JPS59140366A - Method and device for producing thin film - Google Patents

Method and device for producing thin film

Info

Publication number
JPS59140366A
JPS59140366A JP24761083A JP24761083A JPS59140366A JP S59140366 A JPS59140366 A JP S59140366A JP 24761083 A JP24761083 A JP 24761083A JP 24761083 A JP24761083 A JP 24761083A JP S59140366 A JPS59140366 A JP S59140366A
Authority
JP
Japan
Prior art keywords
substrate
thin film
laser beam
dimensionally
base
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP24761083A
Other languages
Japanese (ja)
Inventor
Osamu Tabata
田畑 収
Saburo Kimura
三郎 木村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology filed Critical Agency of Industrial Science and Technology
Priority to JP24761083A priority Critical patent/JPS59140366A/en
Publication of JPS59140366A publication Critical patent/JPS59140366A/en
Pending legal-status Critical Current

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Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/04Coating on selected surface areas, e.g. using masks
    • C23C16/047Coating on selected surface areas, e.g. using masks using irradiation by energy or particles
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/48Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating by irradiation, e.g. photolysis, radiolysis, particle radiation
    • C23C16/483Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating by irradiation, e.g. photolysis, radiolysis, particle radiation using coherent light, UV to IR, e.g. lasers

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  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • General Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Physics & Mathematics (AREA)
  • Chemical Vapour Deposition (AREA)

Abstract

PURPOSE:To form a thin film of the resulting product of thermal decomposition having high quality without changing the structural function of a base body by ejecting gaseous flow of a reactive gaseous material to a substrate while irradiating a laser beam thereto and moving at the same time the substrate two- dimensionally. CONSTITUTION:A laser beam projector 3 is fixed above a sample base 2 provided with a two-dimensional driving mechanism 1, and a laser beam is made incident perpendicularly to the center A of the substrate 4 on the base 2. A reactive gaseous material is projected as fine and high velocity gaseous flow from pencil nozzles 5, 5 toward the incident point A. The base 2 is manipulated two-dimensionally in this state to form film surface and thin film pattern. All the points on the substrate 4 are heated instantaneously only on the extremely thin surface layer when they pass the irradiating point of the laser beam according to the movement in X-, Y directions and are quickly cooled after the passage thereof. The stage for manufacturing the thin film is thus executed at a lower temp. and the thin film having high quality and adhesion strength is formed.

Description

【発明の詳細な説明】 本発明は薄膜製造方法とその装置に関し、より詳細には
レーザビームで基板を照射して加熱し、同時に反応性ガ
ス状物の高速気流を基板に噴射すると共に、基板を2次
元的に移動させて、反応性ガス状物の熱分解物の薄膜を
基板上に形成せしめる方法とその装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method and apparatus for producing a thin film, and more particularly, the present invention relates to a thin film manufacturing method and an apparatus thereof, and more particularly, to irradiating and heating a substrate with a laser beam, and at the same time injecting a high-speed airflow of a reactive gaseous substance onto the substrate. The present invention relates to a method and an apparatus for forming a thin film of a thermal decomposition product of a reactive gaseous substance on a substrate by moving the gas two-dimensionally.

従来、基板表面に化学反応により薄膜を製造する場合に
は、基板を加熱するか、或は基板を収めた反応室全体を
加熱し、基板周辺の反応性ガスを熱分解して熱分解生成
物の薄膜を基板上に形成せしめていた。
Conventionally, when manufacturing a thin film on the surface of a substrate by chemical reaction, the substrate is heated or the entire reaction chamber containing the substrate is heated to thermally decompose the reactive gas around the substrate and generate thermal decomposition products. A thin film was formed on the substrate.

しかしながら、かかる従来の薄膜形成法では、基板周辺
の空間全体が高温になっているので、反応性ガスの熱分
解生成物が更に二次的、三次的に熱分解したり、或は熱
分解生成物が未分解の反応性ガスと反応して形成した薄
膜中に大小様々なピットが生ずる問題点があった。
However, in such conventional thin film forming methods, since the entire space around the substrate is at high temperature, the thermal decomposition products of the reactive gas may be further thermally decomposed secondary or tertiary, or the thermal decomposition products may be thermally decomposed. There is a problem in that pits of various sizes occur in the thin film formed by the reaction of substances with undecomposed reactive gases.

また、基板が強く加熱されるので、基板の歪、反り、伸
び、縮み等、加熱による寸法精度の・狂いや、基板自体
の組織の変質や、すでに基板に形成された機能的構造の
変化など、形成薄膜と基板の双方に多くの損傷が発生す
る欠点があった。
In addition, since the substrate is heated strongly, it may cause distortion, warping, elongation, shrinkage, etc. of the substrate, loss of dimensional accuracy due to heating, deterioration of the structure of the substrate itself, and changes in the functional structure already formed on the substrate. However, there was a drawback that a lot of damage occurred to both the formed thin film and the substrate.

また、真空蒸着、スパッタリング、イオン・プレーテン
グ等の真空下の物理的方法による薄膜形成においても前
記同様な欠点を回避できなかった。
Further, the same drawbacks as described above cannot be avoided even when forming thin films by physical methods under vacuum such as vacuum evaporation, sputtering, and ion plating.

そこで本発明はかかる従来の欠点を解消すべくなされた
ものであり、レーザビームが照射された基板表面のみが
瞬間的に加熱され、その加熱表面にのみ限定された熱分
解反応を誘発することができ、またレーザビーム自体の
持つ、特定波動エネルギーにより、基板表面およびその
隣接空間に存在する反応性ガスを熱的過程を伴うことな
く化学的に分解することができ、従って、理想的な″低
温表面反応゛が可能となり、高品質の薄膜が得られ、基
体の機能的構造を変化させることもないなどの特長を有
するものである。
Therefore, the present invention was made to eliminate such conventional drawbacks, and it is possible to instantaneously heat only the surface of the substrate irradiated with the laser beam, inducing a thermal decomposition reaction limited only to the heated surface. In addition, the specific wave energy of the laser beam itself can chemically decompose the reactive gas existing on the substrate surface and the space adjacent to it without any thermal process. It has features such as enabling surface reaction, producing a high-quality thin film, and not changing the functional structure of the substrate.

すなわち、本発明の薄膜製造方法は、レーザビームで基
板を照射して加熱しながら反応性ガス状物の気流を前記
基板に噴射し、かつこれと同時に前記基板を2次元的に
移動せしめて前記基板表面に前記反応性ガス状物の熱分
解生成物の薄膜を形成せしめることを特徴とするもので
ある。
That is, in the thin film manufacturing method of the present invention, while heating the substrate by irradiating the substrate with a laser beam, a flow of a reactive gaseous material is injected onto the substrate, and at the same time, the substrate is moved two-dimensionally to form the substrate. This method is characterized in that a thin film of thermal decomposition products of the reactive gaseous substance is formed on the surface of the substrate.

また本発明の薄膜製造装置は、基板と、該基板上に夫々
間隔を置いて設けたレーザビーム投射器および反応性ガ
ス状物噴射ノズルからなり、前記基板を二次元的に駆動
可能にしたことを特徴とするものである。
Further, the thin film manufacturing apparatus of the present invention is comprised of a substrate, a laser beam projector and a reactive gaseous material injection nozzle that are respectively provided at intervals on the substrate, and is capable of driving the substrate two-dimensionally. It is characterized by:

本発明は基板を2次元的に移動させる方法なので、一般
には基板駆動法とも云う。
Since the present invention is a method for moving a substrate two-dimensionally, it is also generally referred to as a substrate driving method.

かかる基板駆動法において重要なことは、基板の固有吸
収波長(λI+)に合致した波長(λL)のレーザビー
ムを照射することである。通常、レーザビームは基板に
より反射、透過、吸収されるが、λ、とλ、が合致した
時にのみレーザビームが基板に吸収される。
What is important in such a substrate driving method is to irradiate a laser beam with a wavelength (λL) that matches the intrinsic absorption wavelength (λI+) of the substrate. Normally, the laser beam is reflected, transmitted, and absorbed by the substrate, but the laser beam is absorbed by the substrate only when λ and λ match.

基板の吸収係数(α)が大きい程、基板内に浸入したレ
ーザビームは基板の表面近くで、通常では10μm以内
で吸収され、加熱エネルギーに変換され、この結果、瞬
間的な表面層加熱が起り、通常5008C〜600℃に
基体表面が加熱される。
The larger the absorption coefficient (α) of the substrate, the more the laser beam that penetrates into the substrate is absorbed closer to the substrate surface, usually within 10 μm, and converted into heating energy, resulting in instantaneous surface layer heating. , the surface of the substrate is usually heated to 5008C to 600C.

そして、本発明においては、基板を2次元的に移動させ
ることによって基板はレーザビームで掃引され、基板の
移動にともなって基板表面が順次瞬間的に加熱され、基
板表面に反応性ガス状物の熱分解生成物の薄膜が形成さ
れるのである。
In the present invention, by moving the substrate two-dimensionally, the substrate is swept by a laser beam, and as the substrate moves, the substrate surface is sequentially and instantaneously heated, and a reactive gas is generated on the substrate surface. A thin film of pyrolysis products forms.

図は本発明の薄膜製造装置の実施例を示す概要図であり
、2次元(X、Y)駆動機構1を備えた試料台2の上方
、少なくとも10αの高さにレーザビーム投射器6を垂
直に固定し、レーザビームを試料台2上の基板4の中心
Aに垂直に入射させる。この入射点Aに向けてペンシル
ノズル5,5を配置し、反応性ガス状物を細い高速気流
として射突させる。
The figure is a schematic diagram showing an embodiment of the thin film manufacturing apparatus of the present invention, in which a laser beam projector 6 is vertically positioned at a height of at least 10α above a sample stage 2 equipped with a two-dimensional (X, Y) drive mechanism 1. , and the laser beam is made perpendicularly incident on the center A of the substrate 4 on the sample stage 2. Pencil nozzles 5, 5 are arranged toward this incident point A, and the reactive gaseous material is injected into the system as a thin high-speed air stream.

この状態で試料台2を2次元的に操縦し、膜面や薄膜パ
ターンを形成する。レーザビームは投射器乙のレンズ系
によって最少、数μmに絞ることが可能であり、従って
線巾数十μmの精密な線図を画くこともできる。ペンシ
ルノズル5は、レーザビーム入射点Aを中心に、半径5
Crn以内の半球上で高さ5副以内に必要個数を配置す
る。
In this state, the sample stage 2 is operated two-dimensionally to form a film surface or a thin film pattern. The laser beam can be narrowed down to a minimum of several micrometers by the lens system of the projector B, and therefore it is also possible to draw a precise line diagram with a line width of several tens of micrometers. The pencil nozzle 5 has a radius of 5 around the laser beam incident point A.
Arrange the required number within 5 heights on the hemisphere within Crn.

基板上のすべての点は、X或はY方向の移動に伴ないレ
ーザビームの照射点、たとえばA点を通過するとき瞬間
的に高温に、しかも極く薄い表面層に限って加熱され、
通過後は素早く冷却される。
As all points on the substrate move in the X or Y direction, when they pass the laser beam irradiation point, for example point A, they are instantaneously heated to a high temperature, and only a very thin surface layer is heated.
After passing through, it is quickly cooled down.

すなわち、レーザビームの照射によって熱的に化学変化
を引起すまで高温に加熱されるのは、基板の極く表面層
のみに限られる。その表面加熱層の厚さは、およそ10
μm以内である。
That is, only the very surface layer of the substrate is heated to a high temperature by the laser beam irradiation to the point where it causes a chemical change. The thickness of the surface heating layer is approximately 10
It is within μm.

そして基板上の照射点Aに接する空間に存在する反応性
ガス状物は瞬時に熱分解され、熱分解生成物の薄膜が移
動する基板上のビームの照射点Aに堆積される。このA
上の膜物質の厚さは、基板の移動速度により変化し、移
動速度が増加すると膜物質堆積速度は低下する。
The reactive gas existing in the space in contact with the irradiation point A on the substrate is instantaneously thermally decomposed, and a thin film of thermal decomposition products is deposited at the beam irradiation point A on the moving substrate. This A
The thickness of the overlying film material varies with the speed of movement of the substrate; as the speed of movement increases, the rate of film material deposition decreases.

従って堆積膜の厚さを一定に保つには基板4の移動速度
が増大するにつれ、ビームのエネルギーを増加しなけれ
ばならない。
Therefore, in order to maintain a constant thickness of the deposited film, the energy of the beam must be increased as the moving speed of the substrate 4 increases.

ところで、発明者らの検討結果によると、ビ−ムエネル
ギーE(ワット)と、基板の移動速度u(crn/5e
e)との間には次の関係があることが判明した。
By the way, according to the study results of the inventors, the beam energy E (watts) and the substrate moving speed u (crn/5e
It was found that there is the following relationship between e).

E:u415 すなわち、基板面全体に均一な膜面を形成するためには
、与えられたレーザビームのエネルギーにおいて、基板
移動速度を常に一定に保持する必要があることがわかる
E: u415 That is, it is understood that in order to form a uniform film surface over the entire substrate surface, it is necessary to keep the substrate moving speed constant at a given laser beam energy.

本発明においては、反応性ガス状物噴射ノズル5,5に
より各種の反応性ガス状物を併用して、単種膜や、多層
膜構造を形成することができる。
In the present invention, a monolayer film or a multilayer film structure can be formed by using various reactive gaseous substances together through the reactive gaseous substance injection nozzles 5, 5.

試料台2の駆動はエアシリンダーまたは電動モータで行
ない、その最大駆動長は5oCrn以上である。この基
板駆動法は精密微細加工性に極めて優れている。
The sample stage 2 is driven by an air cylinder or an electric motor, and its maximum driving length is 5oCrn or more. This substrate driving method is extremely superior in precision microfabrication.

本発明において使用する基板としては、従来の薄膜形成
法において用いられた基板をすべて用いることができ、
たとえばガラス板、金属板、石英板、セラミックス板な
どをあげることができる。
As the substrate used in the present invention, all substrates used in conventional thin film forming methods can be used.
Examples include glass plates, metal plates, quartz plates, and ceramic plates.

これら基板に加えてプラスチック、木材などを用いるこ
ともできる。
In addition to these substrates, plastic, wood, etc. can also be used.

通常のレーザ発振器が発生するビームの直径は小さく、
10rn0mφ 以下なので形成される膜面も同程度の
円形斑点となる。従って広い表面薄膜を形成するために
は、ビーム径を必要な大きさに拡大しなければならない
。しかしながら、ビーム径を拡大すれば、照射表面での
エネルギー密度が下り、熱分解反応の誘発が困難になる
The diameter of the beam generated by a normal laser oscillator is small;
Since the diameter is less than 10rn0mφ, the formed film surface also has circular spots of the same size. Therefore, in order to form a thin film on a wide surface, the beam diameter must be expanded to the required size. However, increasing the beam diameter reduces the energy density at the irradiated surface, making it difficult to induce thermal decomposition reactions.

また、ビーム断面にエネルギー分布が存在するので、膜
厚か不均一になる。
Furthermore, since there is an energy distribution in the cross section of the beam, the film thickness becomes non-uniform.

そこで本発明においては、有限の直径を有するレーザビ
ームを使用し、基板を2次元的に移動させることによっ
て斑点蒸着を逐次推進し、最終的に広い膜面を迅速に形
成せしめるのである。
Therefore, in the present invention, a laser beam having a finite diameter is used and the substrate is moved two-dimensionally to promote spot deposition successively, ultimately resulting in the rapid formation of a wide film surface.

本発明における反応性ガス状物とは、加熱された基体表
面に接触して極めて速やかに熱分解されるガス状物、す
なわちガス状または煙霧状の熱分解性原料であり、基体
表面には熱分解生成物の清浄な薄膜が形成される。
In the present invention, the reactive gaseous substance refers to a gaseous substance that is thermally decomposed very quickly when it comes into contact with the heated substrate surface, that is, a gaseous or fume-like thermally decomposable raw material. A clean thin film of decomposition products forms.

使用するレーザは数1.0mW以」二の出力があれば連
続波でもパルス波でもよい。
The laser used may be continuous wave or pulse wave as long as it has an output of several 1.0 mW or more.

好ましくは、基板に照射したときに発熱効果の大きなも
の、換言ずれば基板がレーザビームを効率良く吸収する
ものであることが好ましい。
Preferably, the laser beam has a large heat-generating effect when irradiated onto the substrate, in other words, the substrate efficiently absorbs the laser beam.

従って基板とレーザビームとの間には最適の組合せが存
在する。
Therefore, an optimal combination exists between the substrate and the laser beam.

たとえば、Si基板に対しては、Arレーザ(波長04
8μm)、クリプトンレーザ(053μm)、ルビーレ
ーザ(0,69μm)が、セラミックスやガラスに対し
ては、YAGレーザ(106μm)、HF / DFケ
ミカルレーザ(2,5−4,06μm )、CO2ル−
ザ(106μm)が利用される。本発明の最大の利点は
、通常の高温化学蒸着法と同様、すべての反応性薬品を
反応性ガス状物原料として利用出来るという汎用性にあ
る。
For example, for Si substrates, Ar laser (wavelength 04
For ceramics and glass, YAG laser (106 μm), HF/DF chemical laser (2,5-4,06 μm), CO2 laser
(106 μm) is used. The greatest advantage of the present invention is its versatility in that, like conventional high temperature chemical vapor deposition methods, any reactive chemical can be used as a reactive gaseous source.

従って、製作可能な薄膜素材は極めて広範囲に亘る。た
とえば、AA 、Si 、Cr 、Ni 、Cd 、F
e等の金属、MoSi2. WSi2. TaSi2.
 PtSi、、 、 NbSi2゜NiCr  、5n
Cu  、ZnCu  、InSb  、GaSb  
、LaGa  、NdNi  。
Therefore, the thin film materials that can be manufactured are extremely wide-ranging. For example, AA, Si, Cr, Ni, Cd, F
e, etc., MoSi2. WSi2. TaSi2.
PtSi, , NbSi2゜NiCr, 5n
Cu, ZnCu, InSb, GaSb
, LaGa, NdNi.

Nb5AA + NbSn 、 B1Te等の合金、ま
た、化合物材料でばSin、、  +At203.Ti
e2.ZrO2,5n02 +In2O3,Fe2O3
等の酸化物、SiC、TiC、B、C。
Alloys such as Nb5AA + NbSn and B1Te, and compound materials such as Sin, +At203. Ti
e2. ZrO2,5n02 +In2O3,Fe2O3
oxides such as SiC, TiC, B, C.

WC、VC; 、 ZrC等の炭化物、TiN 、 B
N 、 AtN 、 TaN。
WC, VC; Carbide such as ZrC, TiN, B
N, AtN, TaN.

Si3N4. CrN 、 VN等の窒化物、’ril
l、、  、 ZrB2゜CrB2. WB 、 La
B6. MoB、、等の硼化物、その他、硫化物など殆
んどすべての電子・情報・エネルギー・機械・化学工業
用の表面及び機能性膜素拐を網羅する。
Si3N4. Nitride such as CrN, VN, 'ril
l, , ZrB2°CrB2. WB, La
B6. Covers almost all surfaces and functional membranes for electronic, information, energy, machinery, and chemical industries, including borides such as MoB, and other sulfides.

以−1二述へたように本発明によれば、従来の技術にな
い明白な効果か奏せられる。
As described above, the present invention provides obvious effects that are not available in the prior art.

すなわち、基板の2次元的移動によるレーザビームの掃
引照射によって熱的に化学変化を引起すまで高温に加熱
されるのは、基板の極く表面層のみに限られる。その表
面加熱層の厚さは、およそ10μm以内である。従って
、基板自体の湿度は上ることはなく、高温反応は表面層
に限って起り、短時間に冷却する。ずなわぢ、実質的に
、薄膜製作工程は低温化されたことになる。
In other words, only the very surface layer of the substrate is heated to a high temperature until a chemical change is caused by the sweeping irradiation of the laser beam due to the two-dimensional movement of the substrate. The thickness of the surface heating layer is approximately within 10 μm. Therefore, the humidity of the substrate itself does not increase, high temperature reactions occur only in the surface layer, and the substrate is cooled in a short time. In effect, the thin film manufacturing process has been lowered in temperature.

従って、従来の基板全体、あるいは基板とその周辺の原
料ガス状物全体が加熱される薄膜製造方法のように、二
次的、三次的な分解反応や副反応を生ずることがほとん
どなく、目的とする薄膜形成反応のみを優先的に実施す
ることができる。そして、製作された膜は、高温反応生
成膜に特有な高品質で、耐着力の優れたものが得られる
Therefore, unlike the conventional thin film manufacturing method in which the entire substrate or the entire substrate and surrounding raw material gaseous material is heated, there are almost no secondary or tertiary decomposition reactions or side reactions, and the objective is achieved. It is possible to preferentially perform only those thin film forming reactions that The produced film is of high quality and has excellent adhesion strength, which is characteristic of films produced by high-temperature reactions.

また本発明により酸化物膜を製作する時は、大気中で実
施出来る便益がある。しかも、大面積の膜面を連続的に
製造することも可能である。
Furthermore, when producing an oxide film according to the present invention, there is the advantage that it can be carried out in the atmosphere. Moreover, it is also possible to continuously manufacture large-area membrane surfaces.

反応性薄板状気流を安定化したり、特種ガス雰囲気又は
減圧・真空を必要とする時は、密閉室或はベルジャー内
で実施することもできる。
When the reactive thin plate gas flow is stabilized or a special gas atmosphere or reduced pressure/vacuum is required, the reaction can be carried out in a closed room or a bell jar.

なお、密閉室内へのレーザビームの導入は、室壁に設け
た窓を透して行なう。窓材料には、レーザビームに対し
透過率の高い結晶材料を用いる。レーザビームの波長が
赤外域にあっても、可視域にあっても利用出来る結晶板
としては、Zn5e 、MgF2. LiF 、CaF
2. BaF2. NaC1、KCI。
Note that the laser beam is introduced into the sealed chamber through a window provided in the wall of the chamber. A crystal material with high transmittance to the laser beam is used as the window material. Crystal plates that can be used regardless of whether the wavelength of the laser beam is in the infrared region or the visible region include Zn5e, MgF2. LiF, CaF
2. BaF2. NaC1, KCI.

KBr等が挙げられる。とりわけ、5in2. LiF
 。
Examples include KBr. Especially, 5in2. LiF
.

MgF2  等は可視域において良好な性能を示す。MgF2 etc. show good performance in the visible range.

以下、本発明の実施例を述べる。Examples of the present invention will be described below.

基板駆動法により、Ni及びWの膜面及びパターン形成
を行なった。図示の如く、円筒型ベルジャ6の中央に2
次元(X、Y)I駆動試料台2を固定し、試料台2の駆
動中心上方に、ビーム投射器6を垂直に取り付けた。ベ
ルジャ6の寸法は300+nmφX 450 mで、天
井中央にZn5e板(直径30隔φ)をつけたビーム入
射窓6Aを設けた。試#を台2は広さ80石×80朔、
2次元(x、y)駆動機構1を含めた高さは約150m
mである。ビーム投射器3は試料台2の真上1’50 
rMlの高さに、ビーム入射窓6Aの真下に取り付け、
S1短焦点レンズにより試料台2」二に鋭い焦点Aを結
ばせ、更に、この焦点位置Aがら、約2 ctnの半球
面上に、ペンシルノズル5を2木、ビーム焦点Aに照準
して配備した。ペンシルノズル5はステンレス製テ、寸
法は6mmφX 80 mm 、ノズルロ径ハ06叫φ
である。
Ni and W film surfaces and patterns were formed using a substrate driving method. As shown in the figure, there are two holes in the center of the cylindrical bell jar 6.
The dimension (X, Y) I drive sample stage 2 was fixed, and the beam projector 6 was vertically attached above the drive center of the sample stage 2. The dimensions of the bell jar 6 were 300+nmφ×450 m, and a beam entrance window 6A with a Zn5e plate (diameter 30 mm apart) was provided in the center of the ceiling. Test #2 is 80 stones x 80 square meters in size.
The height including the two-dimensional (x, y) drive mechanism 1 is approximately 150m.
It is m. The beam projector 3 is located 1'50 directly above the sample stage 2.
Installed directly below the beam entrance window 6A at a height of rMl,
A sharp focus A is focused on the sample stage 2'' by the S1 short focus lens, and from this focus position A, a pencil nozzle 5 is placed on a hemispherical surface of approximately 2 ctn, aiming at the beam focus A. did. Pencil nozzle 5 is made of stainless steel, dimensions are 6mmφ x 80mm, nozzle bottom diameter is 06mmφ
It is.

試料台2に研磨したアルミナ基板(50mmX50 +
n+n X O,5m+n ) 4を置き、10〜20
 TorrのAr雰囲気にした後、2本のノズル5.5
から、交互に、N1(Co)、及びWF6の蒸気をH2
ガスと共に噴射した。同時にCO2レーザビームLを連
続照射しながら、試料台駆動機構1を操作して、金属N
iとWの蒸着ラインからなるラスターパターンを形成し
た。入射CO2ビームのエネルギーは8watt、 N
1(Co)、の温度は150℃、WF、  の温度は1
0°C5噴射ガス量はいづれも約] l/mm 。
A polished alumina substrate (50 mm x 50 +
n+n
After creating an Ar atmosphere of Torr, two nozzles 5.5
The vapors of N1(Co) and WF6 are alternately added to H2.
Injected with gas. At the same time, while continuously irradiating the CO2 laser beam L, operate the sample stage drive mechanism 1 to
A raster pattern consisting of i and W vapor deposition lines was formed. The energy of the incident CO2 beam is 8 watts, N
The temperature of 1(Co) is 150℃, and the temperature of WF is 1
The amount of gas injected at 0°C5 is approximately] l/mm.

試料台の移動速度は2 mm/seeである。The moving speed of the sample stage was 2 mm/see.

製作したラスターパターンの素線数は10本、線間ピッ
チは3 mm %線巾は100〜150μm1高さは約
0.5μであった。素線断面は山形となり、約200〜
500μm程度裾が拡がる。また、ビームエネルギーと
試料台駆動速度を共に3倍増加したところ、この裾の拡
がりは1/2以下に減じた。
The number of strands of the manufactured raster pattern was 10, the line pitch was 3 mm, the line width was 100 to 150 μm, and the height was about 0.5 μm. The cross section of the wire is chevron-shaped, approximately 200~
The hem widens by about 500 μm. Furthermore, when both the beam energy and the sample stage driving speed were increased by three times, the spread of this tail was reduced to less than 1/2.

蒸着したNi膜面ば銀色を、W膜面は黒灰色を呈した。The surface of the deposited Ni film had a silver color, and the surface of the W film had a black-gray color.

【図面の簡単な説明】[Brief explanation of the drawing]

図は本発明の薄膜製造装置の実施例を示す概要図である
。 1・・2次元駆動機構 6・・レーザビーム投射器 4
・・・基板 5・・・反応性ガス状物噴射ノズル。 特許出願人 工業技術院長  川 1)裕 部指定代理
人 工業技術院大阪工業技術試験所長速水諒三
The figure is a schematic diagram showing an embodiment of the thin film manufacturing apparatus of the present invention. 1. Two-dimensional drive mechanism 6. Laser beam projector 4
...Substrate 5...Reactive gaseous substance injection nozzle. Patent applicant: Director of the Agency of Industrial Science and Technology Kawa 1) Hirobe Designated Agent: Ryozo Hayami, Director of the Osaka Institute of Industrial Science and Technology, Agency of Industrial Science and Technology

Claims (1)

【特許請求の範囲】 1、レーザビームで基板を照射して加熱しながら反応性
ガス状物の気流を前記基板に噴射し、かつこれと同時に
前記基板を2次元的に移動せしめて前記基板表面に前記
反応性ガス状物の熱分解生成物の薄膜を形成せしめるこ
とを特徴とする薄膜製造方法。 2、基板と、該基板上に間隔を置いて設けた1/−ザビ
ーム投射器および反応性ガス状物噴射ノズルからなり、
前記基板を二次元的に駆動可能にしたことを特徴とする
薄膜製造装置。
[Claims] 1. While irradiating and heating the substrate with a laser beam, a flow of a reactive gas is injected onto the substrate, and at the same time, the substrate is moved two-dimensionally to improve the surface of the substrate. A method for producing a thin film, comprising forming a thin film of a thermal decomposition product of the reactive gaseous substance. 2. Consisting of a substrate, a 1/-the beam projector and a reactive gaseous substance injection nozzle spaced apart from each other on the substrate,
A thin film manufacturing apparatus characterized in that the substrate can be driven two-dimensionally.
JP24761083A 1983-12-27 1983-12-27 Method and device for producing thin film Pending JPS59140366A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24761083A JPS59140366A (en) 1983-12-27 1983-12-27 Method and device for producing thin film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24761083A JPS59140366A (en) 1983-12-27 1983-12-27 Method and device for producing thin film

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP17343682A Division JPS5961920A (en) 1982-10-01 1982-10-01 Manufacture of thin film and equipment for the same

Publications (1)

Publication Number Publication Date
JPS59140366A true JPS59140366A (en) 1984-08-11

Family

ID=17166062

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24761083A Pending JPS59140366A (en) 1983-12-27 1983-12-27 Method and device for producing thin film

Country Status (1)

Country Link
JP (1) JPS59140366A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01136973A (en) * 1987-11-24 1989-05-30 Nec Corp Film formation
US4859496A (en) * 1986-09-02 1989-08-22 Matsushita Electric Industrial Co., Ltd. Method of producing an electrically-conductive transparent film

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5565428A (en) * 1978-11-10 1980-05-16 Tdk Corp Direct formation of thin film pattern

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5565428A (en) * 1978-11-10 1980-05-16 Tdk Corp Direct formation of thin film pattern

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4859496A (en) * 1986-09-02 1989-08-22 Matsushita Electric Industrial Co., Ltd. Method of producing an electrically-conductive transparent film
JPH01136973A (en) * 1987-11-24 1989-05-30 Nec Corp Film formation

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