JPH063417A - Circuit board inspection device - Google Patents

Abstract

PURPOSE:To enable a probe to be easily brought into contact with a measuring terminal by moving a curcor with a mouse to point out the picture image of desired terminal and controlling automatic operation so that a probe position will coicide with the terminal position. CONSTITUTION:After an picture image of a measuring objective board 4 is measured by a CCD camera 32 while moving a carriage 30, the output is A/D converted and the positions of picture elements are stored as addresses in a picture memory 7. By a picture read-out signal from a host computer 1, the picture signal from the memory 7 is read out and is indicated on a display 9. A cursor position is displayed on the display 9 by using a mouse 10. After the cursor is removed until it is placed on the picture image of desired terminal and a signal is sent from the mouse 10, an automatic alignment mechanism is activated, so that the position of the probe 31 is coicided with that of the desired terminal. At this position, a solenoid is energized to lower the probe 31 so as to measure the terminal.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a circuit board inspection device.

[0002]

2. Description of the Related Art As a prior art of the present invention, Japanese Patent Application No. 62-050574 (Japanese Patent Laid-Open No. 63-05074) filed by the applicant of the present application on March 5, 1987 entitled "Function Tester".
No. 215976, hereinafter referred to as prior application). FIG. 4 is a perspective view showing the configuration of the prior application, in which 3 is an XY table on which a substrate to be measured is mounted, 30 is a carriage,
31 is a probe, 33 is a Y-axis bar, 35 is a Y-axis motor,
36 is an X-axis bar, 37 is an X-axis motor, and 38 is a solenoid. The plane of the XY table is the XY plane X-
In the YZ orthogonal coordinates, the X-axis bar 36 is provided parallel to the X-axis of the coordinate, the Y-axis bar 33 is provided parallel to the Y-axis of the coordinate, and the X-axis motor 37 connects the Y-axis bar 33 to the X-axis bar. 36
Drive to any position above. The Y-axis motor 35 drives the carriage 30 to an arbitrary position on the Y-axis bar. Therefore, the probe 31 mounted on the carriage 30 is
It becomes possible to move to any position in the XY plane.

A pulse motor is often used as the X-axis motor 37 and the Y-axis motor 35. In the case of a pulse motor, the input pulse number is algebraic (the forward rotation pulse is +
Since the integrated value is the moving amount, the moving amount of the probe 31 can be easily detected, and thus the position coordinate of the probe 31 can be easily detected. Even when a motor other than the pulse motor is used, the position coordinates of the probe 31 can be detected by a known method. Furthermore, it is also possible to automatically control the position of the probe 31 so as to match the given position coordinates by a known method.

In the apparatus of the prior application, a reference substrate (not shown) is placed on the XY table 3, probes are sequentially brought into contact with predetermined terminals to obtain data, and this data is stored in a storage means (see FIG. 3). (Not shown), the substrate to be inspected is then placed on the XY table 3, probes are sequentially brought into contact with the predetermined terminals to obtain data, and this data is stored in the storage means. The quality was determined by comparing with the data of the substrate.

In this case, accurately aligning the probe 31 with a desired terminal position (in the XY plane) is a troublesome work. For example, in a conventional device as disclosed in Japanese Patent Laid-Open No. 61-262671, an original drawing of a circuit board is separately placed on a digitizer, and the digitizer determines the position coordinates of a desired terminal for the original drawing. With respect to the obtained position coordinates, the troublesome operation of controlling the position of the probe on the XY table is performed. In the invention according to the above-mentioned prior application, in order to avoid this troublesome operation, a focusing light source (not shown) is provided on the carriage 30, and when a desired terminal is irradiated by this focusing light source, the probe automatically controls the position on the terminal. I was made to do it.

[0006]

In the invention of the prior application as described above, it is a relatively easy operation to irradiate a desired terminal with a focusing light source, but still, a troublesome operation of precisely moving the carriage is required. There was a problem that it remained.

The present invention has been made to solve the above problems, and an object of the present invention is to provide a circuit board inspecting apparatus capable of easily bringing a probe into contact with a terminal to be measured.

[0008]

A circuit board inspection apparatus according to the present invention displays an image of a target board on a display device, displays a cursor position on the display surface of the display device, and moves the cursor position with a mouse. When was moved to match the image of the desired terminal, the probe position was automatically controlled so as to match the terminal position.

[0009]

Since a part of the target circuit board can be enlarged and displayed on the display surface of the display device, it is easy to move the cursor position with the mouse for precise positioning.

[0010]

1 is a block diagram showing an embodiment of the present invention. In FIG. 1, the same reference numerals as those in FIG. 4 denote the same or corresponding parts, 1 is a host computer, 2 is a storage means, and 4 is Substrate to be measured, 5 keyboard, 6 image input / output circuit, 7 image memory, 8 processing unit, 9 display device,
10 is a mouse and 32 is a TV camera. FIG. 2 is a circuit diagram showing an equivalent circuit of FIG. 1, and the same reference numerals as those in FIG. 1 represent the same parts and show an embodiment in which the TV camera 32 is a CCD camera. FIG. 3 is a perspective view showing the periphery of the carriage 30, and the same reference numerals as those in FIGS. 1 and 4 denote the same parts.

The operation of the apparatus of the present invention will be described below with reference to FIGS. A small CCD camera 32 is usually used as the TV camera 32, and therefore it is not possible to take an image image from the entire surface of the substrate 4 to be measured at a time. Therefore, the carriage 30 is moved in the X and Y directions for measurement. The image of the target substrate 4 is measured, the output is converted into a digital signal, and the position of the pixel is stored in the image memory 7 via the image input / output circuit 6 as an address. As shown in FIG. 3, the probe 31 and the T
Since there is a position offset between the V camera 32 and the V camera 32, the address when the image image is stored in the image memory 7 is an address with the center point of the probe 31 as the reference position.

When the image read signal from the host computer 1 is transmitted to the image input / output circuit 6, the image memory 7
The image signal is read out and is displayed on the display device 9 through the image input / output circuit 6, the processing unit 8 and the host computer 1. That is, the image displayed on the display device 9 is an image similar to the surface of the measurement target substrate 4. The cursor position is displayed on the display device 9 from the mouse 10 via the host computer 1. This cursor position can be moved freely by operating the mouse 10. When the cursor position is moved to match the image of the desired terminal and then a signal is sent from the mouse 10 to the host computer 1, an automatic alignment mechanism (configured in the host computer 1) operates to operate the probe 31. The position in the XY plane of is matched with the position of the desired terminal. At this position, the solenoid 38 is urged to lower the probe 31 and measure the terminal. It is an easy task to operate the mouse 10 to match the cursor position with the image of the terminal while observing the image of the terminal on the display surface of the display device 9.

First, the reference circuit board is placed on the XY table 3 and a predetermined terminal is measured by using the probe 31, and the measurement result is stored in the storage means 2 to obtain data such as an acceptable range of pass / fail judgment. Is stored in the storage means 2 from the keyboard 5 via the host computer 1. The circuit board to be inspected is placed on the XY table 3 and the same terminal as that measured on the reference circuit board is measured using the probe 31, and the measured value is compared with the numerical value stored in the storage means 2. Then, the quality of the circuit board is determined. When the terminal voltage is AC, it is sampled at an appropriate sampling period and stored as a digital signal. The sampling cycle to be used may be input to the host computer 1 from the keyboard 5 in advance.

[0014]

As described above, according to the present invention, it is possible to facilitate the operation of contacting the probe with the terminal to be measured in the circuit board inspecting device.

[Brief description of drawings]

FIG. 1 is a block diagram showing an embodiment of the present invention.

FIG. 2 is a connection diagram showing an equivalent circuit of FIG.

FIG. 3 is a perspective view showing a portion of the carriage shown in FIG.

FIG. 4 is a perspective view showing a conventional device.

[Explanation of symbols]

 1 Host Computer 2 Storage Means 3 XY Table 4 Measurement Target Substrate 6 Image Input / Output Circuit 7 Image Memory 9 Display Device 10 Mouse 30 Carriage 31 Probe 32 TV Camera

Claims (1)

[Claims] 1. An XY table on which a circuit board to be measured is mounted, and an XY table in which the board mounting plane of the XY table is an XY plane, and the A carriage configured so that the position on the Y plane can be arbitrarily controlled and the position coordinates thereof can be detected, a probe up-and-down mechanism for driving this probe in the Z-axis direction, on the XY table Image pickup means for picking up an image image of the circuit board placed on the image pickup circuit and storing the picked-up image image in the image memory by using the coordinate position of the image on the XY plane as an address; Means for reading out the image image of and displaying it on a display device, displaying an index mark on the display device displaying the circuit board, and aligning the index mark with a predetermined measurement point on the circuit board. Index mark control means for changing the display position of the index mark by an operation so that it can be operated, storage means for storing the coordinate position of the circuit board corresponding to the index mark position on the display device, and the circuit board from the storage means Is provided with a positioning mechanism for moving the carriage so as to match the probe with the coordinate position of the circuit board, and after aligning the probe with the measurement point of the circuit board by the positioning mechanism, A circuit board inspection device in which the probe is brought into contact with the measurement point by the probe lifting mechanism.