JPS562524A - Signal processing method of mtf measuring instrument - Google Patents

Signal processing method of mtf measuring instrument

Info

Publication number
JPS562524A
JPS562524A JP7857079A JP7857079A JPS562524A JP S562524 A JPS562524 A JP S562524A JP 7857079 A JP7857079 A JP 7857079A JP 7857079 A JP7857079 A JP 7857079A JP S562524 A JPS562524 A JP S562524A
Authority
JP
Japan
Prior art keywords
mtf
white
black level
level region
ram30
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7857079A
Other languages
Japanese (ja)
Other versions
JPS6357726B2 (en
Inventor
Yoshiaki Kamimoto
Nobuo Sakuma
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Co Ltd
Original Assignee
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Priority to JP7857079A priority Critical patent/JPS562524A/en
Publication of JPS562524A publication Critical patent/JPS562524A/en
Publication of JPS6357726B2 publication Critical patent/JPS6357726B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0292Testing optical properties of objectives by measuring the optical modulation transfer function

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)

Abstract

PURPOSE:To perform MTF calculation with accuracy by detecting at least either the maximum value or minimum value of white and black level regions. CONSTITUTION:With regard to time-series signal from CCD, the white level region and black level region of a needed chart are discriminated from each other by a threshold level. Then, they are digitized by A/D converter 28 and stored in RAM30 via input-output port 29. Processing the values stored in RAM30 digitally, muCPU31 finds maximum value (a) of the white level region and minimum value (b) of the black level region. From the equation, MTF can generally be found. Here, (a) and (b) are the white level and black level of the needed chart, and A and B are those close to space frequency zero. Then, A, B, (a) and (b) are detected as many as several bits to find respective mean values, which are substituted in the equation to calculate MTF, so that calculation precision will improve.
JP7857079A 1979-06-21 1979-06-21 Signal processing method of mtf measuring instrument Granted JPS562524A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7857079A JPS562524A (en) 1979-06-21 1979-06-21 Signal processing method of mtf measuring instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7857079A JPS562524A (en) 1979-06-21 1979-06-21 Signal processing method of mtf measuring instrument

Publications (2)

Publication Number Publication Date
JPS562524A true JPS562524A (en) 1981-01-12
JPS6357726B2 JPS6357726B2 (en) 1988-11-14

Family

ID=13665548

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7857079A Granted JPS562524A (en) 1979-06-21 1979-06-21 Signal processing method of mtf measuring instrument

Country Status (1)

Country Link
JP (1) JPS562524A (en)

Also Published As

Publication number Publication date
JPS6357726B2 (en) 1988-11-14

Similar Documents

Publication Publication Date Title
JPS55138616A (en) Bearing fault discriminating device
DE69120880D1 (en) Scanning measuring device
ATE37089T1 (en) METHOD AND APPARATUS FOR DETECTING BUMPLES AND DOWNS IN TIRE PLANKS.
CA1258099A (en) Egg with delta wave recognition by double
SU1281180A3 (en) Device for eddy current check of article
JPS5693079A (en) Measurement of time duration
JPS562524A (en) Signal processing method of mtf measuring instrument
JPS562516A (en) Signal processing method of mtf measuring instrument
US3742352A (en) Apparatus and method for measuring and analyzing dynamic processes
FR2441176A1 (en) METHOD AND ASSEMBLY FOR MEASURING LOWNESS AND IN PARTICULAR FOR DETERMINING THE LOWERING DISTORTION AND / OR THE GROUP PROPAGATION TIME DISTORTION OF A MEASUREMENT OBJECT
ATE24056T1 (en) ARRANGEMENT FOR DETERMINING THE POSITION OF THE Puncture POINT OF AN OBJECT MOVED ALONG A TRACK THROUGH A MEASURING PLANE CROSSING THAT TRACK.
JPS55118100A (en) Periodic adjustment and setting of new operation level for detection threshold
JPS562517A (en) Signal processing method of mtf measuring instrument
JPS54151066A (en) Expression method of strip shape pattern
JPS55112560A (en) Ion concentration automatic measuring unit
RU93041184A (en) METHOD OF MEASUREMENT OF NONLINEAR DISTORTION COEFFICIENT
JPS56137266A (en) Automatic detector for magnetic abnormality
JPS6431017A (en) Sensor controller
JPS562518A (en) Signal processing method of mtf measuring instrument
JPS5771080A (en) Medium detector
JPS56138260A (en) Display processing circuit for passive sonar
JPS6466566A (en) Phase difference measurement
SU1179371A1 (en) Device for measuring distribution function of instantaneous frequency of random process
SU726538A1 (en) Analyzer of technological process states
JPS5774670A (en) Tester for construction work