JPH0399375U - - Google Patents

Info

Publication number
JPH0399375U
JPH0399375U JP805890U JP805890U JPH0399375U JP H0399375 U JPH0399375 U JP H0399375U JP 805890 U JP805890 U JP 805890U JP 805890 U JP805890 U JP 805890U JP H0399375 U JPH0399375 U JP H0399375U
Authority
JP
Japan
Prior art keywords
parts
components
defective
testing
linear
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP805890U
Other languages
Japanese (ja)
Other versions
JPH0712948Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP805890U priority Critical patent/JPH0712948Y2/en
Publication of JPH0399375U publication Critical patent/JPH0399375U/ja
Application granted granted Critical
Publication of JPH0712948Y2 publication Critical patent/JPH0712948Y2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第１図はこの考案の一実施例を示す平面図であ
る。 １０……部品、１００……試験装置、１０１…
…テストヘツド、１０２……恒温槽、１０３……
案内レール、１０４……トレー、２００……部品
供給部、３００……整列装置、４００……不良品
搬送装置、５００……第１部品移載装置、５０１
……可動台、５０２……吸着ヘツド、６００……
第２部品移載装置、６０１……可動台、６０２…
…吸着ヘツド、７００……直線搬送装置、７２０
……良品選別装置、７４０……良品収納部。 FIG. 1 is a plan view showing an embodiment of this invention. 10...Parts, 100...Testing equipment, 101...
...Test head, 102... Constant temperature bath, 103...
Guide rail, 104... Tray, 200... Parts supply unit, 300... Aligning device, 400... Defective product transport device, 500... First parts transfer device, 501
...Movable table, 502...Suction head, 600...
Second parts transfer device, 601...Movable base, 602...
...Suction head, 700...Linear transport device, 720
...Good product sorting device, 740...Good product storage section.

Claims (1)

【実用新案登録請求の範囲】 Ａ 部品供給部から繰出される部品を受取つて一
例に整列させる部品整列装置と、 Ｂ この部品整列装置によつて整列された複数の
部品を装置内で循環するトレーに移載する第１部
品移載装置と、 Ｃ 第１部品移載装置によつて部品が移載された
トレーが移送され、搭載された部品の良否を試験
する試験装置と、 Ｄ この試験装置によつて試験された部品を搭載
して到来するトレーから、このトレーに搭載され
ている部品を直線搬送装置に移載する第２部品移
載装置と、 Ｅ 上記直線搬送装置によつて搬送される部品の
中の良品と判定された部品を上記直線搬送装置か
ら排出する良品選別装置と、 Ｆ この良品選別判別装置によつて上記直線搬送
装置から排出された部品を収納する良品部収納と
、 Ｇ 上記直線搬送装置の終端と、上記部品整列装
置との間に設けられ、上記良品選別装置によつて
選別されずに上記直線搬送装置の終端に運ばれた
不良品を上記部品整列装置に帰還させる不良品搬
送装置と、 によつて構成した部品試験装置。[Claims for Utility Model Registration] A: A parts aligning device that receives parts fed from a parts supply unit and arranges them in one example, and B: A tray that circulates a plurality of parts arranged by this parts aligning device within the device. C. A testing device for testing the quality of the loaded components by transferring the trays on which the components have been transferred by the first component transferring device; D. This testing device a second component transfer device that transfers the components loaded on the tray from the arriving tray loaded with the components tested by E to the linear conveyance device; F. a non-defective parts storage for storing the parts discharged from the linear transport device by the non-defective parts sorting and discriminating device; G is provided between the terminal end of the linear conveyance device and the component alignment device, and returns to the component alignment device defective products that have not been sorted by the non-defective product sorting device and have been carried to the terminal end of the linear transportation device. A parts testing device consisting of a defective product conveyance device that allows
JP805890U 1990-01-29 1990-01-29 Parts testing equipment Expired - Fee Related JPH0712948Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP805890U JPH0712948Y2 (en) 1990-01-29 1990-01-29 Parts testing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP805890U JPH0712948Y2 (en) 1990-01-29 1990-01-29 Parts testing equipment

Publications (2)

Publication Number Publication Date
JPH0399375U true JPH0399375U (en) 1991-10-17
JPH0712948Y2 JPH0712948Y2 (en) 1995-03-29

Family

ID=31511702

Family Applications (1)

Application Number Title Priority Date Filing Date
JP805890U Expired - Fee Related JPH0712948Y2 (en) 1990-01-29 1990-01-29 Parts testing equipment

Country Status (1)

Country Link
JP (1) JPH0712948Y2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010156709A (en) * 2004-07-23 2010-07-15 Advantest Corp Electronic component testing device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010156709A (en) * 2004-07-23 2010-07-15 Advantest Corp Electronic component testing device

Also Published As

Publication number Publication date
JPH0712948Y2 (en) 1995-03-29

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees