JPS5987330A - Temperature measuring method of eddy current type - Google Patents
Temperature measuring method of eddy current typeInfo
- Publication number
- JPS5987330A JPS5987330A JP19612682A JP19612682A JPS5987330A JP S5987330 A JPS5987330 A JP S5987330A JP 19612682 A JP19612682 A JP 19612682A JP 19612682 A JP19612682 A JP 19612682A JP S5987330 A JPS5987330 A JP S5987330A
- Authority
- JP
- Japan
- Prior art keywords
- frequency
- temperature
- coil
- induced voltage
- point
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/36—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using magnetic elements, e.g. magnets, coils
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
本発明は、グローブ型渦流検出コイルを用いる温度測定
方法に関し、とぐに検出コイルの寸法に対して厚さが無
限大とみなされる厚さを持った磁性体の表面及び表面近
傍の温度を測定する方法に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a temperature measurement method using a globe-type eddy current detection coil, and the present invention relates to a temperature measurement method using a globe-type eddy current detection coil. The present invention relates to a method for measuring temperature near a surface.
たとえば熱間圧延作業において、圧延ロールの表面及び
表面近傍の温度は、圧延製品の品質及びロール自身の寿
命に大きな影響を与えるため、その温度変化を仰ること
は圧延作業管理上極めて重要なことである。し力1し圧
延中は、ロールは高速で回転しているので、直接感温素
子をロールに接触して温度を測定することは出来ず、さ
らには冷却水による水膜が存在しかつ水蒸気が充満して
いる雰囲気であるので、放射温度計を用いたとしても所
望の測定精度を得ることは難しい。また渦流式温度計を
用いる測温法もあるが、従来の渦流式温度計は、測定温
度範囲が低温部に限られており、熱間圧延時のロールの
ようにその表面温度が600℃付近まで上るものに対し
ては、被測定物の透磁率変化による出力の変化が複雑に
なるため、適用不能であった。For example, in hot rolling operations, the temperature at and near the surface of a rolling roll has a great effect on the quality of the rolled product and the life of the roll itself, so monitoring temperature changes is extremely important for rolling operation management. be. During rolling with a force of 1, the rolls are rotating at high speed, so it is not possible to measure the temperature by directly contacting the temperature sensing element with the rolls, and there is also a water film caused by cooling water and water vapor. Since the atmosphere is full, it is difficult to obtain the desired measurement accuracy even if a radiation thermometer is used. There is also a temperature measurement method that uses an eddy current thermometer, but with conventional eddy current thermometers, the measurement temperature range is limited to low temperature areas, and the surface temperature of the roll during hot rolling is around 600°C. This method was not applicable to objects that rise up to 300 degrees Celsius because changes in output due to changes in magnetic permeability of the object to be measured would be complicated.
本発明は、水膜が存在しかつ水蒸気が充満した雰囲気に
おける圧延ロールのような物体の表面及び表面近傍の温
度を、広い温度範囲にわたって非接触で測定する温度測
定方法を提供するものである。The present invention provides a temperature measurement method that non-contactly measures the temperature at and near the surface of an object such as a mill roll over a wide temperature range in an atmosphere where a water film exists and is filled with water vapor.
以下本発明の詳細な説明する。The present invention will be explained in detail below.
圧延ロールのような磁性体の透磁率、導電率など電気特
性、磁気特性は温度によって変化するので、被測定物表
面に近接して設けた検出コイルの1次コイルに高周波の
励磁電流を流した場合に、被測定物の表面近傍に生ずる
渦電流は、被測定物の温度変化によって変化する。この
渦電流の変化は、1次コイルの内側に同軸上に配置され
た2次コイルの出力電圧の変化となって現われ、この出
力電圧の変化により被測定物の温度変化を測定すること
ができる。Since the electrical and magnetic properties of magnetic materials such as rolling rolls, such as magnetic permeability and conductivity, change depending on temperature, a high-frequency excitation current was passed through the primary coil of the detection coil installed close to the surface of the object to be measured. In this case, the eddy current generated near the surface of the object to be measured changes depending on the temperature change of the object to be measured. Changes in this eddy current appear as changes in the output voltage of the secondary coil placed coaxially inside the primary coil, and changes in the temperature of the object to be measured can be measured by changes in this output voltage. .
いま、第1図に示したような1次コイル1と2次コイル
2を同軸に配置した検出コイル構成において、コイルの
大きさ、形状9巻数、電流および被測定物の厚さを一定
とレム:とき、2次コイル2に誘起される電圧■2げ、
被測定物Sの透磁率μ。Now, in the detection coil configuration in which the primary coil 1 and the secondary coil 2 are arranged coaxially as shown in Fig. 1, it is assumed that the coil size, shape, number of turns, current, and thickness of the object to be measured are constant. : When the voltage induced in the secondary coil 2 is
Magnetic permeability μ of the object to be measured S.
導電率σ、被測定物と検出コイルとの間の距離(以下リ
フトオフという)d、1次コイル1に流す励磁電流の周
波数fによって決する。ここで2矢コイル誘起電圧V2
を複素電圧平面上に示すとつぎのようになる。It is determined by the conductivity σ, the distance d between the object to be measured and the detection coil (hereinafter referred to as lift-off), and the frequency f of the excitation current flowing through the primary coil 1. Here, the two-arrow coil induced voltage V2
is shown on the complex voltage plane as follows.
■ 透磁率μ、導電率σ、リフトオフd1周波数fの一
定の値の組合せに対して、誘起電圧v2の値が一つ定ま
り、これは複素電圧平面内の1点Aで表わされる。すな
わち
V2=func、(μ、a、d、f) −・−−−
−−−−(1)と表わされる。(2) For a combination of constant values of magnetic permeability μ, conductivity σ, and lift-off d1 frequency f, one value of induced voltage v2 is determined, and this value is represented by one point A in the complex voltage plane. That is, V2=func, (μ, a, d, f) ---
---It is expressed as (1).
■ 導電率σと周波数fのいずれか一方あるいは両方が
変化すると点AJある一定のカーブを描く。これをカー
ブCnとすると、点AH導電率σと周波数fの積(σx
f)が増加(減少)すると、カーブCn上を右まわジ(
左まわり)VC動く。■ When either or both of conductivity σ and frequency f changes, point AJ draws a certain curve. If this is a curve Cn, then the product of the point AH conductivity σ and the frequency f (σx
When f) increases (decreases), it rotates clockwise on the curve Cn (
counterclockwise) VC moves.
すなわち
V2= func、 (σX f、 μ、 d )
−−−−−=−(2) 3−
と表わされる。That is, V2 = func, (σX f, μ, d)
−−−−−=−(2) 3−.
これを図で示すと第2図のようになる。第2図において
横軸は誘起電圧■2の実数成分であり、縦軸は誘起電圧
v2の虚数成分である。ただしここで誘起電圧■2の実
数部VReおよび虚数部VImを被測定物がない場合の
誘起電圧Voの絶対値をもって規準化しである。This is illustrated in Figure 2. In FIG. 2, the horizontal axis is the real component of the induced voltage 2, and the vertical axis is the imaginary component of the induced voltage v2. However, here, the real part VRe and imaginary part VIm of the induced voltage (2) are normalized by the absolute value of the induced voltage Vo when there is no object to be measured.
図において、μ、σ、d、fのある一定の組合せに対応
する点Aij、(σxf)が増加(減少)するとカーブ
Cn上を右まわり(左まわり)に動く。In the figure, when the point Aij, (σxf) corresponding to a certain combination of μ, σ, d, and f increases (decreases), it moves clockwise (counterclockwise) on the curve Cn.
■ 透磁率μが増加(減少)すると、第2図のカーブC
nが同図のカーブCM(カーブCo )の方向に変化す
る。ここでカーブCo(q被測定物が非磁性体す−なわ
ち透磁率μがμm 1. OX 4πxio−7〔詔〕
の場合のカーブである。透磁率μが犬きぐなるに従いカ
ーブはCOから上方にふくらんでいくが、カーブのふく
らみは一定の大きさに飽和し図中CMとして示すカーブ
に漸次に接近し、透磁率μが検出コイルの寸法と被測定
物の厚みとによつ 4−
て定まるある一定の透磁率の値(これをμmとする)以
上になると、点AHカーブCM上をKなわち
V2= func、(Z百、 d ) −−−
−−−・−・(3)1こだしくμ≧μm)
と表わされる。なお上記においてカーブの上方へのふく
らみが飽和する透磁率μの値μ=μmは、被測定物の厚
みが大きく(小さく)なると、小さな(大きな)値とな
る。■ As magnetic permeability μ increases (decreases), curve C in Figure 2
n changes in the direction of curve CM (curve Co) in the figure. Here, the curve Co(qThe object to be measured is a non-magnetic material, that is, the magnetic permeability μ is μm.
This is the curve for the case. The curve swells upward from CO as the magnetic permeability μ becomes steeper, but the bulge of the curve saturates to a certain size and gradually approaches the curve shown as CM in the figure, and the magnetic permeability μ increases as the size of the detection coil increases. When the magnetic permeability exceeds a certain value (this is assumed to be μm) determined by ) ---
---・-・(3) 1 μ≧μm) In the above, the value μ=μm of the magnetic permeability μ at which the upward bulge of the curve is saturated becomes smaller (larger) as the thickness of the object to be measured becomes larger (smaller).
さらに、周波数fが検出コイルの寸法によって定まるあ
る一定周波数の値(これをfmとする)以上になると、
透磁率μがμm より大きくても小さくても点Aidカ
ーブCM(カーブCnを含めて〕うになる。すなわち
V2= func、 (i]、 d ) ・・
・・・−14)ただしくf≧fm)
■ リフトオフdを大きくすると、点Aは第2図の縦軸
の目盛1.0の点Bに向って動く。Furthermore, when the frequency f exceeds a certain frequency value (this is defined as fm) determined by the dimensions of the detection coil,
Whether the magnetic permeability μ is larger or smaller than μm, the point Aid curve CM (including the curve Cn) becomes like this. That is, V2 = func, (i], d)...
...-14) Provided that f≧fm) ■ When lift-off d is increased, point A moves toward point B on the scale of 1.0 on the vertical axis in FIG.
本発明は、上述の様な誘起電圧v2の複素電圧平面上で
の挙動についての知見にもとづいて創案されたものであ
る。The present invention was created based on the knowledge about the behavior of the induced voltage v2 on the complex voltage plane as described above.
上述のことから、複素電圧平面上での誘起電圧■2を示
す点Aがカー10M上を動く様な条件で測温を行なうな
らば、広い温度範囲にわたって同一検出コイルで測温が
可能となることがわかる。このような条件の1つとして
、温度範囲の高低にががわらず周波数fを前記したfm
以上の周波数にして、点AがカーブCMないしCnの下
部にくるようにすることが考えられるが、温度の低い領
域では、周波数fを高くすると従来法の場合よりも測温
感度が低下するので好ましくない。そこで本発明では、
被測定物の透磁率μが、複素電圧平面上で誘起電圧v2
を示す点Aがカー10M上を動くようになるような前記
μmと同じになる温度を境界として、この境界温度以下
の温度域(以下これを低温域という)では、第3図のよ
うに誘起電圧■2を示す点がカー10M上で実数成分が
ほぼ最大になる点Xを設定し、この点XVc対応した周
波数fxを基準励磁周波数とし、測温中に誘起電圧■2
がつねに点Xに対応した値となるように周波数を可変制
御し、前記境界温度より高い温度域(以下これを高温域
という)では、誘起電圧V2を示す点がカーブCMの下
部になる点X′に対応した周波数fx’(≧fm )を
基準励磁周波数とし、測温中に誘起電圧■2がつねに点
X′に対応した値となるように周波数を可変制御するも
のである。このようにすることにより被測定物の温度変
化は、励磁周波数の変化としてとらえられることになる
。From the above, if temperature is measured under conditions such that point A indicating the induced voltage (2) on the complex voltage plane moves on the car 10M, temperature can be measured over a wide temperature range with the same detection coil. I understand that. One such condition is that the frequency f is equal to fm regardless of the temperature range.
It is conceivable to set the frequency above above so that the point A is at the bottom of the curve CM or Cn, but in low temperature regions, increasing the frequency f will reduce the temperature measurement sensitivity compared to the conventional method. Undesirable. Therefore, in the present invention,
The magnetic permeability μ of the object to be measured is the induced voltage v2 on the complex voltage plane.
In the temperature range below this boundary temperature (hereinafter referred to as low temperature range), the induced temperature is as shown in Fig. Set the point X where the real component is almost the maximum on the car 10M, and set the frequency fx corresponding to this point XVc as the reference excitation frequency, and the induced voltage ■2 during temperature measurement.
The frequency is variably controlled so that the value always corresponds to point The frequency fx' (≧fm) corresponding to point X' is set as the reference excitation frequency, and the frequency is variably controlled so that the induced voltage (2) always has a value corresponding to point X' during temperature measurement. By doing this, changes in the temperature of the object to be measured can be understood as changes in the excitation frequency.
なお上記において、低温域と高温域の境界は、被測定物
の透磁率μが前述のμmと等しくなる温度であるので、
この境界温度は被測定物の材質(成分)と厚み、及び検
出コイルの寸法によって異った温度となる。In the above, the boundary between the low temperature region and the high temperature region is the temperature at which the magnetic permeability μ of the object to be measured is equal to the aforementioned μm, so
This boundary temperature varies depending on the material (component) and thickness of the object to be measured and the dimensions of the detection coil.
第4図に本発明の実施例における装置の回路構成を示す
。18ニ基準励磁周波数の高周波電圧を発生するための
高周波発振器、6,7はこの高周波電圧波形の位相を所
定の位相差ψ1.ψ2だけ移す移相器である。20′は
検出コイルで、高周波発振器18の出力は検出コイル加
の1次コイル1に加えられる。この1次コイル1は第1
図に示したように被測定物に近接して設置されており、
その内部に同軸上の2次コイル2が設置されている。2
次コイル2の出力に増巾器3を経て同期検波器4に入力
される。移相器6の移相角ψ、は、第3図の複素電圧平
面上の点Xあるいに点X′ニおけるリフトオフdの変化
による誘起電圧■2の変化ベクトルの方向とカーブCM
のなす角に対応した角であり、シタがって同期検波器4
の出力は誘起電圧■2のリフトオフdによる変化分であ
る。第3図の複素電圧平面上での点Xあるいは点X′の
位置を設定すると、基準位相差演算器】9で点Xあるい
に点X′の位相角が演算され、移相器7の移相角ψ2が
設定される。移相器7の出力に同期検波器8で誘起電圧
v2との検波に用いられるとともに、90°移相器10
にも加えられる。90°移相器10の出力は同期検波器
11で誘起電圧v2との検波がなされる。すなわち同期
検波器8の出力は誘起電圧v2の92位相成分v2ψ2
であり、同期検波器11の出力に誘起電圧v2の(ψ2
十90° )位相成分■2(ψ2+90°)となるため
、位相差演算器13でtan −’の演算を行なうこと
により、その出力は誘起電圧v2の位相角の基準位相角
ψ2からの偏差、すなわち第3図の点Xあるいl”lX
’y+>らの偏差を位相角で表わしたものとなる。位相
差演算器13の出力は積分器5の出力とともにリフトオ
フ変動補正演算器14に加えられ、積分器5の出力が0
でない場合には、リフトオフdの変化による誘起電圧■
2の変化分の除去がなされたのち、周波数コンバータ1
5に加えられ、位相差演算器13の出力を0Vr−する
ために必要な1次コイル励磁電流の周波数の変化分Δf
に変換され、周波数一温度変換演算器16と発振周波数
制御回路17に加えられる6、発振周波数制御回路17
では、高周波発振器18の周波数をΔf゛だけ変化させ
るように発振器定数の変更がなされる。周波数一温度変
換演算器16では、周波数変化分Δfは、
Ko11fo=μ/σ
Ko・(fo+Δf)−μ/σ十Δ(μ/σ) ・・・
・・・・・・(5)より
Δ(μ/σ)=Ko・(fo+Δf〕−μ/σ=Ko・
(fo−+−af)−Ko@f。FIG. 4 shows a circuit configuration of a device in an embodiment of the present invention. High-frequency oscillators 6 and 7 for generating a high-frequency voltage at a reference excitation frequency (18D) change the phase of this high-frequency voltage waveform to a predetermined phase difference ψ1. It is a phase shifter that shifts by ψ2. 20' is a detection coil, and the output of the high-frequency oscillator 18 is applied to the primary coil 1 which is added to the detection coil. This primary coil 1 is the first
As shown in the figure, it is installed close to the object to be measured.
A coaxial secondary coil 2 is installed inside the coil. 2
The output of the next coil 2 is inputted to a synchronous detector 4 via an amplifier 3. The phase shift angle ψ of the phase shifter 6 is determined by the direction of the change vector of the induced voltage 2 due to the change in lift-off d at the point X or point X' on the complex voltage plane in FIG. 3 and the curve CM.
The angle corresponds to the angle formed by the synchronous detector 4.
The output is the change in induced voltage (2) due to lift-off d. When the position of point X or point X' on the complex voltage plane in FIG. 3 is set, the phase angle of point X or point A phase shift angle ψ2 is set. The output of the phase shifter 7 is used to detect the induced voltage v2 with a synchronous detector 8, and a 90° phase shifter 10 is used to detect the induced voltage v2.
It can also be added to The output of the 90° phase shifter 10 is detected by the synchronous detector 11 against the induced voltage v2. In other words, the output of the synchronous detector 8 is the 92 phase component v2ψ2 of the induced voltage v2.
, the induced voltage v2 (ψ2
190°) phase component ■2 (ψ2+90°), so by calculating tan −' in the phase difference calculator 13, the output is the deviation of the phase angle of the induced voltage v2 from the reference phase angle ψ2, That is, point X or l"lX in Figure 3
'y+> is expressed as a phase angle. The output of the phase difference calculator 13 is added to the lift-off fluctuation correction calculator 14 together with the output of the integrator 5, so that the output of the integrator 5 becomes 0.
If not, the induced voltage due to change in lift-off d■
After the change in 2 is removed, the frequency converter 1
5, and the change Δf in the frequency of the primary coil excitation current necessary to make the output of the phase difference calculator 13 0Vr-
and is added to the frequency-temperature conversion calculator 16 and the oscillation frequency control circuit 17.
Then, the oscillator constant is changed so that the frequency of the high-frequency oscillator 18 is changed by Δf'. In the frequency-temperature conversion calculator 16, the frequency change Δf is as follows: Ko11fo=μ/σ Ko・(fo+Δf)−μ/σ+Δ(μ/σ)...
・・・・・・From (5), Δ(μ/σ)=Ko・(fo+Δf]−μ/σ=Ko・
(fo-+-af)-Ko@f.
=Ko・Δf 0.、、−、−
(6)なる関係を用いてΔ(μ/σ)に変換され、温度
変化として出力される。なおここでKoid点Xあるい
は点X′でのに一μ/σ×fの値、fold現時点での
高周波発振器18の周波数である。=Ko・Δf 0. ,,−,−
It is converted into Δ(μ/σ) using the relationship (6) and output as a temperature change. Here, the value of 1μ/σ×f at the Koid point X or point X' is the frequency of the high frequency oscillator 18 at the current moment.
このように、被測定物の温度変化に伴なう2次コイルの
誘起電圧の変化は現時点の周波数からの変位にして検出
されるので、測定する温度域及び被測定物の材質(成分
)に合せて複素電圧平面上の点及びこれに対応した励磁
周波数を予じめ設定することにより、広い温度範囲にわ
たって高精度で温度測定が可能となる。In this way, changes in the induced voltage in the secondary coil due to changes in the temperature of the object to be measured are detected as a deviation from the current frequency, so it is possible to In addition, by setting in advance the points on the complex voltage plane and the corresponding excitation frequencies, it becomes possible to measure temperature with high accuracy over a wide temperature range.
本発明を熱間圧延用ワークロールの測温に適用した実施
例を次に示す。使用した検出コイルの構成は
1次コイル内半径: 25 X 10−10−3(次コ
イル外半径: 30 X 10”−3〔rn ]22次
コイル内半径;1ox1o’lm、l12次コイル外半
径: 15 x 10’−3[I11]コ イ ル
長 さ : 10 X IF’ 〔m)1次コ
、イル巻数:40〔L’urn ]2次コイル巻数:
1O(1[Tu口]]1 次 電 流: 0
.25 [Alであり、この場合のμm、fmの値はそ
れぞれμm キ 120X4 π X10−7 [ト
!/ir+)fm: 115 [: KHz ]
である。上記コイル構成でワークロールの温度範囲20
〜300℃に対しては基準励磁周波数を50Kl−■z
、温度範囲300℃〜600℃に対しては、基準励磁
周波数を175 [KHz ]として測定した結果充分
な精度で測定が可能であつf:。An example in which the present invention is applied to temperature measurement of a work roll for hot rolling will be shown below. The configuration of the detection coil used was: Primary coil inner radius: 25 x 10-10-3 (Next coil outer radius: 30 x 10''-3 [rn]22nd coil inner radius: 1ox1o'lm, l1 Secondary coil outer radius : 15 x 10'-3 [I11] Coil length: 10 x IF' [m] Number of primary coil turns: 40 [L'urn] Number of turns of secondary coil:
1O (1 [Tu port]) Primary current: 0
.. 25 [Al, and the values of μm and fm in this case are μm Ki 120X4 π X10-7 [T! /ir+)fm: 115 [: KHz]. With the above coil configuration, the work roll temperature range is 20
For ~300℃, set the standard excitation frequency to 50Kl-■z
For the temperature range of 300°C to 600°C, the reference excitation frequency was set to 175 [KHz], and as a result, measurement was possible with sufficient accuracy and f:.
以上述べたごとく本発明によれば、たとえば圧延ロール
など検出コイルの寸法に比べて大きい厚さをもつ磁性体
の表面及び表面近傍の温度を広い温度範囲にわたって非
接触′i))つ高精度に測定することができ、かつ被測
定物表面に油膜、水膜など 11 −
が存在しても、又被測定物が高速で移動していても影響
を受けず安定し1こ測温が可能であり、従来温度測定が
困難であった部分での測温の可能性を拡大するものであ
る。As described above, according to the present invention, the temperature at and near the surface of a magnetic material such as a rolling roll, which has a thickness larger than the dimensions of the detection coil, can be measured non-contact and with high accuracy over a wide temperature range'i)). Even if there is an oil film, water film, etc. on the surface of the object to be measured, or even if the object is moving at high speed, it is not affected and stable temperature measurement is possible. This expands the possibility of temperature measurement in areas where it has been difficult to measure temperature in the past.
第1図は渦流検出コイルの構成を示す正面図、第2図は
2次コイル誘起電圧の複素電圧平面上における挙動を説
明するための図表、第3図は本発明における2次コイル
誘起電圧の複素電圧平面上での特定点の設定を説明する
ための図表、第4図に本発明の実施例における装置の回
路構成を示すブロック図である。
20・:検出コイル、l・:・1次コイル、2:2次コ
イル、4,8,1.1:同期検波器、6,7,10:移
相器、5,9,12:積分器、13:移相差演算器、1
4 : ’)フト・オフ変動補正演算器、15:周波数
コンバータ、16:周波数一温度変換演算器、17:発
振周波数側、御回路、18:高周波発振器、、19:基
準位相差演算器。
特許出願人 代理人 弁理士 矢 葺 矧 之(ほか1
名) 12−Fig. 1 is a front view showing the configuration of the eddy current detection coil, Fig. 2 is a chart for explaining the behavior of the secondary coil induced voltage on a complex voltage plane, and Fig. 3 is a diagram showing the behavior of the secondary coil induced voltage in the present invention. FIG. 4 is a diagram for explaining the setting of a specific point on a complex voltage plane, and is a block diagram showing the circuit configuration of an apparatus in an embodiment of the present invention. 20: Detection coil, l: Primary coil, 2: Secondary coil, 4, 8, 1.1: Synchronous detector, 6, 7, 10: Phase shifter, 5, 9, 12: Integrator , 13: Phase shift difference calculator, 1
4: ') Foot-off fluctuation correction computing unit, 15: Frequency converter, 16: Frequency-to-temperature conversion computing unit, 17: Oscillation frequency side, control circuit, 18: High frequency oscillator, 19: Reference phase difference computing unit. Patent Applicant Agent Patent Attorney Ya Fuki Hagiyuki (and 1 others)
name) 12-
Claims (1)
型渦流検出コイルを用いる温度測定方法において、2次
コイル誘起電圧を複素電圧平面上に示したときの該誘起
電圧が下記のパラメータKによって、複素平面上の一点
に決定される測定条件となるところの被測定物の透磁率
又は1次コイルの励磁周波数の特定範囲のもとで、予じ
め誘起電圧が複素電圧平面上の特定の点になる1次コイ
ル励磁周波数を設定し、測定中に実際の誘起電圧の前記
特定点からのずれをなくすのに必要な励磁周波数の変化
量を求め、この周波数変化量71)ら被測定物の温度変
化量を求めることを特徴とする渦流式温度測定方法。In a temperature measurement method using a globe-type eddy current detection coil in which a secondary coil is coaxially arranged inside a primary coil, when the secondary coil induced voltage is shown on a complex voltage plane, the induced voltage is expressed by the following parameter K: Under a specific range of the magnetic permeability of the object to be measured or the excitation frequency of the primary coil, which is the measurement condition determined at one point on the complex plane, the induced voltage is determined in advance at a specific point on the complex voltage plane. The excitation frequency of the primary coil is set to An eddy current temperature measurement method characterized by determining the amount of temperature change.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19612682A JPS5987330A (en) | 1982-11-10 | 1982-11-10 | Temperature measuring method of eddy current type |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19612682A JPS5987330A (en) | 1982-11-10 | 1982-11-10 | Temperature measuring method of eddy current type |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5987330A true JPS5987330A (en) | 1984-05-19 |
| JPS6360332B2 JPS6360332B2 (en) | 1988-11-24 |
Family
ID=16352673
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP19612682A Granted JPS5987330A (en) | 1982-11-10 | 1982-11-10 | Temperature measuring method of eddy current type |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5987330A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006300719A (en) * | 2005-04-20 | 2006-11-02 | Ribekkusu:Kk | Measuring method and apparatus |
| CN113660746A (en) * | 2020-05-12 | 2021-11-16 | 佛山市顺德区美的电热电器制造有限公司 | Heating circuit and cooking device |
-
1982
- 1982-11-10 JP JP19612682A patent/JPS5987330A/en active Granted
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006300719A (en) * | 2005-04-20 | 2006-11-02 | Ribekkusu:Kk | Measuring method and apparatus |
| CN113660746A (en) * | 2020-05-12 | 2021-11-16 | 佛山市顺德区美的电热电器制造有限公司 | Heating circuit and cooking device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6360332B2 (en) | 1988-11-24 |
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