JPH04104074A - Electronic printed-circuit board inspection device - Google Patents

Electronic printed-circuit board inspection device

Info

Publication number
JPH04104074A
JPH04104074A JP2221855A JP22185590A JPH04104074A JP H04104074 A JPH04104074 A JP H04104074A JP 2221855 A JP2221855 A JP 2221855A JP 22185590 A JP22185590 A JP 22185590A JP H04104074 A JPH04104074 A JP H04104074A
Authority
JP
Japan
Prior art keywords
variable resistor
circuit board
volume
converter
electronic board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2221855A
Other languages
Japanese (ja)
Inventor
Kazuo Nobemoto
和夫 延本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP2221855A priority Critical patent/JPH04104074A/en
Priority to KR1019910013021A priority patent/KR920004854A/en
Priority to DE4126473A priority patent/DE4126473A1/en
Priority to GB9117906A priority patent/GB2247350B/en
Publication of JPH04104074A publication Critical patent/JPH04104074A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Adjustable Resistors (AREA)

Abstract

PURPOSE:To enable inspection to be performed easily and to be automated by adding a waveform which is similar when a variable resistor is changed by a D/A converter to an output of a variable resistor which is located within an electronic printed-circuit board so that a similar operation as if the variable resistor itself is changed occurs. CONSTITUTION:An electronic printed-circuit board inspection device allows voltage at an input terminal of a variable resistor 1 to be attenuated by a D/A converter 6 and at the same time output of the D/A converter 6 to be fed to the output terminal of the variable resistor 1 for simulating operation of the variable resistor 1, thus allowing operation of an electronic printed-circuit board 2 to be inspected. A waveform which is similar when the variable resistor 1 changes is added to an output of the variable resistor 1 which is located within the electronic printed-circuit board 2 by the external D/A converter 6, thus enabling an operation which is similar when the variable resistor 1 itself is changed to be produced within a circuit of the electronic printed-circuit board 2 for inspecting the electronic printed-circuit board 2.

Description

【発明の詳細な説明】 ［産業上の利用分野］ この発明は、可変抵抗器（以下、ボリュームという）を
有する電子基板の動作を検査するための装置に関するも
のである。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an apparatus for inspecting the operation of an electronic board having a variable resistor (hereinafter referred to as a volume).

［従来の技術］ 第４図（ａ）、（ｂ）に示すように、ボリューム（第５
図の符号１参照）を有する被検査対象の電子基板２を、
所定の接続手段を介して外部の試験器に接続した後、そ
の接続手段に電子基板２の動作に必要な電源および信号
（例えば第５図に示すような波形Ａの信号）を供給し、
第５図に示すように、所定のボリューム１のつまみを手
動または電動ドライバにより直接操作して抵抗値を変更
し、電子基板２の動作を計測器等で確ごしている。[Prior art] As shown in FIGS. 4(a) and 4(b), the volume (fifth
An electronic board 2 to be inspected having a
After connecting to an external tester via a predetermined connection means, supplying power and signals necessary for the operation of the electronic board 2 (for example, a signal with waveform A as shown in FIG. 5) to the connection means,
As shown in FIG. 5, the resistance value is changed by directly operating a knob of a predetermined volume 1 manually or with an electric screwdriver, and the operation of the electronic board 2 is confirmed with a measuring device or the like.

つまり、ボリューム１のつまみを調整することにより、
ボリューム１にて設定される抵抗値を変えることで信号
を変化させ、その電圧出力を電圧計等の計測器により確
認するという手順であり、試験器そのものが、回路を正
常に動作させるための周辺または内部的回路９機構を有
していても。In other words, by adjusting the volume 1 knob,
The procedure is to change the signal by changing the resistance value set with Volume 1, and check the voltage output with a measuring device such as a voltmeter. Or even if it has an internal circuit 9 mechanism.

ボリューム１そのものは、手動またはドライバ等で駆動
することによってのみ制御されている。The volume 1 itself is controlled only manually or by driving with a screwdriver or the like.

また、例えば、第５図に示すように、回路内で発生した
信号の制御を行なっているようなボリューム１を変換さ
せることによる検査は、やはりボリューム１を直接操作
することにより行なっている。Further, for example, as shown in FIG. 5, inspection by converting the volume 1, which controls signals generated within the circuit, is also performed by directly operating the volume 1.

なお、第５図において、符号２ａは電子基板２上のＩＣ
，Ｑｌは電子基板２上のトランジスタである。In addition, in FIG. 5, reference numeral 2a indicates an IC on the electronic board 2.
, Ql are transistors on the electronic substrate 2.

また、上記接続手段としては、第４図（’ａ　）に示す
ようなコネクタ３によるものや、第４図（ｂ）に示すよ
うなピン４によるものなどがある。後者の接続手段では
、コネクタ３等を接続する代りに、試験器に接続される
針状のピン４を、電子基板２裏のパターン部に直接接触
させることにより、外部との電気的接続を行なっている
。Further, as the above-mentioned connection means, there are a connector 3 as shown in FIG. 4('a), a pin 4 as shown in FIG. 4(b), and the like. In the latter connection method, instead of connecting the connector 3 or the like, the needle-shaped pin 4 connected to the tester is brought into direct contact with the pattern on the back of the electronic board 2 to establish electrical connection with the outside. ing.

［発明が解決しようとする課題］ 従来の電子基板の検査手段では、ボリューム１による抵
抗設定量の制御を手動または電動ドライバ等によりボリ
ューム１を直接駆動することによってのみ行なっている
。しかしながら、ボリューム１の位置、形状等から電動
９手動ドライバが挿入困難な電子基板２も多く、検査の
自動化等において障害があった。例えば、ボリューム１
の操作時間がかかったり、多数のボリューム１が電子基
板２上にある場合、ミスにより未検査のボリューム１が
発生する等の不具合が発生する。[Problems to be Solved by the Invention] In the conventional electronic board inspection means, the resistance setting amount by the volume 1 is controlled only by directly driving the volume 1 manually or with an electric screwdriver or the like. However, there are many electronic boards 2 in which it is difficult to insert an electric 9-manual screwdriver due to the position, shape, etc. of the volume 1, which poses a problem in automating inspections and the like. For example, volume 1
If the operation takes a long time, or if a large number of volumes 1 are on the electronic board 2, problems may occur such as uninspected volumes 1 due to mistakes.

この発明は上記のような課題を解消するためになさ些た
もので、ボリューム（可変抵抗器）自体を操作すること
なくボリュームを操作したのと同じ変化を外部から被検
査対象に与えられるようにして、検査の省力化、自動化
を実現した電子基板検査装置を得ることを目的とする。This invention was made in order to solve the above-mentioned problem, and it is possible to apply the same change to the test object from the outside as if the volume was manipulated without manipulating the volume (variable resistor) itself. The purpose of this invention is to obtain an electronic board inspection device that realizes labor saving and automation of inspection.

口課題を解決するための手段］ この発明に係る電子基板検査装置は、可変抵抗器の入力
端の電圧をＤ／Ａコンバータによって減衰させるととも
にＤ／Ａコンバータの出力を可変抵抗器の出力端に与え
て可変抵抗器の操作を模擬し、電子基板の動作を検査す
るものである。Means for Solving the Problems] An electronic board inspection device according to the present invention attenuates the voltage at the input end of a variable resistor using a D/A converter, and also connects the output of the D/A converter to the output end of the variable resistor. This test simulates the operation of a variable resistor and tests the operation of the electronic board.

［作　　　用］ この発明における電子基板検査装置では、電子基板中に
ある可変抵抗器の出力に、外部のＤ／Ａコンバータによ
り可変抵抗器が変化した時と同様の波形が加えられ、あ
たかも可変抵抗器自体が変化したのと同様の動作を、電
子基板中の回路に生じさせて、その電子基板の動作を検
査することができる。[Function] In the electronic board inspection device of the present invention, a waveform similar to that when the variable resistor is changed by an external D/A converter is added to the output of the variable resistor in the electronic board, so that it appears as if the variable resistor is being changed. It is possible to test the operation of the electronic board by causing the circuits in the electronic board to behave in a manner similar to the change in the device itself.

［発明の実施例コ 以下、この発明の一実施例を図について説明する。[Embodiments of the invention] An embodiment of the present invention will be described below with reference to the drawings.

第１，２図において、１は被検査対象の電子基板２中の
ボーリューム（可変抵抗器）、２ａは電子基板２中のＩ
Ｃｌ３はボリュームコントロール回路で、このボリュー
ムコントロール回路５は、Ｄ／Ａコンバータ６および出
力用のプッシュプルゲート（出力用バッファ）７を有し
て構成されており、Ｄ’／’Ａコンバータ６としては、
例えば、ＮＥＣ社製のＤ’／ＡコンバータμＰＤ６’３
２６Ｃなどが用いられる。そして５ボリユ一ムコントロ
ール回路５は、ピン８，８′を介して電子基板２上のボ
リューム１の入力端Ｐ工および出力端Ｐ２に接続される
よう゛になっている。In Figures 1 and 2, 1 is the volume (variable resistor) in the electronic board 2 to be inspected, and 2a is the I in the electronic board 2.
Cl3 is a volume control circuit, and this volume control circuit 5 includes a D/A converter 6 and an output push-pull gate (output buffer) 7, and the D'/'A converter 6 includes: ,
For example, D'/A converter μPD6'3 manufactured by NEC
26C etc. are used. The 5-volume control circuit 5 is connected to the input terminal P and the output terminal P2 of the volume 1 on the electronic board 2 via pins 8 and 8'.

さて、ボリューム１を操作した場合、入力端Ｐ１の電圧
が減衰して出力端Ｐ２に発生し、後段のＩＣ２ａに所定
の作用を及ぼ−１のであるが、従来の検査手段では、こ
のボリューム１を操作し、ＩＣ２ａの出力を観察するこ
とにより回路の動作状態を検査していたが１本実施例の
装置では、Ｄ／Ａコンバータ６、プッシュプルゲート７
などから構成されたボリュームコントロール回路５によ
り、次のように電子基板２の動作を検゛査する。Now, when the volume 1 is operated, the voltage at the input terminal P1 is attenuated and generated at the output terminal P2, which exerts a predetermined effect on the IC 2a in the subsequent stage, resulting in a voltage of -1. The operating state of the circuit was inspected by operating the IC 2a and observing the output of the IC 2a.
The operation of the electronic board 2 is inspected as follows using the volume control circuit 5, which is comprised of the following components.

■ボリューム１の入力端Ｐ１の電圧（波形）を、Ｄ／Ａ
コンバータ６の基準電源とす入く、ピン８を介してＤ／
Ａコンバータ６の１６番端子に取り込む。■The voltage (waveform) of input terminal P1 of volume 1 is D/A
Connects to the reference power supply of converter 6 via pin 8
It is taken into the 16th terminal of A converter 6.

（■Ｉ）／Ａコンバータ６の２番端子にパソコン等（図
示せず）からの制御パルスｉ入力し、゛１５番出力端子
にボリューム１の入力端Ｐ□における電圧波形を任意に
減衰させたものを発生させる。(■I) A control pulse i from a personal computer (not shown) is input to the 2nd terminal of the /A converter 6, and the voltage waveform at the input end P□ of the volume 1 is arbitrarily attenuated to the 15th output terminal. generate something.

■１５番端子の出力をプッシュプルゲート７に入力し、
そのプッシュプルゲート７の出力を、ピン８を介してボ
□リューム１の′出力端Ｐ２に印加する。■Input the output of terminal 15 to push-pull gate 7,
The output of the push-pull gate 7 is applied to the 'output end P2 of the volume 1 via the pin 8.

■ボリューム１の抵抗値設定位置によって′は元来の出
力端Ｐ２の電圧がプッシュプルゲート７の出力電圧より
低い時も高い時もあるが、このプッシュプルゲート７に
より元来の電圧より高くも低くも制御することができる
。■Depending on the resistance setting position of the volume 1, the original voltage at the output terminal P2 may be lower or higher than the output voltage of the push-pull gate 7; It can also be controlled at low levels.

つまり、電子基板２下部よりピン８，８を利用して外部
と電気的に接続し、ボリュームコントロール回路５によ
ってボリューム１の出力を変化させ、ボリューム１を駆
動したことと同様の動作させることができる。In other words, it is possible to electrically connect to the outside using pins 8 and 8 from the bottom of the electronic board 2, change the output of volume 1 with the volume control circuit 5, and perform the same operation as driving volume 1. .

第３図は、パソコン（図示せず）と組み合わせた装置全
体の概略であるが、パソコンのプログラミングにより、
ボリュームコントロール回路（ボリューム出力波形制御
回路）５に所定の信号を送り、ボリューム１を操作する
ことなく電子基板２の検査を行なうことができる。これ
により、検査時間の省略化、検査の自動化、精度の向上
をはかることができる。なお、第３図中、符号４ａ、４
ｂは電子基板２を外部回路と電気的に接続するためのピ
ンである。Figure 3 is a schematic diagram of the entire device combined with a personal computer (not shown).
By sending a predetermined signal to the volume control circuit (volume output waveform control circuit) 5, the electronic board 2 can be inspected without operating the volume 1. This makes it possible to shorten inspection time, automate inspection, and improve accuracy. In addition, in FIG. 3, symbols 4a and 4
b is a pin for electrically connecting the electronic board 2 to an external circuit.

また、ボリューム１の出力が単に直流電圧だけでなく種
々の複雑な波形であっても確実にその出力をコントロー
ルすることができる。Further, even if the output of the volume 1 is not only a direct current voltage but also various complicated waveforms, the output can be reliably controlled.

このようにして、ボリューム１自体が制御している電圧
が直流、交流または複雑な波形であっても、確実にボリ
ューム１自体が入力して電圧波形を再現、増＄１（また
は減衰）させうるので１本発明の装置は、どのように使
われているボリューム１に対しても適用可能である。In this way, even if the voltage controlled by the volume 1 itself is direct current, alternating current, or has a complex waveform, the volume 1 itself can reliably input the voltage to reproduce and increase (or attenuate) the voltage waveform. Therefore, the device of the present invention can be applied to any volume 1 that is used.

なお、上記実施例では、ボリューム１を駆動する回路と
してＤ／Ａコンバータ６を使用しているが、他にオペア
ンプ等を使用し、信号が十電位だけでなく、−電位に対
しても対応が可能な回路を構成し、より幅広い回路に対
応できるようにしてもよい。In the above embodiment, the D/A converter 6 is used as a circuit for driving the volume 1, but an operational amplifier or the like is also used so that the signal can handle not only 10 potentials but also negative potentials. Possible circuits may be configured to accommodate a wider range of circuits.

［発明の効果］ 以上のように、この発明によれば、電子基板中にある可
変抵抗器の出力に、Ｄ／Ａコンバータにより可変抵抗器
が変化した時と同様の波形を加え、あたかも可変抵抗器
自体が変化したのと同様の動　。[Effects of the Invention] As described above, according to the present invention, a waveform similar to that when the variable resistor is changed by the D/A converter is added to the output of the variable resistor in the electronic board, as if the variable resistor were changed. A movement similar to that of the vessel itself changing.

作を生じさせるように構成したので、可変抵抗器自体を
操作することなく、電子基板の動作を検査でき検査の省
力化、自動化を実現できる効果がある。Since the present invention is configured to generate a movement, the operation of the electronic board can be inspected without operating the variable resistor itself, and there is an effect that labor saving and automation of inspection can be realized.

【図面の簡単な説明】[Brief explanation of the drawing]

第１図はこの発明の一実施例による電子基板検査装置を
示す回路図、第２図は本実施例の回路の接続例を示す模
式的な斜視図、第３図は本実施例の回路をパソコンと組
み合わせた場合の全体概略図、第４図（ａ）、（ｂ）は
電子基板と外部回路との電気的接続手段の例を示す斜視
図、第５図は従来の電子基板検査手段を説明するための
電子基板の回路図である。 図において、１−＝−ボリューム（可変抵抗器）、２−
電子基板、６−Ｄ　／　Ａコンバータ。 なお１図中、同一の符号は同一、又は相当部分を示して
いる。FIG. 1 is a circuit diagram showing an electronic board inspection apparatus according to an embodiment of the present invention, FIG. 2 is a schematic perspective view showing an example of the circuit connection of this embodiment, and FIG. 3 is a circuit diagram of the circuit of this embodiment. 4(a) and 4(b) are perspective views showing examples of electrical connection means between an electronic board and an external circuit, and FIG. 5 shows a conventional electronic board inspection means. It is a circuit diagram of an electronic board for explanation. In the figure, 1-=-volume (variable resistor), 2-
Electronic board, 6-D/A converter. In addition, in FIG. 1, the same reference numerals indicate the same or corresponding parts.

Claims (1)

【特許請求の範囲】[Claims] 可変抵抗器を有する被検査対象の電子基板の動作を検査
する電子基板検査装置において、前記可変抵抗器の入力
端の電圧をＤ／Ａコンバータによって減衰させるととも
に該Ｄ／Ａコンバータの出力を前記可変抵抗器の出力端
に与えて前記可変抵抗器の操作を模擬し、前記電子基板
の動作を検査することを特徴とする電子基板検査装置。In an electronic board inspection apparatus that inspects the operation of an electronic board to be tested that has a variable resistor, the voltage at the input terminal of the variable resistor is attenuated by a D/A converter, and the output of the D/A converter is attenuated by the variable resistor. An electronic board inspection device characterized in that the operation of the electronic board is tested by applying it to an output end of a resistor to simulate the operation of the variable resistor.
JP2221855A 1990-08-22 1990-08-22 Electronic printed-circuit board inspection device Pending JPH04104074A (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2221855A JPH04104074A (en) 1990-08-22 1990-08-22 Electronic printed-circuit board inspection device
KR1019910013021A KR920004854A (en) 1990-08-22 1991-07-29 Electromagnetic plate inspection device
DE4126473A DE4126473A1 (en) 1990-08-22 1991-08-09 METHOD AND DEVICE FOR EXAMINING ELECTRONIC CIRCUITS
GB9117906A GB2247350B (en) 1990-08-22 1991-08-20 Method and apparatus for inspecting electronic circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2221855A JPH04104074A (en) 1990-08-22 1990-08-22 Electronic printed-circuit board inspection device

Publications (1)

Publication Number Publication Date
JPH04104074A true JPH04104074A (en) 1992-04-06

Family

ID=16773248

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2221855A Pending JPH04104074A (en) 1990-08-22 1990-08-22 Electronic printed-circuit board inspection device

Country Status (4)

Country Link
JP (1) JPH04104074A (en)
KR (1) KR920004854A (en)
DE (1) DE4126473A1 (en)
GB (1) GB2247350B (en)

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4400809A (en) * 1981-03-02 1983-08-23 Texas Instruments Incorporated Arbitrary drive for magnetic field waveform control
JPS58158566A (en) * 1982-03-17 1983-09-20 Hitachi Ltd Inspecting unit
US4675673A (en) * 1984-01-27 1987-06-23 Oliver Douglas E Programmable pin driver system
DE3683284D1 (en) * 1985-09-23 1992-02-13 Sharetree Systems Ltd OVEN FOR BURNING IN INTEGRATED CIRCUITS.
US4816750A (en) * 1987-01-16 1989-03-28 Teradyne, Inc. Automatic circuit tester control system

Also Published As

Publication number Publication date
GB2247350A (en) 1992-02-26
GB9117906D0 (en) 1991-10-09
DE4126473A1 (en) 1992-03-05
KR920004854A (en) 1992-03-28
GB2247350B (en) 1994-02-16

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