JPS5520470A - Signal processing method in surface defect detection of high-temperature tested material - Google Patents
Signal processing method in surface defect detection of high-temperature tested materialInfo
- Publication number
- JPS5520470A JPS5520470A JP9378378A JP9378378A JPS5520470A JP S5520470 A JPS5520470 A JP S5520470A JP 9378378 A JP9378378 A JP 9378378A JP 9378378 A JP9378378 A JP 9378378A JP S5520470 A JPS5520470 A JP S5520470A
- Authority
- JP
- Japan
- Prior art keywords
- signal
- signals
- sent
- difference
- peak
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000007547 defect Effects 0.000 title abstract 3
- 238000001514 detection method Methods 0.000 title 1
- 238000003672 processing method Methods 0.000 title 1
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9378378A JPS5916661B2 (ja) | 1978-07-29 | 1978-07-29 | 高温被検材の表面欠陥検出における信号処理方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9378378A JPS5916661B2 (ja) | 1978-07-29 | 1978-07-29 | 高温被検材の表面欠陥検出における信号処理方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5520470A true JPS5520470A (en) | 1980-02-13 |
| JPS5916661B2 JPS5916661B2 (ja) | 1984-04-17 |
Family
ID=14092001
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9378378A Expired JPS5916661B2 (ja) | 1978-07-29 | 1978-07-29 | 高温被検材の表面欠陥検出における信号処理方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5916661B2 (ja) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS574540A (en) * | 1980-06-12 | 1982-01-11 | Unitika Ltd | Method and apparatus for detecting defect of long flat object |
| JPS59163861A (ja) * | 1983-03-09 | 1984-09-14 | Hitachi Electronics Eng Co Ltd | 固体撮像素子の白傷、黒傷の検出装置 |
| JPS6089734A (ja) * | 1983-10-24 | 1985-05-20 | Nok Corp | 表面欠陥検査方法 |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56136929U (ja) * | 1980-03-18 | 1981-10-16 |
-
1978
- 1978-07-29 JP JP9378378A patent/JPS5916661B2/ja not_active Expired
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS574540A (en) * | 1980-06-12 | 1982-01-11 | Unitika Ltd | Method and apparatus for detecting defect of long flat object |
| JPS59163861A (ja) * | 1983-03-09 | 1984-09-14 | Hitachi Electronics Eng Co Ltd | 固体撮像素子の白傷、黒傷の検出装置 |
| JPS6089734A (ja) * | 1983-10-24 | 1985-05-20 | Nok Corp | 表面欠陥検査方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5916661B2 (ja) | 1984-04-17 |
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