JPS567044A - Steel sample analyzer using electron beam - Google Patents

Steel sample analyzer using electron beam

Info

Publication number
JPS567044A
JPS567044A JP8282979A JP8282979A JPS567044A JP S567044 A JPS567044 A JP S567044A JP 8282979 A JP8282979 A JP 8282979A JP 8282979 A JP8282979 A JP 8282979A JP S567044 A JPS567044 A JP S567044A
Authority
JP
Japan
Prior art keywords
electron beam
sample
inclusions
spectroscope
crack
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8282979A
Other languages
Japanese (ja)
Inventor
Hiroshi Soga
Koichi Kitamura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP8282979A priority Critical patent/JPS567044A/en
Publication of JPS567044A publication Critical patent/JPS567044A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To measure and display a wide range of two-dimentional distribution of inclusions in a steel sample by applying a electron beam selected within the limit of 0.1-10mm. in diameter to the steel sample in a vacuum. CONSTITUTION:Electron beam EB is applied to the surface of a sample 5, and X- rays radiated from the sample 5 is spread by an X-ray spectroscope 7c having a plane crystal 30 and an X-ray detector 31. The electron beam EB excites inclusions 33 such as Fe, S, or P in the sample 5, and generates characteristic X-rays, Fe-Ka and S-Ka, which are detected by spectroscopes 7e and 7c respectively. The spectroscope 7c is for elementary analysis of the inclusions 33, and the spectroscope 7e is for detecting a crack 37. The electron beam EB permits informations about the inclusions 33 and the crack 37 to be obtained, with the sample 5 moved in the directions of X and Y. The constitution eliminates the need for griding the surface of an object under test having a wide area. Moreover, the distribution pattern of the inclusions can be directly measured, and the crack pattern can be detected also.
JP8282979A 1979-06-29 1979-06-29 Steel sample analyzer using electron beam Pending JPS567044A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8282979A JPS567044A (en) 1979-06-29 1979-06-29 Steel sample analyzer using electron beam

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8282979A JPS567044A (en) 1979-06-29 1979-06-29 Steel sample analyzer using electron beam

Publications (1)

Publication Number Publication Date
JPS567044A true JPS567044A (en) 1981-01-24

Family

ID=13785279

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8282979A Pending JPS567044A (en) 1979-06-29 1979-06-29 Steel sample analyzer using electron beam

Country Status (1)

Country Link
JP (1) JPS567044A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6162849A (en) * 1984-07-18 1986-03-31 Nippon Steel Corp Density curve analytical system of automatic multifunctional analyser
JPS6273546A (en) * 1985-09-26 1987-04-04 Jeol Ltd Analyzing device for non-metal intervening material

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS517992A (en) * 1974-07-10 1976-01-22 Hitachi Ltd
JPS5144864A (en) * 1974-10-16 1976-04-16 Hitachi Ltd

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS517992A (en) * 1974-07-10 1976-01-22 Hitachi Ltd
JPS5144864A (en) * 1974-10-16 1976-04-16 Hitachi Ltd

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6162849A (en) * 1984-07-18 1986-03-31 Nippon Steel Corp Density curve analytical system of automatic multifunctional analyser
JPS6273546A (en) * 1985-09-26 1987-04-04 Jeol Ltd Analyzing device for non-metal intervening material

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