JPS6440817A - Active matrix substrate - Google Patents

Active matrix substrate

Info

Publication number
JPS6440817A
JPS6440817A JP62195265A JP19526587A JPS6440817A JP S6440817 A JPS6440817 A JP S6440817A JP 62195265 A JP62195265 A JP 62195265A JP 19526587 A JP19526587 A JP 19526587A JP S6440817 A JPS6440817 A JP S6440817A
Authority
JP
Japan
Prior art keywords
film
electrodes
deposited
semiconductor
doped
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62195265A
Other languages
Japanese (ja)
Inventor
Masaya Keyakida
Masaki Yuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AGC Inc
Original Assignee
Asahi Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asahi Glass Co Ltd filed Critical Asahi Glass Co Ltd
Priority to JP62195265A priority Critical patent/JPS6440817A/en
Publication of JPS6440817A publication Critical patent/JPS6440817A/en
Pending legal-status Critical Current

Links

Landscapes

  • Liquid Crystal (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Abstract

PURPOSE:To improve the step coverage characteristic of electrodes so as to prevent disconnection and to improve productivity and yield by sloping the end faces of an insulating film in the conductive junctures between the electrodes of active elements and display picture elements. CONSTITUTION:Display electrodes 2 consisting of ITO and gate electrodes 3 consisting of Cr are formed on an insulating substrate 1. A silicon oxynitride film is deposited thereon to form the gate insulating film 4 and a non-doped a-Si film is deposited thereon to form a semiconductor film 5. This semiconductor film and an impurity added semiconductor 6 of P-doped a-Si formed to an island shape. The end faces of the gate insulating film 4 are tapered at the time of forming apertures to the parts on the picture element electrodes of said film. Namely, a photoresist is coated on the film 4 and is patterned to the prescribed shapes, then the resist is dry etched to copy the tapered shape of the resist end face to the end face of the film 4. Cr and Al are then deposited by evaporation to form source electrodes 7 and drain electrodes 8. The film 6 is etched away.
JP62195265A 1987-08-06 1987-08-06 Active matrix substrate Pending JPS6440817A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62195265A JPS6440817A (en) 1987-08-06 1987-08-06 Active matrix substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62195265A JPS6440817A (en) 1987-08-06 1987-08-06 Active matrix substrate

Publications (1)

Publication Number Publication Date
JPS6440817A true JPS6440817A (en) 1989-02-13

Family

ID=16338273

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62195265A Pending JPS6440817A (en) 1987-08-06 1987-08-06 Active matrix substrate

Country Status (1)

Country Link
JP (1) JPS6440817A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH052190A (en) * 1991-06-24 1993-01-08 Hitachi Ltd Active matrix substrate
JPH0572553A (en) * 1991-09-11 1993-03-26 Hitachi Ltd Liquid crystal display device and manufacturing method thereof

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH052190A (en) * 1991-06-24 1993-01-08 Hitachi Ltd Active matrix substrate
JPH0572553A (en) * 1991-09-11 1993-03-26 Hitachi Ltd Liquid crystal display device and manufacturing method thereof

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