TW200630672A - System and method for display testing - Google Patents

System and method for display testing

Info

Publication number
TW200630672A
TW200630672A TW094105747A TW94105747A TW200630672A TW 200630672 A TW200630672 A TW 200630672A TW 094105747 A TW094105747 A TW 094105747A TW 94105747 A TW94105747 A TW 94105747A TW 200630672 A TW200630672 A TW 200630672A
Authority
TW
Taiwan
Prior art keywords
pads
display testing
numbers
test
display
Prior art date
Application number
TW094105747A
Other languages
English (en)
Other versions
TWI333094B (en
Inventor
Chang-Yu Chen
Kuan-Yun Hsieh
Jian-Shen Yu
Yi-Ping Chen
Original Assignee
Au Optronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Au Optronics Corp filed Critical Au Optronics Corp
Priority to TW094105747A priority Critical patent/TWI333094B/zh
Priority to US11/228,644 priority patent/US7298164B2/en
Publication of TW200630672A publication Critical patent/TW200630672A/zh
Priority to US11/862,142 priority patent/US7535248B2/en
Priority to US12/411,614 priority patent/US7821287B2/en
Application granted granted Critical
Publication of TWI333094B publication Critical patent/TWI333094B/zh

Links

Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G09G3/3611—Control of matrices with row and column drivers
    • G09G3/3648—Control of matrices with row and column drivers using an active matrix

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Liquid Crystal (AREA)
TW094105747A 2005-02-25 2005-02-25 System and method for display testing TWI333094B (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
TW094105747A TWI333094B (en) 2005-02-25 2005-02-25 System and method for display testing
US11/228,644 US7298164B2 (en) 2005-02-25 2005-09-15 System and method for display test
US11/862,142 US7535248B2 (en) 2005-02-25 2007-09-26 System for display test
US12/411,614 US7821287B2 (en) 2005-02-25 2009-03-26 System and method for display test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW094105747A TWI333094B (en) 2005-02-25 2005-02-25 System and method for display testing

Publications (2)

Publication Number Publication Date
TW200630672A true TW200630672A (en) 2006-09-01
TWI333094B TWI333094B (en) 2010-11-11

Family

ID=36931460

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094105747A TWI333094B (en) 2005-02-25 2005-02-25 System and method for display testing

Country Status (2)

Country Link
US (3) US7298164B2 (zh)
TW (1) TWI333094B (zh)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8174280B2 (en) 2009-01-05 2012-05-08 Chunghwa Picture Tubes, Ltd. Method of testing display panel
CN102692774A (zh) * 2012-05-23 2012-09-26 深圳市华星光电技术有限公司 液晶显示面板
TWI402515B (zh) * 2009-01-09 2013-07-21 Hon Hai Prec Ind Co Ltd 訊號測試裝置

Families Citing this family (27)

* Cited by examiner, † Cited by third party
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TWI333094B (en) * 2005-02-25 2010-11-11 Au Optronics Corp System and method for display testing
CN100426059C (zh) * 2005-12-08 2008-10-15 群康科技(深圳)有限公司 液晶显示面板
TWI345213B (en) * 2006-03-09 2011-07-11 Au Optronics Corp Low color-shift liquid crystal display and its driving method
TWI339381B (en) * 2006-09-22 2011-03-21 Chimei Innolux Corp Integrated circuit, liquid crystal panel with same and method for detecting integrated circuit
KR20080049216A (ko) * 2006-11-30 2008-06-04 엘지디스플레이 주식회사 액정 표시 장치 및 그 검사 방법
KR101304415B1 (ko) * 2007-01-25 2013-09-05 삼성디스플레이 주식회사 표시 장치
TWI368779B (en) * 2008-02-15 2012-07-21 Chunghwa Picture Tubes Ltd Peripheral circuit
CN102402031B (zh) * 2011-12-14 2014-01-22 深圳市华星光电技术有限公司 测试系统
CN103165055B (zh) * 2011-12-19 2015-06-17 名硕电脑(苏州)有限公司 显示装置分时连接系统及其方法
TWI463155B (zh) * 2012-12-24 2014-12-01 Novatek Microelectronics Corp 具有薄膜覆晶封裝的電子裝置
CN103915416B (zh) * 2013-01-08 2016-12-28 联咏科技股份有限公司 具有薄膜覆晶封装的电子装置
CN103682896B (zh) * 2013-12-20 2016-06-08 深圳市华星光电技术有限公司 用于检查液晶显示装置画面的信号插板
KR102179035B1 (ko) * 2014-03-07 2020-11-16 삼성전자주식회사 반도체 장치
CN104218042B (zh) * 2014-09-02 2017-06-09 合肥鑫晟光电科技有限公司 一种阵列基板及其制备方法、显示装置
TWI540323B (zh) * 2014-09-16 2016-07-01 友達光電股份有限公司 顯示面板之測試單元結構與顯示面板
CN104280908A (zh) * 2014-10-21 2015-01-14 深圳市华星光电技术有限公司 一种检测电路和液晶显示面板及其制造方法
CN104616612B (zh) * 2015-02-26 2018-05-25 上海和辉光电有限公司 Amoled显示器、其测试组件及其缺陷测试方法
CN104700760B (zh) * 2015-04-01 2017-05-31 友达光电(厦门)有限公司 显示面板、检测电路与其检测方法
CN104869752A (zh) * 2015-06-02 2015-08-26 合肥京东方光电科技有限公司 一种柔性电路板及其检测设备、检测方法和显示设备
KR102716282B1 (ko) * 2016-09-12 2024-10-11 삼성디스플레이 주식회사 테스트부를 갖는 표시장치
CN107945721B (zh) * 2017-11-29 2021-09-28 武汉天马微电子有限公司 一种显示面板及其点屏测试方法、显示装置
CN109166504B (zh) * 2018-10-17 2021-10-01 惠科股份有限公司 测试电路及显示装置
CN111367099B (zh) * 2018-12-25 2025-08-19 合肥鑫晟光电科技有限公司 显示基板、显示装置和显示基板的测试方法
KR102656012B1 (ko) * 2019-03-19 2024-04-11 삼성전자주식회사 Led 디스플레이 패널 및 수리 방법.
KR102673395B1 (ko) * 2020-04-28 2024-06-10 주식회사 엘엑스세미콘 소스 구동 장치
CN113448131A (zh) * 2021-06-23 2021-09-28 惠科股份有限公司 显示面板及其测试方法
CN113238114B (zh) * 2021-07-12 2021-10-22 深圳市永达电子信息股份有限公司 一种通用型触摸屏自动检测装置和方法

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KR0182184B1 (en) * 1996-04-24 1999-04-15 Samsung Electronics Co Ltd Disconnection/short test apparatus and its method of signal line using metrix
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TW527513B (en) * 2000-03-06 2003-04-11 Hitachi Ltd Liquid crystal display device and manufacturing method thereof
US20030085855A1 (en) * 2001-07-17 2003-05-08 Kabushiki Kaisha Toshiba Array substrate, method of inspecting array substrate, and liquid crystal display
JP2003308051A (ja) * 2002-04-16 2003-10-31 Seiko Epson Corp 画像信号供給回路および電気光学パネル
DE10227332A1 (de) * 2002-06-19 2004-01-15 Akt Electron Beam Technology Gmbh Ansteuervorrichtung mit verbesserten Testeneigenschaften
TW586144B (en) * 2002-11-15 2004-05-01 Toppoly Optoelectronics Corp Method of forming a liquid crystal display
KR100640208B1 (ko) * 2002-12-28 2006-10-31 엘지.필립스 엘시디 주식회사 액정표시패널의 검사용 범프 구조
JP3964337B2 (ja) * 2003-03-07 2007-08-22 三菱電機株式会社 画像表示装置
TWI239403B (en) * 2003-08-26 2005-09-11 Chunghwa Picture Tubes Ltd A combining detection circuit for a display panel
TWI220696B (en) * 2003-09-12 2004-09-01 Toppoly Optoelectronics Corp Testing device and its operation method of the flat-panel display
US7145352B2 (en) * 2004-08-13 2006-12-05 Agilent Technologies, Inc. Apparatus, method, and kit for probing a pattern of points on a printed circuit board
TWI333094B (en) 2005-02-25 2010-11-11 Au Optronics Corp System and method for display testing
TWI309813B (en) * 2005-12-23 2009-05-11 Au Optronics Corp Display device and pixel testing method thereof

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8174280B2 (en) 2009-01-05 2012-05-08 Chunghwa Picture Tubes, Ltd. Method of testing display panel
TWI402515B (zh) * 2009-01-09 2013-07-21 Hon Hai Prec Ind Co Ltd 訊號測試裝置
CN102692774A (zh) * 2012-05-23 2012-09-26 深圳市华星光电技术有限公司 液晶显示面板
WO2013174046A1 (zh) * 2012-05-23 2013-11-28 深圳市华星光电技术有限公司 液晶显示面板

Also Published As

Publication number Publication date
US20060192585A1 (en) 2006-08-31
US20090184730A1 (en) 2009-07-23
TWI333094B (en) 2010-11-11
US7821287B2 (en) 2010-10-26
US20080061815A1 (en) 2008-03-13
US7298164B2 (en) 2007-11-20
US7535248B2 (en) 2009-05-19

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