JPS51147181A - Detection method of accident location in semiconductor elements - Google Patents

Detection method of accident location in semiconductor elements

Info

Publication number: JPS51147181A
Authority: JP; Japan
Prior art keywords: detection method; semiconductor elements; accident location; accident; location
Prior art date: 1975-06-12
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Granted

Application number

JP7158475A

Other languages

English (en)

Other versions

JPS5821425B2 (ja

Inventor

Nobukatsu Manabe

Kiyoshi Futagawa

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

NEC Corp

Original Assignee

NEC Corp

Nippon Electric Co Ltd

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1975-06-12

Filing date

1975-06-12

Publication date

1976-12-17

1975-06-12 Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp

1975-06-12 Priority to JP7158475A priority Critical patent/JPS5821425B2/ja

1976-12-17 Publication of JPS51147181A publication Critical patent/JPS51147181A/ja

1983-04-30 Publication of JPS5821425B2 publication Critical patent/JPS5821425B2/ja

Status Expired legal-status Critical Current

Links

239000004065 semiconductor Substances 0.000 title abstract 2
238000001514 detection method Methods 0.000 title 1
230000002159 abnormal effect Effects 0.000 abstract 1
238000010438 heat treatment Methods 0.000 abstract 1

Landscapes

Testing Or Measuring Of Semiconductors Or The Like (AREA)

JP7158475A 1975-06-12 1975-06-12 ハンドウタイソシノコシヨウカシヨケンシユツホウホウ Expired JPS5821425B2 (ja)

Priority Applications (1)

Application Number	Priority Date	Filing Date	Title
JP7158475A JPS5821425B2 (ja)	1975-06-12	1975-06-12	ハンドウタイソシノコシヨウカシヨケンシユツホウホウ

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
JP7158475A JPS5821425B2 (ja)	1975-06-12	1975-06-12	ハンドウタイソシノコシヨウカシヨケンシユツホウホウ

Publications (2)

Publication Number	Publication Date
JPS51147181A true JPS51147181A (en)	1976-12-17
JPS5821425B2 JPS5821425B2 (ja)	1983-04-30

Family

ID=13464876

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
JP7158475A Expired JPS5821425B2 (ja)	1975-06-12	1975-06-12	ハンドウタイソシノコシヨウカシヨケンシユツホウホウ

Country Status (1)

Country	Link
JP (1)	JPS5821425B2 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JP2015023114A (ja) *	2013-07-18	2015-02-02	信越半導体株式会社	半導体素子の評価方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS62184191A (ja) *	1986-02-07	1987-08-12	関東レザ−株式会社	凹凸模様を有する結露防止壁紙の製造方法

1975
- 1975-06-12 JP JP7158475A patent/JPS5821425B2/ja not_active Expired

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JP2015023114A (ja) *	2013-07-18	2015-02-02	信越半導体株式会社	半導体素子の評価方法

Also Published As

Publication number	Publication date
JPS5821425B2 (ja)	1983-04-30

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