WO2000025171A3 - Anordnung zur optischen abtastung eines objekts - Google Patents

Anordnung zur optischen abtastung eines objekts Download PDF

Info

Publication number
WO2000025171A3
WO2000025171A3 PCT/DE1999/003400 DE9903400W WO0025171A3 WO 2000025171 A3 WO2000025171 A3 WO 2000025171A3 DE 9903400 W DE9903400 W DE 9903400W WO 0025171 A3 WO0025171 A3 WO 0025171A3
Authority
WO
WIPO (PCT)
Prior art keywords
arrangement
scanning
optically scanning
mirror
scan
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/DE1999/003400
Other languages
English (en)
French (fr)
Other versions
WO2000025171A2 (de
Inventor
Johann Engelhardt
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Leica Microsystems CMS GmbH
Original Assignee
Leica Microsystems Heidelberg GmbH
Leica Microsystems CMS GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE19950225A external-priority patent/DE19950225A1/de
Application filed by Leica Microsystems Heidelberg GmbH, Leica Microsystems CMS GmbH filed Critical Leica Microsystems Heidelberg GmbH
Priority to DE59914912T priority Critical patent/DE59914912D1/de
Priority to EP99960812A priority patent/EP1049952B1/de
Priority to JP2000578692A priority patent/JP2003524194A/ja
Publication of WO2000025171A2 publication Critical patent/WO2000025171A2/de
Publication of WO2000025171A3 publication Critical patent/WO2000025171A3/de
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0036—Scanning details, e.g. scanning stages
    • G02B21/0048—Scanning details, e.g. scanning stages scanning mirrors, e.g. rotating or galvanomirrors, MEMS mirrors
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/006—Optical details of the image generation focusing arrangements; selection of the plane to be imaged
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0064—Optical details of the image generation multi-spectral or wavelength-selective arrangements, e.g. wavelength fan-out, chromatic profiling
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/10—Scanning systems
    • G02B26/101—Scanning systems with both horizontal and vertical deflecting means, e.g. raster or XY scanners

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Microscoopes, Condenser (AREA)
  • Optical Elements Other Than Lenses (AREA)
  • Mechanical Optical Scanning Systems (AREA)

Abstract

Eine Anordnung zur optischen Abtastung eines Objekts, insbesondere in der vorzugsweise konfokalen Laserscan-Mikroskopie, wobei im Beleuchtungs-/Detektionsstrahlengang (1, 2) eine Linse oder ein Objektiv (3) und mindestens ein Scanspiegel (4) angeordnet sind, ist zur Abtastung von die Objektfeldgröße der Mikroskopoptik überschreitende Objektfelder mit einer hinreichend schnellen Datenaufnahme und unter Verwendung einfacher optischer Komponenten dadurch gekennzeichnet, dass der Spiegel (4) mit einer zur Abtastfläche des Objekts zumindest weitgehend orthogonalen Drehachse (5) dreht bzw. schwenkt.
PCT/DE1999/003400 1998-10-24 1999-10-25 Anordnung zur optischen abtastung eines objekts Ceased WO2000025171A2 (de)

Priority Applications (3)

Application Number Priority Date Filing Date Title
DE59914912T DE59914912D1 (de) 1998-10-24 1999-10-25 Anordnung zur optischen abtastung eines objekts
EP99960812A EP1049952B1 (de) 1998-10-24 1999-10-25 Anordnung zur optischen abtastung eines objekts
JP2000578692A JP2003524194A (ja) 1998-10-24 1999-10-25 対象物を光学的に走査するための装置

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
DE19849143 1998-10-24
DE19849143.3 1998-10-24
DE19950225A DE19950225A1 (de) 1998-10-24 1999-10-19 Anordnung zur optischen Abtastung eines Objekts
DE19950225.0 1999-10-19

Related Child Applications (2)

Application Number Title Priority Date Filing Date
US09582177 A-371-Of-International 2000-06-22
US10/201,225 Continuation US20030002148A1 (en) 1998-10-24 2002-07-22 Arrangement for optically scanning an object

Publications (2)

Publication Number Publication Date
WO2000025171A2 WO2000025171A2 (de) 2000-05-04
WO2000025171A3 true WO2000025171A3 (de) 2000-08-31

Family

ID=26049740

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/DE1999/003400 Ceased WO2000025171A2 (de) 1998-10-24 1999-10-25 Anordnung zur optischen abtastung eines objekts

Country Status (3)

Country Link
EP (1) EP1049952B1 (de)
JP (1) JP2003524194A (de)
WO (1) WO2000025171A2 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102011054914A1 (de) * 2011-10-28 2013-05-02 Leica Microsystems Cms Gmbh Verfahren und Anordnung zur Beleuchtung einer Probe
JP6980370B2 (ja) 2016-08-29 2021-12-15 オリンパス株式会社 顕微鏡システム
DE102019113975B4 (de) * 2019-05-24 2023-10-19 Abberior Instruments Gmbh Verfahren und Vorrichtung zum Überwachen des Fokuszustands eines Mikroskops sowie Mikroskop

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5785176A (en) * 1980-11-18 1982-05-27 Nippon Electric Ind Co Ltd Optical reader
JPS5986024A (ja) * 1982-11-08 1984-05-18 Mitsubishi Electric Corp ホログラム・スキヤナ
US5144477A (en) * 1988-04-11 1992-09-01 Medical Research Council Method of operating a scanning confocal imaging system
US5532873A (en) * 1993-09-08 1996-07-02 Dixon; Arthur E. Scanning beam laser microscope with wide range of magnification

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5785176A (en) * 1980-11-18 1982-05-27 Nippon Electric Ind Co Ltd Optical reader
JPS5986024A (ja) * 1982-11-08 1984-05-18 Mitsubishi Electric Corp ホログラム・スキヤナ
US5144477A (en) * 1988-04-11 1992-09-01 Medical Research Council Method of operating a scanning confocal imaging system
US5532873A (en) * 1993-09-08 1996-07-02 Dixon; Arthur E. Scanning beam laser microscope with wide range of magnification

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
KENSINGTON LABS 8500 SERIES PRECISION STAGE, XP002132641, Retrieved from the Internet <URL:http://www.kensingtonlabs.com/products/8500stag> [retrieved on 20000309] *
PATENT ABSTRACTS OF JAPAN vol. 006, no. 168 (P - 139) 2 September 1982 (1982-09-02) *
PATENT ABSTRACTS OF JAPAN vol. 008, no. 202 (P - 300) 14 September 1984 (1984-09-14) *

Also Published As

Publication number Publication date
EP1049952A2 (de) 2000-11-08
JP2003524194A (ja) 2003-08-12
EP1049952B1 (de) 2008-11-26
WO2000025171A2 (de) 2000-05-04

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