WO1998052773A1 - Marking diamond - Google Patents
Marking diamond Download PDFInfo
- Publication number
- WO1998052773A1 WO1998052773A1 PCT/GB1998/001493 GB9801493W WO9852773A1 WO 1998052773 A1 WO1998052773 A1 WO 1998052773A1 GB 9801493 W GB9801493 W GB 9801493W WO 9852773 A1 WO9852773 A1 WO 9852773A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- diamond
- layer
- mark
- resist
- electrically
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B44—DECORATIVE ARTS
- B44B—MACHINES, APPARATUS OR TOOLS FOR ARTISTIC WORK, e.g. FOR SCULPTURING, GUILLOCHING, CARVING, BRANDING, INLAYING
- B44B7/00—Machines, apparatus or hand tools for branding, e.g. using radiant energy such as laser beams
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B44—DECORATIVE ARTS
- B44C—PRODUCING DECORATIVE EFFECTS; MOSAICS; TARSIA WORK; PAPERHANGING
- B44C1/00—Processes, not specifically provided for elsewhere, for producing decorative surface effects
- B44C1/22—Removing surface-material, e.g. by engraving, by etching
-
- A—HUMAN NECESSITIES
- A44—HABERDASHERY; JEWELLERY
- A44C—PERSONAL ADORNMENTS, e.g. JEWELLERY; COINS
- A44C15/00—Other forms of jewellery
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
Definitions
- the present invention relates to a method of marking a surface of a diamond to produce a mark which is invisible to the naked eye.
- the mark may be any mark, but the invention is particularly though not exclusively directed to applying an information mark to the diamond.
- the diamond may be for instance an industrial diamond such as a wire-drawing die, though the invention is of particular interest in marking gemstone diamonds, for instance for applying a mark which is invisible to the naked eye or invisible to the eye using a xlO loupe, when the mark can be applied to a polished facet of the gemstone without detracting from its clarity or colour grade.
- a loupe is used, the visibility is assessed under the internationally accepted conditions for clarity grading, i.e.
- the marks can be used to uniquely identify the gemstone by a serial number or as a brand or quality mark.
- the mark should be capable of being viewed under suitable magnification and viewing conditions, and, if applied to a gemstone, should not detract from the value or appearance of the stone and should preferably not exhibit blackening.
- a layer of resist is applied to the surface of the diamond, a selected zone of the resist layer is ablated to form a mask on the diamond surface, and the diamond surface is etched through the mask, wherein an electrically-conducting layer is applied to the resist layer, and an electrical connection is provided to the electrically-conducting layer to prevent charging during etching.
- the invention extends to a diamond whose surface has been marked by the method, and to apparatus for carrying out the method.
- etching is plasma etching.
- an electrically-conducting layer for example metal
- the resist can then be non-electrically-conducting.
- the layer of metal can for instance be a layer of gold, for instance about 0.1 microns thick. It need not be applied to the whole of the resist layer, only to a region sufficiently large to prevent charging during plasma etching.
- the bilayer mask so formed may require different ablation conditions to a single layer, but generally both layers are ablated substantially simultaneously.
- the electrically-conducting layer effectively remains on the resist around the ablated zone, and thus prevents charging during plasma etching, whilst leaving the ablated zone clear of metal.
- the metal should have an ablation threshold no higher than that of the resist.
- a metal such as gold cannot be used on its own as a resist because it does not give high enough resolution, ablating too readily and leaving poorly defined edges.
- a thicker layer of metal such as gold is used, there is a risk of the metal sputtering and redepositing in the ablated zone.
- a completely dry technique can be used (with no chemical etching or stripping steps); although wet cleaning may be required after plasma etching in order to remove the mask, this is not a critical step requiring controlled conditions.
- the bilayer mask can provide greatly improved resolution (particularly in relation to the laser etching technique disclosed in WO97/03846), and, in comparison with WO97/03846, requires a reduced pulse count if laser ablation is employed, for instance using about 20 pulses or fewer, say 10 pulses, rather than 500 pulses, making it practical to produce serial numbers with a sequence of masks, one for each number.
- the ablation could be performed using a mask projection technique, but can be performed by direct beam writing.
- the resist can be any suitable resist, for instance a plastics (polymer) resist.
- the thickness of the resist layer may for instance be not less than about 0.5 micron and/or not more than about 1 micron.
- the plasma etching should be to a depth of not less than about 10 nm and/or not greater than about 70 nm, more preferably not less than about 20 nm and/or not greater than about 50 nm, a suitable value being about 30 nm.
- the diamond exposed by the mask can be etched using a broad ion beam to convert it to graphite or other non-diamond carbon which may then be removed by, for example, acid cleaning.
- a diamond gemstone is mounted on a holder (or a plurality of diamond gemstones can be so mounted).
- a layer of non-conducting polymer plasma etch resist is applied to the exposed surface of the diamond, for instance by spin coating using e.g. a Novalac photoresist or by evaporation.
- the resist layer is 0.5 to 1 microns thick.
- a layer of gold about 0.1 microns thick is deposited on the resist layer on at least part of the facet to be marked.
- the resist and gold layers are patterned by laser ablation with about 10 pulses to leave a clean diamond surface
- the laser wavelength is selected to give the best results with the chosen resist, shorter wavelengths permitting greater resolution than longer ones 248 nm or other wavelengths may be used, but the preferred wavelength is 193 nm
- an electrical connection is made to the metal layer and the diamond is plasma etched in a standard manner, preferably under a partial pressure of oxygen Zones of the facet not protected by the resist are etched to a depth of about 30 nm, providing a clean etch with no evidence of blackening
- the electrical connection to the metal layer prevents charging
- the stone or stones is/are removed from the holder
- the mask is removed by wet cleaning
- the apparatus used for the laser ablation can be similar to that shown in Figure 2 of WO 97/03846
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Laser Beam Processing (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Carbon And Carbon Compounds (AREA)
- Electrochromic Elements, Electrophoresis, Or Variable Reflection Or Absorption Elements (AREA)
- Drying Of Semiconductors (AREA)
- Macromolecular Compounds Obtained By Forming Nitrogen-Containing Linkages In General (AREA)
- Transition And Organic Metals Composition Catalysts For Addition Polymerization (AREA)
- Peptides Or Proteins (AREA)
- Polishing Bodies And Polishing Tools (AREA)
- Manufacturing Of Electric Cables (AREA)
- Adornments (AREA)
- Processing Of Stones Or Stones Resemblance Materials (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
Description
Claims
Priority Applications (9)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55014198A JP2001526571A (en) | 1997-05-23 | 1998-05-22 | Marking diamonds |
| GB9927676A GB2339726B (en) | 1997-05-23 | 1998-05-22 | Marking diamond |
| HK00104772.6A HK1025544B (en) | 1997-05-23 | 1998-05-22 | Marking diamond |
| EP98922948A EP0983152B1 (en) | 1997-05-23 | 1998-05-22 | Marking diamond |
| AT98922948T ATE216322T1 (en) | 1997-05-23 | 1998-05-22 | DIAMOND MARKING PROCESS |
| US09/423,350 US6358427B1 (en) | 1997-05-23 | 1998-05-22 | Marking diamond |
| DE69804957T DE69804957T2 (en) | 1997-05-23 | 1998-05-22 | DIAMANTMARKIERVERFAHREN |
| AU75408/98A AU728923B2 (en) | 1997-05-23 | 1998-05-22 | Marking diamond |
| CA002291042A CA2291042A1 (en) | 1997-05-23 | 1998-05-22 | Marking diamond |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB9710736.1 | 1997-05-23 | ||
| GB9710736A GB2325439A (en) | 1997-05-23 | 1997-05-23 | Marking diamond gemstone by plasma or ion beam etching through a laser ablated resist |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO1998052773A1 true WO1998052773A1 (en) | 1998-11-26 |
Family
ID=10812995
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/GB1998/001493 Ceased WO1998052773A1 (en) | 1997-05-23 | 1998-05-22 | Marking diamond |
Country Status (16)
| Country | Link |
|---|---|
| US (1) | US6358427B1 (en) |
| EP (1) | EP0983152B1 (en) |
| JP (1) | JP2001526571A (en) |
| KR (1) | KR20010012915A (en) |
| CN (1) | CN1140421C (en) |
| AT (1) | ATE216322T1 (en) |
| AU (1) | AU728923B2 (en) |
| CA (1) | CA2291042A1 (en) |
| DE (1) | DE69804957T2 (en) |
| ES (1) | ES2174438T3 (en) |
| GB (2) | GB2325439A (en) |
| IL (1) | IL124591A (en) |
| RU (1) | RU2198099C2 (en) |
| TW (1) | TW388736B (en) |
| WO (1) | WO1998052773A1 (en) |
| ZA (1) | ZA984375B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2002066262A2 (en) | 2001-02-16 | 2002-08-29 | Gersan Establishment | Forming a mark on a gemstone or industrial diamond |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20080316171A1 (en) * | 2000-01-14 | 2008-12-25 | Immersion Corporation | Low-Cost Haptic Mouse Implementations |
| US6593543B2 (en) * | 2000-07-20 | 2003-07-15 | David Benderly | Gemstone marking system and method |
| US6624385B2 (en) * | 2001-12-21 | 2003-09-23 | Eastman Kodak Company | Method for marking gemstones with a unique micro discrete indicia |
| DE10310293A1 (en) * | 2003-03-10 | 2004-09-23 | Robert Bosch Gmbh | Laser drilling or machining method using electrical field for removal of metal and/or plasma ions from machining point |
| WO2005061400A1 (en) * | 2003-12-12 | 2005-07-07 | Element Six Limited | Method of incorporating a mark in cvd diamond |
| US20060144821A1 (en) * | 2005-01-04 | 2006-07-06 | Academia Sinica | Method for engraving irreproducible pattern on the surface of a diamond |
| RU2357870C1 (en) * | 2005-08-22 | 2009-06-10 | Интернейшнел Джемстоун Реджистри Инк. | Method and system for laser marking precious stones, such as diamonds |
| EA016643B1 (en) * | 2007-07-27 | 2012-06-29 | Юрий Константинович НИЗИЕНКО | Method for marking valuable articles |
| RU2427041C2 (en) * | 2009-05-08 | 2011-08-20 | Юрий Константинович Низиенко | Method of making identification mark for marking valuable articles and valuable article with said mark |
| CN102569506B (en) * | 2011-12-29 | 2014-06-18 | 广东爱康太阳能科技有限公司 | Method for preparing metal electrode of solar battery from silane mask |
| RU2557360C2 (en) * | 2012-12-20 | 2015-07-20 | Общество с ограниченной ответственностью "Си Эн Эл Девайсез" | Formation of mask for diamond films etching |
| SG11201509479WA (en) * | 2013-05-30 | 2015-12-30 | Goldway Technology Ltd | Method of marking material and system therefore, and material marked according to same method |
| HK1198858A2 (en) * | 2014-04-16 | 2015-06-12 | Master Dynamic Limited | Method of marking a solid state material, and solid state materials marked according to such a method |
| TWI814173B (en) * | 2020-12-14 | 2023-09-01 | 香港商金展科技有限公司 | A method and system of forming an identifiable marking at an outer surface of a plurality of gemstones, and gemstones marked according to such a method |
| US11886122B2 (en) | 2021-06-24 | 2024-01-30 | Fraunhofer Usa, Inc. | Deep etching substrates using a bi-layer etch mask |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4117301A (en) * | 1975-07-21 | 1978-09-26 | Rca Corporation | Method of making a submicrometer aperture in a substrate |
| US4425769A (en) * | 1981-05-07 | 1984-01-17 | Maurice Hakoune | Method for treating a gem and gem treated with this method |
| EP0449439A1 (en) * | 1990-03-13 | 1991-10-02 | Fujitsu Limited | Process for formation of resist patterns |
| US5137799A (en) * | 1989-02-06 | 1992-08-11 | Hoechst Aktiengesellschaft | Electrically conductive resist material, a process for its preparation and its use |
| WO1997003846A1 (en) * | 1995-07-17 | 1997-02-06 | Gersan Establishment | Marking diamond |
Family Cites Families (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4018938A (en) | 1975-06-30 | 1977-04-19 | International Business Machines Corporation | Fabrication of high aspect ratio masks |
| JPS5290372A (en) * | 1976-01-23 | 1977-07-29 | Okuda Kazumi | Patter embossed diamond |
| JPS5812234B2 (en) | 1976-12-24 | 1983-03-07 | 一實 奥田 | Manufacturing method for labeled diamonds |
| US4632898A (en) | 1985-04-15 | 1986-12-30 | Eastman Kodak Company | Process for fabricating glass tooling |
| US4675273A (en) | 1986-02-10 | 1987-06-23 | Loctite (Ireland) Limited | Resists formed by vapor deposition of anionically polymerizable monomer |
| JPS6334927A (en) | 1986-07-29 | 1988-02-15 | Matsushita Electric Ind Co Ltd | Working of diamond |
| US4786358A (en) | 1986-08-08 | 1988-11-22 | Semiconductor Energy Laboratory Co., Ltd. | Method for forming a pattern of a film on a substrate with a laser beam |
| US5045150A (en) | 1986-09-11 | 1991-09-03 | National Semiconductor Corp. | Plasma etching using a bilayer mask |
| JP2542608B2 (en) | 1987-03-09 | 1996-10-09 | 住友電気工業株式会社 | Diamond semiconductor etching method |
| JPS63220525A (en) | 1987-03-09 | 1988-09-13 | Sumitomo Electric Ind Ltd | Diamond semiconductor etching method |
| JPS63237531A (en) | 1987-03-26 | 1988-10-04 | Toshiba Corp | Fine processing method |
| JPH07113774B2 (en) | 1987-05-29 | 1995-12-06 | 株式会社日立製作所 | Pattern formation method |
| US4873176A (en) | 1987-08-28 | 1989-10-10 | Shipley Company Inc. | Reticulation resistant photoresist coating |
| US4756794A (en) | 1987-08-31 | 1988-07-12 | The United States Of America As Represented By The Secretary Of The Navy | Atomic layer etching |
| US4780177A (en) | 1988-02-05 | 1988-10-25 | General Electric Company | Excimer laser patterning of a novel resist |
| US4842677A (en) | 1988-02-05 | 1989-06-27 | General Electric Company | Excimer laser patterning of a novel resist using masked and maskless process steps |
| JP2763172B2 (en) * | 1990-03-19 | 1998-06-11 | 株式会社神戸製鋼所 | Diamond thin film etching method |
| US5196376A (en) | 1991-03-01 | 1993-03-23 | Polycon Corporation | Laser lithography for integrated circuit and integrated circuit interconnect manufacture |
| US5397428A (en) | 1991-12-20 | 1995-03-14 | The University Of North Carolina At Chapel Hill | Nucleation enhancement for chemical vapor deposition of diamond |
| JP3104433B2 (en) | 1992-10-16 | 2000-10-30 | 住友電気工業株式会社 | Diamond etching method |
| US5269890A (en) | 1992-12-31 | 1993-12-14 | The United States Of America As Represented By The Secretary Of The Navy | Electrochemical process and product therefrom |
| JP3651025B2 (en) | 1994-08-09 | 2005-05-25 | 住友電気工業株式会社 | Marked diamond and method for forming the same |
| US5591480A (en) | 1995-08-21 | 1997-01-07 | Motorola, Inc. | Method for fabricating metallization patterns on an electronic substrate |
-
1997
- 1997-05-23 GB GB9710736A patent/GB2325439A/en not_active Withdrawn
-
1998
- 1998-05-21 IL IL12459198A patent/IL124591A/en not_active IP Right Cessation
- 1998-05-22 US US09/423,350 patent/US6358427B1/en not_active Expired - Fee Related
- 1998-05-22 RU RU99127463/12A patent/RU2198099C2/en not_active IP Right Cessation
- 1998-05-22 WO PCT/GB1998/001493 patent/WO1998052773A1/en not_active Ceased
- 1998-05-22 TW TW087107949A patent/TW388736B/en not_active IP Right Cessation
- 1998-05-22 CA CA002291042A patent/CA2291042A1/en not_active Abandoned
- 1998-05-22 AU AU75408/98A patent/AU728923B2/en not_active Ceased
- 1998-05-22 AT AT98922948T patent/ATE216322T1/en not_active IP Right Cessation
- 1998-05-22 ZA ZA9804375A patent/ZA984375B/en unknown
- 1998-05-22 KR KR1019997010883A patent/KR20010012915A/en not_active Withdrawn
- 1998-05-22 EP EP98922948A patent/EP0983152B1/en not_active Expired - Lifetime
- 1998-05-22 ES ES98922948T patent/ES2174438T3/en not_active Expired - Lifetime
- 1998-05-22 JP JP55014198A patent/JP2001526571A/en not_active Withdrawn
- 1998-05-22 DE DE69804957T patent/DE69804957T2/en not_active Expired - Fee Related
- 1998-05-22 GB GB9927676A patent/GB2339726B/en not_active Expired - Fee Related
- 1998-05-22 CN CNB988073641A patent/CN1140421C/en not_active Expired - Fee Related
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4117301A (en) * | 1975-07-21 | 1978-09-26 | Rca Corporation | Method of making a submicrometer aperture in a substrate |
| US4425769A (en) * | 1981-05-07 | 1984-01-17 | Maurice Hakoune | Method for treating a gem and gem treated with this method |
| US5137799A (en) * | 1989-02-06 | 1992-08-11 | Hoechst Aktiengesellschaft | Electrically conductive resist material, a process for its preparation and its use |
| EP0449439A1 (en) * | 1990-03-13 | 1991-10-02 | Fujitsu Limited | Process for formation of resist patterns |
| WO1997003846A1 (en) * | 1995-07-17 | 1997-02-06 | Gersan Establishment | Marking diamond |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2002066262A2 (en) | 2001-02-16 | 2002-08-29 | Gersan Establishment | Forming a mark on a gemstone or industrial diamond |
| WO2002066263A2 (en) | 2001-02-16 | 2002-08-29 | Gersan Establishment | Mounting and preparing a gemstone or industrial diamond for the formation of a mark on the surface thereof |
| WO2002066262A3 (en) * | 2001-02-16 | 2003-06-26 | Gersan Ets | Forming a mark on a gemstone or industrial diamond |
| GB2389340A (en) * | 2001-02-16 | 2003-12-10 | Gersan Ets | Forming a mark on a gemstone or industrial diamond |
| GB2389340B (en) * | 2001-02-16 | 2004-08-18 | Gersan Ets | Forming a mark on a gemstone or industrial diamond |
| KR100896783B1 (en) | 2001-02-16 | 2009-05-11 | 게르잔 에스테블리쉬먼트 | Marking method and apparatus for jewelry or industrial diamond |
Also Published As
| Publication number | Publication date |
|---|---|
| AU728923B2 (en) | 2001-01-18 |
| GB2325439A (en) | 1998-11-25 |
| HK1025544A1 (en) | 2000-11-17 |
| US6358427B1 (en) | 2002-03-19 |
| CA2291042A1 (en) | 1998-11-26 |
| ES2174438T3 (en) | 2002-11-01 |
| CN1264341A (en) | 2000-08-23 |
| GB9710736D0 (en) | 1997-07-16 |
| GB2339726A (en) | 2000-02-09 |
| DE69804957T2 (en) | 2002-10-17 |
| RU2198099C2 (en) | 2003-02-10 |
| KR20010012915A (en) | 2001-02-26 |
| TW388736B (en) | 2000-05-01 |
| EP0983152A1 (en) | 2000-03-08 |
| CN1140421C (en) | 2004-03-03 |
| JP2001526571A (en) | 2001-12-18 |
| DE69804957D1 (en) | 2002-05-23 |
| AU7540898A (en) | 1998-12-11 |
| GB2339726B (en) | 2001-09-12 |
| GB9927676D0 (en) | 2000-01-19 |
| IL124591A (en) | 2001-10-31 |
| ATE216322T1 (en) | 2002-05-15 |
| ZA984375B (en) | 1999-11-22 |
| IL124591A0 (en) | 1998-12-06 |
| EP0983152B1 (en) | 2002-04-17 |
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