WO2000052454A3 - Improved thin layer nuclear density gauge - Google Patents

Improved thin layer nuclear density gauge Download PDF

Info

Publication number
WO2000052454A3
WO2000052454A3 PCT/US2000/005485 US0005485W WO0052454A3 WO 2000052454 A3 WO2000052454 A3 WO 2000052454A3 US 0005485 W US0005485 W US 0005485W WO 0052454 A3 WO0052454 A3 WO 0052454A3
Authority
WO
WIPO (PCT)
Prior art keywords
housing
sliding block
source rod
gauge
radiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US2000/005485
Other languages
French (fr)
Other versions
WO2000052454A2 (en
Inventor
Wewage H L Dep
John T Eagan
Alfred W Jordan
Robert E Troxler
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Troxler Electronic Laboratories Inc
Original Assignee
Troxler Electronic Laboratories Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Troxler Electronic Laboratories Inc filed Critical Troxler Electronic Laboratories Inc
Priority to DE60036200T priority Critical patent/DE60036200T2/en
Priority to EP00916002A priority patent/EP1166095B1/en
Priority to AU37174/00A priority patent/AU773968B2/en
Priority to CA002363419A priority patent/CA2363419C/en
Publication of WO2000052454A2 publication Critical patent/WO2000052454A2/en
Publication of WO2000052454A3 publication Critical patent/WO2000052454A3/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Electromagnetism (AREA)
  • Measurement Of Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

The present invention provides an improved thin layer nuclear density gauge comprising a gauge housing having a vertical cavity therethrough and a base, a first radiation detector located at a first position within said housing and adjacent to said base of said housing, a second radiation detector located at a second position within said housing and adjacent to said base of said housing, a vertically moveable source rod extending into said cavity of said gauge housing, a radiation source operatively positioned within a distal end of said source rod, at least one bearing operatively positioned to guide said source rod within said cavity, and means for vertically extending and retracting said source rod to a plurality of predetermined source rod positions so as to change the spatial relationship between said radiation source and said first and second radiation detectors. The source rod has a maximum radial movement of less than about 0.003 inch at each predetermined position. The present invention also provides a gauge with an improved radiation shield assembly comprising a sliding block operatively positioned to move laterally between said first position and said second position, a spring engaging said sliding block and biasing said sliding block into said first position, and a fixed block, said fixed block including a track engaging said sliding block and guiding movement of said sliding block.
PCT/US2000/005485 1999-03-03 2000-03-02 Improved thin layer nuclear density gauge Ceased WO2000052454A2 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
DE60036200T DE60036200T2 (en) 1999-03-03 2000-03-02 NUCLEAR MEASURING DEVICE FOR DETERMINING THE DENSITY OF THIN LAYERS
EP00916002A EP1166095B1 (en) 1999-03-03 2000-03-02 Improved thin layer nuclear density gauge
AU37174/00A AU773968B2 (en) 1999-03-03 2000-03-02 Improved thin layer nuclear density gauge
CA002363419A CA2363419C (en) 1999-03-03 2000-03-02 Improved thin layer nuclear density gauge

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12269499P 1999-03-03 1999-03-03
US60/122,694 1999-03-03

Publications (2)

Publication Number Publication Date
WO2000052454A2 WO2000052454A2 (en) 2000-09-08
WO2000052454A3 true WO2000052454A3 (en) 2001-02-01

Family

ID=22404185

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2000/005485 Ceased WO2000052454A2 (en) 1999-03-03 2000-03-02 Improved thin layer nuclear density gauge

Country Status (8)

Country Link
US (2) US6310936B1 (en)
EP (1) EP1166095B1 (en)
CN (1) CN1156689C (en)
AT (1) ATE371861T1 (en)
AU (1) AU773968B2 (en)
CA (1) CA2363419C (en)
DE (1) DE60036200T2 (en)
WO (1) WO2000052454A2 (en)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ATE371861T1 (en) * 1999-03-03 2007-09-15 Troxler Electronic Lab Inc NUCLEAR MEASURING DEVICE FOR DETERMINING THE DENSITY OF THIN LAYERS
US8164048B2 (en) * 2008-01-04 2012-04-24 Troxler Electronic Laboratories, Inc. Nuclear gauges and methods of configuration and calibration of nuclear gauges
NZ538649A (en) 2005-03-07 2006-10-27 Inst Geolog Nuclear Sciences Estimating strengths of wooden supports using gamma rays
WO2007027760A2 (en) 2005-08-30 2007-03-08 Troxler Electronic Laboratories, Inc. Methods, systems, and computer program products for determining a property of construction material
CN101535844B (en) * 2005-08-30 2013-12-25 特克斯勒电子实验室公司 Methods, systems, and computer program products for determining property of construction material
WO2007120179A2 (en) * 2005-09-21 2007-10-25 Troxler Electronic Laboratories, Inc. Nuclear density gauge
US7605366B2 (en) 2005-09-21 2009-10-20 Troxler Electronic Laboratories, Inc. Nuclear density gauge
FR2920540B1 (en) * 2007-09-05 2012-07-20 Inst La Soudure DEVICE FOR MOUNTING, ON A NON-DESTRUCTIVE CONTROLLED PART, AN IRRADIATION SOURCE PRESENT IN AN IRRADIATION TIP AND / OR A COLLIMATOR OF A CONTROL DEVICE
US10515731B1 (en) 2013-03-14 2019-12-24 Troxler Electronic Laboratories, Inc. Nuclear Gauge
US9885566B2 (en) 2014-07-24 2018-02-06 Johnson Matthey Public Limited Company Apparatus for determining thickness of lining layer

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4749858A (en) * 1986-08-27 1988-06-07 Troxler Electronic Laboratories, Inc. Nuclear measuring gauge with automatic detection of source depth
WO1998057269A1 (en) * 1997-06-12 1998-12-17 Instrotek, Inc. Validation and calibration apparatus and method for nuclear density gauges

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3544793A (en) * 1967-12-11 1970-12-01 Troxler Electronic Lab Inc Portable nuclear measuring gauge providing multiple radiation and detecting positions
US4439675A (en) 1981-09-21 1984-03-27 Campbell Patrick J Moisture and density gauge
US4525854A (en) 1983-03-22 1985-06-25 Troxler Electronic Laboratories, Inc. Radiation scatter apparatus and method
US4641030A (en) 1984-12-13 1987-02-03 Troxler Electronic Laboratories, Inc. Apparatus and method for directly measuring the density of a thin layer
US4701868A (en) 1984-12-13 1987-10-20 Troxler Electronic Laboratories, Inc. Apparatus and method for accurately measuring the density of materials with rough surfaces by radiation backscatter
US4979197A (en) 1986-05-22 1990-12-18 Troxler Electronic Laboratories, Inc. Nuclear radiation apparatus and method for dynamically measuring density of test materials during compaction
US4766319A (en) 1987-02-12 1988-08-23 Troxler Electronic Laboratories, Inc. Portable nuclear moisture-density gauge with low activity nuclear sources
ATE371861T1 (en) * 1999-03-03 2007-09-15 Troxler Electronic Lab Inc NUCLEAR MEASURING DEVICE FOR DETERMINING THE DENSITY OF THIN LAYERS

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4749858A (en) * 1986-08-27 1988-06-07 Troxler Electronic Laboratories, Inc. Nuclear measuring gauge with automatic detection of source depth
WO1998057269A1 (en) * 1997-06-12 1998-12-17 Instrotek, Inc. Validation and calibration apparatus and method for nuclear density gauges

Also Published As

Publication number Publication date
US6310936B1 (en) 2001-10-30
DE60036200T2 (en) 2008-05-21
CA2363419C (en) 2008-01-22
AU3717400A (en) 2000-09-21
AU773968B2 (en) 2004-06-10
WO2000052454A2 (en) 2000-09-08
CN1344367A (en) 2002-04-10
CN1156689C (en) 2004-07-07
EP1166095B1 (en) 2007-08-29
ATE371861T1 (en) 2007-09-15
CA2363419A1 (en) 2000-09-08
US6442232B2 (en) 2002-08-27
DE60036200D1 (en) 2007-10-11
EP1166095A2 (en) 2002-01-02
US20010055363A1 (en) 2001-12-27

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