TW200716944A - Apparatus for and method of measuring image - Google Patents

Apparatus for and method of measuring image

Info

Publication number
TW200716944A
TW200716944A TW095137725A TW95137725A TW200716944A TW 200716944 A TW200716944 A TW 200716944A TW 095137725 A TW095137725 A TW 095137725A TW 95137725 A TW95137725 A TW 95137725A TW 200716944 A TW200716944 A TW 200716944A
Authority
TW
Taiwan
Prior art keywords
image
ccd camera
capturing
captured
outputting
Prior art date
Application number
TW095137725A
Other languages
English (en)
Other versions
TWI294959B (en
Inventor
Sang-Yoon Lee
Min-Gu Kang
Ssang-Gun Lim
Original Assignee
Intekplus Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intekplus Co Ltd filed Critical Intekplus Co Ltd
Publication of TW200716944A publication Critical patent/TW200716944A/zh
Application granted granted Critical
Publication of TWI294959B publication Critical patent/TWI294959B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/04—Measuring microscopes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0271—Testing optical properties by measuring geometrical properties or aberrations by using interferometric methods
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N2021/0181—Memory or computer-assisted visual determination

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Geometry (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
TW095137725A 2005-10-19 2006-10-13 Apparatus for and method of measuring image TWI294959B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020050098853A KR100740249B1 (ko) 2005-10-19 2005-10-19 영상 측정 장치 및 그 방법

Publications (2)

Publication Number Publication Date
TW200716944A true TW200716944A (en) 2007-05-01
TWI294959B TWI294959B (en) 2008-03-21

Family

ID=37962690

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095137725A TWI294959B (en) 2005-10-19 2006-10-13 Apparatus for and method of measuring image

Country Status (5)

Country Link
US (1) US8155483B2 (zh)
JP (1) JP2009511932A (zh)
KR (1) KR100740249B1 (zh)
TW (1) TWI294959B (zh)
WO (1) WO2007046626A1 (zh)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8005290B2 (en) 2007-07-05 2011-08-23 Industrial Technology Research Institute Method for image calibration and apparatus for image acquiring
TWI794909B (zh) * 2021-07-29 2023-03-01 日商雅馬哈智能機器控股股份有限公司 三維畫像產生裝置以及三維畫像產生方法

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100946640B1 (ko) * 2008-03-24 2010-03-09 홍광표 영상처리 측정기
KR100956854B1 (ko) * 2008-04-04 2010-05-11 선문대학교 산학협력단 3차원 형상의 초고속 형상측정장치 및 방법
KR100956853B1 (ko) * 2008-04-04 2010-05-11 선문대학교 산학협력단 3차원 형상의 고속 형상측정장치 및 방법
US8799769B2 (en) * 2011-02-08 2014-08-05 Ebay Inc. Application above-the-fold rendering measurements
KR101341189B1 (ko) * 2011-03-10 2014-01-06 엄두간 표면각도 측정 광센서 및 이를 이용한 감지 방법
KR101401395B1 (ko) 2012-02-07 2014-06-02 엄두간 표면각도 측정 광센서 및 이를 이용한 표면각도 및 형상정보 감지방법
TWI663380B (zh) * 2018-09-19 2019-06-21 致茂電子股份有限公司 影像擷取系統及影像擷取方法
CN111781394A (zh) * 2020-06-16 2020-10-16 江西寻准智能科技有限责任公司 一种白光速度计

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2730203B2 (ja) * 1989-08-17 1998-03-25 オムロン株式会社 光学的情報記録再生装置
JPH04295709A (ja) 1991-03-25 1992-10-20 Ricoh Co Ltd 干渉測定装置及び干渉縞画像情報取り込み方法
DE4335143A1 (de) * 1993-10-15 1995-04-20 Hell Ag Linotype Verfahren und Einrichtung zur Umsetzung von Farbwerten
JP3381924B2 (ja) * 1995-03-10 2003-03-04 株式会社 日立製作所 検査装置
US5793371A (en) * 1995-08-04 1998-08-11 Sun Microsystems, Inc. Method and apparatus for geometric compression of three-dimensional graphics data
JPH09149207A (ja) * 1995-11-24 1997-06-06 Minolta Co Ltd 画像読取装置
PT888522E (pt) * 1996-03-22 2001-10-30 Univ Loughborough Processo e aparelho para a medicao da forma de objectos
US5748904A (en) * 1996-09-13 1998-05-05 Silicon Integrated Systems Corp. Method and system for segment encoded graphic data compression
US5926647A (en) * 1996-10-11 1999-07-20 Divicom Inc. Processing system with dynamic alteration of a color look-up table
US6065746A (en) * 1997-02-18 2000-05-23 Unisys Corporation Apparatus and method of automatically adjusting a document deceleration rate
JP2000171209A (ja) * 1998-12-09 2000-06-23 Nikon Corp 干渉測定装置
US6552806B1 (en) * 2000-02-03 2003-04-22 Veeco Instruments Inc. Automated minimization of optical path difference and reference mirror focus in white-light interference microscope objective
JP2002214129A (ja) 2001-01-16 2002-07-31 Japan Science & Technology Corp ヘテロダイン検出によるミロー干渉計型鉛直断面画像測定装置
KR100434445B1 (ko) * 2001-12-28 2004-06-04 (주) 인텍플러스 3차원 형상/표면조도 측정장치
KR100615576B1 (ko) * 2003-02-06 2006-08-25 주식회사 고영테크놀러지 3차원형상 측정장치
JP4295709B2 (ja) 2004-10-14 2009-07-15 富士フイルム株式会社 撮像装置、画像処理装置、及び画像処理方法

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8005290B2 (en) 2007-07-05 2011-08-23 Industrial Technology Research Institute Method for image calibration and apparatus for image acquiring
US8237933B2 (en) 2007-07-05 2012-08-07 Industrial Technology Research Institute Method for image calibration and apparatus for image acquiring
TWI794909B (zh) * 2021-07-29 2023-03-01 日商雅馬哈智能機器控股股份有限公司 三維畫像產生裝置以及三維畫像產生方法

Also Published As

Publication number Publication date
WO2007046626A1 (en) 2007-04-26
TWI294959B (en) 2008-03-21
US8155483B2 (en) 2012-04-10
US20080260204A1 (en) 2008-10-23
KR20070042841A (ko) 2007-04-24
JP2009511932A (ja) 2009-03-19
KR100740249B1 (ko) 2007-07-18

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