JPS5595859A - Sample holding plate for ultrasonic microscope - Google Patents

Sample holding plate for ultrasonic microscope

Info

Publication number
JPS5595859A
JPS5595859A JP373779A JP373779A JPS5595859A JP S5595859 A JPS5595859 A JP S5595859A JP 373779 A JP373779 A JP 373779A JP 373779 A JP373779 A JP 373779A JP S5595859 A JPS5595859 A JP S5595859A
Authority
JP
Japan
Prior art keywords
ultrasonic wave
holding plate
thickness
plate
sample holding
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP373779A
Other languages
Japanese (ja)
Other versions
JPS5950936B2 (en
Inventor
Makoto Fujimoto
Isao Momii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ALPS NOOTORONIKUSU KK
Original Assignee
ALPS NOOTORONIKUSU KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ALPS NOOTORONIKUSU KK filed Critical ALPS NOOTORONIKUSU KK
Priority to JP54003737A priority Critical patent/JPS5950936B2/en
Publication of JPS5595859A publication Critical patent/JPS5595859A/en
Publication of JPS5950936B2 publication Critical patent/JPS5950936B2/en
Expired legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Abstract

PURPOSE: To decrease the attenuation or reflection of the ultrasonic wave and thus obtain a high-resolution picture by producing the sample holding plate with the sapphire or the like which features a small propagation loss of the ultrasonic wave and also securing an integer-fold of the half wavelength of the ultrasonic wave for the thickness of the holding plate.
CONSTITUTION: Sample holding plate 11 is produced with the material like the sapphire or the like featuring a small propagation loss of the ultrasonic wave, and the thickness of the holding plate is set to an integer-fold of 1/2 the wavelength of the ultrasonic wave. The crystal, ruby and the like can also be used for plate 11. In such constitution, the attenuation of the ultrasonic wave can be decreased for plate 11, and at the same time the acoustic impedance viewed from the sound field medium is set equivalent to the intrinsic acoustic impedance of the acoustic medium. Thus the reflection loss can be reduced down to zero substantially. Also silcon dioxide layer 12 featuring the thickness set to the 1/4 odd-fold of the wavelength of the ultrasonic beam can be formed on both surfaces of plate 11 the thickness of which is prescribed as mentioned above.
COPYRIGHT: (C)1980,JPO&Japio
JP54003737A 1979-01-16 1979-01-16 Ultrasonic microscope sample holding plate Expired JPS5950936B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP54003737A JPS5950936B2 (en) 1979-01-16 1979-01-16 Ultrasonic microscope sample holding plate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP54003737A JPS5950936B2 (en) 1979-01-16 1979-01-16 Ultrasonic microscope sample holding plate

Publications (2)

Publication Number Publication Date
JPS5595859A true JPS5595859A (en) 1980-07-21
JPS5950936B2 JPS5950936B2 (en) 1984-12-11

Family

ID=11565537

Family Applications (1)

Application Number Title Priority Date Filing Date
JP54003737A Expired JPS5950936B2 (en) 1979-01-16 1979-01-16 Ultrasonic microscope sample holding plate

Country Status (1)

Country Link
JP (1) JPS5950936B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5780556A (en) * 1980-11-07 1982-05-20 Noritoshi Nakabachi Concave transducer for focusing ultrasonic wave of ultrasonic microscope
JP2008209257A (en) * 2007-02-27 2008-09-11 Toyohashi Univ Of Technology Acoustic parameter measurement device, sample support for acoustic parameter measurement device, acoustic parameter measurement method, and ultrasonic brain tissue observation method
JP2008209258A (en) * 2007-02-27 2008-09-11 Honda Electronic Co Ltd Sample support for acoustic parameter measuring device, and acoustic parameter measuring device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02147436U (en) * 1989-05-16 1990-12-14

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5780556A (en) * 1980-11-07 1982-05-20 Noritoshi Nakabachi Concave transducer for focusing ultrasonic wave of ultrasonic microscope
JP2008209257A (en) * 2007-02-27 2008-09-11 Toyohashi Univ Of Technology Acoustic parameter measurement device, sample support for acoustic parameter measurement device, acoustic parameter measurement method, and ultrasonic brain tissue observation method
JP2008209258A (en) * 2007-02-27 2008-09-11 Honda Electronic Co Ltd Sample support for acoustic parameter measuring device, and acoustic parameter measuring device

Also Published As

Publication number Publication date
JPS5950936B2 (en) 1984-12-11

Similar Documents

Publication Publication Date Title
DE2960984D1 (en) Method for transferring ultrasonic energy to or from an object and focused ultrasonic transducer
ES454095A1 (en) A device for ecography. (Machine-translation by Google Translate, not legally binding)
Moran et al. Electromagnetic generation of electronically steered ultrasonic bulk waves
CA2156782A1 (en) Optical wavelength filter with reduced sidelobes and simple design
JPS5527944A (en) Ultrasonic wave transducer
JPS5595859A (en) Sample holding plate for ultrasonic microscope
JPS5693415A (en) Elastic surface wave parametric device
CA2106232A1 (en) Crack Orientation Determination and Detection Using Horizontally Polarized Shear Waves
EP0268633B1 (en) Ultrasonic field generation
JPS57173746A (en) Ultrasonic microscope
Hatano et al. High-frequency ultrasonic cleaning tank utilizing oblique incidence
Weglein et al. Elastic characterization of diamond films by acoustic microscopy
JPS55132950A (en) Defect detector
JPS55128152A (en) Ultrasonic microscope
SU726655A1 (en) Adjustable delay line
Kushibiki et al. Material characterization by acoustic line-focus beam
US4034317A (en) Ultrasonic delay lines and method of making the same
Ohyoshi et al. Effect of Bottom-Surface Reflections on Backscatter From Porosity in a Composite Layer
Onoe et al. Shift in the Location of Resonant Frequencies Caused by Large Electromechanical Coupling in Thickness‐Mode Resonators
JPS58156215A (en) Surface acoustic wave element
曹东旭 et al. Detection of thin layer of foreign material in plates by ultrasonic frequency spectrum
Liebermann Absorption of Sound in Fresh Water and in the Sea
JPS59171857A (en) Ultrasonic microscope
JPS6131961A (en) ultrasound microscope
Koerber SONICS AND ULTRASONICS