TW200802402A - Non-volatile memory device and methods using the same - Google Patents

Non-volatile memory device and methods using the same

Info

Publication number
TW200802402A
TW200802402A TW095123754A TW95123754A TW200802402A TW 200802402 A TW200802402 A TW 200802402A TW 095123754 A TW095123754 A TW 095123754A TW 95123754 A TW95123754 A TW 95123754A TW 200802402 A TW200802402 A TW 200802402A
Authority
TW
Taiwan
Prior art keywords
register
programming
data line
memory device
cell array
Prior art date
Application number
TW095123754A
Other languages
English (en)
Other versions
TWI308765B (en
Inventor
Chung-Zen Chen
Jo-Yu Wang
Original Assignee
Elite Semiconductor Esmt
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Elite Semiconductor Esmt filed Critical Elite Semiconductor Esmt
Publication of TW200802402A publication Critical patent/TW200802402A/zh
Application granted granted Critical
Publication of TWI308765B publication Critical patent/TWI308765B/zh

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C8/00—Arrangements for selecting an address in a digital store
    • G11C8/10—Decoders
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G11C16/102—External programming circuits, e.g. EPROM programmers; In-circuit programming or reprogramming; EPROM emulators
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G11C16/102—External programming circuits, e.g. EPROM programmers; In-circuit programming or reprogramming; EPROM emulators
    • G11C16/105—Circuits or methods for updating contents of nonvolatile memory, especially with 'security' features to ensure reliable replacement, i.e. preventing that old data is lost before new data is reliably written
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/26—Sensing or reading circuits; Data output circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1015—Read-write modes for single port memories, i.e. having either a random port or a serial port
    • G11C7/1042—Read-write modes for single port memories, i.e. having either a random port or a serial port using interleaving techniques, i.e. read-write of one part of the memory while preparing another part
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0483—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells having several storage transistors connected in series
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2216/00—Indexing scheme relating to G11C16/00 and subgroups, for features not directly covered by these groups
    • G11C2216/12—Reading and writing aspects of erasable programmable read-only memories
    • G11C2216/14—Circuits or methods to write a page or sector of information simultaneously into a nonvolatile memory, typically a complete row or word line in flash memory

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Security & Cryptography (AREA)
  • Read Only Memory (AREA)
TW095123754A 2006-02-21 2006-06-30 Non-volatile memory device and methods using the same TWI308765B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/358,767 US7336543B2 (en) 2006-02-21 2006-02-21 Non-volatile memory device with page buffer having dual registers and methods using the same

Publications (2)

Publication Number Publication Date
TW200802402A true TW200802402A (en) 2008-01-01
TWI308765B TWI308765B (en) 2009-04-11

Family

ID=38428039

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095123754A TWI308765B (en) 2006-02-21 2006-06-30 Non-volatile memory device and methods using the same

Country Status (2)

Country Link
US (1) US7336543B2 (zh)
TW (1) TWI308765B (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111243648A (zh) * 2018-11-28 2020-06-05 北京知存科技有限公司 闪存单元、闪存模块以及闪存芯片

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KR100472726B1 (ko) * 2002-10-29 2005-03-10 주식회사 하이닉스반도체 고속 데이터억세스를 위한 반도체 메모리장치 및 그구동방법
KR100634457B1 (ko) * 2005-07-04 2006-10-16 삼성전자주식회사 단일의 페이지 버퍼 구조로 멀티-비트 및 단일-비트프로그램 동작을 수행하는 플래시 메모리 장치
KR100713983B1 (ko) * 2005-09-22 2007-05-04 주식회사 하이닉스반도체 플래시 메모리 장치의 페이지 버퍼 및 그것을 이용한프로그램 방법
US7345916B2 (en) * 2006-06-12 2008-03-18 Spansion Llc Method and apparatus for high voltage operation for a high performance semiconductor memory device
US7848141B2 (en) * 2006-10-31 2010-12-07 Hynix Semiconductor Inc. Multi-level cell copyback program method in a non-volatile memory device
US7944749B2 (en) * 2006-12-21 2011-05-17 Sandisk Corporation Method of low voltage programming of non-volatile memory cells
KR100823175B1 (ko) * 2007-02-27 2008-04-18 삼성전자주식회사 프로그램 성능을 향상시킬 수 있는 플래시 메모리 장치 및그것을 포함한 메모리 시스템
US7961512B2 (en) * 2008-03-19 2011-06-14 Sandisk Corporation Adaptive algorithm in cache operation with dynamic data latch requirements
KR101099911B1 (ko) * 2009-12-17 2011-12-28 주식회사 하이닉스반도체 반도체 메모리 장치 및 그 동작 방법
KR101082614B1 (ko) * 2010-07-09 2011-11-10 주식회사 하이닉스반도체 반도체 메모리 장치
US8681569B2 (en) * 2012-02-22 2014-03-25 Silicon Motion, Inc. Method for reading data stored in a flash memory according to a threshold voltage distribution and memory controller and system thereof
CN103730160B (zh) * 2014-01-07 2016-08-24 上海华虹宏力半导体制造有限公司 一种存储器及其读取方法、读取电路
KR20220039203A (ko) * 2020-09-22 2022-03-29 에스케이하이닉스 주식회사 메모리 장치 및 그 동작 방법
KR102854443B1 (ko) * 2021-05-17 2025-09-03 삼성전자주식회사 페이지 버퍼 회로 및 이를 포함하는 메모리 장치
CN119580803B (zh) * 2023-09-06 2026-01-23 长江存储科技有限责任公司 存储器、存储器的操作方法、系统及存储介质

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US6671204B2 (en) * 2001-07-23 2003-12-30 Samsung Electronics Co., Ltd. Nonvolatile memory device with page buffer having dual registers and methods of using the same
US7042770B2 (en) * 2001-07-23 2006-05-09 Samsung Electronics Co., Ltd. Memory devices with page buffer having dual registers and method of using the same
KR100454119B1 (ko) * 2001-10-24 2004-10-26 삼성전자주식회사 캐쉬 기능을 갖는 불 휘발성 반도체 메모리 장치 및 그것의 프로그램, 읽기, 그리고 페이지 카피백 방법들
KR100514415B1 (ko) * 2003-01-22 2005-09-09 주식회사 하이닉스반도체 낸드 플래시 메모리의 페이지 버퍼
DE602004007886T2 (de) * 2004-03-30 2008-04-24 Stmicroelectronics S.R.L., Agrate Brianza Sequenzielles Schreib-Prüfverfahren mit Ergebnisspeicherung
KR100575336B1 (ko) * 2004-04-20 2006-05-02 에스티마이크로일렉트로닉스 엔.브이. 듀얼 레지스터를 갖는 페이지 버퍼, 이를 구비한 반도체메모리 장치 및 그의 프로그램 방법
KR100567912B1 (ko) * 2004-05-28 2006-04-05 주식회사 하이닉스반도체 플래시 메모리 장치의 페이지 버퍼 및 이를 이용한 데이터프로그램 방법
DE602004010795T2 (de) * 2004-06-24 2008-12-11 Stmicroelectronics S.R.L., Agrate Brianza Verbesserter Seitenspeicher für eine programmierbare Speichervorrichtung
KR100672148B1 (ko) * 2005-02-17 2007-01-19 주식회사 하이닉스반도체 불휘발성 메모리 장치 및 그것의 페이지 버퍼 동작 방법
KR100672150B1 (ko) * 2005-02-23 2007-01-19 주식회사 하이닉스반도체 불휘발성 메모리 장치 및 그것의 페이지 버퍼 동작 방법
KR100672122B1 (ko) * 2005-03-10 2007-01-19 주식회사 하이닉스반도체 소비 전력이 감소된 플래시 메모리 장치의 페이지 버퍼 회로
KR100672147B1 (ko) * 2005-03-15 2007-01-19 주식회사 하이닉스반도체 불휘발성 메모리 장치의 체크 보드 프로그램 시에 프로그램페일을 방지하기 위한 페이지 버퍼
KR100600301B1 (ko) * 2005-05-25 2006-07-13 주식회사 하이닉스반도체 면적이 감소된 페이지 버퍼 회로와, 이를 포함하는 플래시메모리 장치 및 그 프로그램 동작 방법

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111243648A (zh) * 2018-11-28 2020-06-05 北京知存科技有限公司 闪存单元、闪存模块以及闪存芯片

Also Published As

Publication number Publication date
TWI308765B (en) 2009-04-11
US20070195635A1 (en) 2007-08-23
US7336543B2 (en) 2008-02-26

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