JPS6076630A - Temperature measuring device - Google Patents

Temperature measuring device

Info

Publication number
JPS6076630A
JPS6076630A JP58184915A JP18491583A JPS6076630A JP S6076630 A JPS6076630 A JP S6076630A JP 58184915 A JP58184915 A JP 58184915A JP 18491583 A JP18491583 A JP 18491583A JP S6076630 A JPS6076630 A JP S6076630A
Authority
JP
Japan
Prior art keywords
temperature
semi
transparent body
mirror
temperature measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58184915A
Other languages
Japanese (ja)
Other versions
JPH0465329B2 (en
Inventor
Isao Hishikari
功 菱刈
Tetsuo Kobari
小針　哲郎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Chino Corp
Original Assignee
Chino Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chino Works Ltd filed Critical Chino Works Ltd
Priority to JP58184915A priority Critical patent/JPS6076630A/en
Publication of JPS6076630A publication Critical patent/JPS6076630A/en
Publication of JPH0465329B2 publication Critical patent/JPH0465329B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/08—Optical arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/08—Optical arrangements
    • G01J5/0808—Convex mirrors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/08—Optical arrangements
    • G01J5/0813—Planar mirrors; Parallel phase plates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/80—Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
    • G01J2005/066—Differential arrangement, i.e. sensitive/not sensitive

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Radiation Pyrometers (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 （１）発明の分野 この発明は、ガラス、高分子フィルム等の半透明体の温
度を測定する装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION (1) Field of the Invention The present invention relates to an apparatus for measuring the temperature of semitransparent bodies such as glass and polymer films.

（２ン従米技術 半透明体の温度を測定するには、その物質の吸収帯に測
定波長を限定した放射温度計を用いて行う方法がある。(2) To measure the temperature of a semitransparent material, there is a method that uses a radiation thermometer whose measurement wavelength is limited to the absorption band of the material.

しかしながら、この方法では、波長を限定しているため
、感度が悪く、測定下限温度を低くとれない問題点があ
る。また、顕著な吸収帯がない場合は、特に測定が困難
となる。However, in this method, since the wavelength is limited, the sensitivity is poor and the lower limit temperature for measurement cannot be kept low. Furthermore, measurement is particularly difficult when there is no significant absorption band.

（３）発明の目的 この発明の目的は２以上の点に鑑み、鏡を利用して半透
明体の温度を高精度に測定することができる温度測定装
置を提供することである。(3) Purpose of the Invention In view of two or more points, the purpose of the present invention is to provide a temperature measuring device that can measure the temperature of a semi-transparent body with high precision using a mirror.

（４）発明の実施例 第１図は、この発明の一実施例を示す構成説明図である
。(4) Embodiment of the Invention FIG. 1 is an explanatory diagram showing an embodiment of the invention.

図においで、１は被測定対象であるガラス、高分子フィ
ルム等の半透明体２をおおう壁、３は半透明体２の背面
に設けられた鏡（ミラー）、４は壁１の壁面１ａの温度
を測定する抵抗体、熱電対その他の温度測定手段、５は
半透明体２からの放射エネルギーを受光する放射温度計
、６は放射温度計５の出力、温度測定手段４の出力等か
ら半透明体２の真温度を演算する演算手段である。In the figure, 1 is a wall covering a semitransparent body 2 such as glass or polymer film to be measured, 3 is a mirror provided on the back of the semitransparent body 2, and 4 is a wall surface 1a of the wall 1. 5 is a radiation thermometer that receives the radiant energy from the translucent body 2; 6 is the output of the radiation thermometer 5, the output of the temperature measurement means 4, etc.; This is a calculation means for calculating the true temperature of the semi-transparent body 2.

ここで測定原理は次のようである。The measurement principle here is as follows.

半透明体２の温度を１２表面の反射率をρｌ、裏面の反
射率をρ２．透過率を１とし、鏡３の温度を＋１Ｉｏ９
反射率をｐｏ、壁面１ａの温度をＴｗ、放射率をｔｗと
し、半透明体２．鏡３．壁面１ａからの放射エネルギー
をＥ（Ｔ）、　Ｅ（Ｔｏ）、　Ｅ（Ｔｗ）、放射温度計
５の受光する放射エネルギーをＢ（Ｓ）とすれば、半透
明体２と鏡３との間の多重反射を考慮して次式が成り立
つ。The temperature of the semi-transparent body 2 is 12, the reflectance of the front surface is ρl, and the reflectance of the back surface is ρ2. Transmittance is 1, temperature of mirror 3 is +1Io9
The reflectance is po, the temperature of the wall 1a is Tw, the emissivity is tw, and the semitransparent body 2. Mirror 3. If the radiant energy from the wall 1a is E(T), E(To), E(Tw), and the radiant energy received by the radiation thermometer 5 is B(S), then the distance between the semitransparent body 2 and the mirror 3 is Considering the multiple reflections of , the following equation holds.

＝（１−α−β）Ｅ（Ｔ）＋ｔｗαＥ（Ｔｗ）＋βＥ　
（Ｔｏ　）　−・（１）ここで。= (1-α-β)E(T)+twαE(Tw)+βE
(To) -・(1) Here.

である。It is.

つまり、（１）式において、右辺第１項、第２項。In other words, in equation (1), the first and second terms on the right side.

第３項は、それぞれ、熱放射の半透明体２から。The third term is from the semitransparent body 2 of thermal radiation, respectively.

壁面１ａから、背面の鏡３からの寄与分で、その係数１
−α−β、α、βは寄与率を示す。The contribution from the wall 1a and the mirror 3 on the back, the coefficient 1
−α−β, α, and β indicate contribution rates.

（１）式よりＥ（Ｔ）をめれば次式となる。If E(T) is subtracted from equation (1), the following equation is obtained.

また、ｐｌ＝ｐ２＝０．２．　ｒ＝０．４とし、１−α
−β、α、βのρＯに対する寄与率は第２図のようにな
る。つまり、鏡３の反射率ρ０が十分大きく、その温度
＋１１ｏが半透明体２の温度Ｔよりも十分小さければ（
ρＯ≧ｏ、　９　＋　１ｏ　（Ｔ　）　、第３式右辺第
３項は無視でき２次式となる。Also, pl=p2=0.2. Let r=0.4, 1-α
The contribution rates of −β, α, and β to ρO are shown in FIG. In other words, if the reflectance ρ0 of the mirror 3 is sufficiently large and its temperature +11o is sufficiently smaller than the temperature T of the semitransparent body 2, then (
ρO≧o, 9 + 1o (T), the third term on the right side of the third equation can be ignored and becomes a quadratic equation.

式においてｔｗ’：ｙｌとおいてよい。In the formula, tw':yl may be used.

このように、放射温置針５の出力Ｅ（Ｓ）を、（３）。In this way, the output E(S) of the radiation temperature setting needle 5 is expressed as (3).

（４）式に従って補正を行えば透明体２の真温度Ｔがま
る。If correction is performed according to equation (4), the true temperature T of the transparent body 2 will be reduced.

第１図の装置の動作は次の通りである。The operation of the apparatus of FIG. 1 is as follows.

対車ｔｗ等を演算手段６に設定値として入力する。The anti-vehicle tw etc. are inputted to the calculation means 6 as set values.

次に、温度測定手段４の出力Ｔｗを演算手段６に入力し
てＥ　（’ｌ’ｗ　）に換算するとともに、演算手段６
は。Next, the output Tw of the temperature measuring means 4 is input to the calculating means 6 to convert it into E ('l'w), and the calculating means 6
teeth.

放射温度計５の透明体３からの放射エネルギーＥ（Ｓ）
に相当する出力に、　Ｅ（Ｔｗ）、α、β等の定数に基
いて（４）式のような補正演算を行ってＥ（Ｔ）をめ。Radiant energy E(S) from the transparent body 3 of the radiation thermometer 5
Perform a correction calculation as shown in equation (4) on the output corresponding to E(Tw) based on constants such as E(Tw), α, β, etc. to obtain E(T).

これより透明体２の真温度Ｔを演算してめることができ
る。From this, the true temperature T of the transparent body 2 can be calculated and determined.

なお、鏡３の温度ＴＯが無視できない場合は、その温度
ＴＯを他の温度測定手段で測定して演算手段６によりＥ
（Ｔｏ）に換算し、（３）式のような演算を行えばよい
。また、ｔｗ→１とおければ、　（３）、　（４）式は
。In addition, if the temperature TO of the mirror 3 cannot be ignored, the temperature TO is measured by other temperature measuring means and calculated by the calculation means 6.
(To) and perform calculations such as equation (3). Also, if we set tw→1, equations (3) and (4) become as follows.

簡略化できる。また、演算手段６等は、マイクロコンピ
ュータ等で構成してもよい。Can be simplified. Furthermore, the calculation means 6 and the like may be configured with a microcomputer or the like.

（５）発明の要約 以上述べたように、この発明は、す憫令セ→今−ｆｔｒ
ｆ−半透明体の背面に鏡を設け、放射温度針の半透明体
からの放射エネルギー出力を、壁面温度測定手段の出力
、半透明体の反射率、透過率、鏡の反射率等で演算手段
により補正し、透明体の真温度を測定するようにした温
度測定装置である。(5) Summary of the invention As stated above, this invention
f - A mirror is provided on the back of the semi-transparent body, and the radiant energy output from the semi-transparent body of the radiant temperature needle is calculated using the output of the wall temperature measuring means, the reflectance and transmittance of the semi-transparent body, the reflectance of the mirror, etc. This is a temperature measuring device that measures the true temperature of a transparent body by correcting it by means.

（６）発明の効果 半透明体の背面に鏡を設けることにより、半透明体のみ
かけの放射率を高め、背面からの熱放射の影響を除去し
、また、壁面からの熱放射の影響も補正して除去するよ
うにしているので、簡単な構成で半透明体の真温度を高
精度に測定することができる。特に、特定の吸収帯がな
く、低温測定の場合に有効で、半透明体全般の温度測定
に好適で、実用的効果が大きい。(6) Effects of the invention By providing a mirror on the back surface of the semi-transparent body, the apparent emissivity of the semi-transparent body is increased, the influence of heat radiation from the back surface is eliminated, and the influence of heat radiation from the wall surface is also reduced. Since it is corrected and removed, the true temperature of the semi-transparent body can be measured with high accuracy with a simple configuration. In particular, it has no specific absorption band, is effective for low temperature measurements, is suitable for measuring the temperature of semitransparent objects in general, and has great practical effects.

【図面の簡単な説明】[Brief explanation of the drawing]

第１図は、この発明の一実施例を示す構成説明図、第２
図は特性説明図である。 ｌ・・・壁、２・・・半透明体、３・・・鏡、４・・・
温度測定手段、５・・・放射温度計、６・・・演算手段
特許出願人　株式会社　千野製作所FIG. 1 is a configuration explanatory diagram showing one embodiment of the present invention, and FIG.
The figure is a characteristic explanatory diagram. l...Wall, 2...Semi-transparent object, 3...Mirror, 4...
Temperature measuring means, 5...Radiation thermometer, 6...Calculating means Patent applicant Chino Seisakusho Co., Ltd.

Claims (1)

【特許請求の範囲】[Claims] １、半透明体の背面に設けられた鋭と、壁面温度を測定
する温度測定手段と、前記半透明体からの放射エネルギ
ーを受光する放射温度計と、この、放射温度計の出力を
、前記温度測定手段の出力および前記半透明体の反射率
、透過率、前記鏡の反射率に基いて補正を行い、前記半
透明体の温度を演算する演算手段とを備えたことを特徴
とする温度測定装置。1. A sharp point provided on the back surface of the semi-transparent body, a temperature measuring means for measuring the wall surface temperature, a radiation thermometer for receiving the radiant energy from the semi-transparent body, and the output of the radiation thermometer as described above. Temperature, characterized by comprising: a calculation means for calculating the temperature of the semi-transparent body by performing correction based on the output of the temperature measuring means, the reflectance and transmittance of the semi-transparent body, and the reflectance of the mirror. measuring device.
JP58184915A 1983-10-03 1983-10-03 Temperature measuring device Granted JPS6076630A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58184915A JPS6076630A (en) 1983-10-03 1983-10-03 Temperature measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58184915A JPS6076630A (en) 1983-10-03 1983-10-03 Temperature measuring device

Publications (2)

Publication Number Publication Date
JPS6076630A true JPS6076630A (en) 1985-05-01
JPH0465329B2 JPH0465329B2 (en) 1992-10-19

Family

ID=16161554

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58184915A Granted JPS6076630A (en) 1983-10-03 1983-10-03 Temperature measuring device

Country Status (1)

Country Link
JP (1) JPS6076630A (en)

Also Published As

Publication number Publication date
JPH0465329B2 (en) 1992-10-19

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