JPS56154652A - Dew point hygrometer with continuous equalizer - Google Patents
Dew point hygrometer with continuous equalizerInfo
- Publication number
- JPS56154652A JPS56154652A JP4426081A JP4426081A JPS56154652A JP S56154652 A JPS56154652 A JP S56154652A JP 4426081 A JP4426081 A JP 4426081A JP 4426081 A JP4426081 A JP 4426081A JP S56154652 A JPS56154652 A JP S56154652A
- Authority
- JP
- Japan
- Prior art keywords
- dew point
- point hygrometer
- equalizer
- continuous
- continuous equalizer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/56—Investigating or analyzing materials by the use of thermal means by investigating moisture content
- G01N25/66—Investigating or analyzing materials by the use of thermal means by investigating moisture content by investigating dew-point
- G01N25/68—Investigating or analyzing materials by the use of thermal means by investigating moisture content by investigating dew-point by varying the temperature of a condensing surface
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US06/135,127 US4345455A (en) | 1980-03-28 | 1980-03-28 | Dew point hygrometer with continuous balancing system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS56154652A true JPS56154652A (en) | 1981-11-30 |
Family
ID=22466680
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4426081A Pending JPS56154652A (en) | 1980-03-28 | 1981-03-27 | Dew point hygrometer with continuous equalizer |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US4345455A (ja) |
| EP (1) | EP0036913B1 (ja) |
| JP (1) | JPS56154652A (ja) |
| CA (1) | CA1135528A (ja) |
| DE (1) | DE3071803D1 (ja) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59170754A (ja) * | 1983-03-16 | 1984-09-27 | Tokyo Hikari Denshi Kogyo Kk | 露点計 |
| JPS62178356U (ja) * | 1986-04-30 | 1987-11-12 | ||
| JP2012093221A (ja) * | 2010-10-27 | 2012-05-17 | Yamatake Corp | 鏡面冷却式センサ |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4579462A (en) * | 1985-05-20 | 1986-04-01 | Trans-Met Engineering, Inc. | Dew point measuring apparatus |
| US5022045A (en) * | 1985-08-06 | 1991-06-04 | Elliott Stanley B | Optical-type, phase transition humidity-responsive devices |
| CA1280910C (en) * | 1988-11-02 | 1991-03-05 | Paul Siska | Dew point analyzer |
| GB8628610D0 (en) * | 1986-11-29 | 1987-01-07 | Emi Plc Thorn | Temperature sensing arrangement |
| US4956538A (en) * | 1988-09-09 | 1990-09-11 | Texas Instruments, Incorporated | Method and apparatus for real-time wafer temperature measurement using infrared pyrometry in advanced lamp-heated rapid thermal processors |
| US4891499A (en) * | 1988-09-09 | 1990-01-02 | Texas Instruments Incorporated | Method and apparatus for real-time wafer temperature uniformity control and slip-free heating in lamp heated single-wafer rapid thermal processing systems |
| US5470154A (en) * | 1991-04-18 | 1995-11-28 | Osaka Sanso Kogyo Ltd. | Method of cleaning the reflector mirror in an optical dew point meter and an optical dew point meter equipped with a cleaning device |
| JP3328555B2 (ja) * | 1997-08-19 | 2002-09-24 | 株式会社日清製粉グループ本社 | 微粉体の帯電量制御方法および装置ならびに微粉体の散布方法および装置 |
| JP4871599B2 (ja) * | 2006-01-20 | 2012-02-08 | 日立住友重機械建機クレーン株式会社 | クレーンおよびクレーンの分解方法 |
| US8764414B2 (en) * | 2011-11-07 | 2014-07-01 | Bha Altair, Llc | System for detecting contaminants in an intake flow of a compressor |
| US10444172B2 (en) * | 2015-11-13 | 2019-10-15 | Roscid Technologies, Inc. | Chilled mirror hygrometer |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4415427Y1 (ja) * | 1966-05-12 | 1969-07-03 | ||
| JPS5019839U (ja) * | 1973-06-25 | 1975-03-06 |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3269A (en) * | 1843-09-14 | Xoltx new new | ||
| US2624195A (en) * | 1946-10-25 | 1953-01-06 | Borg George W Corp | Dew point hygrometer |
| US2720107A (en) * | 1953-01-29 | 1955-10-11 | Wallace & Tiernan Inc | Dew-point hygrometer |
| NL89176C (ja) * | 1955-11-22 | |||
| US3077763A (en) * | 1959-01-30 | 1963-02-19 | Leuna Werke Veb | Low gas moisture measuring apparatus |
| US3280618A (en) * | 1961-12-11 | 1966-10-25 | Honeywell Inc | Humidity sensing apparatus |
| US3269185A (en) * | 1963-01-28 | 1966-08-30 | Cambridge Systems Inc | Dewpoint sensing structure |
| US3195344A (en) * | 1963-01-28 | 1965-07-20 | Cambridge Systems Inc | Dewpoint measuring system |
| US3142986A (en) * | 1963-05-10 | 1964-08-04 | Ind Instr Inc | Thermoelectric dew point hygrometer |
| US3252319A (en) * | 1964-01-06 | 1966-05-24 | Ind Instr Inc | Dew point device with proportional control circuit |
| US3195345A (en) * | 1964-05-11 | 1965-07-20 | Cambridge Systems Inc | Thermoelectric dewpoint determining system |
| US3623356A (en) * | 1969-12-18 | 1971-11-30 | Eg & G Inc | Dew point hygrometer |
| US4083224A (en) * | 1975-09-29 | 1978-04-11 | The University Of Sydney | Phase transition detector |
| US4216669A (en) * | 1978-10-06 | 1980-08-12 | General Eastern Instruments Corporation | Contaminant error reduction system for dew point hygrometers |
| US4335597A (en) * | 1980-03-28 | 1982-06-22 | Eg & G, Inc. | Dew point hygrometer with two cooled reflective surfaces |
-
1980
- 1980-03-28 US US06/135,127 patent/US4345455A/en not_active Expired - Lifetime
- 1980-10-09 CA CA000362016A patent/CA1135528A/en not_active Expired
- 1980-11-24 DE DE8080201108T patent/DE3071803D1/de not_active Expired
- 1980-11-24 EP EP80201108A patent/EP0036913B1/en not_active Expired
-
1981
- 1981-03-27 JP JP4426081A patent/JPS56154652A/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4415427Y1 (ja) * | 1966-05-12 | 1969-07-03 | ||
| JPS5019839U (ja) * | 1973-06-25 | 1975-03-06 |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59170754A (ja) * | 1983-03-16 | 1984-09-27 | Tokyo Hikari Denshi Kogyo Kk | 露点計 |
| JPS62178356U (ja) * | 1986-04-30 | 1987-11-12 | ||
| JP2012093221A (ja) * | 2010-10-27 | 2012-05-17 | Yamatake Corp | 鏡面冷却式センサ |
Also Published As
| Publication number | Publication date |
|---|---|
| CA1135528A (en) | 1982-11-16 |
| EP0036913B1 (en) | 1986-10-15 |
| EP0036913A3 (en) | 1982-03-17 |
| DE3071803D1 (en) | 1986-11-20 |
| US4345455A (en) | 1982-08-24 |
| EP0036913A2 (en) | 1981-10-07 |
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