WO1991015333A3 - Ultrafast electro-dynamic x, y and theta positioning stage - Google Patents

Ultrafast electro-dynamic x, y and theta positioning stage Download PDF

Info

Publication number
WO1991015333A3
WO1991015333A3 PCT/US1990/005563 US9005563W WO9115333A3 WO 1991015333 A3 WO1991015333 A3 WO 1991015333A3 US 9005563 W US9005563 W US 9005563W WO 9115333 A3 WO9115333 A3 WO 9115333A3
Authority
WO
WIPO (PCT)
Prior art keywords
positioning stage
dynamic
ultrafast
theta
electro
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US1990/005563
Other languages
French (fr)
Other versions
WO1991015333A2 (en
Inventor
Ralph L Hollis Jr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Priority to DE69010218T priority Critical patent/DE69010218T2/en
Priority to EP90915253A priority patent/EP0523042B1/en
Publication of WO1991015333A2 publication Critical patent/WO1991015333A2/en
Publication of WO1991015333A3 publication Critical patent/WO1991015333A3/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
    • G01Q10/04—Fine scanning or positioning
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q1/00—Members which are comprised in the general build-up of a form of machine, particularly relatively large fixed members
    • B23Q1/25—Movable or adjustable work or tool supports
    • B23Q1/26—Movable or adjustable work or tool supports characterised by constructional features relating to the co-operation of relatively movable members; Means for preventing relative movement of such members
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q11/00—Accessories fitted to machine tools for keeping tools or parts of the machine in good working condition or for cooling work; Safety devices specially combined with or arranged in, or specially adapted for use in connection with, machine tools
    • B23Q11/001—Arrangements compensating weight or flexion on parts of the machine
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691—Handling of masks or workpieces
    • G03F7/70766—Reaction force control means, e.g. countermass
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70808—Construction details, e.g. housing, load-lock, seals or windows for passing light in or out of apparatus
    • G03F7/70816—Bearings
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02K—DYNAMO-ELECTRIC MACHINES
    • H02K41/00—Propulsion systems in which a rigid body is moved along a path due to dynamo-electric interaction between the body and a magnetic field travelling along the path
    • H02K41/02—Linear motors; Sectional motors
    • H02K41/035—DC motors; Unipolar motors
    • H02K41/0352—Unipolar motors
    • H02K41/0354—Lorentz force motors, e.g. voice coil motors
    • H02K41/0356—Lorentz force motors, e.g. voice coil motors moving along a straight path
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B26—HAND CUTTING TOOLS; CUTTING; SEVERING
    • B26D—CUTTING; DETAILS COMMON TO MACHINES FOR PERFORATING, PUNCHING, CUTTING-OUT, STAMPING-OUT OR SEVERING
    • B26D7/00—Details of apparatus for cutting, cutting-out, stamping-out, punching, perforating, or severing by means other than cutting
    • B26D2007/0012—Details, accessories or auxiliary or special operations not otherwise provided for
    • B26D2007/0043—Details, accessories or auxiliary or special operations not otherwise provided for the cutting machine comprising a linear motor
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02K—DYNAMO-ELECTRIC MACHINES
    • H02K2201/00—Specific aspects not provided for in the other groups of this subclass relating to the magnetic circuits
    • H02K2201/18—Machines moving with multiple degrees of freedom

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Environmental & Geological Engineering (AREA)
  • Epidemiology (AREA)
  • Public Health (AREA)
  • Mechanical Engineering (AREA)
  • Radiology & Medical Imaging (AREA)
  • Electromagnetism (AREA)
  • Nanotechnology (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Power Engineering (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Atmospheric Sciences (AREA)
  • Toxicology (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Combustion & Propulsion (AREA)
  • Analytical Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Control Of Position Or Direction (AREA)
  • Linear Motors (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Machine Tool Units (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Electron Beam Exposure (AREA)

Abstract

The invention discloses an Ultrafast Electro-Dynamic X, Y and Theta Positioning Stage. A positioning stage made according to this invention allows light payloads to be moved with extremely high linear and angular accelerations over finite distances and angles within a plane. An important feature of this invention is a momentum-cancelling design which allows reaction forces and torques on the fixed member to approach zero, thereby, allowing for a smooth and an ultrafast performance by the positioning stage.
PCT/US1990/005563 1990-04-06 1990-09-28 Ultrafast electro-dynamic x, y and theta positioning stage Ceased WO1991015333A2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
DE69010218T DE69010218T2 (en) 1990-04-06 1990-09-28 ULTRA-FAST ELECTRO-DYNAMIC X, Y AND THETA POSITIONING TABLE.
EP90915253A EP0523042B1 (en) 1990-04-06 1990-09-28 Ultrafast electro-dynamic x, y and theta positioning stage

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US513,749 1990-04-06
US07/513,749 US5153494A (en) 1990-04-06 1990-04-06 Ultrafast electro-dynamic x, y and theta positioning stage

Publications (2)

Publication Number Publication Date
WO1991015333A2 WO1991015333A2 (en) 1991-10-17
WO1991015333A3 true WO1991015333A3 (en) 1992-02-20

Family

ID=24044536

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US1990/005563 Ceased WO1991015333A2 (en) 1990-04-06 1990-09-28 Ultrafast electro-dynamic x, y and theta positioning stage

Country Status (5)

Country Link
US (1) US5153494A (en)
EP (1) EP0523042B1 (en)
JP (1) JP2528552B2 (en)
DE (1) DE69010218T2 (en)
WO (1) WO1991015333A2 (en)

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JPH06183561A (en) * 1992-12-18 1994-07-05 Canon Inc Moving stage device
JPH0737786A (en) * 1993-07-21 1995-02-07 Canon Inc Stage positioning control method
DE4436865A1 (en) * 1994-10-17 1996-08-08 Pasim Mikrosystemtechnik Gmbh Modular planar rotor and process for its manufacture
US5548195A (en) * 1994-12-22 1996-08-20 International Business Machines Corporation Compensated servo control stage positioning apparatus
JPH08194162A (en) * 1995-01-17 1996-07-30 Nikon Corp Stage drive
US5834864A (en) * 1995-09-13 1998-11-10 Hewlett Packard Company Magnetic micro-mover
DE19535438A1 (en) * 1995-09-23 1997-03-27 Rovema Gmbh Packaging device
JPH11191585A (en) * 1997-12-26 1999-07-13 Canon Inc Stage apparatus, exposure apparatus using the same, and device manufacturing method
JPH11211732A (en) 1998-01-27 1999-08-06 Hitachi Constr Mach Co Ltd Scanning-type probe microscope
US6130517A (en) * 1998-02-12 2000-10-10 Nikon Corporation Magnetic actuator producing large acceleration on fine stage and low RMS power gain
US6320345B1 (en) 1998-03-05 2001-11-20 Nikon Corporation Command trajectory for driving a stage with minimal vibration
US6008610A (en) * 1998-03-20 1999-12-28 Nikon Corporation Position control apparatus for fine stages carried by a coarse stage on a high-precision scanning positioning system
US6260282B1 (en) 1998-03-27 2001-07-17 Nikon Corporation Stage control with reduced synchronization error and settling time
US6144118A (en) * 1998-09-18 2000-11-07 General Scanning, Inc. High-speed precision positioning apparatus
US20040222708A1 (en) * 1998-11-13 2004-11-11 Barry Reginald Hobson Electric oscillatory machine
US6703724B1 (en) * 1998-11-13 2004-03-09 Merlex Corporation Pty Limited Electric machine
TW439116B (en) * 1998-12-16 2001-06-07 Nippon Kogaku Kk Platen motor device and assembly method thereof, platen motor device driving method, stage device and driving method thereof, exposure device and method thereof, and device and production method thereof
US6323494B1 (en) 1999-04-09 2001-11-27 Nikon Corporation Vertical direction force transducer
US6144119A (en) * 1999-06-18 2000-11-07 Nikon Corporation Planar electric motor with dual coil and magnet arrays
DE10019226B4 (en) * 2000-04-18 2010-03-18 Physik Instrumente (Pi) Gmbh & Co Electromechanical linear actuator with torque compensation
US6405659B1 (en) 2000-05-01 2002-06-18 Nikon Corporation Monolithic stage
US6515381B1 (en) * 2000-09-13 2003-02-04 Nikon Corporation Cantilever stage
JP4288694B2 (en) * 2001-12-20 2009-07-01 株式会社ニコン Substrate holding apparatus, exposure apparatus, and device manufacturing method
US7036374B2 (en) * 2002-01-25 2006-05-02 William Thomas Pike Micro-machined suspension plate with integral proof mass for use in a seismometer or other device
US6776042B2 (en) 2002-01-25 2004-08-17 Kinemetrics, Inc. Micro-machined accelerometer
US6888289B2 (en) * 2002-07-16 2005-05-03 Baldor Electric Company Multi-axes, sub-micron positioner
WO2004012260A1 (en) * 2002-07-30 2004-02-05 Tamura Corporation Prcision machining stage equipment
US7057370B2 (en) * 2003-06-21 2006-06-06 Igor Victorovich Touzov Ultra-fast precision motor with X, Y and Theta motion and ultra-fast optical decoding and absolute position detector
DE102004057062B4 (en) * 2004-11-25 2012-06-14 Technische Universität Dresden Linear direct drive arrangement and method for its regulation
JP4498285B2 (en) * 2006-02-01 2010-07-07 キヤノン株式会社 Scanning probe device
JP4378385B2 (en) 2006-05-17 2009-12-02 キヤノン株式会社 Driving stage in scanning probe apparatus, scanning probe apparatus
US8267388B2 (en) * 2007-09-12 2012-09-18 Xradia, Inc. Alignment assembly
KR100979539B1 (en) * 2010-01-29 2010-09-02 아주대학교산학협력단 In-plane 3 degree-of-freedom positioning stage
DE102012101979B4 (en) * 2012-03-08 2018-02-15 Technische Universität Dresden Method and device for generating a relative movement
US9052250B1 (en) * 2012-05-04 2015-06-09 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Method of calibrating a force balance
CN103066894B (en) * 2012-12-12 2015-05-20 清华大学 Six degrees of freedom magnetic levitation workpiece table
CN108000176A (en) * 2018-01-12 2018-05-08 西南石油大学 A kind of six-degree-of-freedom parallel bed
CN111239777B (en) * 2020-01-07 2023-07-25 哈尔滨工业大学 Satellite cluster hierarchical positioning method based on position fingerprint

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Also Published As

Publication number Publication date
JPH05504100A (en) 1993-07-01
EP0523042A1 (en) 1993-01-20
DE69010218T2 (en) 1995-02-09
EP0523042B1 (en) 1994-06-22
WO1991015333A2 (en) 1991-10-17
US5153494A (en) 1992-10-06
JP2528552B2 (en) 1996-08-28
DE69010218D1 (en) 1994-07-28

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