can be kept constant, and a silicon single crystal of high quality and high yield can be manufactured.

[発明が解決しようとする課題] 従来のCZ法は、粒状のシリコン原料12を原料供給部
Bに連続的に供給するために原料供給管15が配設され
ているが、粒状のシリコン原料12を確実に原料供給部
Bに供給するためには、原料供給管15の出口を石英る
っぽ13と仕切部材16の間の原料供給部Bのシリコン
融液14の液面に近づける必要がある。
[Problems to be Solved by the Invention] In the conventional CZ method, a raw material supply pipe 15 is disposed to continuously supply the granular silicon raw material 12 to the raw material supply section B, but the granular silicon raw material 12 In order to reliably supply the raw material supply part B to the raw material supply part B, it is necessary to bring the outlet of the raw material supply pipe 15 close to the liquid level of the silicon melt 14 in the raw material supply part B between the quartz pipe 13 and the partition member 16. .

なお、仕切部材16の下部にはシリコン溶融液が流動す
るための小孔18が配置されている。
Note that small holes 18 are arranged in the lower part of the partition member 16 to allow the silicon melt to flow.

しかしながら、原料供給管15を使いシリコン単結晶を
製造すると次のような問題が発生した。
However, when silicon single crystals were manufactured using the raw material supply pipe 15, the following problems occurred.

原料供給管15の出口付近はヒーター17が近接してい
るため高温になっている。るつぼやヒータ回りの断熱材
の配置状態によってはシリコン融点(例えば、1420
°C〉を越えるような温度にまでなってしまう、このよ
うな高温の原料供給管15の中を粒状のシリコン原料1
2を通過させると、シリコン原料12は原料供給管15
の内壁から次第に付着堆積し、最終的に原料供給管15
を詰まらせてしまう。−旦詰まると、以後はシリコン原
料12の連続供給は不可能になり、高品質のシリコン単
結晶の製造ができなくなる。
The vicinity of the outlet of the raw material supply pipe 15 is at a high temperature because the heater 17 is close to it. Silicon melting point (for example, 1420
The granular silicon raw material 1 is passed through the raw material supply pipe 15 at such a high temperature that the temperature exceeds °C.
2, the silicon raw material 12 passes through the raw material supply pipe 15
The material is gradually deposited on the inner wall of the raw material supply pipe 15.
It gets clogged. - Once it is clogged, it becomes impossible to continuously supply the silicon raw material 12 from now on, making it impossible to manufacture high-quality silicon single crystals.

この発明はかかる事情に鑑みてなされたものであって、
CZ法において、原料供給管の詰まりを防止する方法及
び装置を提供することを目的とする。
This invention was made in view of such circumstances, and
The present invention aims to provide a method and device for preventing clogging of raw material supply pipes in the CZ method.

[課題を解決するための手段] この発明のシリコン単結晶の製造方法及び装置は、溶融
シリコンが入れられたるつぼを内側のシリコン単結晶の
単結晶育成部と外側のシリコン原料を供給する原料供給
部との間に仕切部材で仕切り、前記原料供給部にシリコ
ン原料を連続的に供給し溶解しながら、前記仕切部材の
小孔を通して溶融シリコンを単結晶育成部に静かに移動
し、前記単結晶育成部からシリコン単結晶を製造する方
法において、シリコン原料を原料供給部の溶融液面上に
原料供給管から連続的に供給し、前記シリコン原料供給
管近傍に配置された高融点金属管又は石英管に導入され
た冷却ガスにより直接的又は間接的に原料供給管に冷却
する製造方法、及びシリコン原料を原料供給部の溶融液
面上に供給する原料供給管と前記原料供給管を冷却する
高融点金属管又は石英管とを配設した製造装置である。
[Means for Solving the Problems] The silicon single crystal manufacturing method and apparatus of the present invention provide a raw material supply system for supplying a single crystal growth section of a silicon single crystal inside a crucible containing molten silicon and a silicon raw material outside. The silicon raw material is continuously supplied to the raw material supplying section and while melting, the molten silicon is gently transferred to the single crystal growth section through the small holes of the partitioning member, and In a method for producing a silicon single crystal from a growth section, a silicon raw material is continuously supplied onto the molten liquid surface of a raw material supply section from a raw material supply pipe, and a high melting point metal tube or quartz is placed near the silicon raw material supply pipe. A manufacturing method in which a raw material supply pipe is directly or indirectly cooled by a cooling gas introduced into the pipe, and a raw material supply pipe that supplies a silicon raw material onto a molten liquid surface of a raw material supply section, and a high temperature cooling system that cools the raw material supply pipe. This is a manufacturing device equipped with melting point metal tubes or quartz tubes.

[作用] この発明はシリコン単結晶を製造する方法及び装置にお
いて、原料供給管の周囲に気体で直接又は間接的に冷却
できるように高融点金属管又は石英管を配設しなので、
原料供給管の周囲が冷却されるので、シリコン原料が原
料供給管内を円滑に通過し、原料供給部Bのシリコン溶
融液の表面に供給できる。
[Function] The present invention provides a method and apparatus for producing a silicon single crystal, in which a high melting point metal tube or a quartz tube is arranged around the raw material supply tube so that it can be cooled directly or indirectly with gas.
Since the area around the raw material supply pipe is cooled, the silicon raw material can smoothly pass through the raw material supply pipe and can be supplied to the surface of the silicon melt in the raw material supply section B.

[実施例] 第1図は本発明の原料供給管の周囲を気体で間接的に冷
却できるように高融点金属管を配設した一実施例を示す
図である。1は原料供給管、2は原料供給管を螺旋状に
沿わせた高融点金属管で、原料供給管1の出口部3付近
まで覆っており、ヒーターやシリコン溶融液面からの放
射熱が直接原石供給管1に当たらないように原料供給管
1の側面を照射しないように高融点金属管2と高融点金
属管2が接触するように密に巻かれている。この高融点
金属管2の一端Cから気体(例えば、アルゴンガス)が
導入できるように配設され、シリコン単結晶引き上げ装
置の外にあるアルゴン供給装置(図示せず)と繋がって
いる。この高融点金属管2の他端りは開放されており、
シリコン単結晶引き上げ装置内に排出できるようにしで
あるので、この螺旋状に沿わせた高融点金属管2はアル
ゴンによって冷却される9図中の矢印は冷却ガスの動き
の方向を示す。
[Example] Fig. 1 is a diagram showing an example in which a high melting point metal pipe is arranged so that the periphery of the raw material supply pipe of the present invention can be indirectly cooled with gas. 1 is a raw material supply pipe, and 2 is a high melting point metal pipe that runs along the raw material supply pipe in a spiral shape, and covers the raw material supply pipe 1 up to the vicinity of the outlet 3, so that the radiant heat from the heater and the silicon melt surface is directly absorbed. The high melting point metal tubes 2 are tightly wound so as to be in contact with each other so as not to hit the raw stone supply tube 1 and to prevent the side surface of the raw material supply tube 1 from being irradiated. This high melting point metal tube 2 is arranged so that gas (for example, argon gas) can be introduced from one end C thereof, and is connected to an argon supply device (not shown) located outside the silicon single crystal pulling device. The other end of this high melting point metal tube 2 is open,
Since it is designed to be discharged into the silicon single crystal pulling apparatus, the spirally arranged refractory metal tube 2 is cooled by argon. The arrows in FIG. 9 indicate the direction of movement of the cooling gas.

本発明は以上のように構成されているので、単に原料供
給管1を筒状物で覆った場合と比べて原料供給管1側に
面した高温物体面温度より低くすることができ、原料供
給管1に照射される高温ヒーターやシリコン溶融液面か
らの放射熱量を大幅に低減することができる。従って間
接的に原料供給管1を冷却して低温に保つことができる
ので、粒状シリコン原料中に含まれる微粉が原料供給管
1の表面に付着を減少し、焼結状に堆積して行くことを
防止することができる。
Since the present invention is configured as described above, the surface temperature of the high temperature object facing the raw material supply pipe 1 side can be lowered compared to the case where the raw material supply pipe 1 is simply covered with a cylindrical object, and the raw material supply The amount of heat radiated to the tube 1 from the high temperature heater and the silicon melt surface can be significantly reduced. Therefore, since the raw material supply pipe 1 can be indirectly cooled and kept at a low temperature, the fine powder contained in the granular silicon raw material is less likely to adhere to the surface of the raw material supply pipe 1 and is deposited in a sintered shape. can be prevented.

本実施例では、原料供給管1の出口部より上部50+u
+を螺旋状に沿わせたタンタルの高融点金属管2で覆い
、このタンタルの高融点金属管2内に冷却ガスとしてア
ルゴンIONβ/iを流して使用した。そして長時間操
業に対しても全くシリコン原料が詰まることはなかった
。なお、タンタルの高融点金属管2は、汚染源になるこ
とも考慮してタンタルの高融点金属管2の外表面を高純
度石英で被覆すればなおよい。
In this embodiment, the upper part 50+u from the outlet of the raw material supply pipe 1 is
+ was covered with a tantalum high melting point metal tube 2 arranged in a spiral shape, and argon IONβ/i was flowed as a cooling gas into the tantalum high melting point metal tube 2. Even during long-term operation, there was no clogging of silicon raw materials. Note that it is better if the outer surface of the tantalum high melting point metal tube 2 is coated with high purity quartz, taking into account that the tantalum high melting point metal tube 2 may become a source of contamination.

第2図は本発明の原料供給管の周囲を気体で間接的に冷
却できるように高融点金属管を配設した他の実施例を示
す図である。外径管5と内径管6で筒状とした二重筒管
で構成された前記高融点金属管2の円管筒内に原料供給
管1を挿入して配設し、第1図の実施例と同様にこの高
融点金属管2の一端C′から気体(例えばアルゴンガス
)が導入できるように配設され、シリコン単結晶引き上
げ装置の外にあるアルゴン供給装置(図示せず)と繋が
っている。この高融点金属管2の他端D′は開放されて
おり、シリコン単結晶引き上げ装置内に排出できるよう
にしである。この装置でも同様な効果が得られた。この
装置で二重管内に仕切材4を入れたのは冷却ガスがショ
ウトバスしないように高融点金属管2の下方まで行き渡
らせるなめである。
FIG. 2 is a diagram showing another embodiment of the present invention in which a high melting point metal tube is arranged so that the periphery of the raw material supply tube can be indirectly cooled with gas. The raw material supply pipe 1 is inserted and arranged in the cylindrical tube of the high melting point metal tube 2, which is composed of a double cylindrical tube made of an outer diameter tube 5 and an inner diameter tube 6, and the method shown in FIG. 1 is carried out. As in the example, the high melting point metal tube 2 is arranged so that gas (for example, argon gas) can be introduced from one end C', and is connected to an argon supply device (not shown) outside the silicon single crystal pulling device. There is. The other end D' of this high melting point metal tube 2 is open so that it can be discharged into a silicon single crystal pulling apparatus. Similar effects were obtained with this device. In this device, the partition material 4 is placed inside the double pipe to allow the cooling gas to reach the bottom of the high melting point metal pipe 2 to prevent short baths.

第3図は原料供給管を気体で直接的に冷却できるように
高融点金属管を配設した実施例を示す図である。この図
のおいて高融点金属管2は原料供給管と平行して設置さ
れ、適当な間隔に開口部7が配置されている。開口部7
の形状は丸型又はスリット型が一般的である。この実施
例は以上のように構成されているので原料供給管1は直
接高融点金属管の小孔又はスリット(図示せず)から噴
射されるので、原料供給管1は強制的に冷却される9 本実施例では小孔を原料供給管1の出口部3より51上
方から101ピツチで6個、−本の高融点金属管2を配
設した。高融点金属管2に供給した冷却用のアルゴンガ
スの量は5 N I / nl1nである。この装置で
の結果ら前記の実施例と同様に原料供給管1の出口部3
付近の粒状のシリコン原料の詰まりは発生しなかった。
FIG. 3 is a diagram showing an embodiment in which a high melting point metal tube is arranged so that the raw material supply tube can be directly cooled with gas. In this figure, the high melting point metal tube 2 is installed parallel to the raw material supply tube, and openings 7 are arranged at appropriate intervals. Opening 7
The shape is generally round or slit. Since this embodiment is configured as described above, the raw material supply pipe 1 is injected directly from the small hole or slit (not shown) of the high melting point metal pipe, so the raw material supply pipe 1 is forcibly cooled. 9 In this embodiment, 6 small holes were arranged at 101 pitches from 51 above the outlet 3 of the raw material supply pipe 1, and the high melting point metal pipes 2 were arranged. The amount of cooling argon gas supplied to the high melting point metal tube 2 was 5 N I /nl1n. From the results of this device, the outlet section 3 of the raw material supply pipe 1 is similar to the previous example.
No clogging of nearby granular silicon raw materials occurred.

又本装置は直接原料供給管1の表面に冷却用アルゴンガ
スを吹き付けるわけであるが、20 N 127 *程
度吹き付けてもシリコン溶融液面の変動及び粒状のシリ
コン原料の飛散は確認されず、シリコン単結晶の育成を
阻害することはなかった。
In addition, this device directly sprays cooling argon gas onto the surface of the raw material supply pipe 1, but even after spraying about 20 N 127*, no fluctuations in the silicon melt level or scattering of granular silicon raw materials were observed. It did not inhibit the growth of single crystals.

本実施例では開口部7付きの高融点金属管2は−本の例
で説明したが複数でも、同様な効果が得られた。高融点
金属管2の材質はタンタルの他に高純度石英管も使用し
た。なお、本発明の全ての実施例では気体としてアルゴ
ンガスを用いたが、シリコン単結晶の育成及び品質上の
支障がなければ他の気体でも良い。
In the present embodiment, the high melting point metal tube 2 with the opening 7 is explained as an example of two tubes, but the same effect can be obtained even with a plurality of tubes. As the material of the high melting point metal tube 2, a high purity quartz tube was also used in addition to tantalum. Although argon gas was used as the gas in all the embodiments of the present invention, other gases may be used as long as they do not interfere with the growth and quality of the silicon single crystal.

又、第1図、第2図に示すように間接冷却方式であれば
、冷却に使用した気体をシリコン単結晶引き上げ装置の
外部に誘導し排気するようにすれば、冷却用に使用でき
る気体の種類は更に増やすこともできる。
In addition, if the indirect cooling method is used as shown in Figures 1 and 2, the gas used for cooling can be guided to the outside of the silicon single crystal pulling equipment and exhausted, thereby reducing the amount of gas that can be used for cooling. The number of types can be further increased.

[発明の効果] 以上のように、この発明によればシリコン単結晶引き上
げ方法及び装置において、シリコン原料を原料供給部の
溶融液面上に連続的に供給する原料供給管と、前記シリ
コン原料供給管を冷却する高融点金属管又は石英管とを
配設しているので、原料供給管の濁囲が冷却されるので
、粒状のシリコン原料が原料供給管内で付着が防止でき
るので、原料供給管内での詰まりの発生はない。
[Effects of the Invention] As described above, according to the present invention, in the method and apparatus for pulling a silicon single crystal, there is provided a raw material supply pipe that continuously supplies a silicon raw material onto the molten liquid surface of a raw material supply section; A high-melting point metal tube or quartz tube is installed to cool the tube, so the turbidity of the raw material supply tube is cooled, and granular silicon raw materials can be prevented from adhering inside the raw material supply tube. No clogging occurred.

【図面の簡単な説明】[Brief explanation of the drawing]

第1区は本発明の原料供給管の周囲を気体で間接的に冷
却できるように高融点金属管を配設した一実施例を示す
図、第2図は本発明の原料供給管の周囲を気体で間接的
に冷却できるように高融点金属管を配設した他の実施例
を示す図、第3図は原料供給部を気体で直接的に冷却で
きるように高融点金属管を配設した実施例を示す図、第
4図は従来のシリコン単結晶の引き上げ装置を示す図で
ある。 1・原料供給管、2・・高融点金属管、3・・高融点金
属管の出口部、4・・・高融点金属管の仕切材、5・・
・外径管、6・・・内径管、7・・・開口部。
Section 1 is a diagram showing an embodiment in which a high melting point metal tube is arranged so that the area around the raw material supply pipe of the present invention can be indirectly cooled with gas, and Figure 2 shows the area around the raw material supply pipe of the present invention. Figure 3 shows another embodiment in which a high melting point metal tube is installed so that the raw material supply section can be cooled indirectly with gas. Embodiment FIG. 4 is a diagram showing a conventional silicon single crystal pulling apparatus. 1. Raw material supply pipe, 2.. High melting point metal tube, 3.. Outlet part of high melting point metal tube, 4.. Partition material for high melting point metal tube, 5..
- Outer diameter pipe, 6... Inner diameter pipe, 7... Opening.

Claims (5)

【特許請求の範囲】[Claims] (1)溶融シリコンが入れられたるつぼを内側のシリコ
ン単結晶の単結晶育成部と外側のシリコン原料を供給す
る原料供給部の間を仕切部材で仕切り、前記原料供給部
にシリコン原料を連続的に供給し溶解しながら、前記仕
切部材の小孔を通して溶融シリコンを単結晶育成部に静
かに移動し、前記単結晶育成部からシリコン単結晶を製
造する方法において、シリコン原料を原料供給管から原
料供給部の溶融液面上に連続的に供給し、前記原料供給
管近傍に配置された高融点金属管又は石英管に導入され
たガスにより直接的又は間接的に原料供給管を冷却する
ことを特徴とするシリコン単結晶の製造方法。
(1) A crucible containing molten silicon is partitioned by a partition member between an inner silicon single crystal growth section and an outer raw material supply section for supplying silicon raw material, and the silicon raw material is continuously supplied to the raw material supply section. In the method of producing a silicon single crystal from the single crystal growth section, the molten silicon is gently transferred to the single crystal growth section through the small holes of the partition member while being melted. The raw material supply pipe is cooled directly or indirectly by gas that is continuously supplied onto the molten liquid surface of the supply section and introduced into a high melting point metal tube or quartz tube arranged near the raw material supply pipe. Characteristics of the manufacturing method for silicon single crystals.
(2)溶融シリコンが入れられたるつぼを内側のシリコ
ン単結晶の単結晶育成部と外側のシリコン原料を供給す
る原料供給部とに仕切部材で仕切り、前記原料供給部に
シリコン原料を連続的に供給しながら前記原料供給部で
シリコン原料を溶解しながら、前記仕切部材の小孔を通
して溶融シリコンを単結晶育成部に静かに移動し、前記
単結晶育成部からシリコン単結晶を製造する装置におい
て、シリコン原料を原料供給部の溶融液面上に供給する
原料供給管と前記原料供給管を直接的又は間接的に冷却
する高融点金属管又は石英管とを配設したことを特徴と
するシリコン単結晶の製造装置。
(2) A crucible containing molten silicon is divided by a partition member into an inner single-crystal silicon crystal growth section and an outer raw material supply section that supplies silicon raw material, and the silicon raw material is continuously supplied to the raw material supply section. In an apparatus for manufacturing a silicon single crystal from the single crystal growth section by gently moving the molten silicon through the small holes of the partition member to the single crystal growth section while melting the silicon raw material in the raw material supply section while supplying the silicon raw material, A silicon unit characterized in that a raw material supply pipe for supplying a silicon raw material onto the molten liquid surface of a raw material supply section and a high melting point metal tube or a quartz tube for cooling the raw material supply pipe directly or indirectly are arranged. Crystal manufacturing equipment.
(3)前記原料供給管の外面を囲むように螺旋状に沿わ
せて、高融点金属管又は石英管を配設したことを特徴と
する請求項2記載のシリコン単結晶の製造装置。
(3) The silicon single crystal manufacturing apparatus according to claim 2, wherein a high melting point metal tube or a quartz tube is arranged spirally to surround the outer surface of the raw material supply tube.
(4)外径管と内径管で筒状とした二重筒管で構成され
た高融点金属管又は石英管の円管筒内に、前記原料供給
管を挿入して配設したことを特徴とする請求項2記載の
シリコン単結晶の製造装置。
(4) The raw material supply pipe is inserted into a cylindrical cylinder of a high-melting point metal tube or a quartz tube, which is made up of a double-cylindrical tube with an outer diameter tube and an inner diameter tube. 3. The silicon single crystal manufacturing apparatus according to claim 2.
(5)原料供給管近傍に沿って複数以上の開口部を設け
た1本以上の高融点金属管又は石英管を配設してなるこ
とを特徴とする請求項2記載のシリコン単結晶の製造装
置。
(5) Production of the silicon single crystal according to claim 2, characterized in that one or more high-melting point metal tubes or quartz tubes having a plurality or more openings are arranged along the vicinity of the raw material supply tube. Device.
JP14192389A 1989-06-02 1989-06-02 Silicon single crystal manufacturing method and manufacturing device Pending JPH038791A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14192389A JPH038791A (en) 1989-06-02 1989-06-02 Silicon single crystal manufacturing method and manufacturing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14192389A JPH038791A (en) 1989-06-02 1989-06-02 Silicon single crystal manufacturing method and manufacturing device

Publications (1)

Publication Number Publication Date
JPH038791A true JPH038791A (en) 1991-01-16

Family

ID=15303302

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14192389A Pending JPH038791A (en) 1989-06-02 1989-06-02 Silicon single crystal manufacturing method and manufacturing device

Country Status (1)

Country Link
JP (1) JPH038791A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0945528A1 (en) * 1998-03-26 1999-09-29 Leybold Systems GmbH Crystal pulling apparatus
EP0945529A1 (en) * 1998-03-26 1999-09-29 Leybold Systems GmbH Crystal pulling apparatus
WO2025239906A1 (en) * 2024-05-16 2025-11-20 Globalwafers Co., Ltd. Systems and methods for cooling a chunk polycrystalline feeder

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0945528A1 (en) * 1998-03-26 1999-09-29 Leybold Systems GmbH Crystal pulling apparatus
EP0945529A1 (en) * 1998-03-26 1999-09-29 Leybold Systems GmbH Crystal pulling apparatus
WO2025239906A1 (en) * 2024-05-16 2025-11-20 Globalwafers Co., Ltd. Systems and methods for cooling a chunk polycrystalline feeder

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