WO1996028745A3 - Timing generator with multiple coherent synchronized clocks - Google Patents

Timing generator with multiple coherent synchronized clocks Download PDF

Info

Publication number
WO1996028745A3
WO1996028745A3 PCT/US1995/015712 US9515712W WO9628745A3 WO 1996028745 A3 WO1996028745 A3 WO 1996028745A3 US 9515712 W US9515712 W US 9515712W WO 9628745 A3 WO9628745 A3 WO 9628745A3
Authority
WO
WIPO (PCT)
Prior art keywords
timing generator
timing
resolution
analog
signals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US1995/015712
Other languages
French (fr)
Other versions
WO1996028745A2 (en
Inventor
Michael P Botham
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Priority to DE69517604T priority Critical patent/DE69517604T2/en
Priority to EP95944473A priority patent/EP0815461B1/en
Publication of WO1996028745A2 publication Critical patent/WO1996028745A2/en
Publication of WO1996028745A3 publication Critical patent/WO1996028745A3/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
    • G01R31/2841—Signal generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/3167—Testing of combined analog and digital circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Analogue/Digital Conversion (AREA)

Abstract

Automatic test equipment with programmable timing generators to generate digital signals and analog signals. The digital timing generator can be programmed to generate timing signals with a resolution finer than that of the master clock of the timing generator. Extremely fine resolution is achieved by specifying the numerator and denominator of a fractional portion of a period. A similar arrangement is used to allow fine frequency resolution for the analog timing generator. The fine resolution achievable with the timing generators allows the digital timing generator to be synchronized to the analog timing generator.
PCT/US1995/015712 1995-03-16 1995-12-04 Timing generator with multiple coherent synchronized clocks Ceased WO1996028745A2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
DE69517604T DE69517604T2 (en) 1995-03-16 1995-12-04 TIMER WITH MULTIPLE COHERENT SYNCHRONIZED CLOCKS
EP95944473A EP0815461B1 (en) 1995-03-16 1995-12-04 Timing generator with multiple coherent synchronized clocks

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US40532695A 1995-03-16 1995-03-16
US08/405,326 1995-03-16

Publications (2)

Publication Number Publication Date
WO1996028745A2 WO1996028745A2 (en) 1996-09-19
WO1996028745A3 true WO1996028745A3 (en) 1996-12-05

Family

ID=23603220

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US1995/015712 Ceased WO1996028745A2 (en) 1995-03-16 1995-12-04 Timing generator with multiple coherent synchronized clocks

Country Status (4)

Country Link
US (1) US5905967A (en)
EP (1) EP0815461B1 (en)
DE (1) DE69517604T2 (en)
WO (1) WO1996028745A2 (en)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4138163B2 (en) * 1999-07-07 2008-08-20 株式会社ルネサステクノロジ LSI test apparatus and timing calibration method thereof
EP1085335A1 (en) * 1999-09-14 2001-03-21 Alcatel Method and apparatus for testing integrated circuits with automatic test equipment
US6396313B1 (en) 2000-08-24 2002-05-28 Teradyne, Inc. Noise-shaped digital frequency synthesis
US6675117B2 (en) 2000-12-12 2004-01-06 Teradyne, Inc. Calibrating single ended channels for differential performance
US7343387B2 (en) 2002-02-26 2008-03-11 Teradyne, Inc. Algorithm for configuring clocking system
US7080304B2 (en) * 2002-02-26 2006-07-18 Teradyne, Inc. Technique for programming clocks in automatic test system
AU2003222702A1 (en) * 2002-05-03 2003-11-17 Mcgill University Method and device for use in dc parametric tests
US6925408B2 (en) * 2003-09-08 2005-08-02 Texas Instruments Incorporated Mixed-signal core design for concurrent testing of mixed-signal, analog, and digital components
US9621384B2 (en) * 2004-02-19 2017-04-11 Georgia Tech Research Corporation Systems and methods for communicating data over parallel data paths
US7454681B2 (en) * 2004-11-22 2008-11-18 Teradyne, Inc. Automatic test system with synchronized instruments
US7319936B2 (en) 2004-11-22 2008-01-15 Teradyne, Inc. Instrument with interface for synchronization in automatic test equipment
TWI339948B (en) * 2007-11-19 2011-04-01 Faraday Tech Corp Pll base timing generator and method of generating timing signal
EP2227726A4 (en) * 2007-12-31 2012-12-05 Teradyne Inc Timing signal generator providing synchronized timing signals at non-integer clock multiples adjustable by more than one period
US8359504B1 (en) 2010-05-18 2013-01-22 Advanced Testing Technologies, Inc. Digital functional test system
US9562951B2 (en) * 2014-03-11 2017-02-07 Venable Corporation Digital Frequency response analysis system and method useful for power supplies
US9503102B2 (en) * 2014-08-29 2016-11-22 Tektronix, Inc. Synchronization for multiple arbitrary waveform generators

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4101761A (en) * 1976-11-26 1978-07-18 Pacific Western Systems Timing pulse generator
US4231104A (en) * 1978-04-26 1980-10-28 Teradyne, Inc. Generating timing signals
EP0474274A2 (en) * 1990-09-05 1992-03-11 Schlumberger Technologies, Inc. Event sequencer for automatic test equipment
GB2252418A (en) * 1990-10-30 1992-08-05 Teradyne Inc High speed pattern generator

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4063308A (en) * 1975-06-27 1977-12-13 International Business Machines Corporation Automatic clock tuning and measuring system for LSI computers
US4564953A (en) * 1983-03-28 1986-01-14 Texas Instruments Incorporated Programmable timing system
US4789835A (en) * 1983-08-01 1988-12-06 Fairchild Camera & Instrument Corporation Control of signal timing apparatus in automatic test systems using minimal memory
US4779221A (en) * 1987-01-28 1988-10-18 Megatest Corporation Timing signal generator
US5274796A (en) * 1987-02-09 1993-12-28 Teradyne, Inc. Timing generator with edge generators, utilizing programmable delays, providing synchronized timing signals at non-integer multiples of a clock signal

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4101761A (en) * 1976-11-26 1978-07-18 Pacific Western Systems Timing pulse generator
US4231104A (en) * 1978-04-26 1980-10-28 Teradyne, Inc. Generating timing signals
EP0474274A2 (en) * 1990-09-05 1992-03-11 Schlumberger Technologies, Inc. Event sequencer for automatic test equipment
GB2252418A (en) * 1990-10-30 1992-08-05 Teradyne Inc High speed pattern generator

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
CONNER D: "ATE pin electronics. Versatile ICs reach beyond ATE systems", EDN, 25 APRIL 1991, USA, vol. 36, no. 9, ISSN 0012-7515, pages 109 - 112, 114, XP002007954 *

Also Published As

Publication number Publication date
EP0815461B1 (en) 2000-06-21
WO1996028745A2 (en) 1996-09-19
DE69517604T2 (en) 2001-02-22
US5905967A (en) 1999-05-18
EP0815461A2 (en) 1998-01-07
DE69517604D1 (en) 2000-07-27

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