JPS6457106A - Optical method for inspecting appearance of chip component and automatic appearance sorter - Google Patents

Optical method for inspecting appearance of chip component and automatic appearance sorter

Info

Publication number
JPS6457106A
JPS6457106A JP62214433A JP21443387A JPS6457106A JP S6457106 A JPS6457106 A JP S6457106A JP 62214433 A JP62214433 A JP 62214433A JP 21443387 A JP21443387 A JP 21443387A JP S6457106 A JPS6457106 A JP S6457106A
Authority
JP
Japan
Prior art keywords
image processing
chip component
appearance
conveyance route
cpus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62214433A
Other languages
Japanese (ja)
Other versions
JPH0638043B2 (en
Inventor
Toru Mizuno
Yasuhiko Kitajima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TDK Corp
Original Assignee
TDK Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TDK Corp filed Critical TDK Corp
Priority to JP62214433A priority Critical patent/JPH0638043B2/en
Priority to KR1019890002517A priority patent/KR0122739B1/en
Publication of JPS6457106A publication Critical patent/JPS6457106A/en
Publication of JPH0638043B2 publication Critical patent/JPH0638043B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Sorting Of Articles (AREA)

Abstract

PURPOSE:To quantity the basis of inspection, to improve the quality and to make high the speed of inspection processing, by applying oblique and transmission illumination to a chip component at a stop position thereof while conveying same on a conveyance route. CONSTITUTION:An image processing unit has camera elements 11a and 11b including a transmission illumination system, CPUs 14a and 14b for image processing, CPU 15 for comprehensive determination and control of mechanism elements, and a monitor element 16 connected to video memory elements 13a and 13b through a switch 17. By this constitution, a chip component 1 is subjected to oblique and transmission illuminations at stop positions thereof while it is conveyed in a prescribed direction on a conveyance route 24 by an intermittent operation. Reflected and transmitted lights thereof are taken in as video signals, these signals are subjected to image processing in the image processing unit comprising A/D converters 12a and 12b, the video memories 13a and 13b and the CPUs 14a, 14b and 15, and thereby an external appearance of the component 1 and the inclination thereof on the conveyance route 24 are discriminated.
JP62214433A 1987-08-28 1987-08-28 Automatic appearance sorter for chip parts Expired - Fee Related JPH0638043B2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP62214433A JPH0638043B2 (en) 1987-08-28 1987-08-28 Automatic appearance sorter for chip parts
KR1019890002517A KR0122739B1 (en) 1987-08-28 1989-02-28 Method and measuring device for classification of chip-type component and checking of chip-type component's aspect by optical

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62214433A JPH0638043B2 (en) 1987-08-28 1987-08-28 Automatic appearance sorter for chip parts

Publications (2)

Publication Number Publication Date
JPS6457106A true JPS6457106A (en) 1989-03-03
JPH0638043B2 JPH0638043B2 (en) 1994-05-18

Family

ID=16655702

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62214433A Expired - Fee Related JPH0638043B2 (en) 1987-08-28 1987-08-28 Automatic appearance sorter for chip parts

Country Status (1)

Country Link
JP (1) JPH0638043B2 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06213603A (en) * 1993-01-14 1994-08-05 Toshiba Eng Co Ltd Parts sorting device
JPH06288721A (en) * 1993-04-01 1994-10-18 Masahide Matsuda Automatic inspection device
JPH06298335A (en) * 1993-04-19 1994-10-25 Ntn Corp Parts discriminator
JP2023074700A (en) * 2021-11-18 2023-05-30 大同特殊鋼株式会社 Front/back discriminating device
WO2025220719A1 (en) * 2024-04-19 2025-10-23 株式会社村田製作所 Visual inspection device

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61243303A (en) * 1985-04-22 1986-10-29 Hitachi Denshi Ltd Visual inspection system for mounted substrate
JPS61177500U (en) * 1985-04-24 1986-11-05
JPS6250605A (en) * 1985-08-30 1987-03-05 Fujitsu Ltd Inspecting instrument for body to be inspected
JPS62127616A (en) * 1985-11-29 1987-06-09 Toppan Printing Co Ltd Method and device for detecting curved surface contour image of transparent container
JPS62127602A (en) * 1985-11-29 1987-06-09 Fujitsu Ltd Parts inspecting device

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61243303A (en) * 1985-04-22 1986-10-29 Hitachi Denshi Ltd Visual inspection system for mounted substrate
JPS61177500U (en) * 1985-04-24 1986-11-05
JPS6250605A (en) * 1985-08-30 1987-03-05 Fujitsu Ltd Inspecting instrument for body to be inspected
JPS62127616A (en) * 1985-11-29 1987-06-09 Toppan Printing Co Ltd Method and device for detecting curved surface contour image of transparent container
JPS62127602A (en) * 1985-11-29 1987-06-09 Fujitsu Ltd Parts inspecting device

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06213603A (en) * 1993-01-14 1994-08-05 Toshiba Eng Co Ltd Parts sorting device
JPH06288721A (en) * 1993-04-01 1994-10-18 Masahide Matsuda Automatic inspection device
JPH06298335A (en) * 1993-04-19 1994-10-25 Ntn Corp Parts discriminator
JP2023074700A (en) * 2021-11-18 2023-05-30 大同特殊鋼株式会社 Front/back discriminating device
WO2025220719A1 (en) * 2024-04-19 2025-10-23 株式会社村田製作所 Visual inspection device

Also Published As

Publication number Publication date
JPH0638043B2 (en) 1994-05-18

Similar Documents

Publication Publication Date Title
US5007096A (en) Object inspection apparatus
CA2282486A1 (en) Inspection system
EP0816926A3 (en) Exposure apparatus
DE3574235D1 (en) Means for identifying and recording bottles and/or bottle hampers
BR9403582A (en) Apparatus for detecting flaws and / or split seams in a translucent container and method of inspection of translucent containers
JPS6457106A (en) Optical method for inspecting appearance of chip component and automatic appearance sorter
WO1992017770A3 (en) Dimensional inspection process of medical ampules
WO1991014173A3 (en) Web inspection system
JPH0228191B2 (en)
JPS57121367A (en) Method for reading color original
US20060132759A1 (en) Vision inspection apparatus using a full reflection mirror
JPS57165735A (en) Device for measuring refracting power in optical system
EP0343665A3 (en) Variable optical axis type bottle inspecting apparatus
JP2593863B2 (en) Object appearance inspection device
JPH02268260A (en) Solder inspecting apparatus
JPS55149830A (en) Inspection apparatus for appearance of spherical body
EP1099948A3 (en) System and method for optical inspection
JP2623115B2 (en) Appearance inspection device
JPS62113050A (en) Bottle mouth inspection system
JPS56140243A (en) Inspecting method of ring shaped body
JPS578438A (en) Bottle inspecting device
JPS538061A (en) Automatic positioning apparatus of articles
KR100187017B1 (en) Device mounting state inspection device and method of PCB
JPS60228906A (en) Length measuring method and apparatus thereof
JPS6472036A (en) Inspection device for lead joint part

Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees