JPS5295251A - Method of detecting surface deficiency with continuous wave motion - Google Patents

Method of detecting surface deficiency with continuous wave motion

Info

Publication number
JPS5295251A
JPS5295251A JP1158776A JP1158776A JPS5295251A JP S5295251 A JPS5295251 A JP S5295251A JP 1158776 A JP1158776 A JP 1158776A JP 1158776 A JP1158776 A JP 1158776A JP S5295251 A JPS5295251 A JP S5295251A
Authority
JP
Japan
Prior art keywords
continuous wave
wave motion
detecting surface
surface deficiency
deficiency
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1158776A
Other languages
English (en)
Other versions
JPS5828525B2 (ja
Inventor
Takahiko Ootani
Yasumasa Urabe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Inax Corp
Original Assignee
Inax Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Inax Corp filed Critical Inax Corp
Priority to JP51011587A priority Critical patent/JPS5828525B2/ja
Publication of JPS5295251A publication Critical patent/JPS5295251A/ja
Publication of JPS5828525B2 publication Critical patent/JPS5828525B2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)
JP51011587A 1976-02-04 1976-02-04 連続波動による表面欠陥検知方法 Expired JPS5828525B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP51011587A JPS5828525B2 (ja) 1976-02-04 1976-02-04 連続波動による表面欠陥検知方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP51011587A JPS5828525B2 (ja) 1976-02-04 1976-02-04 連続波動による表面欠陥検知方法

Publications (2)

Publication Number Publication Date
JPS5295251A true JPS5295251A (en) 1977-08-10
JPS5828525B2 JPS5828525B2 (ja) 1983-06-16

Family

ID=11782025

Family Applications (1)

Application Number Title Priority Date Filing Date
JP51011587A Expired JPS5828525B2 (ja) 1976-02-04 1976-02-04 連続波動による表面欠陥検知方法

Country Status (1)

Country Link
JP (1) JPS5828525B2 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011052130A1 (ja) * 2009-10-28 2011-05-05 株式会社ニレコ 突起物検出装置及び突起物検出方法
JP4865933B1 (ja) * 2011-04-27 2012-02-01 株式会社ニレコ 異常形状検出装置及び異常形状検出方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS497957U (ja) * 1972-04-22 1974-01-23

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS497957U (ja) * 1972-04-22 1974-01-23

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011052130A1 (ja) * 2009-10-28 2011-05-05 株式会社ニレコ 突起物検出装置及び突起物検出方法
JP2011095051A (ja) * 2009-10-28 2011-05-12 Nireco Corp 突起物検出装置及び突起物検出方法
CN102197275A (zh) * 2009-10-28 2011-09-21 株式会社尼利可 突起物检测装置及突起物检测方法
US20110241924A1 (en) * 2009-10-28 2011-10-06 Nireco Corporation Projection detecting apparatus and projection detecting method
US8878717B2 (en) 2009-10-28 2014-11-04 Nireco Corporation Projection detecting apparatus and projection detecting method
JP4865933B1 (ja) * 2011-04-27 2012-02-01 株式会社ニレコ 異常形状検出装置及び異常形状検出方法
WO2012147132A1 (ja) * 2011-04-27 2012-11-01 株式会社ニレコ 異常形状検出装置及び異常形状検出方法

Also Published As

Publication number Publication date
JPS5828525B2 (ja) 1983-06-16

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