WO2000008449A3 - Procede et dispositif pour le controle non destructif d'une surface au moyen d'un produit colorant - Google Patents

Procede et dispositif pour le controle non destructif d'une surface au moyen d'un produit colorant Download PDF

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Publication number
WO2000008449A3
WO2000008449A3 PCT/FR1999/001942 FR9901942W WO0008449A3 WO 2000008449 A3 WO2000008449 A3 WO 2000008449A3 FR 9901942 W FR9901942 W FR 9901942W WO 0008449 A3 WO0008449 A3 WO 0008449A3
Authority
WO
WIPO (PCT)
Prior art keywords
dye
dye product
observation
polarised
rectilinear
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/FR1999/001942
Other languages
English (en)
Other versions
WO2000008449B1 (fr
WO2000008449A2 (fr
Inventor
Pierre-Marie Pailliotet
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
DEVRED MONIQUE
Original Assignee
DEVRED MONIQUE
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to US09/647,419 priority Critical patent/US6556298B1/en
Priority to EP99936697A priority patent/EP1102978B1/fr
Priority to DE69916853T priority patent/DE69916853T2/de
Priority to JP2000564033A priority patent/JP2002522764A/ja
Priority to AT99936697T priority patent/ATE265679T1/de
Priority to IL14125299A priority patent/IL141252A/en
Application filed by DEVRED MONIQUE filed Critical DEVRED MONIQUE
Priority to CA002339882A priority patent/CA2339882C/fr
Priority to AU51701/99A priority patent/AU5170199A/en
Publication of WO2000008449A2 publication Critical patent/WO2000008449A2/fr
Publication of WO2000008449A3 publication Critical patent/WO2000008449A3/fr
Publication of WO2000008449B1 publication Critical patent/WO2000008449B1/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/91—Investigating the presence of flaws or contamination using penetration of dyes, e.g. fluorescent ink

Landscapes

  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

Procédé de contrôle non destructif de l'état d'une surface susceptible de présenter des fissures, par une méthode basée sur l'observation de l'onde émise par un produit colorant appliqué sur la surface et dans les fissures, sur l'effet d'un faisceau d'excitation incident de longueur d'onde appropriée au produit colorant, caractérisé en ce qu'on utilise la rotation de l'onde polarisée rectiligne émise par le colorant en fonction de l'épaisseur du colorant par rapport à une onde de lumière polarisée rectiligne incidente, pour éliminer de l'observation les tâches dues au produit colorant résiduel présent sur la surface. Sur les figures, (1) est un laser, (2) est une caméra d'observation et (3) un analyseur d'onde polarisée. Application aux techniques de ressuage et de magnétoscopie.
PCT/FR1999/001942 1998-08-05 1999-08-05 Procede et dispositif pour le controle non destructif d'une surface au moyen d'un produit colorant Ceased WO2000008449A2 (fr)

Priority Applications (8)

Application Number Priority Date Filing Date Title
US09/647,419 US6556298B1 (en) 1998-08-05 1999-04-05 Method and system for non-destructive dye penetration testing of a surface
DE69916853T DE69916853T2 (de) 1998-08-05 1999-08-05 Verfahren und vorrichtung zur zerstörungsfreien oberflächenprüfung mittels eines färbemittels
JP2000564033A JP2002522764A (ja) 1998-08-05 1999-08-05 表面の非破壊染色浸透探傷方法およびシステム
AT99936697T ATE265679T1 (de) 1998-08-05 1999-08-05 Verfahren und vorrichtung zur zerstörungsfreien oberflächenprüfung mittels eines färbemittels
IL14125299A IL141252A (en) 1998-08-05 1999-08-05 Method and device for non-destructive control of a surface using a dye product
EP99936697A EP1102978B1 (fr) 1998-08-05 1999-08-05 Procede et dispositif pour le controle non destructif d'une surface au moyen d'un produit colorant
CA002339882A CA2339882C (fr) 1998-08-05 1999-08-05 Procede et dispositif pour le controle non destructif d'une surface au moyen d'un produit colorant
AU51701/99A AU5170199A (en) 1998-08-05 1999-08-05 Method and device for non-destructive control of a surface using a dye product

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR98/10062 1998-08-05
FR9810062A FR2782165B1 (fr) 1998-08-05 1998-08-05 Procede et dispositif pour le controle non destructif de l'etat d'une surface au moyen d'un produit colorant

Publications (3)

Publication Number Publication Date
WO2000008449A2 WO2000008449A2 (fr) 2000-02-17
WO2000008449A3 true WO2000008449A3 (fr) 2000-04-20
WO2000008449B1 WO2000008449B1 (fr) 2000-06-29

Family

ID=9529423

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/FR1999/001942 Ceased WO2000008449A2 (fr) 1998-08-05 1999-08-05 Procede et dispositif pour le controle non destructif d'une surface au moyen d'un produit colorant

Country Status (12)

Country Link
US (1) US6556298B1 (fr)
EP (1) EP1102978B1 (fr)
JP (1) JP2002522764A (fr)
CN (1) CN1152249C (fr)
AT (1) ATE265679T1 (fr)
AU (1) AU5170199A (fr)
CA (1) CA2339882C (fr)
DE (1) DE69916853T2 (fr)
ES (1) ES2220094T3 (fr)
FR (1) FR2782165B1 (fr)
IL (1) IL141252A (fr)
WO (1) WO2000008449A2 (fr)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050174567A1 (en) * 2004-02-09 2005-08-11 Mectron Engineering Company Crack detection system
EP1828756A1 (fr) * 2004-12-16 2007-09-05 Volvo Aero Corporation Procede et dispositif pour detecter des fissures dans un objet
US9699417B2 (en) * 2011-02-28 2017-07-04 Snecma Device for searching for defects on parts by endoscopy
US8638564B2 (en) 2011-09-15 2014-01-28 International Business Machines Corporation Dye-based circuit mount testing
CN104007000A (zh) * 2014-06-11 2014-08-27 孙守渊 一种除水垢着色渗透检测剂及其制备方法
FR3051911B1 (fr) * 2016-05-30 2021-12-03 Raymond Chevallier Procede de controle de plaques metalliques par ressuage
CN109211928A (zh) * 2018-08-31 2019-01-15 胜科纳米（苏州）有限公司 芯片表面膜层缺陷的检测方法
CN114383988B (zh) * 2020-10-16 2024-04-05 深南电路股份有限公司 一种电路板的吸附性能检测方法及检测系统
DE102022107445A1 (de) 2022-03-29 2023-10-05 MTU Aero Engines AG Verfahren zum prüfen eines bauteils

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4699512A (en) * 1984-07-13 1987-10-13 Hitachi, Ltd. Device for measuring fluorescence polarization
US4893008A (en) * 1987-06-09 1990-01-09 Olympus Optical Co., Ltd. Scanning optical microscope
US5133198A (en) * 1989-09-15 1992-07-28 Institut Textile De France Endoscopic apparatus for flaw detection on a circular knitting machine
US5333052A (en) * 1990-11-27 1994-07-26 Orbotech Ltd. Method and apparatus for automatic optical inspection
US5554318A (en) * 1994-02-07 1996-09-10 Basf Aktiengesellschaft Use of compounds which absorbs and fluoresce in the IR range as crack-detecting agents

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US3774030A (en) * 1972-06-02 1973-11-20 Magnaflux Corp Defect detecting and indicating means for non-destructive testing
JPS57161640A (en) * 1981-03-31 1982-10-05 Olympus Optical Co Ltd Inspecting device for surface
US4418315A (en) * 1981-05-22 1983-11-29 Combustion Engineering, Inc. Method for effecting a surface examination of coated components
US4598997A (en) * 1982-02-15 1986-07-08 Rca Corporation Apparatus and method for detecting defects and dust on a patterned surface
US4755752A (en) * 1983-07-05 1988-07-05 Gerald L. Fitzpatrick Flaw imaging in ferrous and nonferrous materials using magneto-optic visualization
DE3342855A1 (de) * 1983-11-26 1985-06-05 Brent Chemicals International PLC, Iver, Buckinghamshire Verfahren zur zerstoerungsfreien pruefung von oberflaechendefekten
US4621193A (en) * 1984-11-21 1986-11-04 Michael Van Hoye Fluorescent penetrant crack detection
JPS63122421A (ja) * 1986-11-12 1988-05-26 株式会社東芝 内視鏡装置
US5115136A (en) * 1990-08-06 1992-05-19 Olympus Corporation Ultraviolet remote visual inspection system
US5150175A (en) * 1991-03-13 1992-09-22 American Research Corporation Of Virginia Optical imaging system for fabric seam detection
US5539514A (en) * 1991-06-26 1996-07-23 Hitachi, Ltd. Foreign particle inspection apparatus and method with front and back illumination
US5479252A (en) * 1993-06-17 1995-12-26 Ultrapointe Corporation Laser imaging system for inspection and analysis of sub-micron particles
JP3455289B2 (ja) * 1994-06-23 2003-10-14 ペンタックス株式会社 蛍光診断用内視鏡装置
KR100245805B1 (ko) * 1995-03-10 2000-04-01 가나이 쓰도무 검사방법 및 장치 또 이것을 사용한 반도체장치의 제조방법
JPH095252A (ja) * 1995-04-19 1997-01-10 Nikon Corp マスクの異物検査装置
US5835220A (en) * 1995-10-27 1998-11-10 Nkk Corporation Method and apparatus for detecting surface flaws
JPH1183753A (ja) * 1997-07-09 1999-03-26 Toshiba Corp 光学式基板検査装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4699512A (en) * 1984-07-13 1987-10-13 Hitachi, Ltd. Device for measuring fluorescence polarization
US4893008A (en) * 1987-06-09 1990-01-09 Olympus Optical Co., Ltd. Scanning optical microscope
US5133198A (en) * 1989-09-15 1992-07-28 Institut Textile De France Endoscopic apparatus for flaw detection on a circular knitting machine
US5333052A (en) * 1990-11-27 1994-07-26 Orbotech Ltd. Method and apparatus for automatic optical inspection
US5554318A (en) * 1994-02-07 1996-09-10 Basf Aktiengesellschaft Use of compounds which absorbs and fluoresce in the IR range as crack-detecting agents

Also Published As

Publication number Publication date
AU5170199A (en) 2000-02-28
DE69916853D1 (de) 2004-06-03
FR2782165A1 (fr) 2000-02-11
ATE265679T1 (de) 2004-05-15
CA2339882A1 (fr) 2000-02-17
IL141252A0 (en) 2002-03-10
DE69916853T2 (de) 2005-04-21
WO2000008449B1 (fr) 2000-06-29
JP2002522764A (ja) 2002-07-23
EP1102978B1 (fr) 2004-04-28
EP1102978A2 (fr) 2001-05-30
CN1319184A (zh) 2001-10-24
US6556298B1 (en) 2003-04-29
FR2782165B1 (fr) 2000-12-29
ES2220094T3 (es) 2004-12-01
CN1152249C (zh) 2004-06-02
CA2339882C (fr) 2007-06-05
IL141252A (en) 2004-05-12
WO2000008449A2 (fr) 2000-02-17

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