TW200737314A - Gas supply system, substrate processing apparatus and gas supply method - Google Patents

Gas supply system, substrate processing apparatus and gas supply method

Info

Publication number
TW200737314A
TW200737314A TW096104484A TW96104484A TW200737314A TW 200737314 A TW200737314 A TW 200737314A TW 096104484 A TW096104484 A TW 096104484A TW 96104484 A TW96104484 A TW 96104484A TW 200737314 A TW200737314 A TW 200737314A
Authority
TW
Taiwan
Prior art keywords
gas supply
gas
branch
processing
additional
Prior art date
Application number
TW096104484A
Other languages
English (en)
Other versions
TWI397112B (zh
Inventor
Kenetsu Mizusawa
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Publication of TW200737314A publication Critical patent/TW200737314A/zh
Application granted granted Critical
Publication of TWI397112B publication Critical patent/TWI397112B/zh

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45563Gas nozzles
    • C23C16/45565Shower nozzles
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45563Gas nozzles
    • C23C16/45574Nozzles for more than one gas
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F17STORING OR DISTRIBUTING GASES OR LIQUIDS
    • F17DPIPE-LINE SYSTEMS; PIPE-LINES
    • F17D1/00Pipe-line systems
    • F17D1/02Pipe-line systems for gases or vapours
    • F17D1/04Pipe-line systems for gases or vapours for distribution of gas
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/3244Gas supply means
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T137/00Fluid handling
    • Y10T137/0318Processes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Materials Engineering (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Plasma & Fusion (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Drying Of Semiconductors (AREA)
  • Chemical Vapour Deposition (AREA)
TW96104484A 2006-02-08 2007-02-07 A gas supply device, a substrate processing device, and a gas supply method TWI397112B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006031731A JP4911984B2 (ja) 2006-02-08 2006-02-08 ガス供給装置,基板処理装置,ガス供給方法及びシャワーヘッド

Publications (2)

Publication Number Publication Date
TW200737314A true TW200737314A (en) 2007-10-01
TWI397112B TWI397112B (zh) 2013-05-21

Family

ID=38492465

Family Applications (1)

Application Number Title Priority Date Filing Date
TW96104484A TWI397112B (zh) 2006-02-08 2007-02-07 A gas supply device, a substrate processing device, and a gas supply method

Country Status (5)

Country Link
US (1) US20070181181A1 (zh)
JP (1) JP4911984B2 (zh)
KR (1) KR100810827B1 (zh)
CN (1) CN101017771A (zh)
TW (1) TWI397112B (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI676702B (zh) * 2016-03-04 2019-11-11 日商東京威力科創股份有限公司 混合氣體複數系統供給體系及利用該體系的基板處理裝置

Families Citing this family (43)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060124169A1 (en) * 2004-12-09 2006-06-15 Tokyo Electron Limited Gas supply unit, substrate processing apparatus, and supply gas setting method
KR100725098B1 (ko) * 2005-11-17 2007-06-04 삼성전자주식회사 반도체 제조설비의 유량조절기 오동작 감지장치 및 그 방법
US20080078746A1 (en) * 2006-08-15 2008-04-03 Noriiki Masuda Substrate processing system, gas supply unit, method of substrate processing, computer program, and storage medium
JP5192214B2 (ja) 2007-11-02 2013-05-08 東京エレクトロン株式会社 ガス供給装置、基板処理装置および基板処理方法
JP5230225B2 (ja) 2008-03-06 2013-07-10 東京エレクトロン株式会社 蓋部品、処理ガス拡散供給装置、及び基板処理装置
US9484213B2 (en) * 2008-03-06 2016-11-01 Tokyo Electron Limited Processing gas diffusing and supplying unit and substrate processing apparatus
KR101121202B1 (ko) * 2008-11-14 2012-03-23 세메스 주식회사 다채널을 이용한 공정가스 공급이 가능한 화학기상증착 장치
KR101229775B1 (ko) 2008-12-26 2013-02-06 엘지디스플레이 주식회사 기판 세정장치
KR101110080B1 (ko) * 2009-07-08 2012-03-13 주식회사 유진테크 확산판을 선택적으로 삽입설치하는 기판처리방법
KR101047469B1 (ko) * 2009-09-14 2011-07-07 엘아이지에이디피 주식회사 샤워 헤드
US9540731B2 (en) 2009-12-04 2017-01-10 Applied Materials, Inc. Reconfigurable multi-zone gas delivery hardware for substrate processing showerheads
US9441295B2 (en) * 2010-05-14 2016-09-13 Solarcity Corporation Multi-channel gas-delivery system
WO2011159690A2 (en) * 2010-06-15 2011-12-22 Applied Materials, Inc. Multiple precursor showerhead with by-pass ports
TWI534291B (zh) * 2011-03-18 2016-05-21 應用材料股份有限公司 噴淋頭組件
CN102231360B (zh) * 2011-05-27 2013-05-15 中微半导体设备(上海)有限公司 等离子体刻蚀腔体内刻蚀气体调节方法
JP5860668B2 (ja) 2011-10-28 2016-02-16 東京エレクトロン株式会社 半導体装置の製造方法
US20130295283A1 (en) * 2012-05-07 2013-11-07 Pinecone Material Inc. Chemical vapor deposition apparatus with multiple inlets for controlling film thickness and uniformity
JP6140412B2 (ja) 2012-09-21 2017-05-31 東京エレクトロン株式会社 ガス供給方法及びプラズマ処理装置
JP5580908B2 (ja) * 2013-01-31 2014-08-27 東京エレクトロン株式会社 ガス供給装置、基板処理装置および基板処理方法
TWI627305B (zh) * 2013-03-15 2018-06-21 Applied Materials, Inc. 用於轉盤處理室之具有剛性板的大氣蓋
JP6007143B2 (ja) * 2013-03-26 2016-10-12 東京エレクトロン株式会社 シャワーヘッド、プラズマ処理装置、及びプラズマ処理方法
JP6027490B2 (ja) * 2013-05-13 2016-11-16 東京エレクトロン株式会社 ガスを供給する方法、及びプラズマ処理装置
JP6195481B2 (ja) * 2013-07-08 2017-09-13 東京エレクトロン株式会社 クリーニング方法及び基板処理装置
JP6336719B2 (ja) * 2013-07-16 2018-06-06 株式会社ディスコ プラズマエッチング装置
JP5917477B2 (ja) * 2013-11-29 2016-05-18 株式会社日立国際電気 基板処理装置、半導体装置の製造方法及びプログラム
KR101560623B1 (ko) * 2014-01-03 2015-10-15 주식회사 유진테크 기판처리장치 및 기판처리방법
JP6169040B2 (ja) * 2014-05-12 2017-07-26 東京エレクトロン株式会社 プラズマ処理装置の上部電極構造、プラズマ処理装置、及びプラズマ処理装置の運用方法
KR20150140936A (ko) * 2014-06-09 2015-12-17 삼성전자주식회사 유도 결합형 플라즈마(Inductively Coupled Plasma : ICP)를 이용한 식각 장치
JP6305314B2 (ja) * 2014-10-29 2018-04-04 東京エレクトロン株式会社 成膜装置およびシャワーヘッド
US9972740B2 (en) 2015-06-07 2018-05-15 Tesla, Inc. Chemical vapor deposition tool and process for fabrication of photovoltaic structures
US10577690B2 (en) * 2016-05-20 2020-03-03 Applied Materials, Inc. Gas distribution showerhead for semiconductor processing
US9748434B1 (en) 2016-05-24 2017-08-29 Tesla, Inc. Systems, method and apparatus for curing conductive paste
US9954136B2 (en) 2016-08-03 2018-04-24 Tesla, Inc. Cassette optimized for an inline annealing system
US10115856B2 (en) 2016-10-31 2018-10-30 Tesla, Inc. System and method for curing conductive paste using induction heating
KR102096700B1 (ko) * 2017-03-29 2020-04-02 도쿄엘렉트론가부시키가이샤 기판 처리 장치 및 기판 처리 방법
KR102344450B1 (ko) * 2017-09-26 2021-12-28 세메스 주식회사 기판 처리 장치 및 기판 처리 방법
US11535936B2 (en) * 2018-07-23 2022-12-27 Lam Research Corporation Dual gas feed showerhead for deposition
KR102641752B1 (ko) * 2018-11-21 2024-03-04 삼성전자주식회사 가스 주입 모듈, 기판 처리 장치, 및 그를 이용한 반도체 소자의 제조방법
JP2020105590A (ja) 2018-12-27 2020-07-09 キオクシア株式会社 基板処理装置および基板処理方法
KR20230088869A (ko) * 2020-10-23 2023-06-20 램 리써치 코포레이션 플라즈마 에칭 반응기 내로 증기 증착 프로세스의 통합
CN113205995B (zh) * 2021-05-08 2022-04-08 长鑫存储技术有限公司 气体分配装置、等离子体处理装置、方法及半导体结构
JP7771599B2 (ja) 2021-09-28 2025-11-18 東京エレクトロン株式会社 基板処理を行う装置、ガスシャワーヘッド、及び基板処理を行う方法
US11940819B1 (en) * 2023-01-20 2024-03-26 Applied Materials, Inc. Mass flow controller based fast gas exchange

Family Cites Families (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5050213A (en) * 1986-10-14 1991-09-17 Electronic Publishing Resources, Inc. Database usage metering and protection system and method
US5516722A (en) * 1994-10-31 1996-05-14 Texas Instruments Inc. Method for increasing doping uniformity in a flow flange reactor
JPH08158072A (ja) * 1994-12-02 1996-06-18 Nippon Soken Inc ドライエッチング装置
US5675510A (en) * 1995-06-07 1997-10-07 Pc Meter L.P. Computer use meter and analyzer
US5683517A (en) * 1995-06-07 1997-11-04 Applied Materials, Inc. Plasma reactor with programmable reactant gas distribution
US6162488A (en) * 1996-05-14 2000-12-19 Boston University Method for closed loop control of chemical vapor deposition process
US7166524B2 (en) * 2000-08-11 2007-01-23 Applied Materials, Inc. Method for ion implanting insulator material to reduce dielectric constant
US6333272B1 (en) * 2000-10-06 2001-12-25 Lam Research Corporation Gas distribution apparatus for semiconductor processing
JP2002280357A (ja) * 2001-03-21 2002-09-27 Sony Corp プラズマエッチング装置およびエッチング方法
JP2003007697A (ja) * 2001-06-21 2003-01-10 Hitachi Kokusai Electric Inc 半導体装置の製造方法、基板処理方法および基板処理装置
US20030000924A1 (en) * 2001-06-29 2003-01-02 Tokyo Electron Limited Apparatus and method of gas injection sequencing
US8271400B2 (en) * 2002-01-15 2012-09-18 Hewlett-Packard Development Company, L.P. Hardware pay-per-use
JP3856730B2 (ja) * 2002-06-03 2006-12-13 東京エレクトロン株式会社 流量制御装置を備えたガス供給設備からのチャンバーへのガス分流供給方法。
US6816809B2 (en) * 2002-07-23 2004-11-09 Hewlett-Packard Development Company, L.P. Hardware based utilization metering
US20040050326A1 (en) * 2002-09-12 2004-03-18 Thilderkvist Karin Anna Lena Apparatus and method for automatically controlling gas flow in a substrate processing system
US7169231B2 (en) * 2002-12-13 2007-01-30 Lam Research Corporation Gas distribution system with tuning gas
US7627506B2 (en) * 2003-07-10 2009-12-01 International Business Machines Corporation Method of providing metered capacity of temporary computer resources
WO2004109420A1 (ja) * 2003-06-09 2004-12-16 Ckd Corporation 相対的圧力制御システム及び相対的流量制御システム
KR100580062B1 (ko) * 2004-02-03 2006-05-12 마츠시타 덴끼 산교 가부시키가이샤 화학기상성장장치 및 막 성장방법
JP4606944B2 (ja) * 2004-06-02 2011-01-05 東京エレクトロン株式会社 プラズマ処理装置およびインピーダンス調整方法
TWI447802B (zh) * 2004-06-21 2014-08-01 東京威力科創股份有限公司 A plasma processing apparatus, a plasma processing method, and a computer-readable recording medium
US8612480B2 (en) * 2004-10-23 2013-12-17 International Business Machines Corporation Permitting utilization of computer system resources in accordance with their licensing
US8176564B2 (en) * 2004-11-15 2012-05-08 Microsoft Corporation Special PC mode entered upon detection of undesired state
US20060165005A1 (en) * 2004-11-15 2006-07-27 Microsoft Corporation Business method for pay-as-you-go computer and dynamic differential pricing
US7694153B2 (en) * 2004-11-15 2010-04-06 Microsoft Corporation Changing product behavior in accordance with license
US8074223B2 (en) * 2005-01-31 2011-12-06 International Business Machines Corporation Permanently activating resources based on previous temporary resource usage
US7406446B2 (en) * 2005-03-08 2008-07-29 Microsoft Corporation System and method for trustworthy metering and deactivation

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI676702B (zh) * 2016-03-04 2019-11-11 日商東京威力科創股份有限公司 混合氣體複數系統供給體系及利用該體系的基板處理裝置
US10550471B2 (en) 2016-03-04 2020-02-04 Tokyo Electron Limited Mixed gas multiple line supply system and substrate processing apparatus using same

Also Published As

Publication number Publication date
TWI397112B (zh) 2013-05-21
JP4911984B2 (ja) 2012-04-04
US20070181181A1 (en) 2007-08-09
KR20070080824A (ko) 2007-08-13
JP2007214295A (ja) 2007-08-23
CN101017771A (zh) 2007-08-15
KR100810827B1 (ko) 2008-03-07

Similar Documents

Publication Publication Date Title
TW200737314A (en) Gas supply system, substrate processing apparatus and gas supply method
TW200733184A (en) Gas supply system, substrate processing apparatus and gas supply method
TW200633049A (en) Gas supply unit, substrate processing apparatus, and supply gas setting method
TW200735209A (en) Gas switching section including valves having different flow coefficients for gas distribution system
MX2009012977A (es) Aparato y metodo para manejar el suministro de aditivo en sitios de pozo.
TW200746294A (en) Processing apparatus and processing method
TW200710264A (en) Methods for verifying gas flow rates from a gas supply system into a plasma processing chamber
SG156600A1 (en) Method and apparatus for stripping holes in a metal substrate
UA97105C2 (ru) Способ и устройство подачи химикатов в поток обработки
WO2011068936A3 (en) Methods and apparatus for treating exhaust gas in a processing system
WO2008066586A3 (en) System and method for controlling elution from a radioisotope generator with electronic pinch valves
TW200636856A (en) Semiconductor processing apparatus and method
UA87063C2 (ru) Устройство для питания топливом газотурбинного двигателя с регулируемым расходом топлива
GB2492715A (en) Apparatus for supplying gases to a patient
MY147076A (en) Skid architecture for a power augmentation system
MY155509A (en) Plasma temperature control apparatus and plasma temperature control method
GB2487703A (en) Methods of and apparatus for controlling pressure in multiple zones of a process tool
TW200736899A (en) Method and apparatus for controlling power supply in a computer system
WO2008015554A3 (en) Hydrogen supplying apparatus and method for controlling hydrogen supplying apparatus
WO2010052434A3 (fr) Systeme et procede de lavage et purge a l'eau du circuit combustible liquide d'une turbine
WO2008051809A3 (en) Thermal load locator
WO2009088610A3 (en) Methods and systems for controlling temperature in a vessel
GB2355548B (en) Water distribution pressure control method and apparatus
ATE550801T1 (de) Vorrichtung und verfahren zur versorgung einer brennstoffzelle mit oxidationsmittel
SG158854A1 (en) Liquid discharge device

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees