JPS5897667A - Method and device for detecting resistance and voltage between chips of resistance welder - Google Patents
Method and device for detecting resistance and voltage between chips of resistance welderInfo
- Publication number
- JPS5897667A JPS5897667A JP19663981A JP19663981A JPS5897667A JP S5897667 A JPS5897667 A JP S5897667A JP 19663981 A JP19663981 A JP 19663981A JP 19663981 A JP19663981 A JP 19663981A JP S5897667 A JPS5897667 A JP S5897667A
- Authority
- JP
- Japan
- Prior art keywords
- bath
- voltage
- resistance
- value
- power
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims description 12
- 238000003466 welding Methods 0.000 claims description 20
- 239000004020 conductor Substances 0.000 claims description 14
- 238000001514 detection method Methods 0.000 claims description 7
- 241000282994 Cervidae Species 0.000 claims 1
- 206010011224 Cough Diseases 0.000 claims 1
- 241000283973 Oryctolagus cuniculus Species 0.000 claims 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 5
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 3
- 238000005070 sampling Methods 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 2
- 238000012544 monitoring process Methods 0.000 description 2
- 238000009736 wetting Methods 0.000 description 2
- 238000003287 bathing Methods 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 238000000855 fermentation Methods 0.000 description 1
- 230000004151 fermentation Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000002123 temporal effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/20—Measuring earth resistance; Measuring contact resistance, e.g. of earth connections, e.g. plates
- G01R27/205—Measuring contact resistance of connections, e.g. of earth connections
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Measurement Of Current Or Voltage (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
最近、抵抗浴接においてチップ間抵抗あるいけナツプi
l+:圧を浴接結果のモニダ睦として利用することが、
盛んに行なわれている。[Detailed Description of the Invention] Recently, in resistance bath welding, the resistance between chips has been increased.
l+:Using pressure as a monitor of bathing results is
It is actively practiced.
本会明け、このチップ間抵抗おLびテップ間屯田を検出
する方法おLび装置[IjAするものである。After the meeting, a method and apparatus for detecting the inter-chip resistance L and the inter-chip resistance will be presented.
従来、チップ間抵抗およびチップ間電圧を検出する方法
としては、上、下のチップにリード締金接続し、直接検
出していた。Conventionally, the inter-chip resistance and inter-chip voltage have been detected by directly connecting the upper and lower chips with lead clamps.
従来の検出方法に1%別な装a’yr必要とせず。Does not require 1% additional equipment compared to conventional detection methods.
非常に簡単に検出でき心が、実用に際しては次に述べる
工うな種々の問題がある。Although it is very easy to detect, there are various problems in practical use as described below.
チップは、絶えず、vt浴接物とぶつかるものであるか
ら、チップに接続された。検出用リード線は傷つけられ
たり1時にづ切断される。The tip was connected to the tip since it is constantly in contact with the VT bath contact. The detection lead wire may be damaged or cut at one time.
チップを装備した浴接横用ガンは、浴接機種に工ってげ
人間あるいはロボットに工り、振り娼され、この定め予
ツブvclifflされたリード@に切断される。A tip-equipped gun for bath wetting is made into a bath welding machine, is made by a human or a robot, is swung, and is cut into the predetermined pre-cut lead.
チップに消耗品で、かなり高い頻度で交換されるため、
その都度、リード線の接続をやり直さなければならない
。Since the chip is a consumable item and is replaced quite frequently,
Each time, you have to reconnect the lead wires.
また、リード線は、大電流である浴接電流が置れる二次
導体に添わして配線するため。In addition, the lead wire is wired along with the secondary conductor where the large bath current is placed.
酵導の影響を受けやすく時には、誤った信号が検出され
るため、それなりの工夫がなされてい/)。Because it is susceptible to the effects of fermentation, sometimes false signals are detected, so certain measures have been taken.
N上の工うに、チップにリード線を接続する従来の検出
方法は溶接作業にとって非常にわずられしく、実用的で
ない。However, the conventional detection method of connecting a lead wire to the tip is very cumbersome and impractical for welding operations.
これに対し本発明け、従来の方法とけ全く異った方法に
よるものでチップにリード線を接続することなく検出で
きる方法お↓び実用上非常にすぐれた装#全開発したも
のである。In contrast, the present invention is completely different from the conventional method, and has developed a method that allows detection without connecting lead wires to the chip, and a device that is extremely superior in practical terms.
以下に本発明の方法おLび装#CI)一実施例について
図面に基づいて説明する。An example of the method and method of the present invention will be described below with reference to the drawings.
術1図は、浴接機を等価的に示しtものであ0
jけ溶接機に電力を供給する交流電源、21dサイリス
タスタック、3は浴接トランス、4け二次導体に含まれ
る抵抗ル、4け二次導体に含まれるインダクタンスL、
5はtmチップ間に被浴接物を挿入した時のチップ間抵
抗1(,1である。Fig. 1 shows an equivalent representation of a bath welding machine, including an AC power source that supplies power to the welding machine, a 21d thyristor stack, 3 a bath welding transformer, and a resistance loop included in the 4-piece secondary conductor. , inductance L included in the 4-digit secondary conductor,
5 is the inter-chip resistance 1 (, 1) when the object to be bathed is inserted between the tm chips.
チップ間には、抵抗at゛の他にインダクタンスbX5
+も言まれ/)がこのインダクタンス分は抵抗ルtVこ
比べて小さいのでここでは無纜すaものとする。In addition to the resistance at, there is an inductance bX5 between the chips.
It is also said that +/) is small compared to the resistance tV, so this inductance is ignored here.
第1図において浴接トランスの2g4子A、Bから二次
回路に供給される電力は、二次回路がインダクタンスL
を含んでいるから有効電力と無効電力から構成され、有
効電力は二次回路の抵抗外すなわち二次導体の抵抗ルと
テッグ間砥抗ルt VC工って消費されるシカに等しい
。なぜならインダクタンスLげ電力の蓄積および放出を
行なうのみで電力t/lli費しないからである。In Figure 1, the power supplied to the secondary circuit from the 2g4 children A and B of the bath-connected transformer is
It is composed of active power and reactive power, and the active power is equal to the power consumed by the resistance of the secondary circuit, that is, the resistance of the secondary conductor and the grinding force between the two. This is because the inductance L only stores and releases power, and does not consume t/lli of power.
従って、二次回路tflLれる電嘘すなわちfg接電は
をI、有効電力をPとすると次の関係式が成立する。Therefore, if the electric current flowing through the secondary circuit tflL, that is, the fg connection, is I, and the active power is P, the following relational expression holds true.
P=(ル+ルt)I“・・・・旧・・Tl)となり有効
電力Pを浴接電党工の2乗値で除算し、さらに二次導体
の抵抗Ki差し引けば、チップ間抵抗ll′tt f求
めることができる。P=(ru+rut)I"...formerly...Tl), and by dividing the active power P by the square value of the bath connection power and further subtracting the resistance Ki of the secondary conductor, The resistance ll'ttf can be found.
さらに(31式で求めたチップ間抵抗R,tに(4)式
で示す工うに浴接電aIt乗じればチップ間ぼ圧Vtを
求められることけ明らかである。Furthermore, it is clear that the inter-chip voltage Vt can be obtained by multiplying the inter-chip resistance R, t obtained by Equation 31 by the bath contact voltage aIt shown in Equation (4).
Vt = FLt X I ・・・−−−−−−(4
)以上のように有効電力Pと溶接1茄Iが判れば、チッ
プ間にリード線を接続することなく、チップ間抵抗ルt
お工びチップ間電圧Vtを求めることができる。Vt=FLtXI...---(4
) As described above, if the effective power P and the welding capacity I are known, the inter-chip resistance t can be calculated without connecting lead wires between the chips.
The rough chip-to-chip voltage Vt can be determined.
ここで(31お工び(4)式は一般式で心り、実用上は
溶接中におけるチップ間抵抗および電圧の時間的変化が
浴接結果のモニタ曖として弔いらられる。Here, the formula (4) is a general formula, and in practice, the temporal changes in inter-chip resistance and voltage during welding are considered ambiguous in monitoring the welding results.
従って交流電源のn/2サイクルごとのチップ間抵抗お
よび成田を求める必要がある。その方法について次に述
べる。Therefore, it is necessary to find the interchip resistance and Narita every n/2 cycles of the AC power supply. The method will be described next.
第2図は、浴接トランス二次側電圧v(liIl′R値
)と浴接電fit(瞬間値)の波形を示したものである
。FIG. 2 shows the waveforms of the bath contact transformer secondary voltage v (liIl'R value) and the bath contact voltage fit (instantaneous value).
′rに交茄電源周波数n/2サイクルの期間であれば任
意でよいが、ここでは説明を簡単にす/)ためn =
]とし、に源周波数の半サイクルである。'r may be any period of n/2 cycles of the alternating power supply frequency, but for the purpose of simplifying the explanation here, n =
], which is half a cycle of the source frequency.
1+おLびtlは浴接電流tが零の時点であれば任意で
LいがここでH−PIとして半サイクル電加の禮れ初め
の時点とする。1+L and tl can be arbitrarily set as long as the bath contact current t is zero, but here, H-PI is assumed to be the time point at which the half-cycle electric current is applied.
期間′rにおける有効電力Pけ(5)式で表わすことが
できる。The active power P during period 'r can be expressed by equation (5).
p =7 Jtt、vLd t ・” ・・・”・LD
)同様にして期間゛rにおける浴接電光の2乗厘1tj
(61式で表わすことができる。p = 7 Jtt, vLd t・”...”・LD
) Similarly, the square of the bath-contact lightning in the period r is 1tj
(It can be expressed by equation 61.
”=T J”t、” ””・・・・・・・・・(6)1
5)、(6)式!−に9弐に代入すると電極子ッグ間抵
抗比tけ(7)式の工うになる。”=T J”t,” ””・・・・・・・・・(6)1
5), (6) expression! Substituting - into 92, we get the resistance ratio t between the electrodes and the formula (7).
この(7)式の計JIEを浴接期間中にわたって行なう
と半サイクルごとのチップ間抵抗1(tlに求めること
ができる。If the total JIE of equation (7) is performed during the bath contact period, the interchip resistance 1 (tl) can be determined for every half cycle.
半サイクルごとのチップ間抵抗L(It力涼1れば(4
)式にLす半サイクルごとの浴接電fiI!−ルtに乗
じてやれば、半サイクルごとのチップ間電圧Vtが求ま
る。Interchip resistance L per half cycle (If it is 1, then (4
), the bath contact voltage fiI for every half cycle is L! - Multiplying by t, the chip-to-chip voltage Vt for each half cycle can be found.
Vtとしてピーク値あるいけ平均値あるいけ実効値を求
め/)場合は辱接電健として、半サイクルごとのピーク
値、あるいけ平均値あるいは実効匝を用いれはよい。If the peak value, average value, or effective value is determined as Vt, the peak value, average value, or effective value for each half cycle may be used as the power connection.
以上の1うに期間′rを半サイクルに選ぶと半サイクル
ごとのチップ間抵抗および電圧が求められるが、期間′
rをn/2サイクルに選ぶと同様にしてn/2 サイク
ルごとのチップ間抵抗お工び電圧が求められることは明
らかである。If the period 'r is chosen to be a half cycle as described in 1 above, the inter-chip resistance and voltage can be found for each half cycle, but the period 'r'
It is clear that if r is chosen to be n/2 cycles, the inter-chip resistance voltage for every n/2 cycles can be found in the same way.
また(7)式の電圧Vはここでけl@接トランスの二次
測道Fft用いたが、−矢屯田でも工い。In addition, the voltage V in equation (7) is here used as the secondary measurement path Fft of the transformer, but it can also be calculated using the -yaton field.
なぜなら−vcfsと二次側の電圧は相似であるからで
ある。This is because -vcfs and the voltage on the secondary side are similar.
ただ[7,この場合、−久am圧そのものでなく、二次
側の電圧の大きさに見合う工うに小さくした喧を用いる
。However, in this case, instead of using -am voltage itself, a voltage that is made smaller to match the voltage on the secondary side is used.
さらに(7)式の電8Evは供給電源の電圧でもよい。Further, the voltage 8Ev in equation (7) may be the voltage of the power supply.
ただし太きさけ一久電圧を用いた時と同様vc%二次電
圧に見合うように小さくし比値を用しる。この場合@2
図の電圧vri連続の正弦波となるが、電流tが零の期
間でけVLは零となるから(力式の計算結果けVのll
[として二次mFl用い友場合と同じになる。However, as with the case of using the thicker voltage, the ratio value is used by reducing it to match the vc% secondary voltage. In this case @2
The voltage vri in the figure becomes a continuous sine wave, but since VL becomes zero during the period when the current t is zero (as a result of calculation of the force formula,
[It will be the same as when using second-order mFl.
なお、有効電力を求わるのK 151式を利用したが(
5)式以外の方法に=って求めても構わない。In addition, I used the K151 formula to find the effective power (
5) You may find = using a method other than the formula.
次に本発明の方法を51!施すめtめの装置の一実施例
を第3図に基づいて説明する。Next, 51 methods of the present invention! An embodiment of the second application device will be described with reference to FIG.
第3図μチップ間抵抗検出装置8と、これに浴接電概算
出回路】4お工び乗算器15t−寸卯した電極チッグ間
置圧峡出装置のブロック図である。FIG. 3 is a block diagram of a μ-chip resistance detection device 8 and a circuit for roughly calculating the bath contact voltage thereto; a four-pronged multiplier 15t; and a sized electrode chip interposition pressure extraction device;
浴接トランス3の二次側唯圧Vと浴接電随船?ある手段
lこて検出し、有効区力算出回路9に入力し、(3)式
の右辺第1項の分子Pを求める。また、浴接電(HLは
、浴接電離2巣値算出回路]・OvC入力さfl、、(
31式の右辺第1項の分母I2を求める。The secondary side pressure V of the bath-connected transformer 3 and the bath-connected power supply? A certain means detects the trowel, inputs it to the effective force calculation circuit 9, and calculates the numerator P of the first term on the right side of equation (3). In addition, the bath ground voltage (HL is the bath ground ionization double nest value calculation circuit) OvC input fl,, (
Determine the denominator I2 of the first term on the right side of Equation 31.
こうして得られ7tPとI”、−1除算器INvc入力
して(3)式V)右辺第】項p7x”−2求める。この
P /jjと凡設定@12からの信号を減算器13に入
力し、(31式に示すチップ間抵抗Rtが得られる。Thus obtained 7tP and I'' are inputted to a -1 divider INvc to obtain the term p7x''-2 on the right side of equation (3). This P/jj and the signal from general setting @12 are input to the subtracter 13, and the inter-chip resistance Rt shown in equation 31 is obtained.
次vclF、4チップ間電圧Vtを求めるvcけ、浴接
〔1を所望の値、すなわちピーク値、あるいけ平均値、
あるいけ実効値のいずれかを求・ぬる溶接電離算出回路
14に入力して得られfcf#接亀fiIと前記で求め
たチップ間低部tを乗算器15に入力する。そして(4
)式に示すチツ′プ間電圧vtt得る。Next, vclF, find the voltage Vt between the four chips.
Either of the effective values is input to the welding ionization calculation circuit 14, and the resulting fcf# contact fiI and the inter-tip low portion t determined above are input to the multiplier 15. And (4
) Obtain the chip-to-chip voltage vtt shown in the equation.
ここでル設定′aVこついて、もう少し詳しく述べる。Here I will explain the settings in a little more detail.
ル設定′aは(5)式に示される二次導体抵抗ルに相当
する信号を出力するものである。二次導体抵抗ルは、二
次導体の消耗VCより変化するが、その変化のスピード
は1日本位あるいは週単位といった非常にゆっくりとし
たものであり、十数サイクルという非常に短かい1回の
浴接時間においては一定と見なすことができる。fた電
極チップ間抵抗Rtお1び電圧VBj、モニタ量として
使用する場合必ずしもその真値が必要でなく、溶接中に
お叶るRtお工びVtの挙蛸が判れば十分である。The setting 'a' is for outputting a signal corresponding to the secondary conductor resistance shown in equation (5). The secondary conductor resistance changes due to the consumption VC of the secondary conductor, but the speed of change is very slow, on the order of a day or a week, and only occurs once in a very short period of ten or more cycles. The bath exposure time can be considered constant. When using f, inter-electrode tip resistance Rt and voltage VBj as monitoring quantities, their true values are not necessarily required; it is sufficient to know the behavior of Rt and Vt that occurs during welding.
従ってR設定器12の出力は二次導体抵抗&に相当する
値で1くかつ一定であっても構わない。Therefore, the output of the R setting device 12 may be a constant value corresponding to the secondary conductor resistance &.
JIIJ図ri、!3図に示す有効電力算出回路9お工
び浴接電流2東値算出回路1(lさらに具体的に示り、
7tものである。JIIJ diagram,! Active power calculation circuit 9 shown in Fig. 3
It weighs 7 tons.
リセット信号発生!22とサンプリング信号定主器23
げ、有効電力Pお工び爵接電微2乗値■1をn/2 サ
イク、ルごとに算出するためにn/2 サイクルごとに
信号を発生するものであり、たとえばn=3すなわち半
サイクルごとの有効電力Pお工びsmta2乗値I“?
算出す/)l!1合は半サイクルごとに信号が発生され
る。Reset signal generated! 22 and sampling signal constant main unit 23
It generates a signal every n/2 cycles in order to calculate the active power P and the squared value of 1 for every n/2 cycles, for example, when n=3 or half Active power per cycle P and smta squared value I"?
Calculate/)l! If the signal is 1, a signal is generated every half cycle.
これらリセット信号およびサンプリング信号tゴ(7)
式から判、bように同じ期間t、〜t□間の有効電力P
お工び爵接電a2乗値IIを求めて除算すb必要がある
定め、有効電力算出回路お工び俗接電帷2乗値算田回路
の両方に共通のものでなければならない。These reset signals and sampling signals (7)
From the formula, the active power P during the same period t, ~t□ as b
It is necessary to determine the square value II of the electric power source II and divide it, and it must be common to both the active power calculation circuit and the square value circuit.
まず%(5)式に示される有効電力Pf算出するには、
浴接醒atと、浴接トランス二次電圧vf乗IIL器1
6に入力しV(を求めkc)vt?積分器17とサンプ
ルホールド器18に工りn/2サイクルごとに積分とホ
ールド金繰返すと工い。First, to calculate the active power Pf shown in formula (5),
Bath contact at and bath contact transformer secondary voltage vf multiplied by IIL unit 1
6 and find V(kc)vt? The integrator 17 and sample hold device 18 are modified to repeat integration and hold every n/2 cycles.
次兄(6)式に示される浴接電a2剰値11を算出 4
゜す/)VCは、爵接側0を乗算器19に入力し。Calculate the bath contact a2 remainder value 11 shown in equation (6) 4
゜S/) VC inputs the input side 0 to the multiplier 19.
j″を求め、この4″を積分器20とサンプルールドを
繰返すとニー。Find j'' and repeat this 4'' with the integrator 20 and the sample rule.
以上のように本発明の一実施例を71−ド的に実現す/
)場合について述べたが、第3図お工ヒ@ 4 図t:
t、コンビ亙−夕を用いてソフト的に実現することも可
能である。As described above, one embodiment of the present invention can be realized in a 71-code manner.
) I mentioned the case shown in Figure 3.
It is also possible to implement this in software using a combination controller.
以上、本発明によれば、浴接トランスの一次側もしくげ
二次−の電圧と!@接電at用いて、チップ間抵抗お工
び(圧を検出することができる。すなわち電極ナツプか
ら噛れた場所からめ信号VcLつで検出できるので、電
極テップにIJ−Filt秦続する従来の方法と比べて
、冒頭で述べた工うな溶接作業に対するわずられしさを
一挙に解決する非常に丁ぐれ九効来がある。As described above, according to the present invention, the voltage on the primary side of the bath-connected transformer and the voltage on the secondary side! @Connection AT can be used to detect the inter-chip resistance (pressure).In other words, it can be detected with the signal VcL from the place where the electrode nap is bitten, so it is different from the conventional method of connecting IJ-Filt to the electrode tip. Compared to other methods, this method is extremely effective in solving all the troublesome welding operations mentioned at the beginning.
第1図は、抵抗溶接機t−ぼ気的シンボルで等価的に表
わしたものである。
接電幌の波形を表わしtものである。
第3図は、浴接機の等価回路と1本発明の1実施例のブ
ロック図である。
@4図は、第3図の有効電力算出回路9と浴接電fi2
乗値算出回1i1110を具体的に示したブロック図で
ある。
〔図面の簡単な説明〕
1、 溶接電源
2、 サイ゛リスダスグツタ
3、 溶接トランス
4、 溶接機二次導体抵抗
5、# # インダクタンス6、 チップ
間抵抗
7、 電は検出器
8、 テラ1間抵抗検出装置のブロック図9、 有
効電力算出回路
10、 1@接電a2乗箪算出回路
】1.除算器
】2.R設定器
13、減算器
14、 !i!電置装出回路
15」6 、19.乗 算 器
17、!O,積分器
1821、 サンプルホールド器
22、 リセット信号発生器
23、 サンプリング信号発生器匂h 澹
・i −@ →111FIG. 1 is an equivalent representation of a resistance welding machine with a t-vapor symbol. This represents the waveform of the electrical connection hood. FIG. 3 is a block diagram of an equivalent circuit of a bath wetting machine and an embodiment of the present invention. @Figure 4 shows the active power calculation circuit 9 and bath connection fi2 in Figure 3.
It is a block diagram specifically showing a multiplication value calculation circuit 1i1110. [Brief explanation of the drawings] 1. Welding power source 2, Sirius dust ivy 3, Welding transformer 4, Welding machine secondary conductor resistance 5, ## Inductance 6, Inter-chip resistance 7, Current detector 8, Terra 1 resistance Block diagram of the detection device 9, active power calculation circuit 10, 1@connected a2 power calculation circuit] 1. Divider】2. R setting device 13, subtractor 14, ! i! Electrical equipment circuit 15"6, 19. Multiplier 17! O, integrator 1821, sample hold device 22, reset signal generator 23, sampling signal generator 澹・i -@ →111
Claims (4)
浴接醸碓?中いて、浴接機の二次回路に供給される有効
電力會交at源のn/2サイクルととvc宋め、その有
効成力を、前記浴接遡ltの2乗@?交a電源のn/2
サイクルごとに積分した頃で除直し、その除算1直から
俗従儂二次導体の砥抗噛ケ差引くことに工りナノ1…祇
抗を検出する方法。(1) What is the voltage of the secondary rod 11 on the primary side of the transformer connected to the panel and the voltage of the secondary rod 11? Let us assume that the active power source supplied to the secondary circuit of the bath welding machine is n/2 cycles, and its effective power is defined as the square of the bath welding power lt. n/2 of AC power supply
A method of detecting the nano 1...Gi resistance by dividing the integral for each cycle and subtracting the grind resistance of the secondary conductor from the division 1.
田と俗接電り管用いて、浴接機の二次回路に供給され/
)有効シカ?’l喝l原のn/2サイクルごとに求め、
その何5Ph鑞力全前記も接I[茄の2乗1iifを交
峨電源のn/2サイクルごとに積分したf直で除痺し、
その除算1直から浴接機二次導体の抵抗値を差引き、そ
の差引いた咳に前記浴接Kmの0/2fイクルごとの電
p値を栄じることにエリチップ間電圧を噴出する方法。(2) The hair-resistant transformer is supplied to the secondary circuit of the bath water heater using the 1st, 11th, 2nd and 1st law tonden and common connection pipes.
) Valid deer? Calculate every n/2 cycles of the original,
What 5Ph energize all the above is also neutralized by the f direct which integrates the square of 1iif every n/2 cycles of the alternating power supply,
A method of subtracting the resistance value of the secondary conductor of the bath contactor from the division 1, and ejecting the voltage between the electrodes by adding the voltage p value for each 0/2 f cycle of the bath contact Km to the subtracted cough. .
の電圧と俗畷酸売を中いて、降接機の二次回路に供給さ
れる有効電力?交を危鑞源のn/2サイクルごとに算出
する有効峨力算出回路と。 前記浴接醒欠の2乗値全交流電源のn/2サイクルごと
に算出する浴接電15!2乗値算出回路と、前記有効ギ
カを前記爵接鑞鑞2乗値で除算するための除算器と、浴
接機二久導体の抵抗Hに相当す/)信締を出力するル設
定器と、前記除算器の出力から前記ル設定器の出力を差
引くための城真器とを有するナノ1間抵抗検出vc#。(3) Secondary to the primary 7IC of the bath contact transformer! +Q
What is the active power supplied to the secondary circuit of the unloading machine through the voltage and voltage of ? and an effective force calculation circuit that calculates the intersection every n/2 cycles of the critical source. A circuit for calculating the square value of the bath contact voltage every n/2 cycles of the total AC power supply; a divider for outputting a value corresponding to the resistance H of the bath contactor's permanent conductor; and a value setting device for subtracting the output of the value setting device from the output of the divider. Resistance detection between Nano 1 with VC#.
田と酊接電兎を用いてfg接磯の二次11略に供給され
る何効曜力を交/J礪源のn/!サイクルごとに算出す
る有効電力算出回路と、前記俗接電りの2乗置を交/i
W電源の(1/2サイクルごとに算出する浴接dl[+
5!2乗III算出回路と、前記有効電力を前記浴接鑞
l51t2乗値で除算するための除算器と%溶接機二次
導体の抵抗FLに相当する信号を出力す/)l(設定器
と、前記除算器の出力から@記R設定器の出力を差引く
tめの減算器と、前記ffj2接這流のn/2サイクル
ごとのvL茄値?算出する浴接*a算出回路と、前記減
算器の出力と前記浴接電茄算出回路の出力とを乗算する
ための乗算器とを有するテラ1間電圧検出装首。(4) Using the Ikkyu 1 rule of the bath-connected transformer and the secondary ill's tonden and the 醊connection electric rabbit, we exchange the power that is supplied to the secondary 11 of the fg connection /J 礪源 n/! Intersect the active power calculation circuit that calculates each cycle with the square of the common ground voltage /i
Bath contact dl[+ calculated every 1/2 cycle of W power supply
5! Square III calculation circuit, a divider for dividing the active power by the square value of the bath welding machine, and a signal corresponding to the resistance FL of the secondary conductor of the welding machine. and a t-th subtracter that subtracts the output of the R setter from the output of the divider, and a bath tangent*a calculation circuit that calculates the vL value for each n/2 cycle of the ffj2 tangent current. , a multiplier for multiplying the output of the subtracter and the output of the bath connection voltage calculation circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19663981A JPS5897667A (en) | 1981-12-07 | 1981-12-07 | Method and device for detecting resistance and voltage between chips of resistance welder |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19663981A JPS5897667A (en) | 1981-12-07 | 1981-12-07 | Method and device for detecting resistance and voltage between chips of resistance welder |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5897667A true JPS5897667A (en) | 1983-06-10 |
| JPH0549952B2 JPH0549952B2 (en) | 1993-07-27 |
Family
ID=16361109
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP19663981A Granted JPS5897667A (en) | 1981-12-07 | 1981-12-07 | Method and device for detecting resistance and voltage between chips of resistance welder |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5897667A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59222652A (en) * | 1983-06-01 | 1984-12-14 | Mazda Motor Corp | Control device for automatic transmission |
| JPH02151373A (en) * | 1988-12-01 | 1990-06-11 | Nichicon Corp | Flicker compensating device |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4829499U (en) * | 1971-08-12 | 1973-04-11 | ||
| JPS4841231A (en) * | 1971-09-27 | 1973-06-16 |
-
1981
- 1981-12-07 JP JP19663981A patent/JPS5897667A/en active Granted
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4829499U (en) * | 1971-08-12 | 1973-04-11 | ||
| JPS4841231A (en) * | 1971-09-27 | 1973-06-16 |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59222652A (en) * | 1983-06-01 | 1984-12-14 | Mazda Motor Corp | Control device for automatic transmission |
| JPH02151373A (en) * | 1988-12-01 | 1990-06-11 | Nichicon Corp | Flicker compensating device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0549952B2 (en) | 1993-07-27 |
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