JPS646841A - Detecting device - Google Patents

Detecting device

Info

Publication number
JPS646841A
JPS646841A JP62162977A JP16297787A JPS646841A JP S646841 A JPS646841 A JP S646841A JP 62162977 A JP62162977 A JP 62162977A JP 16297787 A JP16297787 A JP 16297787A JP S646841 A JPS646841 A JP S646841A
Authority
JP
Japan
Prior art keywords
light
photoconductive medium
incident
incident light
polarization state
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62162977A
Other languages
Japanese (ja)
Inventor
Toshiyuki Furuta
Hiroyuki Horiguchi
Yasuo Katano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Co Ltd
Original Assignee
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Priority to JP62162977A priority Critical patent/JPS646841A/en
Publication of JPS646841A publication Critical patent/JPS646841A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55Specular reflectivity
    • G01N21/552Attenuated total reflection

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To utilize incident light effectively, to make the optical waveguide in a photoconductive medium longer, and to reduce the size of a detecting device without increasing the capacity of the photoconductive medium by adding polarizing filters to an incident light part and a photodetection part. CONSTITUTION:At least part of the flank of the plate type photoconductive medium 1 is covered with a reflecting layer 2 and a sensing layer 3 varies in double refractive index by sensing a material to be measured which is present in gas or liquid. A polarizing filter 16 is added to the incident light part and the incident light beam is polarized by 45 deg. and made incident, so that the light incident on the reflecting layer 2 almost at right angles has its initial polarization state nearly maintained when reaching the photodetection part and the polarizing filter of the photodetection part cuts the majority of the light. Further, a light beam which is reflected totally by the border surface between the photoconductive medium 1 and sensing layer 3 changes in polarization state every time it is reflected totally and enters a nearly random polarization state when reaching the photodetection part, so that the light reaches a photodetecting element without reference to whether or not the polarizing filters are provided.
JP62162977A 1987-06-30 1987-06-30 Detecting device Pending JPS646841A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62162977A JPS646841A (en) 1987-06-30 1987-06-30 Detecting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62162977A JPS646841A (en) 1987-06-30 1987-06-30 Detecting device

Publications (1)

Publication Number Publication Date
JPS646841A true JPS646841A (en) 1989-01-11

Family

ID=15764874

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62162977A Pending JPS646841A (en) 1987-06-30 1987-06-30 Detecting device

Country Status (1)

Country Link
JP (1) JPS646841A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0372263A (en) * 1989-08-11 1991-03-27 Daikin Ind Ltd Optical measuring aids and optical measuring devices
JPH0372264A (en) * 1989-08-11 1991-03-27 Daikin Ind Ltd optical measuring device
JP2012163342A (en) * 2011-02-03 2012-08-30 National Institute Of Advanced Industrial & Technology Metal detector, detection plate, and metal detection method
JP2016061575A (en) * 2014-09-16 2016-04-25 株式会社日立製作所 Concentration detector
KR20200015223A (en) * 2018-08-03 2020-02-12 한국과학기술원 Nondestructive inspection apparatus and method for micro defect inspection

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0372263A (en) * 1989-08-11 1991-03-27 Daikin Ind Ltd Optical measuring aids and optical measuring devices
JPH0372264A (en) * 1989-08-11 1991-03-27 Daikin Ind Ltd optical measuring device
JP2012163342A (en) * 2011-02-03 2012-08-30 National Institute Of Advanced Industrial & Technology Metal detector, detection plate, and metal detection method
JP2016061575A (en) * 2014-09-16 2016-04-25 株式会社日立製作所 Concentration detector
KR20200015223A (en) * 2018-08-03 2020-02-12 한국과학기술원 Nondestructive inspection apparatus and method for micro defect inspection

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