JPS6249448A - Scan in control system - Google Patents

Abstract

PURPOSE:To input data of specific pattern directly to a scan ring by providing a changeover control circuit that changes data inputted to a data fixation flip- flop, a data selection flip-flop and a scan ring. CONSTITUTION:When all stages of a shift register latch 7 that constitutes a scan ring 6 are set to '0', a data fixation flip-flop 8 is made '0', and a data selection flip-flop 9 is set to '1'. Accordingly, inputting of output from a shift register 4 to a scan ring 6 is checked, and the output '0' from the data fixation flip-flop 8 is inputted to the scan ring 6. Consequently, '0' is set to all stages of the shift register latch 7. Further, when the data selection flip-flop 9 is set to '1', shifting of data from a scan buffer 3 to the shift register 4 is also checked. Thereby, the waiting becomes unnecessary for operation of a shift lock from the scan buffer 3 to the shift register 4, and the continuous sending of number of stages of the scan ring 6 becomes possible.

Description

Detailed Description of the Invention [Field of Industrial Application] The present invention relates to a scan-in control method in a data processing device. This relates to a scan-in control method that can be input using .

[Conventional technology]

FIG. 2 is a schematic configuration diagram of a conventional scan-in control method. In FIG. 1, (1) is a service processor (SVP), which includes a scan buffer (3).
and a shift register are included. (2) is the main unit, which includes a scan ring (AIH) and an appropriate number of shift register latches (SRLs) (7
It consists of 1. (5) is a separate signal line,
The service processor (c) sends various control signals for controlling the scan operation for the scan ring (Al) in the main unit (c).

Next, the operation will be explained. Scan buffer (,71
Regarding scan-in, in which the data in the buffer is transferred to the scan ring (6), the selection of the scan ring (6) is made by an appropriate signal on the control signal g (!I, and then the data is transferred to the scan buffer (3). The stored data to be scanned in is transferred to the shift register (example). Then, by the shift clock signal on the sideways signal M (!rl), all data in the shift register (IIi is directed to the scan ring (6) Then, when all the data in the shift register (ri) has been transferred to the scan ring (6), the data following the second one is taken out from the scan ring (3). and move it to the shift register (ri).

By repeating this action the required number of times.

The amount of data that can be stored in the scan ring (6) is transferred from the scan buffer (3) via the shift register (Hiro 1).

[Problem that the invention seeks to solve]

The conventional scan-in system is configured as described above.1 For example, when trying to store all O'm data in the scan ring (6), the scan buffer (3)
This is because all ``θ'' data was written to the ``θ'' data before the scan-in was executed.

There was a problem in that it took a considerable amount of time to initialize the hardware.

This invention was made in order to solve the above-mentioned problems, and provides a scan-in sideways system in which constant turn data can be input directly to the scan ring. The purpose is to

[Means for solving problems]

The scan-in suppression method according to the present invention is a scan-in suppression method for a data processing device that includes a main unit including a scan ring made up of several shift register latches and a service processor that monitors this main unit. A flip 70 tab, a data selection flip 70 tab, and a switching overturn circuit for switching data input to the scan ring are provided.

[For production]

According to the invention, fixed data from the data fixed 71 knob 70 is input to the scan ring when the data selection flip-flop is in a predetermined state.

〔Example〕

An embodiment of the present invention will be described below with reference to FIG.

In FIG. 1, the parts numbered from 1 to (7) indicate the same or equivalent parts as the parts given the same numbers in the conventional example shown in FIG. The processor (/A) has a scan buffer (,7
1 and shift registers, the following means are included. That is, the data fixing flip-flop III fixes the data to be added to the scan ring (6) to either O'' or /''', and the data from the shift register (111 or data fixing) is used as the data to be added to the scan ring (6). Flip-flop (data selection flip-flop for selecting any of the data from gl).

and a switch for switching either data from the shift register (lI) or data from the data fixing flip-flop (gl) as data to be added to the scan ring (6) depending on the contents of the data selection flip-flop (9). This switching side-turning circuit (/θ) has an AND gate (10A) and a restraining Goethe (/θB) in parallel, and each blade is set to the OR gate (/θ).
/θC) are connected to mutually different input sections.

Next, the operation will be explained. Now, Scan Ring (6
), as a specific pattern of data, for example, all “O
”Input the data to check all stages of shift) L/discratch (7) that constitute the scan ring (6).
Assume that you are trying to set it to . At this time,
Instead of setting the content of the scan buffer (,71 to ``O'', set the data fixed flip-flop (ff) i to ``O'',
This also prevents the output from the shift register (example) from being input to the scan ring (l,) and from the data fixing flip-flop (to). 0", which is the cutting edge of the scan ring (6), is inputted to the scan ring (6) K. For this purpose, 60" is set in all stages of the shift register latch (7) that constitutes the entire scan ring (6). .Also, the data selection flip 70 knob (9) is /
”, scan buffer f,
? This is because the movement of data from + to the shift register (ri) is also inhibited.

The operation of the shift clock used to add all the data to the scan ring (6) eliminates the need to wait while moving the data from the scan buffer (3) to the shift register (4'l). ) desired data can be sent continuously for the number of stages.

Note that in the above embodiment, e, scan buffer f,
? Although it has been explained that the 1% shift register (111, data fixing flip-flop, etc.) is provided on the service processor (/A) side, it is not limited to this; It may be arranged so that it is provided.

〔Effect of the invention〕

As explained above, in the scan-in method of a data processing device that includes a main unit including a scan ring consisting of an appropriate number of shift register latches and a service processor that monitors this main unit, data fixing flip-flops and data fixing flip-flops are used. Since the configuration includes a selection flip-flop and a switching sterilization circuit that switches all data input to the scan ring depending on the state of the data selection flip-flop, the data selection flip-flop is set to a predetermined value. when in the state of

The fixed data from the data fixed flip-flop can be input directly to the scan ring 1, for example during hardware initialization.

The time required to input fixed data, such as all 10'' data, into all scan rings is reduced, and the initial state of the hardware is quickly achieved.

[Brief explanation of the drawing]

FIG. 1 is a schematic diagram of a scan-in side leg system according to an embodiment of the present invention, and FIG. 2 is a schematic diagram of a conventional system. (1), (/A) are the service processor, (λ) is the main unit, (3) is the scan buffer, (4'lH shift register, (j) is the sideways signal line, (6) is the scan ring , (7) is a shift register latch, It)h data fixed flip-flop, and (9) is a data selection 7 rib flop. clo) is the switching side leg circuit. In each figure, the same reference numerals indicate the same or corresponding parts. Figure 2

Claims (1)

[Claims] In a scan-in control method for a data processing device including a main unit including a scan ring consisting of an appropriate number of shift register latches and a service processor that monitors the main unit, the data fixing flip-flop, the data selection flip-flop, and the a switching control circuit that switches the data input to the scan ring depending on the state of the data selection flip-flop; A scan-in control method in which fixed data is input to the scan ring.