TW200721191A - Minimizing adjacent wordline disturb in a memory device - Google Patents

Minimizing adjacent wordline disturb in a memory device

Info

Publication number
TW200721191A
TW200721191A TW095148893A TW95148893A TW200721191A TW 200721191 A TW200721191 A TW 200721191A TW 095148893 A TW095148893 A TW 095148893A TW 95148893 A TW95148893 A TW 95148893A TW 200721191 A TW200721191 A TW 200721191A
Authority
TW
Taiwan
Prior art keywords
memory device
voltage
predetermined voltage
adjacent wordline
biased
Prior art date
Application number
TW095148893A
Other languages
English (en)
Other versions
TWI301277B (en
Inventor
Paul J Rudeck
Andrei Mihnea
Andrew Bicksler
Original Assignee
Micron Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micron Technology Inc filed Critical Micron Technology Inc
Publication of TW200721191A publication Critical patent/TW200721191A/zh
Application granted granted Critical
Publication of TWI301277B publication Critical patent/TWI301277B/zh

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/10Programming or data input circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/34Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3418Disturbance prevention or evaluation; Refreshing of disturbed memory data
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/34Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3418Disturbance prevention or evaluation; Refreshing of disturbed memory data
    • G11C16/3427Circuits or methods to prevent or reduce disturbance of the state of a memory cell when neighbouring cells are read or written
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/04Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0483Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells having several storage transistors connected in series

Landscapes

  • Read Only Memory (AREA)
  • Semiconductor Memories (AREA)
TW095148893A 2004-06-30 2005-06-28 Minimizing adjacent wordline disturb in a memory device TWI301277B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/881,951 US7212435B2 (en) 2004-06-30 2004-06-30 Minimizing adjacent wordline disturb in a memory device

Publications (2)

Publication Number Publication Date
TW200721191A true TW200721191A (en) 2007-06-01
TWI301277B TWI301277B (en) 2008-09-21

Family

ID=35058663

Family Applications (2)

Application Number Title Priority Date Filing Date
TW094121594A TWI302315B (en) 2004-06-30 2005-06-28 Minimizing adjacent wordline disturb in a memory device
TW095148893A TWI301277B (en) 2004-06-30 2005-06-28 Minimizing adjacent wordline disturb in a memory device

Family Applications Before (1)

Application Number Title Priority Date Filing Date
TW094121594A TWI302315B (en) 2004-06-30 2005-06-28 Minimizing adjacent wordline disturb in a memory device

Country Status (3)

Country Link
US (3) US7212435B2 (zh)
TW (2) TWI302315B (zh)
WO (1) WO2006012292A1 (zh)

Families Citing this family (52)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100684873B1 (ko) * 2004-11-22 2007-02-20 삼성전자주식회사 불휘발성 메모리 장치 및 그것의 워드라인 전압 제어 방법
US7251160B2 (en) * 2005-03-16 2007-07-31 Sandisk Corporation Non-volatile memory and method with power-saving read and program-verify operations
KR100680462B1 (ko) * 2005-04-11 2007-02-08 주식회사 하이닉스반도체 비휘발성 메모리 장치 및 그것의 핫 일렉트론 프로그램디스터브 방지방법
US7408810B2 (en) * 2006-02-22 2008-08-05 Micron Technology, Inc. Minimizing effects of program disturb in a memory device
US7561469B2 (en) * 2006-03-28 2009-07-14 Micron Technology, Inc. Programming method to reduce word line to word line breakdown for NAND flash
US7440321B2 (en) * 2006-04-12 2008-10-21 Micron Technology, Inc. Multiple select gate architecture with select gates of different lengths
US7286408B1 (en) * 2006-05-05 2007-10-23 Sandisk Corporation Boosting methods for NAND flash memory
US7436709B2 (en) * 2006-05-05 2008-10-14 Sandisk Corporation NAND flash memory with boosting
WO2007130832A2 (en) * 2006-05-05 2007-11-15 Sandisk Corporation Boosting voltage technique fpr programming nand flash memory devices
US7471565B2 (en) * 2006-08-22 2008-12-30 Micron Technology, Inc. Reducing effects of program disturb in a memory device
KR100763093B1 (ko) * 2006-09-29 2007-10-04 주식회사 하이닉스반도체 플래쉬 메모리 장치의 프로그램 방법
KR101012133B1 (ko) * 2006-11-02 2011-02-07 샌디스크 코포레이션 다중 부스팅 모드들을 이용하여 비휘발성 메모리에서 프로그램 디스터브를 감소시키는 방법
US7468911B2 (en) * 2006-11-02 2008-12-23 Sandisk Corporation Non-volatile memory using multiple boosting modes for reduced program disturb
US7440323B2 (en) * 2006-11-02 2008-10-21 Sandisk Corporation Reducing program disturb in non-volatile memory using multiple boosting modes
EP2122628B1 (en) * 2007-02-07 2012-05-30 MOSAID Technologies Incorporated Source side asymmetrical precharge programming scheme
US20080273389A1 (en) * 2007-03-21 2008-11-06 Micron Technology, Inc. Flash memory cells, NAND cell units, methods of forming NAND cell units, and methods of programming NAND cell unit strings
US7619931B2 (en) * 2007-06-26 2009-11-17 Micron Technology, Inc. Program-verify method with different read and verify pass-through voltages
KR100908560B1 (ko) * 2007-08-06 2009-07-21 주식회사 하이닉스반도체 플래시 메모리 소자의 프로그램 방법
JP4510060B2 (ja) * 2007-09-14 2010-07-21 株式会社東芝 不揮発性半導体記憶装置の読み出し/書き込み制御方法
US8355278B2 (en) 2007-10-05 2013-01-15 Micron Technology, Inc. Reducing effects of program disturb in a memory device
US7619933B2 (en) * 2007-10-05 2009-11-17 Micron Technology, Inc. Reducing effects of program disturb in a memory device
KR100894489B1 (ko) * 2007-11-02 2009-04-22 주식회사 하이닉스반도체 반도체 장치 및 반도체 메모리장치
US7826262B2 (en) * 2008-01-10 2010-11-02 Macronix International Co., Ltd Operation method of nitride-based flash memory and method of reducing coupling interference
US7733705B2 (en) * 2008-03-13 2010-06-08 Micron Technology, Inc. Reduction of punch-through disturb during programming of a memory device
US7808819B2 (en) * 2008-04-29 2010-10-05 Sandisk Il Ltd. Method for adaptive setting of state voltage levels in non-volatile memory
US7808836B2 (en) * 2008-04-29 2010-10-05 Sandisk Il Ltd. Non-volatile memory with adaptive setting of state voltage levels
US7821839B2 (en) * 2008-06-27 2010-10-26 Sandisk Il Ltd. Gain control for read operations in flash memory
KR101569894B1 (ko) * 2008-11-12 2015-11-17 삼성전자주식회사 불 휘발성 메모리 장치의 프로그램 방법
US8238161B2 (en) 2008-11-17 2012-08-07 Samsung Electronics Co., Ltd. Nonvolatile memory device
US7995386B2 (en) * 2008-11-21 2011-08-09 Spansion Llc Applying negative gate voltage to wordlines adjacent to wordline associated with read or verify to reduce adjacent wordline disturb
US7995394B2 (en) * 2009-07-30 2011-08-09 Sandisk Technologies Inc. Program voltage compensation with word line bias change to suppress charge trapping in memory
US8009478B2 (en) 2009-10-05 2011-08-30 Micron Technology, Inc. Non-volatile memory apparatus and methods
KR101642932B1 (ko) * 2009-11-02 2016-07-27 삼성전자주식회사 플래시 메모리 장치의 로컬 셀프 부스팅 방법 및 그것을 이용한 프로그램 방법
US8351286B2 (en) * 2010-07-23 2013-01-08 Macronix International Co., Ltd. Test method for screening manufacturing defects in a memory array
US8390051B2 (en) 2010-07-27 2013-03-05 Micron Technology, Inc. Methods of forming semiconductor device structures and semiconductor device structures including a uniform pattern of conductive lines
US8570808B2 (en) 2010-08-09 2013-10-29 Samsung Electronics Co., Ltd. Nonvolatile memory device with 3D memory cell array
CN102568567B (zh) * 2010-12-07 2015-06-17 旺宏电子股份有限公司 快闪记忆体的操作方法
KR101881366B1 (ko) 2012-06-04 2018-07-24 에스케이하이닉스 주식회사 반도체 장치 및 그 동작 방법
KR20130136343A (ko) 2012-06-04 2013-12-12 에스케이하이닉스 주식회사 반도체 장치 및 그 동작 방법
KR102012903B1 (ko) 2012-10-30 2019-08-21 삼성전자주식회사 불휘발성 메모리 장치 및 불휘발성 메모리 장치의 프로그램 방법
US9087601B2 (en) * 2012-12-06 2015-07-21 Sandisk Technologies Inc. Select gate bias during program of non-volatile storage
US9026757B2 (en) * 2013-01-25 2015-05-05 Sandisk Technologies Inc. Non-volatile memory programming data preservation
US9449690B2 (en) * 2013-04-03 2016-09-20 Cypress Semiconductor Corporation Modified local segmented self-boosting of memory cell channels
KR101976452B1 (ko) * 2013-04-22 2019-05-10 에스케이하이닉스 주식회사 반도체 장치
US9355689B2 (en) 2013-08-20 2016-05-31 Oracle International Corporation Detection of multiple accesses to a row address of a dynamic memory within a refresh period
US8988945B1 (en) 2013-10-10 2015-03-24 Sandisk Technologies Inc. Programming time improvement for non-volatile memory
US10147500B2 (en) * 2015-05-22 2018-12-04 SK Hynix Inc. Hybrid read disturb count management
JP6869633B2 (ja) * 2015-08-14 2021-05-12 マクロニクス インターナショナル カンパニー リミテッド 3次元nandメモリ装置及びその駆動方法
WO2022027541A1 (en) * 2020-08-07 2022-02-10 Yangtze Memory Technologies Co., Ltd. Operating method of generating enhanced bit line voltage and non-volatile memory device
US11670374B2 (en) * 2021-08-17 2023-06-06 Micron Technology, Inc. Memory device including initial charging phase for double sense operation
US12141446B2 (en) * 2021-11-18 2024-11-12 Samsung Electronics Co., Ltd. Memory device for individually applying voltages to word lines adjacent to selected word line, and operating method thereof
CN115862710B (zh) * 2022-12-13 2025-12-23 至讯创新科技(无锡)有限公司 Nand闪存实现同或运算的控制方法

Family Cites Families (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5563823A (en) * 1993-08-31 1996-10-08 Macronix International Co., Ltd. Fast FLASH EPROM programming and pre-programming circuit design
DE69428516T2 (de) * 1994-03-28 2002-05-08 Stmicroelectronics S.R.L., Agrate Brianza Flash-EEPROM-Speicher-Matrix und Verfahren zur Vorspannung
US5677875A (en) * 1995-02-28 1997-10-14 Nec Corporation Non-volatile semiconductor memory device configured to minimize variations in threshold voltages of non-written memory cells and potentials of selected bit lines
KR0145475B1 (ko) * 1995-03-31 1998-08-17 김광호 낸드구조를 가지는 불휘발성 반도체 메모리의 프로그램장치 및 방법
KR0170296B1 (ko) * 1995-09-19 1999-03-30 김광호 비휘발성 메모리소자
US5715194A (en) * 1996-07-24 1998-02-03 Advanced Micro Devices, Inc. Bias scheme of program inhibit for random programming in a nand flash memory
US5917757A (en) * 1996-08-01 1999-06-29 Aplus Flash Technology, Inc. Flash memory with high speed erasing structure using thin oxide semiconductor devices
US5912837A (en) * 1996-10-28 1999-06-15 Micron Technology, Inc. Bitline disturb reduction
US5986931A (en) * 1997-01-02 1999-11-16 Caywood; John M. Low voltage single CMOS electrically erasable read-only memory
KR100272037B1 (ko) * 1997-02-27 2000-12-01 니시무로 타이죠 불휘발성 반도체 기억 장치
KR100323554B1 (ko) * 1997-05-14 2002-03-08 니시무로 타이죠 불휘발성반도체메모리장치
US5959892A (en) 1997-08-26 1999-09-28 Macronix International Co., Ltd. Apparatus and method for programming virtual ground EPROM array cell without disturbing adjacent cells
US5959982A (en) * 1997-08-29 1999-09-28 Adicom Wireless, Inc. Method and apparatus for adapting a time division duplex timing device for propagation delay
KR100297602B1 (ko) * 1997-12-31 2001-08-07 윤종용 비휘발성메모리장치의프로그램방법
US5991202A (en) * 1998-09-24 1999-11-23 Advanced Micro Devices, Inc. Method for reducing program disturb during self-boosting in a NAND flash memory
US6240016B1 (en) * 1999-12-17 2001-05-29 Advanced Micro Devices, Inc. Method to reduce read gate disturb for flash EEPROM application
US6504757B1 (en) * 2000-08-11 2003-01-07 Advanced Micro Devices, Inc. Double boosting scheme for NAND to improve program inhibit characteristics
KR100385226B1 (ko) * 2000-11-22 2003-05-27 삼성전자주식회사 프로그램 디스터브를 방지할 수 있는 플래시 메모리 장치및 그것을 프로그램하는 방법
KR100378188B1 (ko) * 2000-12-06 2003-03-29 삼성전자주식회사 멀티 로우 어드레스 디스터브 테스트시 모든 워드라인들에동일한 스트레스를 인가하는 워드라인 드라이버 및 그구동방법
KR100385229B1 (ko) * 2000-12-14 2003-05-27 삼성전자주식회사 스트링 선택 라인에 유도되는 노이즈 전압으로 인한프로그램 디스터브를 방지할 수 있는 불휘발성 반도체메모리 장치 및 그것의 프로그램 방법
KR100385230B1 (ko) * 2000-12-28 2003-05-27 삼성전자주식회사 불휘발성 반도체 메모리 장치의 프로그램 방법
US6620682B1 (en) * 2001-02-27 2003-09-16 Aplus Flash Technology, Inc. Set of three level concurrent word line bias conditions for a nor type flash memory array
JP4565767B2 (ja) * 2001-04-11 2010-10-20 ルネサスエレクトロニクス株式会社 不揮発性半導体記憶装置
US6731544B2 (en) * 2001-05-14 2004-05-04 Nexflash Technologies, Inc. Method and apparatus for multiple byte or page mode programming of a flash memory array
KR100453854B1 (ko) * 2001-09-07 2004-10-20 삼성전자주식회사 향상된 프로그램 방지 특성을 갖는 불휘발성 반도체메모리 장치 및 그것의 프로그램 방법
US6894930B2 (en) * 2002-06-19 2005-05-17 Sandisk Corporation Deep wordline trench to shield cross coupling between adjacent cells for scaled NAND
US6987693B2 (en) * 2002-09-24 2006-01-17 Sandisk Corporation Non-volatile memory and method with reduced neighboring field errors
KR100502412B1 (ko) * 2002-10-23 2005-07-19 삼성전자주식회사 불 휘발성 반도체 메모리 장치 및 그것의 프로그램 방법
US7233522B2 (en) * 2002-12-31 2007-06-19 Sandisk 3D Llc NAND memory array incorporating capacitance boosting of channel regions in unselected memory cells and method for operation of same
JP4156986B2 (ja) * 2003-06-30 2008-09-24 株式会社東芝 不揮発性半導体記憶装置
KR100632942B1 (ko) * 2004-05-17 2006-10-12 삼성전자주식회사 불 휘발성 메모리 장치의 프로그램 방법

Also Published As

Publication number Publication date
US20060198222A1 (en) 2006-09-07
US20060002167A1 (en) 2006-01-05
TWI302315B (en) 2008-10-21
US7212435B2 (en) 2007-05-01
US7272039B2 (en) 2007-09-18
TW200606954A (en) 2006-02-16
TWI301277B (en) 2008-09-21
US20060198221A1 (en) 2006-09-07
US7257024B2 (en) 2007-08-14
WO2006012292A1 (en) 2006-02-02

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