JPS646776A - Method of testing semiconductor memory - Google Patents

Method of testing semiconductor memory

Info

Publication number
JPS646776A
JPS646776A JP62159843A JP15984387A JPS646776A JP S646776 A JPS646776 A JP S646776A JP 62159843 A JP62159843 A JP 62159843A JP 15984387 A JP15984387 A JP 15984387A JP S646776 A JPS646776 A JP S646776A
Authority
JP
Japan
Prior art keywords
test
data
circuit
memory
memory cells
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62159843A
Other languages
English (en)
Other versions
JP2670049B2 (ja
Inventor
Tsuneo Matsumura
Tsuneo Mano
Junzo Yamada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NTT Inc
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP62159843A priority Critical patent/JP2670049B2/ja
Priority to EP87115295A priority patent/EP0264893B1/en
Priority to DE3751002T priority patent/DE3751002T2/de
Priority to KR1019870011614A priority patent/KR900004312B1/ko
Publication of JPS646776A publication Critical patent/JPS646776A/ja
Priority to US07/837,667 priority patent/US5400342A/en
Application granted granted Critical
Publication of JP2670049B2 publication Critical patent/JP2670049B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP62159843A 1986-10-20 1987-06-29 半導体メモリの試験方法 Expired - Fee Related JP2670049B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP62159843A JP2670049B2 (ja) 1987-06-29 1987-06-29 半導体メモリの試験方法
EP87115295A EP0264893B1 (en) 1986-10-20 1987-10-19 Semiconductor memory
DE3751002T DE3751002T2 (de) 1986-10-20 1987-10-19 Halbleiterspeicher.
KR1019870011614A KR900004312B1 (ko) 1986-10-20 1987-10-20 반도체메모리와 그 시험방법
US07/837,667 US5400342A (en) 1986-10-20 1992-02-14 Semiconductor memory having test circuit and test method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62159843A JP2670049B2 (ja) 1987-06-29 1987-06-29 半導体メモリの試験方法

Publications (2)

Publication Number Publication Date
JPS646776A true JPS646776A (en) 1989-01-11
JP2670049B2 JP2670049B2 (ja) 1997-10-29

Family

ID=15702450

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62159843A Expired - Fee Related JP2670049B2 (ja) 1986-10-20 1987-06-29 半導体メモリの試験方法

Country Status (1)

Country Link
JP (1) JP2670049B2 (ja)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55122298A (en) * 1979-03-09 1980-09-19 Chiyou Lsi Gijutsu Kenkyu Kumiai Memory test method
JPS57105053A (en) * 1980-12-22 1982-06-30 Nec Corp Integrated circuit which has incorporated testing circuit for fault detecting circuit
JPS60224199A (ja) * 1984-04-20 1985-11-08 Fujitsu Ltd 半導体記憶装置
JPS61840A (ja) * 1984-06-12 1986-01-06 Matsushita Electric Ind Co Ltd 携帯用デ−タ端末の自己診断装置
JPS62141700A (ja) * 1985-12-16 1987-06-25 Nippon Telegr & Teleph Corp <Ntt> 半導体メモリ

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55122298A (en) * 1979-03-09 1980-09-19 Chiyou Lsi Gijutsu Kenkyu Kumiai Memory test method
JPS57105053A (en) * 1980-12-22 1982-06-30 Nec Corp Integrated circuit which has incorporated testing circuit for fault detecting circuit
JPS60224199A (ja) * 1984-04-20 1985-11-08 Fujitsu Ltd 半導体記憶装置
JPS61840A (ja) * 1984-06-12 1986-01-06 Matsushita Electric Ind Co Ltd 携帯用デ−タ端末の自己診断装置
JPS62141700A (ja) * 1985-12-16 1987-06-25 Nippon Telegr & Teleph Corp <Ntt> 半導体メモリ

Also Published As

Publication number Publication date
JP2670049B2 (ja) 1997-10-29

Similar Documents

Publication Publication Date Title
US4055754A (en) Memory device and method of testing the same
US7185243B1 (en) Testing implementation suitable for built-in self-repair (BISR) memories
US6928593B1 (en) Memory module and memory component built-in self test
US5661729A (en) Semiconductor memory having built-in self-test circuit
EP0451985A2 (en) Built-in self-test technique for content-addressable memories
US6081465A (en) Static RAM circuit for defect analysis
DE69429397D1 (de) Prüfung eines statischen Direktzugriffspeichers
US4816757A (en) Reconfigurable integrated circuit for enhanced testing in a manufacturing environment
US6009026A (en) Compressed input/output test mode
US5327382A (en) Method of testing redundant memory cells
US5956280A (en) Contact test method and system for memory testers
US4800332A (en) Reconfigurable integrated circuit with enhanced testability of memory cell leakage
US5757816A (en) IDDQ testing of integrated circuits
US4004222A (en) Test system for semiconductor memory cell
WO1982002793A1 (en) Semiconductor memory redundant element identification circuit
KR970016613A (ko) 웨이퍼 번인 테스트회로 및 그 방법
KR940010665B1 (ko) 다이나믹메모리장치 및 그 번인방법
JPS63241791A (ja) 半導体記憶装置
US5940413A (en) Method for detecting operational errors in a tester for semiconductor devices
JPS61292299A (ja) オンチツプメモリテスト容易化回路
JPS646776A (en) Method of testing semiconductor memory
DE3681666D1 (de) Integrierter halbleiterspeicher.
KR100339502B1 (ko) 다수개의 데이터 라인을 구분되게 테스트하는 통합 데이터 라인 테스트 회로 및 이를 이용하는 테스트 방법
US6535999B1 (en) Test and observe mode for embedded memory
JPS62103894A (ja) 読取り完了信号発生回路

Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees