PT110747A - Dispositivo para melhorar o desempenho em microscopia por depleção da emissão estimulada (sted) usando uma única máscara de fase - Google Patents
Dispositivo para melhorar o desempenho em microscopia por depleção da emissão estimulada (sted) usando uma única máscara de faseInfo
- Publication number
- PT110747A PT110747A PT110747A PT11074718A PT110747A PT 110747 A PT110747 A PT 110747A PT 110747 A PT110747 A PT 110747A PT 11074718 A PT11074718 A PT 11074718A PT 110747 A PT110747 A PT 110747A
- Authority
- PT
- Portugal
- Prior art keywords
- relation
- already
- microscopy
- sted
- understanding
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/361—Optical details, e.g. image relay to the camera or image sensor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/6456—Spatial resolved fluorescence measurements; Imaging
- G01N21/6458—Fluorescence microscopy
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0056—Optical details of the image generation based on optical coherence, e.g. phase-contrast arrangements, interference arrangements
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/58—Optics for apodization or superresolution; Optical synthetic aperture systems
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Microscoopes, Condenser (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Abstract
A PRESENTE INVENÇÃO REFERE-SE A UM MÉTODO PARA MICROSCOPIA DE ALTA RESOLUÇÃO ESPACIAL COMPREENDENDO UMA PLACA DE FASE OU UM MODULADOR ESPACIAL DE LUZ PARA MICROSCOPIA DE DEPLEÇÃO DA EMISSÃO ESTIMULADA (''STIMULATED EMISSION DEPLETION'' - STED) E MICROSCOPIA DE TRANSIÇÕES ÓPTICAS FLUORESCENTES REVERSÍVEIS SATURÁVEIS (''REVERSIBLE SATURABLE OPTICAL FLUORESCENCE TRANSITION'' - RESOLFT) NO GERAL, EM QUE UM PADRÃO BIVÓRTICE É IMPRESSO NA DITA PLACA DE FASE OU MODULADOR ESPACIAL DE LUZ PARA GERAR UM FEIXE. O PADRÃO BIVÓRTICE PERMITE ALGUMA LIBERDADE NA CONFORMAÇÃO DO FEIXE STED DE FORMA A MELHORAR O DESEMPENHO AXIAL E A CAPACIDADE DE SECCIONAMENTO ÓPTICO DESTA MICROSCOPIA. A PRESENTE INVENÇÃO REFERE-SE AINDA A UM MÉTODO PARA MICROSCOPIA STED E RESOLFT COMPREENDENDO O PASSO DE MODULAÇÃO DA FASE ÓPTICA DA LUZ NUMA PLACA DE FASE OU NUM MODULADOR ESPACIAL DE LUZ COM UMA MÁSCARA DE FASE COMPREENDENDO UM PADRÃO EM BIVÓRTICE COM UM RAIO AJUSTÁVEL. AS MÁSCARAS DE FASE E OS MÉTODOS DE MICROSCOPIA DE STED E RESOLFT AQUI DIVULGADOS PODEM SER VANTAJOSAMENTE APLICADOS PARA FORNECER UM REGIME HÍBRIDO 2D/3D, MAS COM UMA REDUÇÃO SIGNIFICATIVA NOS GRAUS DE LIBERDADE PARA ALINHAMENTO EM RELAÇÃO AO QUE É ENCONTRADO EM SUPERPOSIÇÕES INCOERENTES DE FEIXE, PROPORCIONANDO ASSIM UMA MELHORIA NA QUALIDADE DO FEIXE, OU SEJA, UMA INTENSIDADE CENTRAL MINIMIZADA E MENOR SENSIBILIDADE A ABERRAÇÕES, RESULTANDO NUM NÍVEL DE SINAL E NUM DESEMPENHO AXIAL AUMENTADOS.
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PT110747A PT110747B (pt) | 2018-05-18 | 2018-05-18 | Dispositivo para melhorar o desempenho em microscopia por depleção da emissão estimulada (sted) usando uma única máscara de fase |
| PCT/PT2019/050012 WO2019221622A1 (en) | 2018-05-18 | 2019-05-17 | Device for improving performance in sted and resolft microscopy using a single phase mask |
| EP19728145.4A EP3853650B1 (en) | 2018-05-18 | 2019-05-17 | Device for improving performance in sted and resolft microscopy using a single phase mask |
| US17/056,612 US11487098B2 (en) | 2018-05-18 | 2019-05-17 | Device for improving performance in STED and RESOLFT microscopy using a single phase mask |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PT110747A PT110747B (pt) | 2018-05-18 | 2018-05-18 | Dispositivo para melhorar o desempenho em microscopia por depleção da emissão estimulada (sted) usando uma única máscara de fase |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| PT110747A true PT110747A (pt) | 2019-11-18 |
| PT110747B PT110747B (pt) | 2023-02-10 |
Family
ID=66690929
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PT110747A PT110747B (pt) | 2018-05-18 | 2018-05-18 | Dispositivo para melhorar o desempenho em microscopia por depleção da emissão estimulada (sted) usando uma única máscara de fase |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US11487098B2 (pt) |
| EP (1) | EP3853650B1 (pt) |
| PT (1) | PT110747B (pt) |
| WO (1) | WO2019221622A1 (pt) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP3620840B1 (en) * | 2018-09-05 | 2025-01-01 | Sorbonne Université | High sensitivity phase microscopy imaging |
| EP3686643A1 (en) * | 2019-01-25 | 2020-07-29 | Hochschule Für Angewandte Wissenschaften München | Pulse shaping for stimulated emission depletion microscopy |
| US20230204514A1 (en) | 2020-05-26 | 2023-06-29 | Abberior Instruments Gmbh | Method and device for determining positions of molecules in a sample |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102006026204A1 (de) * | 2006-05-31 | 2007-12-06 | Carl Zeiss Microimaging Gmbh | Mikroskop mit erhöhter Auflösung |
| US9693034B2 (en) * | 2011-12-13 | 2017-06-27 | The Board Of Trustees Of The Leland Stanford Junior University | Apparatus and method for localizing objects for distance and/or in three dimensions using a spiral point spread function |
| WO2013167479A1 (en) * | 2012-05-07 | 2013-11-14 | INSERM (Institut National de la Santé et de la Recherche Médicale) | Microscope for high spatial resolution imaging a structure of interest in a sample |
| US9823486B2 (en) * | 2013-03-11 | 2017-11-21 | Stc. Unm | Rotating point-spread function (PSF) design for three-dimensional imaging |
| JP6234105B2 (ja) * | 2013-08-05 | 2017-11-22 | オリンパス株式会社 | 超解像顕微鏡 |
| WO2017153430A1 (de) * | 2016-03-07 | 2017-09-14 | MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. | Verfahren zum hochaufgelösten lokalen abbilden einer struktur in einer probe, um reaktionen eines interessierenden objekts auf veränderte umgebungsbedingungen zu erfassen |
| DE102016211374A1 (de) * | 2016-06-24 | 2017-12-28 | Carl Zeiss Microscopy Gmbh | Mikroskopieverfahren unter Nutzung zeitlicher Fokusmodulation und Mikroskop |
| JP2018120006A (ja) * | 2017-01-23 | 2018-08-02 | オリンパス株式会社 | 超解像顕微鏡 |
-
2018
- 2018-05-18 PT PT110747A patent/PT110747B/pt active IP Right Grant
-
2019
- 2019-05-17 WO PCT/PT2019/050012 patent/WO2019221622A1/en not_active Ceased
- 2019-05-17 EP EP19728145.4A patent/EP3853650B1/en active Active
- 2019-05-17 US US17/056,612 patent/US11487098B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| US11487098B2 (en) | 2022-11-01 |
| EP3853650B1 (en) | 2025-11-19 |
| EP3853650C0 (en) | 2025-11-19 |
| EP3853650A1 (en) | 2021-07-28 |
| WO2019221622A1 (en) | 2019-11-21 |
| US20210208379A1 (en) | 2021-07-08 |
| PT110747B (pt) | 2023-02-10 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| BB1A | Laying open of patent application |
Effective date: 20190705 |
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| FG3A | Patent granted, date of granting |
Effective date: 20230207 |