WO1993013239A1 - Exothermic reflexible glass, exothermic transparent glass and process of manufacturing them - Google Patents

Exothermic reflexible glass, exothermic transparent glass and process of manufacturing them Download PDF

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Publication number
WO1993013239A1
WO1993013239A1 PCT/KR1992/000081 KR9200081W WO9313239A1 WO 1993013239 A1 WO1993013239 A1 WO 1993013239A1 KR 9200081 W KR9200081 W KR 9200081W WO 9313239 A1 WO9313239 A1 WO 9313239A1
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Prior art keywords
glass
exothermic
manufacturing
reflexible
sputtering
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PCT/KR1992/000081
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French (fr)
Inventor
Chull Woo Han
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HIGHER VACUUM IND CO Ltd
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HIGHER VACUUM IND CO Ltd
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Priority to JP5511286A priority Critical patent/JPH07509534A/en
Priority to RU9294033355A priority patent/RU2075537C1/en
Priority to EP93901531A priority patent/EP0618984A1/en
Publication of WO1993013239A1 publication Critical patent/WO1993013239A1/en
Anticipated expiration legal-status Critical
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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/08Oxides
    • C23C14/086Oxides of zinc, germanium, cadmium, indium, tin, thallium or bismuth
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C17/00Surface treatment of glass, not in the form of fibres or filaments, by coating
    • C03C17/06Surface treatment of glass, not in the form of fibres or filaments, by coating with metals
    • C03C17/09Surface treatment of glass, not in the form of fibres or filaments, by coating with metals by deposition from the vapour phase
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C17/00Surface treatment of glass, not in the form of fibres or filaments, by coating
    • C03C17/22Surface treatment of glass, not in the form of fibres or filaments, by coating with other inorganic material
    • C03C17/23Oxides
    • C03C17/245Oxides by deposition from the vapour phase
    • C03C17/2453Coating containing SnO2
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/14Metallic material, boron or silicon
    • C23C14/18Metallic material, boron or silicon on other inorganic substrates
    • C23C14/185Metallic material, boron or silicon on other inorganic substrates by cathodic sputtering
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C2217/00Coatings on glass
    • C03C2217/20Materials for coating a single layer on glass
    • C03C2217/21Oxides
    • C03C2217/23Mixtures
    • C03C2217/231In2O3/SnO2
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C2217/00Coatings on glass
    • C03C2217/20Materials for coating a single layer on glass
    • C03C2217/25Metals
    • C03C2217/251Al, Cu, Mg or noble metals
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C2217/00Coatings on glass
    • C03C2217/20Materials for coating a single layer on glass
    • C03C2217/25Metals
    • C03C2217/257Refractory metals
    • C03C2217/26Cr, Mo, W
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C2217/00Coatings on glass
    • C03C2217/20Materials for coating a single layer on glass
    • C03C2217/25Metals
    • C03C2217/261Iron-group metals, i.e. Fe, Co or Ni
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C2218/00Methods for coating glass
    • C03C2218/10Deposition methods
    • C03C2218/15Deposition methods from the vapour phase
    • C03C2218/154Deposition methods from the vapour phase by sputtering

Definitions

  • This invention relates to the exothermic reflexible glass and exothermic transparent glass as well as to a process for the manufacture of them, whose surface temperature can be adjusted at will by means of coating non-conductive glass either with reflexibility-conductive material or transparency-conductive material by use of the sputtering technique generally used for plasma.
  • the technique of vacuum evaporation by sputtering is performed by a direct evaporation of the material to be evaporated in vacuum through colliding ionized inert gas into the surface of the target, that is, ionization of the inert gas takes place in the area of abnormal glow discharge and the thus ionized gas, under the influence of the electric field, is made to beat the surface of a cathode.
  • the target is
  • the cathode and the vacuum container or the matrix, as the anode are used as the cathode and the vacuum container or the matrix, as the anode.
  • FIG. 1 A simplest diode planar sputtering technique is shown in Fig. 1, wherein a low
  • the electric pressure applicable to the cathode can be varied from hundreds of volts to thousands of volts, while the distance between the cathode and the matrixCvacuum container), the anode, is so near as about 5cm.
  • the velocity of vacuum evaporation being about lOOA/min, it is decided according to the energy and quantity of the ion being shot out. That is, the velocity of vacuum evaporation can be increased by raising the electric pressure and restricted by the decrease of the ionized cross section.
  • the velocity of vacuum evaporation can rather be decreased in an effect of dispersion of the gas.
  • the optimum condition as to the velocity of the vacuum evaporation will have to be determined only through
  • plasma(4) is given rise to around the target and the positive ions existing in the area of the electric discharge come to beat the surface of the target by virtue of electric forces.
  • the kinetic energy of the positive ions is transferred to the atoms which exist on the surface of target, and if this energy is stronger than the bonding energy of the atom which are beaten, the atoms of the target are emitted.
  • the triode system has been invented, which, has a third electrode for control of both the source of thermion emission, and the flow of the emitted thermion is added to the diode system, where a tungsten filament is used as the source of emission for the thermions.
  • vhen a triode system is adopted the velocity of vacuum evaporation can be increased, because it is possible to increase the concentration of plasma by the emission of thermions.
  • the concentration of the electrons in plasma is increased by emission of thermions, the probability of ionization is heightened by brisk action of electrons, the number of ions that beat the target is increased, and thus the velocity of vacuum evaporation is accelerated.
  • Fig. 2(A)(B) show the structure of the target, wherein the highest probability of ionization is to be seen at the point at which a line of magnetic force intersects another perpendicularly, showing a regional sputtering taking place forming a belt of high plasma concentration.
  • the present invention is intended to provide both the process of manufacturing exothermic reflexible glass by coating any such metals as Cr, Ni, Au, Ag, Al, Cu over the surface of glass by the technique of magnetic sputtering as given above, and the process of manufacturing exothermic transparent glass by creating a layer of oxidized coating with InOOZ)-Sn(lOX) alloy in a vacuum container.
  • DESCRIPTION OF THE DRAWINGS Fig. 1 is a sketch of the diode planar sputtering apparatus of the present invention.
  • Fig. 2CA) and (B) are sketches to show the structure of a target for the sputtering.
  • Fig. 3 is a graph showing the different transparencies of the respective 110 and Au thin coating test pieces on glass of different times spent on vacuum evaporation.
  • Fig. 4 is a graph showing the different resistivilities of the respective ITO and Au thin coating test pieces of different times spent on vacuum evaporation.
  • Figs. 5CA) and (B) are graphs showing the surface temperatures of ITO and Au thin coatings of 6,000A and 400A thicknesses, respectively.
  • Fig.6 shows results of the XRD analysis of ITO test piece whose FU2/FAr value is 0.43.
  • magnetron was attached to the back of the target to raise the velocity of vacuum evaporation up to l,000 ⁇ /min.
  • the glass used as the matrix was 2mm thick, of 130mm respectively in length and breadth. It was placed under a process of cleansing with alcohol, distilled
  • Exothermic transparent glass is, unlike exothermic reflexible glass, made by coating glass with transparent oxide instead of using any single metal, and in the present invention a target of In(90%)-Sn(10%) was used for production of exothermic transparent glass, and indium-tin oxideCITO) was synthesized under the mixture of Ar and O2 for formation of the oxide.
  • the specific feature of this material is that even when its thickness is 1,000A it can allow penetration of light by more than 80% so that it can be made wide use of in production of the liquid crystal for TV or other liquid crystal display systems. Hence the extensive study of this material has been made recently.
  • indium-tin oxide(110) in the present invention is made through the reactional process of DC magnetron, and what is important at this time is the
  • the ratio of Ar and O2 gas in the mixture If the ratio of O2 is lower than the preferable ratio, the desired oxide is not produced, while if it ' is higher than that, the transparency decreases and the transparent conductive coating is not
  • the density of the electric power can be 1.5 - 8.0W/cm 3 and if it is higher, it takes short time for the vacuum evaporation and if it is lower, it takes long time for it. It is more desirable to set the density of the power at 2.26W/cm 3 and the time at 6.5 minutes.
  • the experimental conditions for said indium-tin oxide(ITO) are given in Table 1 below:
  • coating layers is Au with the best conductivity, and in the present invention Au
  • Fig. 3 is a graph to show the different transparencies of the ITO and Au thin coating layers obtained by varied times of vacuum evaporation.
  • the penetration of light was about 80% when the thin coating layer's thickness was 0.8 /im.vacuum evaporation by sputtering for 6.5 minutes), and the transparency gradually decreased as the layer's thickness
  • the resistive features were measured by calculating the current, as 10V electric pressure was applied, after placing a Cu electrode each on both ends of
  • Fig. 4(A) carries a graph showing the resistive features of an ITO experimental piece, different as the time for vacuum evaporation by the
  • the value of resistance was 400 ⁇ when the time for vacuum evaporation by the sputtering was two minutes, but it declined rapidly as the time was protracted to fall, for instance, as low as about 20 ⁇ when the time was
  • Fig. 4(B) carries a graph of the resistive features in the case of an Au coating layer, and in this, too, as in the case of the ITO coating layer, the resistance rapidly declined with rapidity as the time for vacuum ' evaporation by the sputtering increased.
  • the object of the present invention is to develop a material as well as the software for the manufacture of conductive and transparent glass for use in automobiles, and since the change of temperatures of the experimental piece makes, as well as its transparency, a most important part of the present invention, the temperatures should be measured acculately.
  • a K-type thermo-electric band was attached by means of silver paste and it was connected to a X-Y recorder in order to measure continuously the temperatures of the surface of the experimental piece varying at the change of the electric pressure and the electric current.
  • Fig. 5(A) is a graph showing the measured surface temperatures of the ITO thin
  • the 110 thin coating of 6,000A having, as shown in Fig. 3, a transparency of 80%, it can be adopted as a very important material in production of the conductive glass for automobiles.
  • Fig. 5(B) shows the curve indicating the surface temperatures of the Au thin
  • coating layers of 400A in thickness the electric current being 0.114A when it was supplied at 13.8V, the surface temperature showing about 45 * C 600 seconds later.
  • Fig. 6 shows the results of XRD analysis of the ITO experimental piece with its FO ⁇ /EAr value at 0.43, wherein in the case of an experimental piece of good transparency and conductivity its In ⁇ SnOs coating exceedingly well develops at 2 ⁇ - 45.36, and it was found that the above ITO coating contributed to
  • Such exothermic reflexible glass coated over the surface of the glass in automobiles, can be used very preferably to remove the moisture inside, and is extensively made use of for liquid crystal display systems also.

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  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Life Sciences & Earth Sciences (AREA)
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Abstract

The present invention relates to a process of manufacturing an exothermic reflexible glass which can emit heat of over 50 °C by coating the matrix glass with a thin layer of such metals as Cr, Ni, Au, Ag, Al, Cu by use of the sputtering technique for plasma, and a process of manufacturing an exothermic transparent glass whose surface temperature can be adjusted to a desired degree by means of connecting to a power source, after coating the matrix glass with a thin layer of transparent material of indium-tin oxide by use of the reactive sputtering technique and also to the glass produced respectively by these processes.

Description

Exothermic Reflexible Glass, Exothermic Transparent Glass and Process of manufacturing them BACKGROUND OF THE INVENTION
Field of Invention This invention relates to the exothermic reflexible glass and exothermic transparent glass as well as to a process for the manufacture of them, whose surface temperature can be adjusted at will by means of coating non-conductive glass either with reflexibility-conductive material or transparency-conductive material by use of the sputtering technique generally used for plasma. Description of Prior Art
The technique of vacuum evaporation by sputtering, the very technique of manufacturing exothermic reflexible glass and exothermic transparent glass here, is performed by a direct evaporation of the material to be evaporated in vacuum through colliding ionized inert gas into the surface of the target, that is, ionization of the inert gas takes place in the area of abnormal glow discharge and the thus ionized gas, under the influence of the electric field, is made to beat the surface of a cathode. Ihus, in the sputtering technique, the target is
used as the cathode and the vacuum container or the matrix, as the anode.
A simplest diode planar sputtering technique is shown in Fig. 1, wherein a low
pressure electric discharge takes place between the targetO), which is used as
the cathode, and the anode. The pressure of the inert gas in common use should,
for the purpose of maintaining electric discharge, be over 5 X 10"3 torr, the working pressure ranging from 2 X 10"2 torr to 10"! torr. The electric pressure applicable to the cathode can be varied from hundreds of volts to thousands of volts, while the distance between the cathode and the matrixCvacuum container), the anode, is so near as about 5cm. The velocity of vacuum evaporation being about lOOA/min, it is decided according to the energy and quantity of the ion being shot out. That is, the velocity of vacuum evaporation can be increased by raising the electric pressure and restricted by the decrease of the ionized cross section.
However, even though the ionized electric current can be increased by added pressure of inert gas, the velocity of vacuum evaporation can rather be decreased in an effect of dispersion of the gas. Thus, the optimum condition as to the velocity of the vacuum evaporation will have to be determined only through
repeated experiments.
To see the basic idea of the sputtering it is known that when a certain
pressure and electric tension are applied to a targetO), which exists within a
vacuum container, plasma(4) is given rise to around the target and the positive ions existing in the area of the electric discharge come to beat the surface of the target by virtue of electric forces. At this time the kinetic energy of the positive ions is transferred to the atoms which exist on the surface of target, and if this energy is stronger than the bonding energy of the atom which are beaten, the atoms of the target are emitted.
The disadvantage of the sputtering technique lies in the very slow velocity in
the coating formation, and the resultant low productivity, when a diode process
is adopted. To solve the above problems the triode system has been invented, which, has a third electrode for control of both the source of thermion emission, and the flow of the emitted thermion is added to the diode system, where a tungsten filament is used as the source of emission for the thermions. vhen a triode system is adopted the velocity of vacuum evaporation can be increased, because it is possible to increase the concentration of plasma by the emission of thermions. When the concentration of the electrons in plasma is increased by emission of thermions, the probability of ionization is heightened by brisk action of electrons, the number of ions that beat the target is increased, and thus the velocity of vacuum evaporation is accelerated.
Besides the way of increasing the concentration of the plasma by supplying electrons there is another way of increasing the probability of ionization, that is, by means of controlling the action of electrons with the use of magnetism. The sputtering with the use of magnetism results in N and S electrodes at the back of the target changing the action of electrons from rectilinear to spiral.
Thus the probability of electrons to hit neutral atoms and others under the same pressure increases as the distance of electrons' movement is increased, and by heightening the probability of ionization a greater velocity for vacuum evaporation is obtained. Fig. 2(A)(B) show the structure of the target, wherein the highest probability of ionization is to be seen at the point at which a line of magnetic force intersects another perpendicularly, showing a regional sputtering taking place forming a belt of high plasma concentration. SUMMARY OF THE INVENTION
The present invention is intended to provide both the process of manufacturing exothermic reflexible glass by coating any such metals as Cr, Ni, Au, Ag, Al, Cu over the surface of glass by the technique of magnetic sputtering as given above, and the process of manufacturing exothermic transparent glass by creating a layer of oxidized coating with InOOZ)-Sn(lOX) alloy in a vacuum container.
Also the present invention is intended to provide both exothermic reflexible glass and exothermic transparent glass prepared by the above processes. DESCRIPTION OF THE DRAWINGS Fig. 1 is a sketch of the diode planar sputtering apparatus of the present invention.
Fig. 2CA) and (B) are sketches to show the structure of a target for the sputtering.
Fig. 3 is a graph showing the different transparencies of the respective 110 and Au thin coating test pieces on glass of different times spent on vacuum evaporation. Fig. 4 is a graph showing the different resistivilities of the respective ITO and Au thin coating test pieces of different times spent on vacuum evaporation.
Figs. 5CA) and (B) are graphs showing the surface temperatures of ITO and Au thin coatings of 6,000A and 400A thicknesses, respectively.
Fig.6 shows results of the XRD analysis of ITO test piece whose FU2/FAr value is 0.43. Indices
1— as inlet, 2 power source,
3 target, 4 plasma,
5,11....substrate, 6 pumping system, 7 chamber, 12 electron,
13—argon, 14 atom sputtered,
15 target, 16 anode,
17 cathode, 18 magnetic field lines, 19 substrate carrier.
DETAILED DESCRIPTION OF THE INVENTION
In the present invention the direct current supplied by the DC power supply
source was used and, as shown in Fig. 2, magnetron was attached to the back of the target to raise the velocity of vacuum evaporation up to l,000Λ/min.
For the target an experimental item of 75mm in diameter and 5mm in thickness was used, and in the case of Ni a thin coating was formed on the target whose thickness was adjusted to 1mm - 1.5mm due to its propensity for magnetizing by magnetrons. In the case of such metals as Cr, Ni, and Cu the density of the electric power applied to them is 11.3W/cm3, and at the initial vacuity of 1 X 10"5 torr Ar gas of purity 99.995% was introduced for generation of plasma at the working pressure of 6 X 10"3 torr to produce reflexible glass. In the case of such metals as Au, Ag, and Al the density of the electric power was lowered to 6.8W/cm3 because under same conditions, the velocity of vacuum evaporation of these is greater than that of Cr, Ni, or Cu.
The glass used as the matrix was 2mm thick, of 130mm respectively in length and breadth. It was placed under a process of cleansing with alcohol, distilled
water, and aceton in that order, drying in an oven of 200*C for 10 minutes and putting inside the sputter chamber, and then over 1,000A thick coating was
formed over its surface by the sputtering process. Then, when electric wires were attached by silver paste to the reflexible glass made by the above method electric power of about 0.06W/cm3 was supplied, it was found that a temperature
of over 50°C was obtained on the density of the electric power and a desired temperature on the surface was obtained without difficulty.
Exothermic transparent glass is, unlike exothermic reflexible glass, made by coating glass with transparent oxide instead of using any single metal, and in the present invention a target of In(90%)-Sn(10%) was used for production of exothermic transparent glass, and indium-tin oxideCITO) was synthesized under the mixture of Ar and O2 for formation of the oxide. The specific feature of this material is that even when its thickness is 1,000A it can allow penetration of light by more than 80% so that it can be made wide use of in production of the liquid crystal for TV or other liquid crystal display systems. Hence the extensive study of this material has been made recently.
Then indium-tin oxide(110) in the present invention is made through the reactional process of DC magnetron, and what is important at this time is the
ratio of Ar and O2 gas in the mixture. If the ratio of O2 is lower than the preferable ratio, the desired oxide is not produced, while if it' is higher than that, the transparency decreases and the transparent conductive coating is not
obtained. Thereupon in the present invention, using a mass flow meter manufactured by a US company MS, the flow of Ar gas was adjusted to 100 SCCM and
the flow of O2 gas to 30-98 SCCM, resulting in formation of a transparent
conductive material of good quality, while setting the flow of Ar gas at 100 SCCM
and O2 gas at 43 SCCM is more preferable.
The density of the electric power can be 1.5 - 8.0W/cm3 and if it is higher, it takes short time for the vacuum evaporation and if it is lower, it takes long time for it. It is more desirable to set the density of the power at 2.26W/cm3 and the time at 6.5 minutes. The experimental conditions for said indium-tin oxide(ITO) are given in Table 1 below:
TABLE 1. Experimental Conditions for IIP Vacuum Evaporation
Figure imgf000009_0001
The greatest factor that affects the transparency and conductivity at the time
of production of the 110 thin coating is the partial pressure of O2, and when the
flow of the neutral Ar gas supplied for reactive sputtering was indicated by FAr and that of O2 by FO2, when the value of FU2/FAr was 0.39 or lower a coating of very good conductivity but of very bad transparency was formed, while when the value was 0.45 or more the transparency was fine but the conductivity fell to MΩ /cm(megaΩ/cm). When the value of FO∑/FAr was 0.43 it was possible to form a coating fitting the purpose of the present invention, and the velocity of the
formation of the coating at the time was measured about l,200A/min.
Among the materials which have so far been widely used in production of thin
coating layers is Au with the best conductivity, and in the present invention Au
was vacuum evaporated on glass by the sputtering technique in order to compare it with an ITO thin coating layer, when the speed of the formation of the coating was set at 40A/sec. With Cr, Al, Ni, and Cu coating it was found practically
impossible to produce a thin coating of such conductivity and transparency as will justify commercial production, but yet it was also possible to use them in production of conductive reflexible glass by means of increasing the tickness of the coating layers.
Fig. 3 is a graph to show the different transparencies of the ITO and Au thin coating layers obtained by varied times of vacuum evaporation. In the case of the ITO thin coating layer the penetration of light was about 80% when the thin coating layer's thickness was 0.8 /im.vacuum evaporation by sputtering for 6.5 minutes), and the transparency gradually decreased as the layer's thickness
increased, falling to 40% when the thickness was about
Figure imgf000010_0001
evaporation by sputtering for 20 minutes). On the contrary, in the case of the thin coating layer of Au, the transparency measured 65% with the thickness 200A(vacuum evaporation by the sputtering for 5 seconds) and as the time for the vacuum evaporation increased the transparency rapidly fell.
The resistive features were measured by calculating the current, as 10V electric pressure was applied, after placing a Cu electrode each on both ends of
• an experimental piece of 72mm by 23mm size. Those showing resistance by MΩ
units were measured with ordinary multi meters, the results being shown in Fig.
4. Fig. 4(A) carries a graph showing the resistive features of an ITO experimental piece, different as the time for vacuum evaporation by the
sputtering varied. The value of resistance was 400Ω when the time for vacuum evaporation by the sputtering was two minutes, but it declined rapidly as the time was protracted to fall, for instance, as low as about 20Ω when the time was
10 minutes(1.2ιm).
Fig. 4(B) carries a graph of the resistive features in the case of an Au coating layer, and in this, too, as in the case of the ITO coating layer, the resistance rapidly declined with rapidity as the time for vacuum' evaporation by the sputtering increased.
The object of the present invention is to develop a material as well as the software for the manufacture of conductive and transparent glass for use in automobiles, and since the change of temperatures of the experimental piece makes, as well as its transparency, a most important part of the present invention, the temperatures should be measured acculately. Hence, on the surface of the experimental piece a K-type thermo-electric band was attached by means of silver paste and it was connected to a X-Y recorder in order to measure continuously the temperatures of the surface of the experimental piece varying at the change of the electric pressure and the electric current.
Fig. 5(A) is a graph showing the measured surface temperatures of the ITO thin
coating layers of 6,000A in thickness, drawing a curve of (a), (b), (c), (d), and (e) 'for 0.775W(5V X 0.155A), 1.512W(7V X 0.216A), 2.466WOV X 0.274A), 3.3WQ1V X 0.330A), 5.07WQ3V X 0.390A), respectively. Moreover, the 110 thin coating of 6,000A having, as shown in Fig. 3, a transparency of 80%, it can be adopted as a very important material in production of the conductive glass for automobiles.
Fig. 5(B) shows the curve indicating the surface temperatures of the Au thin
coating layers of 400A in thickness, the electric current being 0.114A when it was supplied at 13.8V, the surface temperature showing about 45*C 600 seconds later.
Fig. 6 shows the results of XRD analysis of the ITO experimental piece with its FO∑/EAr value at 0.43, wherein in the case of an experimental piece of good transparency and conductivity its In∑SnOs coating exceedingly well develops at 2 θ - 45.36, and it was found that the above ITO coating contributed to
improvement of conductivity.
Such exothermic reflexible glass, coated over the surface of the glass in automobiles, can be used very preferably to remove the moisture inside, and is extensively made use of for liquid crystal display systems also.

Claims

1. A process of manufacturing an exothermic reflexible glass by the magnetic sputtering technique, characterized in that it is manufactured by cleansing glass with alcohol, distilled water, and aceton in that order, drying it in an oven at about 200*C making it generate plasma in the magnetic filed of magnetron at the electric density of 6-12W/cm3, the initial vacuity of 1 X 10"5 torr, and the working pressure of 6 X 10"3 torr, and coating it with such conductive metals as Cr, Ni, Ag, Al, Cu by sputtering to a thickness of about 1,000A or more.
2. A process of manufacturing an exothermic transparent glass by the magnetic sputtering technique characterized in that it is manufactured by cleansing glass with alcohol, distilled water, and aceton in that order, drying it in an oven at about 200TC making an alloy of In(90%)-Sn(10%) generate plasma in the magnetic field of magnetron, sputtering with the flow of Ar gas at 100 SCCM and that of O2 gas at 30 - 98 SCCM, and forming an indium-tin oxide(ITO) thin coating layer over the glass under the initial vacuity of 1 X 10"6 torr and the working pressure of 6 X lO"3 torr.
3. A process of manufacturing an exothermic transparent glass according to Claim 2, characterized in that the flow of Ar gas is 100 SCCM and that of O2 gas is 43 SCCM.
4. An exothermic reflexible glass manufactured by the process according to Clam 1.
5. An exothermic transparent glass manufactured by the process according to Claim 2.
PCT/KR1992/000081 1991-12-28 1992-12-28 Exothermic reflexible glass, exothermic transparent glass and process of manufacturing them Ceased WO1993013239A1 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP5511286A JPH07509534A (en) 1991-12-28 1992-12-28 Heat-generating reflective glass, heat-generating transparent glass, and manufacturing methods thereof
RU9294033355A RU2075537C1 (en) 1992-12-05 1992-12-28 Exothermic glass and methods of its production
EP93901531A EP0618984A1 (en) 1991-12-28 1992-12-28 Exothermic reflexible glass, exothermic transparent glass and process of manufacturing them

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
KR1991-24856 1991-12-28
KR910024856 1991-12-28
KR920023423 1992-12-05
KR1992-23423 1992-12-05

Publications (1)

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WO1993013239A1 true WO1993013239A1 (en) 1993-07-08

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PCT/KR1992/000081 Ceased WO1993013239A1 (en) 1991-12-28 1992-12-28 Exothermic reflexible glass, exothermic transparent glass and process of manufacturing them

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EP (1) EP0618984A1 (en)
JP (1) JPH07509534A (en)
CA (1) CA2126674A1 (en)
WO (1) WO1993013239A1 (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0293645A1 (en) * 1987-06-04 1988-12-07 Siemens Aktiengesellschaft Process for the fabrication of transparent, conductive indium-tinoxide layers, especially for image sensor lines based on amorphous silicon
DE3933713A1 (en) * 1988-10-08 1990-04-12 Matsushita Electric Works Ltd METHOD FOR FORMING A CONDUCTIVE METAL LAYER ON AN INORGANIC SUBSTRATE
EP0447850A2 (en) * 1990-02-27 1991-09-25 Nihon Shinku Gijutsu Kabushiki Kaisha Method and apparatus for producing transparent conductive film

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0293645A1 (en) * 1987-06-04 1988-12-07 Siemens Aktiengesellschaft Process for the fabrication of transparent, conductive indium-tinoxide layers, especially for image sensor lines based on amorphous silicon
DE3933713A1 (en) * 1988-10-08 1990-04-12 Matsushita Electric Works Ltd METHOD FOR FORMING A CONDUCTIVE METAL LAYER ON AN INORGANIC SUBSTRATE
EP0447850A2 (en) * 1990-02-27 1991-09-25 Nihon Shinku Gijutsu Kabushiki Kaisha Method and apparatus for producing transparent conductive film

Also Published As

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CA2126674A1 (en) 1993-07-08
JPH07509534A (en) 1995-10-19
EP0618984A1 (en) 1994-10-12

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