WO2001064389A3 - Vertical counter balanced test head manipulator - Google Patents

Vertical counter balanced test head manipulator Download PDF

Info

Publication number
WO2001064389A3
WO2001064389A3 PCT/US2001/006456 US0106456W WO0164389A3 WO 2001064389 A3 WO2001064389 A3 WO 2001064389A3 US 0106456 W US0106456 W US 0106456W WO 0164389 A3 WO0164389 A3 WO 0164389A3
Authority
WO
WIPO (PCT)
Prior art keywords
test head
vertical support
main arm
vertical counter
counter balanced
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US2001/006456
Other languages
French (fr)
Other versions
WO2001064389A2 (en
Inventor
Alyn R Holt
Brian R Moore
Henri M Akouka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
InTest Corp
Original Assignee
InTest IP Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by InTest IP Corp filed Critical InTest IP Corp
Priority to JP2001563272A priority Critical patent/JP2003525433A/en
Priority to DE60117003T priority patent/DE60117003T2/en
Priority to AU2001239949A priority patent/AU2001239949A1/en
Priority to US10/204,069 priority patent/US7554321B2/en
Priority to KR1020027011523A priority patent/KR20020082862A/en
Priority to EP01914580A priority patent/EP1259829B1/en
Publication of WO2001064389A2 publication Critical patent/WO2001064389A2/en
Anticipated expiration legal-status Critical
Publication of WO2001064389A3 publication Critical patent/WO2001064389A3/en
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C29/56016—Apparatus features

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Transmission Devices (AREA)
  • Manipulator (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Vehicle Body Suspensions (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
  • Supporting Of Heads In Record-Carrier Devices (AREA)
  • Details Or Accessories Of Spraying Plant Or Apparatus (AREA)

Abstract

A positioner, such as a test head carrier for a semiconductor wafer and device tester, includes a vertical support and a main arm for supporting a test head. The main arm is suspended for vernier movement by use of a counterbalancing force such as counterweights. The suspension of the main arm is performed at a mechanical advantage so that reduced counterblancing force and correspondingly large movements on the counterblance side are used to effect the vernier movement. The vertical support may be adjusted with a non-compliant drive such as a ball screw mechanism. The vernier movement can also be used to sense collisions and other positioning errors and actuation of the drive for the vertical support can be controlled accordingly.
PCT/US2001/006456 2000-03-01 2001-03-01 Vertical counter balanced test head manipulator Ceased WO2001064389A2 (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP2001563272A JP2003525433A (en) 2000-03-01 2001-03-01 Balanced vertical docking motion in a driven vertical axis test head manipulator
DE60117003T DE60117003T2 (en) 2000-03-01 2001-03-01 VERTICALLY BALANCED TIP HEAD MANIPULATOR
AU2001239949A AU2001239949A1 (en) 2000-03-01 2001-03-01 Vertical counter balanced test head manipulator
US10/204,069 US7554321B2 (en) 2000-03-01 2001-03-01 Counter balanced vertical docking motion in a driven vertical axis test head manipulator
KR1020027011523A KR20020082862A (en) 2000-03-01 2001-03-01 Counter balanced vertical docking motion in a driven vertical axis test head manipulator
EP01914580A EP1259829B1 (en) 2000-03-01 2001-03-01 Vertical counter balanced test head manipulator

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US18619600P 2000-03-01 2000-03-01
US60/186,196 2000-03-01

Publications (2)

Publication Number Publication Date
WO2001064389A2 WO2001064389A2 (en) 2001-09-07
WO2001064389A3 true WO2001064389A3 (en) 2002-09-06

Family

ID=22684009

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2001/006456 Ceased WO2001064389A2 (en) 2000-03-01 2001-03-01 Vertical counter balanced test head manipulator

Country Status (11)

Country Link
US (1) US7554321B2 (en)
EP (2) EP1650573B1 (en)
JP (1) JP2003525433A (en)
KR (1) KR20020082862A (en)
CN (1) CN100495040C (en)
AT (1) ATE317128T1 (en)
AU (1) AU2001239949A1 (en)
DE (2) DE60117003T2 (en)
MY (2) MY144519A (en)
TW (1) TWI222911B (en)
WO (1) WO2001064389A2 (en)

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US7235964B2 (en) * 2003-03-31 2007-06-26 Intest Corporation Test head positioning system and method
KR20060057603A (en) * 2003-08-06 2006-05-26 인테스트 코포레이션 Test Head Positioning System
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CN100582800C (en) * 2004-09-02 2010-01-20 东京毅力科创株式会社 Heavy object tipping arrangement
JP4793809B2 (en) * 2004-09-02 2011-10-12 東京エレクトロン株式会社 Heavy object turning mechanism
US8607935B2 (en) * 2005-12-20 2013-12-17 Intuitive Surgical Operations, Inc. Guide systems for laminated spring assemblies
TWI439709B (en) * 2006-12-29 2014-06-01 Intest Corp Manupulator and load positioning system for translating load along axis of translation
US8350584B2 (en) 2006-12-29 2013-01-08 Intest Corporation Test head positioning system and method
SG178722A1 (en) * 2007-02-23 2012-03-29 Intest Corp Test head manipulator
US7750657B2 (en) * 2007-03-15 2010-07-06 Applied Materials Inc. Polishing head testing with movable pedestal
JP5221118B2 (en) * 2007-12-14 2013-06-26 東京エレクトロン株式会社 Inspection device
CN101846589B (en) * 2009-03-24 2013-06-05 京元电子股份有限公司 Flip test module and its test system
US8981807B2 (en) 2010-07-27 2015-03-17 Intest Corporation Positioner system and method of positioning
SG10201605656TA (en) 2011-07-12 2016-08-30 Intest Corp Method and apparatus for docking a test head with a peripheral
US8935952B2 (en) * 2012-06-27 2015-01-20 International Business Machines Corporation Dynamic rack cabinet stability testing
CN102735387B (en) * 2012-07-16 2014-08-06 台州市计量技术研究院 Static torque precise testing device and torque testing method using same
CN103629913B (en) * 2012-08-16 2015-04-08 上海华虹宏力半导体制造有限公司 Vertical gravity center adjusting devices of revolution type rotary drier
JP5953215B2 (en) * 2012-12-07 2016-07-20 三鷹光器株式会社 Automatic balancing structure of medical balancing stand
EP3301032B1 (en) 2013-02-13 2019-05-01 Lantech.Com LLC Containment force-based wrapping
CA3202951A1 (en) 2014-01-14 2015-07-23 Lantech.Com, Llc Dynamic adjustment of wrap force parameter responsive to monitored wrap force and/or for film break reduction
EP3204298B1 (en) 2014-10-07 2019-04-24 Lantech.Com LLC Graphical depiction of wrap profile for load wrapping apparatus
AU2016246778B2 (en) 2015-04-10 2019-03-14 Lantech.Com, Llc Stretch wrapping machine supporting top layer containment operations
WO2017053608A1 (en) 2015-09-25 2017-03-30 Lantech.Com, Llc Stretch wrapping machine with automated determination of load stability by subjecting a load to a disturbance
KR102221204B1 (en) * 2016-10-10 2021-03-03 레이드-애쉬맨 매뉴팩추어링 인코포레이티드 Manipulator
TWI658271B (en) * 2017-08-25 2019-05-01 鴻勁精密股份有限公司 Electronic component crimping unit and test equipment for its application
SMT202300435T1 (en) 2017-09-22 2024-01-10 Lantech Com Llc Load wrapping apparatus wrap profiles with controlled wrap cycle interruptions
CN110303487B (en) * 2018-05-17 2023-06-20 青岛理工大学 Manipulator device for carrying pipes
CN109856554A (en) * 2019-04-22 2019-06-07 星云智能装备（昆山）有限公司 It is a kind of automatically to slotting mechanism and battery pack test device
CN110251197A (en) * 2019-07-05 2019-09-20 四川大学 An auxiliary device for spinal drilling surgery
CA3147094C (en) 2019-09-09 2025-02-11 Lantech.Com, Llc Stretch wrapping machine with dispense rate control based on sensed rate of dispensed packaging material and predicted load geometry
AU2020350496B2 (en) 2019-09-19 2024-01-25 Lantech.Com, Llc Packaging material grading and/or factory profiles
DE102021114443B4 (en) * 2021-06-04 2023-06-15 Xcerra Corp. Probe for a finger tester and finger tester with several such probes and method for testing printed circuit boards
CN114325325B (en) * 2021-12-29 2023-12-01 日月新半导体(昆山)有限公司 Apparatus for testing integrated circuit products
US12480986B1 (en) * 2022-05-30 2025-11-25 Christos Tsironis Mechanism for remotely controlling the contacting of wafer probes attached to load pull tuners
CN115902431A (en) * 2023-01-10 2023-04-04 深圳市信维通信股份有限公司 A kind of antenna test fixture and using method thereof

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US5059089A (en) * 1988-10-17 1991-10-22 Kocaoglan Harutyun A Infinitely adjustable travel lead screw and multi-cylinder driven movement unit
EP0609633A1 (en) * 1993-02-04 1994-08-10 Megamation Incorporated Linear motor suspension system
US5603677A (en) * 1995-03-28 1997-02-18 Sollo; Robert E. Weight assisted rehabilitation system
US5818219A (en) * 1994-11-24 1998-10-06 Advantest Corp. Semiconductor test system having test head connection apparatus
US6009670A (en) * 1999-02-01 2000-01-04 Howard; Glenn Gate operator for vertical gate movement

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US5059089A (en) * 1988-10-17 1991-10-22 Kocaoglan Harutyun A Infinitely adjustable travel lead screw and multi-cylinder driven movement unit
EP0609633A1 (en) * 1993-02-04 1994-08-10 Megamation Incorporated Linear motor suspension system
US5818219A (en) * 1994-11-24 1998-10-06 Advantest Corp. Semiconductor test system having test head connection apparatus
US5603677A (en) * 1995-03-28 1997-02-18 Sollo; Robert E. Weight assisted rehabilitation system
US6009670A (en) * 1999-02-01 2000-01-04 Howard; Glenn Gate operator for vertical gate movement

Also Published As

Publication number Publication date
CN1408065A (en) 2003-04-02
EP1259829B1 (en) 2006-02-01
MY144519A (en) 2011-09-30
TWI222911B (en) 2004-11-01
MY138984A (en) 2009-08-28
AU2001239949A1 (en) 2001-09-12
CN100495040C (en) 2009-06-03
KR20020082862A (en) 2002-10-31
WO2001064389A2 (en) 2001-09-07
DE60117003D1 (en) 2006-04-13
US7554321B2 (en) 2009-06-30
US20040051517A1 (en) 2004-03-18
ATE317128T1 (en) 2006-02-15
DE60117003T2 (en) 2006-11-30
EP1650573A3 (en) 2006-07-19
JP2003525433A (en) 2003-08-26
DE60144498D1 (en) 2011-06-01
EP1259829A2 (en) 2002-11-27
EP1650573A2 (en) 2006-04-26
EP1650573B1 (en) 2011-04-20

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