TW200736602A - Method for making laminated film, method and device for detecting defects of laminated film, laminated film and image display device - Google Patents

Method for making laminated film, method and device for detecting defects of laminated film, laminated film and image display device

Info

Publication number
TW200736602A
TW200736602A TW096101085A TW96101085A TW200736602A TW 200736602 A TW200736602 A TW 200736602A TW 096101085 A TW096101085 A TW 096101085A TW 96101085 A TW96101085 A TW 96101085A TW 200736602 A TW200736602 A TW 200736602A
Authority
TW
Taiwan
Prior art keywords
laminated film
photographic device
filter
image display
detecting defects
Prior art date
Application number
TW096101085A
Other languages
English (en)
Other versions
TWI417536B (zh
Inventor
Takamasa Kobayashi
Michihiro Hagiwara
Yuuki Yano
Kouji Shizen
Original Assignee
Nitto Denko Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nitto Denko Corp filed Critical Nitto Denko Corp
Publication of TW200736602A publication Critical patent/TW200736602A/zh
Application granted granted Critical
Publication of TWI417536B publication Critical patent/TWI417536B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/30—Polarising elements

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Mathematical Physics (AREA)
  • Optics & Photonics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Polarising Elements (AREA)
TW096101085A 2006-01-11 2007-01-11 積層膜片的製造方法、積層膜片的缺陷檢測方法、積層膜片的缺陷檢測裝置、積層膜片及影像顯示裝置 TWI417536B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2006003856 2006-01-11
JP2006340274A JP4869053B2 (ja) 2006-01-11 2006-12-18 積層フィルムの製造方法、積層フィルムの欠陥検出方法、積層フィルムの欠陥検出装置、積層フィルム、及び画像表示装置

Publications (2)

Publication Number Publication Date
TW200736602A true TW200736602A (en) 2007-10-01
TWI417536B TWI417536B (zh) 2013-12-01

Family

ID=38256272

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096101085A TWI417536B (zh) 2006-01-11 2007-01-11 積層膜片的製造方法、積層膜片的缺陷檢測方法、積層膜片的缺陷檢測裝置、積層膜片及影像顯示裝置

Country Status (6)

Country Link
US (1) US7850801B2 (zh)
JP (1) JP4869053B2 (zh)
KR (1) KR101249119B1 (zh)
CN (1) CN101360990B (zh)
TW (1) TWI417536B (zh)
WO (1) WO2007080867A1 (zh)

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TWI884307B (zh) * 2020-08-28 2025-05-21 日商住友化學股份有限公司 檢查方法

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KR101713880B1 (ko) * 2014-08-14 2017-03-22 주식회사 엘지화학 필름 텐션 조절 시스템 및 이를 포함하는 편광판 제조 시스템
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JP6437329B2 (ja) * 2015-02-03 2018-12-12 住友化学株式会社 光学フィルムの欠陥検査方法
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JP6784540B2 (ja) * 2015-09-30 2020-11-11 日東電工株式会社 偏光板の検査方法および検査装置
JP6795883B2 (ja) * 2015-10-05 2020-12-02 日東電工株式会社 偏光子の製造方法
KR102001445B1 (ko) * 2015-10-30 2019-07-19 주식회사 엘지화학 필터 결합체를 이용한 광학부재 검사 장치 및 그 장치를 이용하여 광학부재의 결함 유무를 검사하는 방법
CN206583816U (zh) * 2015-12-15 2017-10-24 住友化学株式会社 缺陷检查用拍摄装置、缺陷检查系统以及膜制造装置
KR102063551B1 (ko) * 2016-05-24 2020-01-08 주식회사 엘지화학 광학필름의 결함 검출 시스템 및 광학필름의 결함 검출 방법
CN105866986B (zh) * 2016-05-26 2019-09-20 明基材料有限公司 检测装置及检测方法
KR101955757B1 (ko) * 2016-06-08 2019-03-07 삼성에스디아이 주식회사 필름 처리장치 및 처리방법
JP6924002B2 (ja) * 2016-07-22 2021-08-25 日東電工株式会社 検査装置及び検査方法
EP3532429B1 (en) 2016-10-26 2025-08-06 Board of Regents, The University of Texas System High throughput, high resolution optical metrology for reflective and transmissive nanophotonic devices
KR102367544B1 (ko) * 2016-11-07 2022-02-24 주식회사 엘지화학 인라인 코팅필름의 핀홀 자동화 표시 시스템 및 방법
JP6865646B2 (ja) * 2016-11-30 2021-04-28 住友化学株式会社 欠陥検査装置、欠陥検査方法、及びセパレータ捲回体の製造方法
JP2018120156A (ja) * 2017-01-27 2018-08-02 日本電産サンキョー株式会社 アライメント装置
CN107390393B (zh) * 2017-07-24 2020-09-22 惠州高视科技有限公司 一种液晶模组缺陷检测后的复判分层方法
JP6924645B2 (ja) * 2017-07-31 2021-08-25 日東電工株式会社 偏光フィルムの撮像装置、及び検査装置、並びに検査方法
KR102707189B1 (ko) * 2017-09-13 2024-09-13 스미또모 가가꾸 가부시키가이샤 결함 검사 장치, 결함 검사 방법, 원 편광판 또는 타원 편광판의 제조 방법 및 위상차판의 제조 방법
JP6948215B2 (ja) * 2017-10-11 2021-10-13 住友化学株式会社 欠陥検査装置、欠陥検査方法、及び、フィルムの製造方法
KR20200047259A (ko) 2018-10-25 2020-05-07 동우 화인켐 주식회사 광학 필름의 결함 검사 방법 및 장치
JP7668083B2 (ja) * 2018-11-30 2025-04-24 日東電工株式会社 外観検査方法および外観検査装置
CN111721502B (zh) * 2019-03-22 2024-06-11 住友化学株式会社 检查方法及检查装置
CN111721776B (zh) * 2019-03-22 2024-02-20 住友化学株式会社 检查方法及检查装置
KR102871822B1 (ko) * 2019-05-15 2025-10-15 스미또모 가가꾸 가부시키가이샤 광학 필름의 검사 방법 및 광학 필름의 제조 방법
CN110736610B (zh) * 2019-10-22 2021-08-20 歌尔光学科技有限公司 测量光学中心偏移的方法、装置、存储介质及深度相机
CN110987963A (zh) * 2019-12-25 2020-04-10 苏州伟信奥图智能科技有限公司 一种带有膜的移动物体表面缺陷检测方法
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KR20220023874A (ko) * 2020-08-20 2022-03-03 삼성디스플레이 주식회사 표시 장치 광학 성능 테스트용 광학 검사 기기 및 이를 이용한 광학 검사 방법
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI884307B (zh) * 2020-08-28 2025-05-21 日商住友化學股份有限公司 檢查方法

Also Published As

Publication number Publication date
JP4869053B2 (ja) 2012-02-01
WO2007080867A1 (ja) 2007-07-19
KR20080086928A (ko) 2008-09-26
KR101249119B1 (ko) 2013-03-29
CN101360990A (zh) 2009-02-04
US7850801B2 (en) 2010-12-14
CN101360990B (zh) 2012-05-16
JP2007212442A (ja) 2007-08-23
TWI417536B (zh) 2013-12-01
US20090288754A1 (en) 2009-11-26

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