TW200633211A - Semiconductor devices integrating high-voltage and low-voltage field effect transistors on the same wafer - Google Patents
Semiconductor devices integrating high-voltage and low-voltage field effect transistors on the same waferInfo
- Publication number
- TW200633211A TW200633211A TW094106558A TW94106558A TW200633211A TW 200633211 A TW200633211 A TW 200633211A TW 094106558 A TW094106558 A TW 094106558A TW 94106558 A TW94106558 A TW 94106558A TW 200633211 A TW200633211 A TW 200633211A
- Authority
- TW
- Taiwan
- Prior art keywords
- voltage
- field effect
- same wafer
- low
- semiconductor devices
- Prior art date
Links
- 230000005669 field effect Effects 0.000 title abstract 2
- 239000004065 semiconductor Substances 0.000 title 1
- 230000010354 integration Effects 0.000 abstract 1
- 238000004519 manufacturing process Methods 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
Landscapes
- Junction Field-Effect Transistors (AREA)
- Electrodes Of Semiconductors (AREA)
Abstract
A field effect transistor(FET) with novel field-plate structure relates to a Schottky gate FET structure with field plate thereon for high voltage operations. The structure and fabrication processes thereof not only provide a reliable way to produce high-voltage FETs, but also allow the integration of conventional low voltage FETs on the same wafer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW094106558A TW200633211A (en) | 2005-03-04 | 2005-03-04 | Semiconductor devices integrating high-voltage and low-voltage field effect transistors on the same wafer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW094106558A TW200633211A (en) | 2005-03-04 | 2005-03-04 | Semiconductor devices integrating high-voltage and low-voltage field effect transistors on the same wafer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW200633211A true TW200633211A (en) | 2006-09-16 |
Family
ID=57809259
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW094106558A TW200633211A (en) | 2005-03-04 | 2005-03-04 | Semiconductor devices integrating high-voltage and low-voltage field effect transistors on the same wafer |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TW200633211A (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102254943A (en) * | 2011-08-06 | 2011-11-23 | 深圳市稳先微电子有限公司 | Transistor power device with gate source side table protection and manufacturing method thereof |
| CN102280483A (en) * | 2011-08-06 | 2011-12-14 | 深圳市稳先微电子有限公司 | Power device with side stage protecting source and gate and manufacture method thereof |
| US9508843B2 (en) | 2013-09-10 | 2016-11-29 | Delta Electronics, Inc. | Heterojunction semiconductor device for reducing parasitic capacitance |
| US10236236B2 (en) | 2013-09-10 | 2019-03-19 | Delta Electronics, Inc. | Heterojunction semiconductor device for reducing parasitic capacitance |
| US10665709B2 (en) | 2013-09-10 | 2020-05-26 | Delta Electronics, Inc. | Power semiconductor device integrated with ESD protection circuit under source pad, drain pad, and/or gate pad |
| US10833185B2 (en) | 2013-09-10 | 2020-11-10 | Delta Electronics, Inc. | Heterojunction semiconductor device having source and drain pads with improved current crowding |
| US10910491B2 (en) | 2013-09-10 | 2021-02-02 | Delta Electronics, Inc. | Semiconductor device having reduced capacitance between source and drain pads |
-
2005
- 2005-03-04 TW TW094106558A patent/TW200633211A/en unknown
Cited By (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102254943A (en) * | 2011-08-06 | 2011-11-23 | 深圳市稳先微电子有限公司 | Transistor power device with gate source side table protection and manufacturing method thereof |
| CN102280483A (en) * | 2011-08-06 | 2011-12-14 | 深圳市稳先微电子有限公司 | Power device with side stage protecting source and gate and manufacture method thereof |
| CN102254943B (en) * | 2011-08-06 | 2013-06-19 | 深圳市稳先微电子有限公司 | Transistor power device with gate source side table protection and manufacturing method thereof |
| US9508843B2 (en) | 2013-09-10 | 2016-11-29 | Delta Electronics, Inc. | Heterojunction semiconductor device for reducing parasitic capacitance |
| US10084076B2 (en) | 2013-09-10 | 2018-09-25 | Delta Electronics, Inc. | Heterojunction semiconductor device for reducing parasitic capacitance |
| US10236236B2 (en) | 2013-09-10 | 2019-03-19 | Delta Electronics, Inc. | Heterojunction semiconductor device for reducing parasitic capacitance |
| US10468516B2 (en) | 2013-09-10 | 2019-11-05 | Delta Electronics, Inc. | Heterojunction semiconductor device for reducing parasitic capacitance |
| US10573736B2 (en) | 2013-09-10 | 2020-02-25 | Delta Electronics, Inc. | Heterojunction semiconductor device for reducing parasitic capacitance |
| US10665709B2 (en) | 2013-09-10 | 2020-05-26 | Delta Electronics, Inc. | Power semiconductor device integrated with ESD protection circuit under source pad, drain pad, and/or gate pad |
| US10833185B2 (en) | 2013-09-10 | 2020-11-10 | Delta Electronics, Inc. | Heterojunction semiconductor device having source and drain pads with improved current crowding |
| US10910491B2 (en) | 2013-09-10 | 2021-02-02 | Delta Electronics, Inc. | Semiconductor device having reduced capacitance between source and drain pads |
| US10950524B2 (en) | 2013-09-10 | 2021-03-16 | Delta Electronics, Inc. | Heterojunction semiconductor device for reducing parasitic capacitance |
| US11817494B2 (en) | 2013-09-10 | 2023-11-14 | Ancora Semiconductors Inc. | Semiconductor device having reduced capacitance between source and drain pads |
| US12062716B2 (en) | 2013-09-10 | 2024-08-13 | Ancora Semiconductors Inc. | Semiconductor device including source pad region and drain pad region configured to improve current uniformity and reduce resistance |
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